Absolute cross-sections differential in m(l2b). Uncertainties are signed to show correlations.

Absolute cross-sections differential in E(llb). Uncertainties are signed to show correlations.

Absolute cross-sections differential in mT(llvvb). Uncertainties are signed to show correlations.

Absolute cross-sections differential in m(llb). Uncertainties are signed to show correlations.

Normalised cross-sections differential in E(b). Uncertainties are signed to show correlations.

Normalised cross-sections differential in m(l1b). Uncertainties are signed to show correlations.

Normalised cross-sections differential in m(l2b). Uncertainties are signed to show correlations.

Normalised cross-sections differential in E(llb). Uncertainties are signed to show correlations.

Normalised cross-sections differential in mT(llvvb). Uncertainties are signed to show correlations.

Normalised cross-sections differential in m(llb). Uncertainties are signed to show correlations.

The systematic uncertainty on the unfolded distribution as a function of minimax-mbl, broken down by components.

The covariance matrix for the unfolded, normalized data in bins of minimax-mbl shown in Figure 2. Redundant entries are suppressed.

Leading lepton transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading lepton transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading lepton pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading lepton pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading b-jet transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading b-jet transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading b-jet pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading b-jet pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

The detector-level minimax-m(bl) distribution for events entering the Z+jets control region.

The detector-level minimax-m(bl) distribution for events entering the same-sign lepton control region.

Data from FigAux 4 and FigAux 8a-16a. The unfolded $log_{10}(\rho^2)$ distribution for anti-kt R=0.8 jets with $p_T$(lead) > 600 GeV, after the soft drop algorithm is applied for beta = 0, in data. All uncertainties described in the text are shown on the data; the uncertainties from the calculations are shown on each one. The distributions are normalized to the integrated cross section, sigma(resum), measured in the resummation region, $-3.7 < log_{10}(\rho^2) < -1.7$. Each set of 10 bins corresponds to one $p_T$ bin in {600, 650, 700, 750, 800, 850, 900, 950, 1000, ∞ } and 10 evenly spaced bins in $log_{10}(\rho^2)$ from -4.5 to -0.5.

Data from FigAux 4 and FigAux 8b-16b. The unfolded $log_{10}(\rho^2)$ distribution for anti-kt R=0.8 jets with $p_T$(lead) > 600 GeV, after the soft drop algorithm is applied for $\beta$ = 1, in data. All uncertainties described in the text are shown on the data; the uncertainties from the calculations are shown on each one. The distributions are normalized to the integrated cross section, sigma(resum), measured in the resummation region, $-3.7 < log_{10}(\rho^2) < -1.7$. Each set of 10 bins corresponds to one $p_T$ bin in {600, 650, 700, 750, 800, 850, 900, 950, 1000, ∞ } and 10 evenly spaced bins in $log_{10}(\rho^2)$ from -4.5 to -0.5.

Data from FigAux 8c-16c. The unfolded $log_{10}(\rho^2)$ distribution for anti-kt R=0.8 jets with $p_T$(lead) > 600 GeV, after the soft drop algorithm is applied for $\beta$ = 2, in data. All uncertainties described in the text are shown on the data; the uncertainties from the calculations are shown on each one. The distributions are normalized to the integrated cross section, sigma(resum), measured in the resummation region, $-3.7 < log_{10}(\rho^2) < -1.7$. Each set of 10 bins corresponds to one $p_T$ bin in {600, 650, 700, 750, 800, 850, 900, 950, 1000, ∞ } and 10 evenly spaced bins in $log_{10}(\rho^2)$ from -4.5 to -0.5.

Data from FigAux 6a. The summed covariance matrices of the systematic and statistical uncertainties for the combined $p_T$ and $log_{10}(\rho^2)$ bins for $\beta$ = 0. Each group of 10 bins corresponds to a bin of $p_T$ in {600, 650, 700, 750, 800, 850, 900, 950, 1000, ∞ }; each bin within the $p_T$ bin corresponds to 10 evenly spaced bins in $log_{10}(\rho^2)$ from -4.5 to -0.5.

Data from FigAux 6b. The summed covariance matrices of the systematic and statistical uncertainties for the combined $p_T$ and $log_{10}(\rho^2)$ bins for $\beta$ = 1. Each group of 10 bins corresponds to a bin of $p_T$ in {600, 650, 700, 750, 800, 850, 900, 950, 1000, ∞ }; each bin within the $p_T$ bin corresponds to 10 evenly spaced bins in $log_{10}(\rho^2)$ from -4.5 to -0.5.

Data from FigAux 6c. The summed covariance matrices of the systematic and statistical uncertainties for the combined $p_T$ and $log_{10}(\rho^2)$ bins for $\beta$ = 2. Each group of 10 bins corresponds to a bin of $p_T$ in {600, 650, 700, 750, 800, 850, 900, 950, 1000, ∞ }; each bin within the $p_T$ bin corresponds to 10 evenly spaced bins in $log_{10}(\rho^2)$ from -4.5 to -0.5.

Data from FigAux 7a. The summed covariance matrices of the systematic and statistical uncertainties for the $log_{10}(\rho^2)$ bins for $\beta$ = 0, inclusive in $p_T$.

Data from FigAux 7b. The summed covariance matrices of the systematic and statistical uncertainties for the $log_{10}(\rho^2)$ bins for $\beta$ = 1, inclusive in $p_T$.

Data from FigAux 7c. The summed covariance matrices of the systematic and statistical uncertainties for the $log_{10}(\rho^2)$ bins for $\beta$ = 2, inclusive in $p_T$.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $467 < m^{\gamma-\rm jet1} < 510$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $510 < m^{\gamma-\rm jet1} < 590$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $590 < m^{\gamma-\rm jet1} < 670$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $670 < m^{\gamma-\rm jet1} < 760$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $760 < m^{\gamma-\rm jet1} < 850$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $850 < m^{\gamma-\rm jet1} < 950$ GeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $0.95 < m^{\gamma-\rm jet1} < 1.05$ TeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $1.05 < m^{\gamma-\rm jet1} < 1.25$ TeV.

Measured cross sections for isolated-photon plus 1jet production as a function of $|\cos\theta^{\star}|$ for the range $1.25 < m^{\gamma-\rm jet1} < 2.45$ TeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $E_{\rm T}^{\gamma}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $p_{\rm T}^{\rm jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm \gamma-jet2}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\Delta\phi^{\rm jet1-jet2}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 2jet production as a function of $\beta^{\rm jet1}$.

Measured cross sections for isolated-photon plus 2jet production as a function of $\beta^{\gamma}$.

Ratio of measured cross sections for isolated-photon plus 2jet production as a function of $\beta$.

Measured cross sections for isolated-photon plus 3jet production as a function of $E_{\rm T}^{\gamma}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $p_{\rm T}^{\rm jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm \gamma-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet1-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$ for the range $130< E_{\rm T}^{\gamma} <300$ GeV.

Measured cross sections for isolated-photon plus 3jet production as a function of $\Delta\phi^{\rm jet2-jet3}$ for the range $E_{\rm T}^{\gamma} >300$ GeV.

List of systematic uncertainties contributing to the total uncertainty in the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, and $R_t= \sigma(tq)/\sigma(\bar{t}q)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\;\%$. In the publication, uncertainties contributing less than $0.5\,\%$ are marked with ``$<0.5$''. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to the following uncertainties on $\sigma(tq):$ electron uncertainties, $c$-tagging efficiency, light-jet tagging efficiency and $t\bar{t}$, $Wt$, $t\bar{b}+\bar{t}b$ radiation. For the measurement of $\sigma(\bar{t}q)$ the approximation is only applied to the uncertainty in the light-jet tagging efficiency. In case of the ratio $R_t$, there are six uncertainties for which the impact on $R_t$ is estimated to be $<0.5$, but for the purpose of providing the data in electronic form in this table they are quoted as $\pm 0.5\,\%$. These uncertainties are $E_\mathrm{T}^{\mathrm{miss}}$ modelling, '$b$-tagging efficiency, light-jet tagging efficiency, PDF, other background normalisation and luminosity.

Measured values of the cross-sections $\sigma(tq)$, $\sigma(\bar{t}q)$, $\sigma(tq+\bar{t} q)$, and $R_t$ for different simulated top-quark masses. The quoted uncertainties are statistical only.

Expected 95% CL exclusion contours for the gluino one-step variable-x model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step variable-x model.

Expected 95% CL exclusion contours for the squark one-step variable-x model.

Observed 95% CL exclusion contours for the gluino two-step model.

Expected 95% CL exclusion contours for the gluino two-step model.

Observed 95% CL exclusion contours for pMSSM model.

Expected 95% CL exclusion contours for pMSSM model.

$m_{\mathrm{eff}}$ distribution in 2J b-veto signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{eff}}$ distribution in 4J low-x b-veto signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{eff}}$ distribution in 4J high-x b-veto signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{eff}}$ distribution in 6J b-veto signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{eff}}$ distribution in 2J b-tag signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{eff}}$ distribution in 4J low-x b-tag signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{eff}}$ distribution in 4J high-x b-tag signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{eff}}$ distribution in 6J b-tag signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{eff}}$ distribution in 9J signal regions after fit. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 2J b-veto signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$E_{\mathrm T}^{\mathrm{miss}}$ distribution for events satisfying all the 2J b-veto signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 2J b-tag signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$E_{\mathrm T}^{\mathrm{miss}}$ distribution for events satisfying all the 2J b-tag signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 4J low-x b-veto signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$E_{\mathrm T}^{\mathrm{miss}}$ distribution for events satisfying all the 4J low-x b-veto signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 4J low-x b-tag signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$E_{\mathrm T}^{\mathrm{miss}}$ distribution for events satisfying all the 4J low-x b-tag signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 4J high-x b-veto signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$E_{\mathrm T}^{\mathrm{miss}}$ distribution for events satisfying all the 4J high-x b-veto signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 4J high-x b-tag signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$E_{\mathrm T}^{\mathrm{miss}}$ distribution for events satisfying all the 4J high-x b-tag signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 6J b-veto signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$E_{\mathrm T}^{\mathrm{miss}}$ distribution for events satisfying all the 6J b-veto signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 6J b-tag signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$E_{\mathrm T}^{\mathrm{miss}}$ distribution for events satisfying all the 6J b-tag signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

$m_{\mathrm{T}}$ distribution for events satisfying all the 9J signal region selections but for the one on the variable shown in the figure. The uncertainty bands plotted include all statistical and systematic uncertainties. The dashed lines stand for the benchmark signal samples.

Observed upper limits on the signal cross-section for gluino one-step x = 1/2 model.

Observed upper limits on the signal cross-section for gluino one-step variable-x model.

Observed upper limits on the signal cross-section for squark one-step x = 1/2 model.

Observed upper limits on the signal cross-section for squark one-step variable-x model.

Observed upper limits on the signal cross-section for gluino two-step model.

Observed upper limits on the signal cross-section for pMSSM model.

Acceptance in 2J discovery signal region for gluino one-step x = 1/2 model.

Acceptance in 2J discovery signal region for squark one-step x = 1/2 model.

Acceptance in 4J low-x discovery signal region for gluino one-step variable-x model.

Acceptance in 4J low-x discovery signal region for squark one-step variable-x model.

Acceptance in 4J high-x discovery signal region for gluino one-step variable-x model.

Acceptance in 4J high-x discovery signal region for squark one-step variable-x model.

Acceptance in 6J discovery signal region for gluino one-step x = 1/2 model.

Acceptance in 6J discovery signal region for squark one-step x = 1/2 model.

Acceptance in 9J discovery signal region for pMSSM model.

Acceptance in 9J discovery signal region for gluino two-step model.

Efficiency in 2J discovery signal region for gluino one-step x = 1/2 model.

Efficiency in 2J discovery signal region for squark one-step x = 1/2 model.

Efficiency in 4J low-x discovery signal region for gluino one-step variable-x model.

Efficiency in 4J low-x discovery signal region for squark one-step variable-x model.

Efficiency in 4J high-x discovery signal region for gluino one-step variable-x model.

Efficiency in 4J high-x discovery signal region for squark one-step variable-x model.

Efficiency in 6J discovery signal region for gluino one-step x = 1/2 model.

Efficiency in 6J discovery signal region for squark one-step x = 1/2 model.

Efficiency in 9J discovery signal region for pMSSM model.

Efficiency in 9J discovery signal region for gluino two-step model.

Cutflow table for the 2J discovery signal region with a representative target signal model. The weighted numbers are normalized to 36.1 fb$^{-1}$ and rounded to the statistical error. The selection called "Filter" is introduced for initial data reduction. It selects events with at least one soft electron or muon ($3.5 < p_\mathrm{T} < 25$ GeV for muons and $4.5 < p_\mathrm{T} < 25$ GeV for electrons) in which an $E_\mathrm{T}^\mathrm{miss}$ trigger has fired or events with at least one hard electron or muon ($p_\mathrm{T} >$25 GeV).

Cutflow table for the 4J high-x discovery signal region with a representative target signal model. The weighted numbers are normalized to 36.1 fb$^{-1}$ and rounded to the statistical error. The selection called "Filter" is introduced for initial data reduction. It selects events with at least one soft electron or muon ($3.5 < p_\mathrm{T} < 25$ GeV for muons and $4.5 < p_\mathrm{T} < 25$ GeV for electrons) in which an $E_\mathrm{T}^\mathrm{miss}$ trigger has fired or events with at least one hard electron or muon ($p_\mathrm{T} >$25 GeV).

Cutflow table for the 4J low-x discovery signal region (targetting gluino decays) with a representative target signal model. The weighted numbers are normalized to 36.1 fb$^{-1}$ and rounded to the statistical error. The selection called "Filter" is introduced for initial data reduction. It selects events with at least one soft electron or muon ($3.5 < p_\mathrm{T} < 25$ GeV for muons and $4.5 < p_\mathrm{T} < 25$ GeV for electrons) in which an $E_\mathrm{T}^\mathrm{miss}$ trigger has fired or events with at least one hard electron or muon ($p_\mathrm{T} >$25 GeV).

Cutflow table for the 4J low-x discovery signal region (targetting squark decays) with a representative target signal model. The weighted numbers are normalized to 36.1 fb$^{-1}$ and rounded to the statistical error. The selection called "Filter" is introduced for initial data reduction. It selects events with at least one soft electron or muon ($3.5 < p_\mathrm{T} < 25$ GeV for muons and $4.5 < p_\mathrm{T} < 25$ GeV for electrons) in which an $E_\mathrm{T}^\mathrm{miss}$ trigger has fired or events with at least one hard electron or muon ($p_\mathrm{T} >$25 GeV).

Cutflow table for the 6J discovery signal region (targetting gluino decays) with a representative target signal model. The weighted numbers are normalized to 36.1 fb$^{-1}$ and rounded to the statistical error. The selection called "Filter" is introduced for initial data reduction. It selects events with at least one soft electron or muon ($3.5 < p_\mathrm{T} < 25$ GeV for muons and $4.5 < p_\mathrm{T} < 25$ GeV for electrons) in which an $E_\mathrm{T}^\mathrm{miss}$ trigger has fired or events with at least one hard electron or muon ($p_\mathrm{T} >$25 GeV).

Cutflow table for the 6J discovery signal region (targetting squark decays) with a representative target signal model. The weighted numbers are normalized to 36.1 fb$^{-1}$ and rounded to the statistical error. The selection called "Filter" is introduced for initial data reduction. It selects events with at least one soft electron or muon ($3.5 < p_\mathrm{T} < 25$ GeV for muons and $4.5 < p_\mathrm{T} < 25$ GeV for electrons) in which an $E_\mathrm{T}^\mathrm{miss}$ trigger has fired or events with at least one hard electron or muon ($p_\mathrm{T} >$25 GeV).

Cutflow table for the 9J discovery signal region with a representative target signal model. The weighted numbers are normalized to 36.1 fb$^{-1}$ and rounded to the statistical error. The selection called "Filter" is introduced for initial data reduction. It selects events with at least one soft electron or muon ($3.5 < p_\mathrm{T} < 25$ GeV for muons and $4.5 < p_\mathrm{T} < 25$ GeV for electrons) in which an $E_\mathrm{T}^\mathrm{miss}$ trigger has fired or events with at least one hard electron or muon ($p_\mathrm{T} >$25 GeV).

Upper limits on the fiducial cross section times branching ratio to two photons at centre-of-mass energy of 13 TeV of a narrow-width (Γ_X = 4 MeV) spin-0 resonance as a function of its mass m_X.

Upper limits on the production cross section times branching ratio to two photons at centre-of-mass energy of 13 TeV of the lightest KK graviton as a function of its mass m_G* for k/MPl=0.01.

Upper limits on the production cross section times branching ratio to two photons at centre-of-mass energy of 13 TeV of the lightest KK graviton as a function of its mass m_G* for k/MPl=0.10. Only the limits derived with the asymptotic formulae are quoted here.

Upper limits on the production cross section times branching ratio to two photons at centre-of-mass energy of 13 TeV of the lightest KK graviton as a function of its mass m_G* for k/MPl=0.20.

Upper limits on the production cross section times branching ratio to two photons at centre-of-mass energy of 13 TeV of the lightest KK graviton as a function of its mass m_G* for k/MPl=0.30.

Distribution of the diphoton invariant mass for data events passing the spin-0 selection. The data points are plotted at the centre of each bin. The error bars indicate statistical uncertainties. The distribution consists of not only genuine diphoton events, but also events where at least one photon is faked by a jet. There is no data event above 2700 GeV.

Distribution of the diphoton invariant mass for data events passing the spin-2 selection. The data points are plotted at the centre of each bin. The error bars indicate statistical uncertainties. The distribution consists of not only genuine diphoton events, but also events where at least one photon is faked by a jet. There is no data event above 2700 GeV.

Fiducial acceptance and product of the fiducial acceptance times the combined reconstruction and identification efficiency as a function of the mass for a spin-0 resonant signal with narrow width under the spin-0 selection. Only MC statistical uncertainties are included.

Fiducial acceptance and product of the fiducial acceptance times the combined reconstruction and identification efficiency as a function of the mass for a spin-2 resonant signal with k/MPl=0.1 under the spin-2 selection. The definition of fiducial region is provided in JHEP 09 (2016) 001. Only MC statistical uncertainties are included.

Fiducial acceptance and product of the fiducial acceptance times the combined reconstruction and identification efficiency as a function of the mass for an ADD excess (GRW formalism), calculated as the difference between the sum of ADD and SM contributions (including their interference) and the SM contribution, under the spin-2 selection in the signal region M(gamma gamma)>2240 GeV. The definition of fiducial region is provided in JHEP 09 (2016) 001, and M(gamma gamma)>2240 GeV is required in addition. Only MC statistical uncertainties are included.

Measured total production cross sections of WW production in the total phase space. Both, resonant and non-resonant WW, production are considered as signal.

Dijet mass distributions for data in the (a) WW signal region.

Dijet mass distributions for data in the (b) WZ signal region.

Dijet mass distributions for data in the (c) ZZ signal region.

Dijet mass distributions for data in the (d) WZ+WW signal region.

Dijet mass distributions for data in the (e) WW+ZZ signal region.

Upper limits at the 95% CL on the cross section times branching ratio for WW+WZ production as a function of V' mass

Upper limits at the 95% CL on the cross section times branching ratio for WW+ZZ production as a function of GKK mass for the bulk RS model with k/M̄Pl=1.

Upper limits at the 95% CL on the cross section times branching ratio for (c) WW+ZZ production as a function of scalar mass.

Upper limits at the 95% CL on the cross section times branching ratio for WW production as a function of V' mass

Upper limits at the 95% CL on the cross section times branching ratio for WZ production as a function of V' mass

Upper limits at the 95% CL on the cross section times branching ratio for WW production as a function of GKK mass for the bulk RS model with k/M̄Pl=0.5.

Upper limits at the 95% CL on the cross section times branching ratio for ZZ production as a function of GKK mass for the bulk RS model with k/M̄Pl=0.5.

Upper limits at the 95% CL on the cross section times branching ratio for WW production as a function of GKK mass for the bulk RS model with k/M̄Pl=1.

Upper limits at the 95% CL on the cross section times branching ratio for ZZ production as a function of GKK mass for the bulk RS model with k/M̄Pl=1.

Upper limits at the 95% CL on the cross section times branching ratio for WW+ZZ production as a function of GKK mass for the bulk RS model with k/M̄Pl=0.5.

Upper limits at the 95% CL on the cross section times branching ratio for WW production as a function of scalar mass.

Upper limits at the 95% CL on the cross section times branching ratio for ZZ production as a function of scalar mass.