Impact of different components of systematic uncertainty on the measured fiducial cross section, without taking into account correlations. The impact of one source of systematic uncertainty is computed by first performing the fit with the corresponding nuisance parameter fixed to one standard deviation up or down from the value obtained in the nominal fit, then these up and down variations are symmetrized. The impacts of several sources of systematic uncertainty are added in quadrature for each component. The categorization of sources of systematic uncertainties into experimental and theory modeling correspond to those used for the measured fiducial cross section.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dijet invariant mass, $m_{jj}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dilepton invariant mass, $m_{ll}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Upper limits on $\sigma\times B$ as a function of $m_{e^*}$ in the $e\nu J$ channel. The $\pm 1(2)\sigma$ uncertainty bands around the expected limit represent all sources of systematic and statistical uncertainties.

Lower limits on $\Lambda$ as a function of $m_{e^*}$ for the $eejj$ channel. The $\pm\ 1(2)\sigma$ uncertainty bands around the expected limit represent all sources of systematic and statistical uncertainties. The limits for $m_{e^*}\gt4$ TeV are the result of extrapolation.

Lower limits on $\Lambda$ as a function of $m_{e^*}$ for the $e\nu J$ channel. The $\pm\ 1(2)\sigma$ uncertainty bands around the expected limit represent all sources of systematic and statistical uncertainties.

Lower limits on $\Lambda$ as a function of $m_{e^*}$ combined for the $eejj$ and the $e\nu J$ channels. The $\pm\ 1(2)\sigma$ uncertainty bands around the expected limit represent all sources of systematic and statistical uncertainties. The limits for $m_{e^*}\gt4$ TeV are the result of extrapolation.

The nuclear modification factor R_pPb for prompt, isolated photons with rapidity in (1.09,1.90).

The nuclear modification factor R_pPb for prompt, isolated photons with rapidity in (−1.84,0.91).

The nuclear modification factor R_pPb for prompt, isolated photons with rapidity in (−2.83,−2.02).

The ratio of R_{pPb} from rapidity (1.09,1.90) to that of rapidity (−2.83,−2.02).

Observed top-quark mass distribution and expected background in Region A after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region B after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region C after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region D after the fit (Post-Fit) under the background-only hypothesis for the resolved analysis.

Observed top-quark mass distribution and expected background in Region SR1 Medium 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Medium 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Tight 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR1 Tight 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Medium 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Medium 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Tight 1b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Observed top-quark mass distribution and expected background in Region SR2 Tight 2b after the fit (Post-Fit) under the background-only hypothesis for the boosted analysis.

Expected and observed upper limits on the cross-section times branching fraction of topcolor-assisted-technicolor Z$^{\prime}_{TC2}$ decaying into top-quark pair as a function of the Z$^{\prime}_{TC2}$ mass.

Expected and observed upper limits on the cross-section times branching fraction of A1 axial-vector mediator decaying into top-quark pair as a function of the mediator mass.

Expected and observed upper limits on the cross-section times branching fraction of V1 vector mediator decaying into top-quark pair as a function of the mediator mass.

Expected and observed upper limits on the cross-section times branching fraction of Kaluza-Klein graviton decaying into top-quark pair as a function of the graviton mass.

Expected and observed upper limits on the cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the gluon mass.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 0.5 TeV.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 1 TeV.

Expected and observed upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 1.5 TeV.

Expected upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 2 TeV.

Expected upper limits on cross-section times branching fraction of Kaluza-Klein gluon decaying into top-quark pair as a function of the width of Kaluza-Klein gluon for masses of 5 TeV.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Measured fiducial cross section for a single leptonic decay channel $\ell'^\pm \nu \ell^+ \ell'^-$ of the $W The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds and pileup. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded cross section.

Measured fiducial cross section for a single leptonic decay channel $\ell'^\pm \nu \ell^+ \ell'^-$ of the $W The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds and pileup. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded cross section.

Measured fiducial cross section for a single leptonic decay channel $\ell'^\pm \nu \ell^+ \ell'^-$ of the $W The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds and pileup. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded cross section.

Measured fiducial cross section for a single leptonic decay channel $\ell'^\pm \nu \ell^+ \ell'^-$ of the $W The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds and pileup. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded cross section.

Measured fiducial cross section for a single leptonic decay channel $\ell'^\pm \nu \ell^+ \ell'^-$ of the $W The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds and pileup. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded cross section.

Measured fiducial cross section for a single leptonic decay channel $\ell'^\pm \nu \ell^+ \ell'^-$ of the $W The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds and pileup. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded cross section.

Measured fiducial cross section for a single leptonic decay channel $\ell'^\pm \nu \ell^+ \ell'^-$ of the $W The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds and pileup. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded cross section.

Measured fiducial cross section for a single leptonic decay channel $\ell'^\pm \nu \ell^+ \ell'^-$ of the $W The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds and pileup. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded cross section.

5: Measured helicity fractions in the fiducial phase space with Born level leptons, for $W^-$, $W^+Z$ and $W^{\pm}Z$ events. The total uncertainties on the measurements are reported.

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 50$< p_{T}^{4l} <$100 GeV

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 100$< p_{T}^{4l} <$600 GeV

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.0$< y_{4l} <$0.4

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.4$< y_{4l} <$0.8

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.8$< y_{4l} <$1.2

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 1.2$< y_{4l} <$2.5

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$<$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$>$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $\mu\mu\mu\mu$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $eeee$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $ee\mu\mu$ events

Systematic covariance matrix for the differential $m_{4l}$ distribution.

Statistical covariance matrix for the differential $m_{4l}$ distribution.

Background covariance matrix for the differential $m_{4l}$ distribution.

Systematic covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution.<br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Statistical covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Background covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Systematic covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Statistical covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Background covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Systematic covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Statistical covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Background covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Systematic covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Statistical covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Background covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Lower mass requirement for signal regions.

Lower mass requirement for signal regions.

Lower mass requirement for signal regions.

Expected and observed events in the 16 discovery regions along with the according control regions.

Expected and observed events in the 16 discovery regions along with the according control regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector R-hadron search.

p0-values and model-independent upper limits on cross-section x acceptance x efficiency for the 16 discovery regions.

p0-values and model-independent upper limits on cross-section x acceptance x efficiency for the 16 discovery regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic search for metastable gluino R-hadrons.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic search for metastable gluino R-hadrons.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector direct-stau search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector direct-stau search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector chargino search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector chargino search.

Upper cross-section limit in gluino R-hadron search.

Upper cross-section limit in gluino R-hadron search.

Upper cross-section limit in sbottom R-hadron search.

Upper cross-section limit in sbottom R-hadron search.

Upper cross-section limit in stop R-hadron search.

Upper cross-section limit in stop R-hadron search.

Upper cross-section limit in stau search.

Upper cross-section limit in stau search.

Upper cross-section limit in chargino search.

Upper cross-section limit in chargino search.

Lower mass limit as function of gluino lifetime.

Lower mass limit as function of gluino lifetime.

Acceptance x efficiency, acceptance and efficiency for the full range of simulated masses in the MS-agnostic R-hadron search.

Acceptance x efficiency, acceptance and efficiency for the full range of simulated masses in the MS-agnostic R-hadron search.

Upper cross-section limit in meta-stable gluino R-hadron search.

Upper cross-section limit in meta-stable gluino R-hadron search.

Flavor composition of 800 GeV stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

ETmiss trigger efficiency as function of true ETmiss (EtmissTurnOn).

ETmiss trigger efficiency as function of true ETmiss (EtmissTurnOn).

Single-muon trigger efficiency as function of $|\eta|$ and $\beta$ (SingleMuTurnOn).

Single-muon trigger efficiency as function of $|\eta|$ and $\beta$ (SingleMuTurnOn).

Candidate reconstruction efficiency for ID+Calo selection (IDCaloEff).

Candidate reconstruction efficiency for ID+Calo selection (IDCaloEff).

Candidate reconstruction efficiency for loose selection (LooseEff).

Candidate reconstruction efficiency for loose selection (LooseEff).

Efficiency for a loose candidate to be promoted to a tight candidate (TightPromotionEff).

Efficiency for a loose candidate to be promoted to a tight candidate (TightPromotionEff).

Resolution and average of reconstructed dE/dx mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed dE/dx mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for FullDet candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for FullDet candidates.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{ee}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{\mu\mu}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{e\mu}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{ee}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{\mu\mu}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{e\mu}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $ee jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Expected and observed 95% CL lower limits on first- and second-generation leptoquark masses for different values of $\beta$.

Event yields in the dimuon channel control regions with total uncertainties. The observed number of events is given in the first row. The background event numbers as obtained from the fit are shown together with the total uncertainties. The second row shows the total background expectation, the further rows show the breakdown into different background components.

Event yields in the dielectron channel control regions with total uncertainties. The observed number of events is given in the first row. The background event numbers as obtained from the fit are shown together with the total uncertainties. The second row shows the total background expectation, the further rows show the breakdown into different background components.

Distribution of $m_{LQ}^{min}$ in the training region for the BDT for the $ee jj$ and $\mu\mu jj$ channels. Data are shown together with predicted total background expectation.

Distribution of $m_{LQ}^{T}$ in the training region for the BDT for the $e\nu jj$ and $\mu\nu jj$ channels. Data are shown together with predicted total background expectation.

Ratio of unfolded width of azimuthal angular correlation distributions (P PB/ P P). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Ratio of unfolded Dijet conditional yields (P PB/ P P). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Unfolded width of azimuthal angular correlation distributions (Delta p_{T} > 3). Full markers represent p+Pb, open markers p+p

Unfolded Dijet conditional yields (Delta p_{T} > 3). Full markers represent p+Pb, open markers p+p

Ratio of unfolded width of azimuthal angular correlation distributions (P PB/ P P) (Delta p_{T} > 3). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Ratio of unfolded Dijet conditional yields (P PB/ P P) (Delta p_{T} > 3). Different colors correspond to different combinations of p_{T,1} and p_{T,2}

Unfolded azimuthal angular correlation distributions. Black markers represent p+Pb, red markers p+p

Unfolded azimuthal angular correlation distributions (Delta p_{T} > 3). Black markers represent p+Pb, red markers p+p

The 95% CL upper limits of the cross section times branching fraction of $\Phi \to \mu^+\mu^-$ for b-associated production

The observed/expected 95% CL upper limits of the cross section times branching fraction of $\Phi \to \mu^+\mu^-$ as a function of $\Phi$ mass and the cross section fraction of the b-associated production.

Signal acceptance for different masses in bTag and bVeto signal regions.