Showing 1 of 1 results
This paper presents a search for direct electroweak gaugino or gluino pair production with a chargino nearly mass-degenerate with a stable neutralino. It is based on an integrated luminosity of 36.1 $\mathrm{fb}^{-1}$ of $pp$ collisions at $\sqrt{s} = 13$ TeV collected by the ATLAS experiment at the LHC. The final state of interest is a disappearing track accompanied by at least one jet with high transverse momentum from initial-state radiation or by four jets from the gluino decay chain. The use of short track segments reconstructed from the innermost tracking layers significantly improves the sensitivity to short chargino lifetimes. The results are found to be consistent with Standard Model predictions. Exclusion limits are set at 95% confidence level on the mass of charginos and gluinos for different chargino lifetimes. For a pure wino with a lifetime of about 0.2 ns, chargino masses up to 460 GeV are excluded. For the strong production channel, gluino masses up to 1.65 TeV are excluded assuming a chargino mass of 460 GeV and lifetime of 0.2 ns.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
When you search on a word, e.g. 'collisions', we will automatically search across everything we store about a record. But sometimes you may wish to be more specific. Here we show you how.
Guidance on the query string syntax can also be found in the OpenSearch documentation.
About HEPData Submitting to HEPData HEPData File Formats HEPData Coordinators HEPData Terms of Use HEPData Cookie Policy
Status Email Forum Twitter GitHub
Copyright ~1975-Present, HEPData | Powered by Invenio, funded by STFC, hosted and originally developed at CERN, supported and further developed at IPPP Durham.