Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Distributions of $m_{\mathrm{eff}}$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Distributions of Object-based $E_{\mathrm{T}}^{\mathrm{miss}} {Sig.}$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Distributions of Object-based $E_{\mathrm{T}}^{\mathrm{miss}} {Sig.}$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Distributions of MaxMin alternative algorithm $m(h_{\mathrm{cand1}},h_{\mathrm{cand2}})_{\mathrm{avg}}$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Distributions of MaxMin alternative algorithm $m(h_{\mathrm{cand1}},h_{\mathrm{cand2}})_{\mathrm{avg}}$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Distributions of Leading jet $p_T$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Distributions of Leading jet $p_T$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Distributions of MaxMin algorithm $m_{hcand}$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Distributions of MaxMin algorithm $m_{hcand}$ after the background-only fit. The backgrounds which contribute only a small amount (diboson, W+jets and ttbar+W/Z/h) are grouped and labelled as `Other'.

Signal efficiency in SRA_M_m60 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_M_m60 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal acceptance in SRC_28 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRC_28 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRC_26 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRC_26 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRC_24 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRC_24 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_M_dm130 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_M_dm130 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRB for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRB for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_L_dm130 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_L_dm130 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRC_incl for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRC_incl for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_L_m60 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_L_m60 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_incl_dm130 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_incl_dm130 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_incl_m60 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_incl_m60 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal efficiency in SRA_H_m60 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_H_m60 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_L_dm130 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_L_dm130 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRB for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRB for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal acceptance in SRC_22 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRC_22 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal efficiency in SRA_H_dm130 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_H_dm130 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_24 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_24 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_26 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_26 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal acceptance in SRA_H_m60 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_H_m60 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal efficiency in SRA_incl_m60 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_incl_m60 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_22 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_22 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal acceptance in SRA_M_m60 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_M_m60 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal efficiency in SRC_28 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_28 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal acceptance in SRA_H_dm130 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal acceptance in SRA_H_dm130 for simplified models with $\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$ production

Signal efficiency in SRA_incl_dm130 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_incl_dm130 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_L_m60 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_L_m60 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_M_dm130 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRA_M_dm130 for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_incl for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Signal efficiency in SRC_incl for simplified models with '$\widetilde{b}\widetilde{b}$ $\rightarrow$ $b\bar{b} \widetilde{\chi}_2^0 \widetilde{\chi}_2^0$ $\rightarrow$ hh$\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$, h $\rightarrow$ $b\bar{b}$' production

Observed 95% CLs exclusion limit for the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid for the best combined signal regions.

Observed 95% CLs exclusion limit for the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid for the best combined signal regions.

Expected 95% CLs exclusion limit for the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid for the best combined signal regions.

Expected 95% CLs exclusion limit for the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid for the best combined signal regions.

Observed 95% CLs exclusion limit for the $M(\widetilde{\chi}_{1}^{0})$=60GeV signal grid for the best combined signal regions.

Observed 95% CLs exclusion limit for the $M(\widetilde{\chi}_{1}^{0})$=60GeV signal grid for the best combined signal regions.

Expected 95% CLs exclusion limit for the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid for the best combined signal regions.

Expected 95% CLs exclusion limit for the $M(\widetilde{\chi}_{1}^{0})$=60GeV signal grid for the best combined signal regions.

Model dependent upper limit on the best combined signal regions considered in the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid

Model dependent upper limit on the best combined signal regions considered in the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid

Model dependet upper limits on the best combined signal regions considered in the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid

Model dependet upper limits on the best combined signal regions considered in the $\Delta M(\widetilde{\chi}_{2}^{0},\widetilde{\chi}_{1}^{0})$=130GeV signal grid

Result of background only fit applied to signal regions. Event yields from the signal regions compared with SM MC predictions for the 3 highest contributing backgrounds separately and combined minor backgrounds.

Result of background only fit applied to signal regions. Event yields from the signal regions compared with SM MC predictions for the 3 highest contributing backgrounds separately and combined minor backgrounds.

Expected background event yields and dominant systematic uncertainties on background estimates in the A-type (inclusive), B-type and C-type (inclusive) regions.

Expected background event yields and dominant systematic uncertainties on background estimates in the A-type (inclusive), B-type and C-type (inclusive) regions.

Background-only fit results for the A- and B-type regions performed using 139$fb^{-1}$ of data. The quoted uncertainties on the fitted SM background include both the statistical and systematic uncertainties.

Background-only fit results for the A- and B-type regions performed using 139$fb^{-1}$ of data. The quoted uncertainties on the fitted SM background include both the statistical and systematic uncertainties.

Background-only fit results for the C-type region performed using 139$fb^{-1}$ of data. The quoted uncertainties on the fitted SM background include both the statistical and systematic uncertainties.

Background-only fit results for the C-type region performed using 139$fb^{-1}$ of data. The quoted uncertainties on the fitted SM background include both the statistical and systematic uncertainties.

Observed 95% CL upper limits on the visible cross sections σvis, the observed (S95obs) and expected (S95exp) 95% CL upper limits on the number of signal events with ± 1 σ excursions of the expectation, the CL of the background-only hypothesis, CLB, the discovery p-value (p0), truncated at 0.5, and the associated significance.

Observed 95% CL upper limits on the visible cross sections σvis, the observed (S95obs) and expected (S95exp) 95% CL upper limits on the number of signal events with ± 1 σ excursions of the expectation, the CL of the background-only hypothesis, CLB, the discovery p-value (p0), truncated at 0.5, and the associated significance.

Cutflow of the MC events scaled to 139 $fb^{-1}$ for the SRA selections, with a scalar bottom signal of m$(\widetilde{b}_{1},\widetilde{\chi}_2^0,\widetilde{\chi}_1^0) = (1100, 330, 200)$ GeV, considered.

Cutflow of the MC events scaled to 139 $fb^{-1}$ for the SRA selections, with a scalar bottom signal of m$(\widetilde{b}_{1},\widetilde{\chi}_2^0,\widetilde{\chi}_1^0) = (1100, 330, 200)$ GeV, considered.

Cutflow of the MC events scaled to 139 $fb^{-1}$ for the SRB selections, with a scalar bottom signal of m$(\widetilde{b}_{1},\widetilde{\chi}_2^0,\widetilde{\chi}_1^0) = (700, 680, 550)$ GeV, considered.

Cutflow of the MC events scaled to 139 $fb^{-1}$ for the SRB selections, with a scalar bottom signal of m$(\widetilde{b}_{1},\widetilde{\chi}_2^0,\widetilde{\chi}_1^0) = (700, 680, 550)$ GeV, considered.

Cutflow of the MC events scaled to 139 $fb^{-1}$ for the SRC selections, with a scalar bottom signal of m$(\widetilde{b}_{1},\widetilde{\chi}_2^0,\widetilde{\chi}_1^0) = (1200, 1150, 60)$ GeV, considered.

Cutflow of the MC events scaled to 139 $fb^{-1}$ for the SRC selections, with a scalar bottom signal of m$(\widetilde{b}_{1},\widetilde{\chi}_2^0,\widetilde{\chi}_1^0) = (1200, 1150, 60)$ GeV, considered.

Expected and observed events in the 16 discovery regions along with the according control regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector R-hadron search.

p0-values and model-independent upper limits on cross-section x acceptance x efficiency for the 16 discovery regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic search for metastable gluino R-hadrons.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector direct-stau search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector chargino search.

Upper cross-section limit in gluino R-hadron search.

Upper cross-section limit in sbottom R-hadron search.

Upper cross-section limit in stop R-hadron search.

Upper cross-section limit in stau search.

Upper cross-section limit in chargino search.

Lower mass limit as function of gluino lifetime.

Acceptance x efficiency, acceptance and efficiency for the full range of simulated masses in the MS-agnostic R-hadron search.

Upper cross-section limit in meta-stable gluino R-hadron search.

Flavor composition of 800 GeV stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

ETmiss trigger efficiency as function of true ETmiss (EtmissTurnOn).

Single-muon trigger efficiency as function of $|\eta|$ and $\beta$ (SingleMuTurnOn).

Candidate reconstruction efficiency for ID+Calo selection (IDCaloEff).

Candidate reconstruction efficiency for loose selection (LooseEff).

Efficiency for a loose candidate to be promoted to a tight candidate (TightPromotionEff).

Resolution and average of reconstructed dE/dx mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for FullDet candidates.

The observed and expected 95% CL upper limits on model-independent visible cross-sections, along with the observed $p0$ values, for the stable signal region, as a function of different mass windows, for which the lower bound is shown. The upper boundary on the mass window is 5 TeV for all windows.

The observed and expected 95% CL upper limits on model-independent visible cross-sections, along with the observed $p0$ values, for the metastable signal region, as a function of different mass windows, for which the lower bound is shown. The upper boundary on the mass window is 5 TeV for all windows.

For each gluino lifetime and mass in the signal samples, the lower boundary of the mass window in which at least $70\%$ of the reconstructed signal appears. The upper boundary for all mass windows is 5 TeV.

Acceptance and efficiency for a representative set of pair-produced gluino signal samples. The mass of the gluino ($m(\tilde{g})$), its lifetime ($\tau(\tilde{g})$) and the mass of the neutralino ($m(\tilde{\chi}^{0})$) are given in the first three columns. The Pythia 6.4.27 signal samples shown in this table are not reweighted to match the transverse momentum of the gluino-gluino system as simulated by MadGraph5_aMC@NLO. The acceptance is defined as the fraction of events passing a loose set of fiducial requirements. The full simulation efficiency (Full sim. $\epsilon$) is defined as the ratio of the number of reconstructed events, as expected by the full ATLAS simulation, and the number of events passing the fiducial requirements. The parameterised simulation efficiency (Param. sim. $\epsilon$) is defined as the ratio of the number of events estimated using a set of parametrised efficiencies (see auxiliary Figures 9,10,11,12) and the number of events passing the fiducial requirements alone.

The reconstructed candidate track mass distributions for observed data, predicted background, and the expected contribution from two signal models in the metastable R-hadron signal region. The yellow band around the background estimation includes both the statistical and systematic uncertainties.

The reconstructed candidate track mass distributions for observed data, predicted background, and the expected contribution from two signal models in the stable R-hadron signal region. The yellow band around the background estimation includes both the statistical and systematic uncertainties.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 10$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for stable gluino $R$-hadrons, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

Observed 95% lower limits on the gluino mass in the gluino lifetime--mass plane. The excluded area is to the left of the curves.

Expected 95% lower limits on the gluino mass in the gluino lifetime--mass plane. The excluded area is to the left of the curves.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 1$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 3$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 30$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 50$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The relationship between generated and reconstructed mass for gluino $R$-hadrons. Above 1500 GeV, the reconstructed mass falls below the generated mass due to bias in the reconstructed momentum. The uncertainty on the reconstructed mass is dominated by momentum uncertainty. The black dots represent the reconstructed mass computed as the most probable value of a Gaussian fit function, with the error bars showing its statistical uncertainty, while the orange band is the full-width at half maximum of the reconstructed mass distribution.

The parameterised efficiency for events to pass metastable event selections (including trigger, E$_{T}^{miss}$, and event cleaning requirements) as a function of the true E$_{T}^{miss}$ in the system, which is calculated at generator level. Event-level efficiencies are evaluated for events which have at least true E$_{T}^{miss} > 50$ GeV. The metastable event efficiencies are evaluated for different radial regions depending on the smallest radial distance, R, at which an R-hadron decays in the detector.

The parameterised efficiency for events to pass metastable event selections (including trigger, E$_{T}^{miss}$, and event cleaning requirements) as a function of the true E$_{T}^{miss}$ in the system, which is calculated at generator level. Event-level efficiencies are evaluated for events which have at least true E$_{T}^{miss} > 50$ GeV. The stable event efficiencies are evaluated for samples in which no R-hadron decays within the detector.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$. The stable efficiency is evaluated for samples which do not decay within the detector. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

Observed and expected dilepton mass distributions, with the bin boundaries considered for the interpretation, in SRC of the low-pT edge search. All statistical and systematic uncertainties of the expected background are included in the hatched band. An example signal from the $Z^{*}$ model with m(gluino) = 1000 GeV and m(neutralino1) = 900 GeV is overlaid.

Observed and expected dilepton mass distributions, with the bin boundaries considered for the interpretation, in SRC-MET of the low-pT edge search. All statistical and systematic uncertainties of the expected background are included in the hatched band. An example signal from the $Z^{*}$ model with m(gluino) = 1000 GeV and m(neutralino1) = 900 GeV is overlaid.

Observed 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Expected 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Observed 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Expected 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Observed 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Expected 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Observed 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Expected 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the gluino and next-to-lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the gluino and next-to-lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the squark and next-to-lightest neutralino masses in a SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the squark and next-to-lightest neutralino masses in a SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and the lightest neutralino.

Acceptance and efficiency in the on-Z bin for SR-medium for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Acceptance and efficiency in the on-Z bin for SR-high for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-low for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-medium for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-high for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SRC for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SRC-MET for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the signal regions, in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the low-p$_{T}$ signal regions, in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the signal regions, in a SUSYscenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the low-p$_{T}$ signal regions, in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson.

Cutflow table for three benchmark signal points from the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, with m(gluino) = 1395 GeV and m(neutralino2) = 505 GeV, m(gluino) = 920 GeV and m(neutralino2) = 230 GeV and m(gluino) = 940 GeV and m(neutralino2) = 660 GeV, in the on-$Z$ $m_{ll}$ bins of SR-medium and SR-high for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow table for a signal point from the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, with m(gluino) = 1000 GeV and m(neutralino1) = 800 GeV, m(gluino) = 1200 GeV and m(neutralino1) = 500 GeV and m(gluino) = 1400 GeV and m(neutralino1) = 100 GeV, in all m_{ll}$ bins of SR-low, SR-medium and SR-high for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow table for a signal point from the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, with m(gluino) = 600 GeV and m(neutralino1) = 560 GeV and m(gluino) = 1000 GeV and m(neutralino1) = 960 GeV, in all $m_{ll}$ bins of SRC and SRC-MET for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, corresponding to the SR determined to give the best expected limit for a given signal point.

Low-$p_{T}$ signal region used to derive the exclusion limit in the compressed region for the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Low-$p_{T}$ signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Acceptance for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Distribution of the missing transverse momentum $E_{\mathrm{T}}^{\mathrm{miss}}$ for the sample satisfying all requirements of the $\mathrm{SR}^{\gamma\gamma}_{W-L}$ selection except the $E_{\mathrm{T}}^{\mathrm{miss}}$ requirement itself. Overlaid are the expected SM backgrounds, separated into the various contributing sources. Also shown are the signal expectations for the ($m_{\tilde{W}}$, $m_{\tilde{\chi}^{0}_{1}}$) = (1000,100) GeV and ($m_{\tilde{W}}$, $m_{\tilde{\chi}^{0}_{1}}$) = (1000,800) GeV models. The vertical dashed lines and right-pointing arrows show the region of the $E_{\mathrm{T}}^{\mathrm{miss}}$ observable selected for inclusion in $\mathrm{SR}^{\gamma\gamma}_{W-L}$ and $\mathrm{SR}^{\gamma\gamma}_{W-H}$. The lower panels show the ratio of observed data to the combined SM expectation. For these plots, the band represents the range of combined statistical and systematic uncertainty in the SM expectation. Events outside the range of the displayed region are included in the highest-value bin.

Distribution of the missing transverse momentum $E_{\mathrm{T}}^{\mathrm{miss}}$ for the sample satisfying all requirements of the $\mathrm{SR}^{\gamma\gamma}_{W-H}$ selection except the $E_{\mathrm{T}}^{\mathrm{miss}}$ requirement itself. Overlaid are the expected SM backgrounds, separated into the various contributing sources. Also shown are the signal expectations for the ($m_{\tilde{W}}$, $m_{\tilde{\chi}^{0}_{1}}$) = (1000,100) GeV and ($m_{\tilde{W}}$, $m_{\tilde{\chi}^{0}_{1}}$) = (1000,800) GeV models. The vertical dashed lines and right-pointing arrows show the region of the $E_{\mathrm{T}}^{\mathrm{miss}}$ observable selected for inclusion in $\mathrm{SR}^{\gamma\gamma}_{W-L}$ and $\mathrm{SR}^{\gamma\gamma}_{W-H}$. The lower panels show the ratio of observed data to the combined SM expectation. For these plots, the band represents the range of combined statistical and systematic uncertainty in the SM expectation. Events outside the range of the displayed region are included in the highest-value bin.

Comparisons between expected and observed content of the validation and signal regions for the photon+jets analysis. The uncertainties in the expected numbers of events are the combined statistical and systematic uncertainties. The lower panel shows the pull (difference between observed and expected event counts normalized by the uncertainty) for each region.

Distribution of the missing transverse momentum $E_{\mathrm{T}}^{\mathrm{miss}}$ for the sample satisfying all requirements of the $\mathrm{SR}^{\gamma j}_{H}$ selection except the $E_{\mathrm{T}}^{\mathrm{miss}}$ requirement itself. Overlaid are the expected SM backgrounds, separated into the various contributing sources. Also shown are the signal expectations for points in the $m_{\tilde{g}}-m_{\tilde{\chi}^{0}_{1}}$ parameter space of the GGM model relevant to the photon+jets analysis (mass values in GeV). The value of the gluino mass arises from the choice $M_{3}$ = 1900 GeV. The $\tilde{\chi}^{0}_{1}$ mass values of 1868, 1920, 442 and 652 GeV arise from the choices $\mu$ = 1810, 1868, 400 and 600 GeV, respectively, combined with the constraint that the branching fraction of $\tilde{\chi}^{0}_{1}$ $\to \gamma \tilde{G}$ be 50%. The vertical dashed lines and right-pointing arrows show the region of the $E_{\mathrm{T}}^{\mathrm{miss}}$ observable selected for inclusion in $\mathrm{SR}^{\gamma j}_{H}$ and $\mathrm{SR}^{\gamma j}_{L}$ for $\mathrm{SR}^{\gamma j}_{L200}$, the $E_{\mathrm{T}}^{\mathrm{miss}}$ requirement is 200 GeV rather than 300 GeV. The lower panels show the ratio of observed data to the combined SM expectation. For these plots, the band represents the range of statistical uncertainty in the SM expectation. Events outside the range of the displayed region are included in the highest-value bin.

Distribution of the missing transverse momentum $E_{\mathrm{T}}^{\mathrm{miss}}$ for the sample satisfying all requirements of the $\mathrm{SR}^{\gamma j}_{L}$ or $\mathrm{SR}^{\gamma j}_{L200}$ selection except the $E_{\mathrm{T}}^{\mathrm{miss}}$ requirement itself. Overlaid are the expected SM backgrounds, separated into the various contributing sources. Also shown are the signal expectations for points in the $m_{\tilde{g}}-m_{\tilde{\chi}^{0}_{1}}$ parameter space of the GGM model relevant to the photon+jets analysis (mass values in GeV). The value of the gluino mass arises from the choice $M_{3}$ = 1900 GeV. The $\tilde{\chi}^{0}_{1}$ mass values of 1868, 1920, 442 and 652 GeV arise from the choices $\mu$ = 1810, 1868, 400 and 600 GeV, respectively, combined with the constraint that the branching fraction of $\tilde{\chi}^{0}_{1} \to \gamma \tilde{G}$ be 50%. The vertical dashed lines and right-pointing arrows show the region of the $E_{\mathrm{T}}^{\mathrm{miss}}$ observable selected for inclusion in $\mathrm{SR}^{\gamma j}_{H}$ and $\mathrm{SR}^{\gamma j}_{L}$ for $\mathrm{SR}^{\gamma j}_{L200}$, the $E_{\mathrm{T}}^{\mathrm{miss}}$ requirement is 200 GeV rather than 300 GeV. The lower panels show the ratio of observed data to the combined SM expectation. For these plots, the band represents the range of statistical uncertainty in the SM expectation. Events outside the range of the displayed region are included in the highest-value bin.

Expected exclusion limits in the gluino-bino mass plane, using the $\mathrm{SR}^{\gamma\gamma}_{S-H}$ analysis for $m_{\tilde{\chi}^{0}_{1}} > 1600$ GeV and the $\mathrm{SR}^{\gamma\gamma}_{S-L}$ analysis for $m_{\tilde{\chi}^{0}_{1}} < 1600$ GeV.

Observed exclusion limits in the gluino--bino mass plane, using the $\mathrm{SR}^{\gamma\gamma}_{S-H}$ analysis for $m_{\tilde{\chi}^{0}_{1}} > 1600$ GeV and the $\mathrm{SR}^{\gamma\gamma}_{S-L}$ analysis for $m_{\tilde{\chi}^{0}_{1}} < 1600$ GeV.

Expected exclusion limit in the squark-bino mass plane, using the $\mathrm{SR}^{\gamma\gamma}_{S-H}$ analysis for $m_{\tilde{\chi}^{0}_{1}} > 900$ GeV and the $\mathrm{SR}^{\gamma\gamma}_{S-L}$ analysis for $m_{\tilde{\chi}^{0}_{1}} < 900$ GeV.

Observed exclusion limit in the squark--bino mass plane, using the $\mathrm{SR}^{\gamma\gamma}_{S-H}$ analysis for $m_{\tilde{\chi}^{0}_{1}} > 900$ GeV and the $\mathrm{SR}^{\gamma\gamma}_{S-L}$ analysis for $m_{\tilde{\chi}^{0}_{1}} < 900$ GeV.

Expected exclusion limit in the wino-bino mass plane, using the $\mathrm{SR}^{\gamma\gamma}_{W-H}$ analysis for $m_{\tilde{\chi}^{0}_{1}} > 400$ GeV and the $\mathrm{SR}^{\gamma\gamma}_{W-L}$ analysis for $m_{\tilde{\chi}^{0}_{1}}$ < 400$ GeV.

Observed exclusion limit in the wino-bino mass plane, using the $\mathrm{SR}^{\gamma\gamma}_{W-H}$ analysis for $m_{\tilde{\chi}^{0}_{1}} > 400$ GeV and the $\mathrm{SR}^{\gamma\gamma}_{W-L}$ analysis for $m_{\tilde{\chi}^{0}_{1}}$ < 400$ GeV.

Expected exclusion limits for the $\mu > 0$ higgsino-bino GGM model explored by the photon+jets analysis.

Observed exclusion limits for the $\mu > 0$ higgsino-bino GGM model explored by the photon+jets analysis.

Distribution of the transverse momentum $p_{\mathrm{T}} (\ell\gamma\gamma)$ of events in the $\ell\gamma\gamma$ control region (except without a cut on $p_{\mathrm{T}} (\ell\gamma\gamma)$). Also shown is the expected contribution from various SM sources, including $W(\to\ell\nu) + \gamma\gamma$ production itself. The displayed uncertainties are a combination of those from all SM sources except $W(\to\ell\nu) + \gamma\gamma$ production, and include statistical and systematic uncertainties.

Distribution of $E_{\mathrm{T}}^{\mathrm{miss}}$ for diphoton events in a validation region defined by a requirement of $H_{\mathrm{T}} > 1750$ GeV. Also shown is the expected contribution from various SM sources, as well as their combined statistical and systematic uncertainties.

Distribution of $H_{\mathrm{T}}$ for diphoton events in a validation region defined by requirement of $E_{\mathrm{T}}^{\mathrm{miss}} > 100$ GeV. Also shown is the expected contribution from various SM sources, as well as their combined statistical and systematic uncertainties.

Distribution of $m_{\mathrm{eff}}$ for events satisfying all requirements $\mathrm{SR}^{\gamma j}_{H}$ save the $m_{\mathrm{eff}}$ requirement itself. Also shown is the expected contribution from various SM sources, and their combined statistical uncertainties.

Distribution of $m_{\mathrm{eff}}$ for events satisfying all requirements $\mathrm{SR}^{\gamma j}_{L}$ save the $m_{\mathrm{eff}}$ requirement itself. Also shown is the expected contribution from various SM sources, and their combined statistical uncertainties.

Derived exclusion limits for the gluino-bino GGM model explored by the diphoton analysis. For each point in the gluino-bino parameter space, the SR ($\mathrm{SR}^{\gamma\gamma}_{S-L}$ or $\mathrm{SR}^{\gamma\gamma}_{S-H}$) that provides the best expected sensitivity is used to estimate the exclusion likelihood. The model dependent upper limits on cross-section (fb) are shown by grey numbers for each signal point.

Derived exclusion limits for the squark-bino GGM model explored by the diphoton analysis. For each point in the squark-bino parameter space, the SR ($\mathrm{SR}^{\gamma\gamma}_{S-L}$ or $\mathrm{SR}^{\gamma\gamma}_{S-H}$) that provides the best expected sensitivity is used to estimate the exclusion likelihood. The model dependent upper limits on cross-section (fb) are shown by grey numbers for each signal point.

Derived exclusion limits for the wino-bino GGM model explored by the diphoton analysis. For each point in the wino-bino parameter space, the SR ($\mathrm{SR}^{\gamma\gamma}_{W-L}$ or $\mathrm{SR}^{\gamma\gamma}_{W-H}$) that provides the best expected sensitivity is used to estimate the exclusion likelihood. The model dependent upper limits on cross-section (fb) are shown by grey numbers for each signal point.

Derived exclusion limits for the $\mu > 0$ higgsino-bino GGM model explored by the photon+jets analysis. For each point in the higgsino-bino parameter space, the SR ($\mathrm{SR}^{\gamma j}_{L}$ or $\mathrm{SR}^{\gamma j}_{H}$) that provides the best expected sensitivity is used to estimate the exclusion likelihood. The model dependent upper limits on cross-section (fb) are shown by grey numbers for each signal point.

Derived exclusion limits for the gluino-bino GGM model explored by the diphoton analysis. For each point in the gluino-bino parameter space, the SR ($\mathrm{SR}^{\gamma\gamma}_{S-L}$ or $\mathrm{SR}^{\gamma\gamma}_{S-H}$) that provides the best expected sensitivity is used to estimate the exclusion likelihood. The labels indicate the best-expected signal region for each point, where SL and SH mean $\mathrm{SR}^{\gamma\gamma}_{S-L}$ and $\mathrm{SR}^{\gamma\gamma}_{S-H}$, respectively.

Derived exclusion limits for the squark-bino GGM model explored by the diphoton analysis. For each point in the squark-bino parameter space, the SR ($\mathrm{SR}^{\gamma\gamma}_{S-L}$ or $\mathrm{SR}^{\gamma\gamma}_{S-H}$) that provides the best expected sensitivity is used to estimate the exclusion likelihood. The labels indicate the best-expected signal region for each point, where SL and SH mean $\mathrm{SR}^{\gamma\gamma}_{S-L}$ and $\mathrm{SR}^{\gamma\gamma}_{S-H}$, respectively.

Derived exclusion limits for the wino--bino GGM model explored by the diphoton analysis. For each point in the wino-bino parameter space, the SR ($\mathrm{SR}^{\gamma\gamma}_{W-L}$ or $\mathrm{SR}^{\gamma\gamma}_{W-H}$) that provides the best expected sensitivity is used to estimate the exclusion likelihood. The labels indicate the best-expected signal region for each point, where WL and WH mean $\mathrm{SR}^{\gamma\gamma}_{W-L}$ and $\mathrm{SR}^{\gamma\gamma}_{W-H}$, respectively.

Derived exclusion limits for the $\mu > 0$ higgsino-bino GGM model explored by the photon+jets analysis. For each point in the higgsino-bino parameter space, the SR ($\mathrm{SR}^{\gamma j}_{L}$ or $\mathrm{SR}^{\gamma j}_{H}$) that provides the best expected sensitivity is used to estimate the exclusion likelihood. The labels indicate the best-expected signal region for each point, where L and H mean $\mathrm{SR}^{\gamma j}_{L}$ and $\mathrm{SR}^{\gamma j}_{H}$, respectively.

Acceptance and efficiency for $\mathrm{SR}^{\gamma\gamma}_{S-L}$ for the signal models of the gluino-bino GGM grid.

Acceptance and efficiency for $\mathrm{SR}^{\gamma\gamma}_{S-H}$ for the signal models of the gluino-bino GGM grid.

Acceptance and efficiency for $\mathrm{SR}^{\gamma\gamma}_{S-L}$ for the signal models of the squark-bino GGM grid.

Acceptance and efficiency for $\mathrm{SR}^{\gamma\gamma}_{S-H}$ for the signal models of the squark-bino GGM grid.

Acceptance and efficiency for $\mathrm{SR}^{\gamma\gamma}_{W-L}$ for the signal models of the wino-bino GGM grid.

Acceptance and efficiency for $\mathrm{SR}^{\gamma\gamma}_{W-H}$ for the signal models of the wino-bino GGM grid.

Acceptance and efficiency for $\mathrm{SR}^{\gamma j}_{L}$ for the signal models of the photon+jets GGM grid.

Acceptance and efficiency for $\mathrm{SR}^{\gamma j}_{H}$ for the signal models of the photon+jets GGM grid.

Cutflow for the $\mathrm{SR}^{\gamma\gamma}_{S-L}$ selection for one relevant signal point in the gluino-bino model, where the gluinos have mass of 1900 GeV and the $\tilde{\chi}^{0}_{1}$ has a mass of 300 GeV (10000 generated events). The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow for the $\mathrm{SR}^{\gamma\gamma}_{S-H}$ selection for one relevant signal point in the gluino-bino model, where the gluinos have mass of 1900 GeV and the $\tilde{\chi}^{0}_{1}$ has a mass of 1700 GeV (10000 generated events). The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow for the $\mathrm{SR}^{\gamma\gamma}_{S-L}$ selection for one relevant signal point in the squark-bino model, where the squarks have mass of 1700 GeV and the $\tilde{\chi}^{0}_{1}$ has a mass of 200 GeV (10000 generated events). The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow for the $\mathrm{SR}^{\gamma\gamma}_{S-H}$ selection for one relevant signal point in the squark-bino model, where the squarks have mass of 1700 GeV and the $\tilde{\chi}^{0}_{1}$ has a mass of 1600 GeV (10000 generated events). The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow for the $\mathrm{SR}^{\gamma\gamma}_{W-L}$ selection for one relevant signal point in the wino-bino model, where the winos have mass of 1000 GeV and the $\tilde{\chi}^{0}_{1}$ has a mass of 200 GeV (10000 generated events). The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow for the $\mathrm{SR}^{\gamma\gamma}_{W-H}$ selection for one relevant signal point in the wino-bino model, where the winos have mass of 1000 GeV and the $\tilde{\chi}^{0}_{1}$ has a mass of 800 GeV (10000 generated events). The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow for the $\mathrm{SR}^{\gamma j}_{L}$ selection, for two relevant signal points in the higgsino-bino model, where the gluinos have mass of 1974 GeV and the $\tilde{\chi}^{0}_{1}$ has a mass of 442 GeV (10000 generated events), and 652 GeV (10000 generated events). The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow for the $\mathrm{SR}^{\gamma j}_{H}$ selection, for two relevant signal points in the higgsino-bino model, where the gluinos have mass of 1974 GeV and the $\tilde{\chi}^{0}_{1}$ has a mass of 1868 GeV (10000 generated events), and 1920 GeV (10000 generated events). The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.