$R_{pPb}$ as a function of $p_{T}$ integrated over rapidity range $-1.8<y*<1.3$ for the 0--90% centrality interval for the three geometric models: (a) Glauber, (b) Glauber-Gribov with $\omega_{\sigma}=0.11$ and (c) Glauber-Gribov with $\omega_{\sigma}=0.2$.

$R_{pPb}$ values as a function of $p_{T}$ in the 0--90% centrality interval averaged over $|y*|<0.5$.The $\langle T_{Pb} \rangle$ value for the ATLAS centrality correction is calculated with the Glauber model. The total systematic uncertainties, which include the uncertainty in $\langle T_{Pb} \rangle$, are indicated by lines of the same colour. Strict quantitative agreement is not expected as each measurement uses different rapidity intervals for the centrality determination and apply different event selection criteria to reject diffractive collisions.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

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The inclusive prompt photon cross section with systematic and statistical uncertainties for the region 1.81<|eta(gamma)| < 2.37.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the VBS fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the aQGC fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Expected and observed one-dimensional 95% Confidence Level intervals on the anomalous couplings parameters. Anomalous couplings are introduced as form factors using a cut-off scale $\Lambda_{\mathrm{co}}$.

Expected and observed one-dimensional intervals at 95% Confidence Level on the Effective Field Theory (EFT) parameters.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The measured differential cross sections $\rm{d}\sigma/\rm{d}|\eta|$ of $D^{*\pm}$ and $D^\pm$ production with $20<p_T<100\,$GeV. The first and second errors are the statistical and systematic uncertainties, respectively. The systematic uncertainty fractions corresponding to the tracking ($\delta_2$) uncertainties (Table 2 of the paper) are strongly correlated. The fully correlated uncertainties linked with the luminosity measurement ($3.5\%$) and branching fractions ($1.5\%$ and $2.1\%$ for $D^{*\pm}$ and $D^\pm$, respectively) are not shown.

A2 for the yZ-integrated measurement (unregularised).

A3 for the yZ-integrated measurement (unregularised).

A4 for the yZ-integrated measurement (unregularised).

A5 for the yZ-integrated measurement (unregularised).

A6 for the yZ-integrated measurement (unregularised).

A7 for the yZ-integrated measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the yZ-integrated measurement (regularised).

A0 for the yZ-integrated measurement (regularised).

A1 for the yZ-integrated measurement (regularised).

A2 for the yZ-integrated measurement (regularised).

A3 for the yZ-integrated measurement (regularised).

A4 for the yZ-integrated measurement (regularised).

A5 for the yZ-integrated measurement (regularised).

A6 for the yZ-integrated measurement (regularised).

A7 for the yZ-integrated measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0-A2 for the 0<|yZ|<1 measurement (unregularised).

A0 for the 0<|yZ|<1 measurement (unregularised).

A1 for the 0<|yZ|<1 measurement (unregularised).

A2 for the 0<|yZ|<1 measurement (unregularised).

A3 for the 0<|yZ|<1 measurement (unregularised).

A4 for the 0<|yZ|<1 measurement (unregularised).

A5 for the 0<|yZ|<1 measurement (unregularised).

A6 for the 0<|yZ|<1 measurement (unregularised).

A7 for the 0<|yZ|<1 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the 0<|yZ|<1 measurement (regularised).

A0 for the 0<|yZ|<1 measurement (regularised).

A1 for the 0<|yZ|<1 measurement (regularised).

A2 for the 0<|yZ|<1 measurement (regularised).

A3 for the 0<|yZ|<1 measurement (regularised).

A4 for the 0<|yZ|<1 measurement (regularised).

A5 for the 0<|yZ|<1 measurement (regularised).

A6 for the 0<|yZ|<1 measurement (regularised).

A7 for the 0<|yZ|<1 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0-A2 for the 1<|yZ|<2 measurement (unregularised).

A0 for the 1<|yZ|<2 measurement (unregularised).

A1 for the 1<|yZ|<2 measurement (unregularised).

A2 for the 1<|yZ|<2 measurement (unregularised).

A3 for the 1<|yZ|<2 measurement (unregularised).

A4 for the 1<|yZ|<2 measurement (unregularised).

A5 for the 1<|yZ|<2 measurement (unregularised).

A6 for the 1<|yZ|<2 measurement (unregularised).

A7 for the 1<|yZ|<2 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the 1<|yZ|<2 measurement (regularised).

A0 for the 1<|yZ|<2 measurement (regularised).

A1 for the 1<|yZ|<2 measurement (regularised).

A2 for the 1<|yZ|<2 measurement (regularised).

A3 for the 1<|yZ|<2 measurement (regularised).

A4 for the 1<|yZ|<2 measurement (regularised).

A5 for the 1<|yZ|<2 measurement (regularised).

A6 for the 1<|yZ|<2 measurement (regularised).

A7 for the 1<|yZ|<2 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A2 for the 2<|yZ|<3.5 measurement (unregularised).

A3 for the 2<|yZ|<3.5 measurement (unregularised).

A5 for the 2<|yZ|<3.5 measurement (unregularised).

A7 for the 2<|yZ|<3.5 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A2 for the 2<|yZ|<3.5 measurement (regularised).

A3 for the 2<|yZ|<3.5 measurement (regularised).

A5 for the 2<|yZ|<3.5 measurement (regularised).

A7 for the 2<|yZ|<3.5 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0 for the 2<|yZ|<3.5 measurement (unregularised).

A4 for the 2<|yZ|<3.5 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0 for the 2<|yZ|<3.5 measurement (regularised).

A4 for the 2<|yZ|<3.5 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

The leptonic asymmetry dependence on the invariant mass of top-antitop system ($m_{t\bar{t}}$) in the fiducial volume.

The leptonic asymmetry dependence on the longitudinal boost of the top-antitop system ($\beta_z^{t\bar{t}}$) in the fiducial volume.

The leptonic asymmetry dependence on the transverse momentum of the top-antitop system ($p_T^{t\bar{t}}$) in the fiducial volume.

The top-antitop inclusive asymmetry in the fiducial volume.

The top-antitop asymmetry dependence on the invariant mass of top-antitop system ($m_{t\bar{t}}$) in the fiducial volume.

The top-antitop asymmetry dependence on the longitudinal boost of the top-antitop system ($\beta_z^{t\bar{t}}$) in the fiducial volume.

The top-antitop asymmetry dependence on the transverse momentum of the top-antitop system ($p_T^{t\bar{t}}$) in the fiducial volume.

Charged-particle spectra in different centrality intervals for Pb+Pb.

Charged-particle spectra in different centrality intervals for Pb+Pb (not shown in Fig. 10).

Charged-particle spectra in different centrality intervals for Pb+Pb.

Charged-particle spectra in different centrality intervals for Pb+Pb (not shown in Fig. 10).

Charged-particle spectra in different centrality intervals for Pb+Pb.

Charged-particle spectra in different centrality intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Rcp in different centrality intervals.

Rcp in different centrality intervals (not shown in Fig. 12).

Rcp in different centrality intervals.

Rcp in different centrality intervals (not shown in Fig. 12).

Rcp in different centrality intervals.

Rcp in different centrality intervals (not shown in Fig. 12).

Rcp in different centrality intervals.

Raa in different centrality intervals.

Raa in different centrality intervals (not shown in Fig. 13).

Raa in different centrality intervals.

Raa in different centrality intervals (not shown in Fig. 13).

Raa in different centrality intervals.

Raa in different centrality intervals (not shown in Fig. 13).

Raa in different centrality intervals.

Raa in different centrality intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa.

Raa as a function of <Npart>.

Raa as a function of <Npart>.

Raa as a function of <Npart>.

Raa as a function of <Npart>.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for pp.

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb (not shown in Fig. 17).

Charged-particle spectra in different eta intervals for Pb+Pb.

Charged-particle spectra in different eta intervals for Pb+Pb.

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals (not shown in Fig. 18).

Raa in different eta intervals.

Raa in different eta intervals.