Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{-}_{L}$

Impact of groups of uncertainties on charge asymmetry versus $|y_{W}|$ for $W_{L}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}_{L}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{-}_{R}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}_{L}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{-}_{L}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{-}_{R}$

Impact of groups of uncertainties on charge asymmetry versus $|y_{W}|$ for $W_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on unpolarized charge asymmetry versus $|y_{W}|$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on $A_{4}$ coefficient versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on $A_{4}$ coefficient versus $|y_{W}|$ for $W^{+}$

Correlation matrix among normalized signal cross sections in the helicity fit, for combination of muon and electron channel. The cross sections are shown in Fig. 9 in paper

Correlation matrix among normalized signal cross sections in the helicity fit, for combination of muon and electron channel. The cross sections are shown in Fig. 9 in paper

Correlation matrix among PDF nuisances parameters in the helicity fit with fixed signal cross sections, for combination of muon and electron channel. The postfit values for these nuisance parameters are shown in Fig. 20 in paper

Postfit pulls and constraints for some nuisance parameters: $p_T^{W}$ binned $\mu_R$, $\mu_F$, $\mu_R\mu_F$ for $W_R$

Postfit pulls and constraints for some nuisance parameters: $p_T^{W}$ binned $\mu_R$, $\mu_F$, $\mu_R\mu_F$ for $W_L$

Postfit pulls and constraints for some nuisance parameters: PDFs and $\alpha_S$

Postfit pulls and constraints for all nuisance parameters in the W boson helicity fit with fixed signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Postfit pulls and constraints for all nuisance parameters in the W boson helicity fit with floating signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured fiducial cross sections and ratio from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Impact of groups of uncertainties on charge asymmetry versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on charge asymmetry versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Postfit pulls and constraints for all nuisance parameters in the W boson double-differential cross section fit with floating signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Cross section using conversion method and an isolation cut of 15 pct of thephoton PT in a cone around the photon. There is an additional +42,-61 pct syste matic uncertainty in addition to the PT dependent systematic errors shown in thetable.

Minimum Bias Trigger.

High ET threshold trigger.

Minimum bias trigger.

High ET threshold trigger.

Medium ET threshold trigger.