Summary of the measured values of $ d\sigma / d{m}$ (pb/GeV) in the dielectron channel with the statistical ($\delta_{\text{stat}}$), experimental ($\delta_{\text{exp}}$) and theoretical ($\delta_{\text{theo}}$) uncertainties, respectively. Here, $\delta_{\text{tot}}$ is the quadratic sum of the three components.

Summary of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dimuon channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dielectron channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

Summary of the combined values of $ d\sigma / d{m}$ (pb/GeV) using the results from both the dimuon and dielectron channels. Here, $\delta_{\text{tot}}$ is the quadratic sum of the statistical, experimental and theoretical uncertainties.

Covariance matrix of the Drell-Yan differential cross section as a function of the dimuon invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the Drell-Yan differential cross section as a function of the dielectron invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the differential DY cross section measured for the combination of the two channels in the full phase space.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

Measured fiducial cross section in all $\ell^+\ell^-\ell'^+\ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Cross section extrapolated to total phase space and all Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Detector response matrix (PROB) for the acoplanarity variable (ACO) for mu+ mu- channel (empty bins are not reported).

Acoplanarity (ACO) distributions unfolded for detector resolution, and lepton pair trigger, reconstruction and identification efficiencies for e+ e- channel (empty bins are not reported).

Acoplanarity (ACO) distributions unfolded for detector resolution, and lepton pair trigger, reconstruction and identification efficiencies for mu+ mu- channel (empty bins are not reported).

The lepton pair exclusive selection efficiency in the fiducial region for signal MC events as a function of M and Y for e+ e- channel.

The lepton pair exclusive selection efficiency in the fiducial region for signal MC events as a function of M and Y for mu+ mu- channel.

The lepton pair exclusive selection efficiency in the fiducial region for single-dissociative MC events as a function of M and Y for e+ e- channel.

The lepton pair exclusive selection efficiency in the fiducial region for single-dissociative MC events as a function of M and Y for mu+ mu- channel.

The expected invariant mass distribution of signal Z'@0.75TeV and $\tilde{\nu}_{\tau}$@1TeV. The arbitrary choice of couplings are: $\lambda_{311}^{'}=0.11$ and $\lambda_{i3k}=0.07$ for $\tilde{\nu}_{\tau}$, $Q_{ll^{'}}=1$ for Z' .

Observed and predicted $\mu\tau$ invariant mass distributions.

The expected invariant mass distribution of signal Z'@0.75TeV and $\tilde{\nu}_{\tau}$@1TeV. The arbitrary choice of couplings are: $\lambda_{311}^{'}=0.11$ and $\lambda_{i3k}=0.07$ for $\tilde{\nu}_{\tau}$, $Q_{ll^{'}}=1$ for Z' .

Expected cross section times branching ratio as a function of $\tilde{\nu}_{\tau}$ mass in the $e\mu$ channel for the arbitrary choice of couplings $\lambda_{311}^{'}=0.11$ and $\lambda_{i3k}=0.07$.

The 95% CL limits on cross section times branching ratio as a function of $\tilde{\nu}_{\tau}$ mass in the $e\mu$ channel.

Expected cross section times branching ratio as a function of Z' mass in the $e\mu$ channel for the arbitrary choice of couplings $Q_{ll^{'}}=1$.

The 95% CL limits on cross section times branching ratio as a function of Z' mass in the $e\mu$ channel.

The 95% CL limits on cross section times branching ratio as a function of $\tilde{\nu}_{\tau}$ mass in the $e\tau$ channel.

The 95% CL limits on cross section times branching ratio as a function of Z' mass in the $e\tau$ channel.

The 95% CL limits on cross section times branching ratio as a function of $\tilde{\nu}_{\tau}$ mass in the $\mu\tau$ channel.

The 95% CL limits on cross section times branching ratio as a function of Z' mass in the $\mu\tau$ channel.

The 95% CL limits on lambda'_311 as a function of sneutrino mass for assumed value of lambda_i3k=0.07 for $e\mu$, $e\tau$ and $\mu\tau$ modes.

Estimated SM backgrounds and observed event yields for the validation and search region.

Cut flow for signal $\tilde{\nu}_{\tau}$ and Z' at 1TeV mass point.

Gaussian standard deviation of M(ll') distributions at various signal mass.

Inputs used for the Z'-->$e\mu$ channel limit setting.

Inputs used for the $\tilde{\nu}_{\tau}$-->$e\mu$ channel limit setting.

Inputs used for the Z'-->$e\tau$ channel limit setting.

Inputs used for the $\tilde{\nu}_{\tau}$ -->$e\tau$ channel limit setting.

Inputs used for the Z'-->$\mu\tau$ channel limit setting.

Inputs used for the $\tilde{\nu}_{\tau}$-->$\mu\tau$ channel limit setting.

Fiducial cross sections for pT(gamma) > 15 GeV with statistical, systematic, and luminosity uncertainties, respectively. Combined result of electron and muon channels.

Measured jet multiplicity distribution in the $W\mu\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured dilepton invariant mass distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured $E_{T}^{miss}$ distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured leading jet $p_{T}$ distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured jet multiplicity distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured transverse mass distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured $E_{T}^{miss}$ distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured leading jet $p_{T}$ distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured jet multiplicity distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured dilepton invariant mass distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured $E_{T}^{miss}$ distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured leading jet $p_{T}$ distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured jet multiplicity distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured distribution of the jet multiplicity for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of $E_{T}^{miss}$ for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of leading jet $p_{T}$ for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_{T}$ to $E_{T}^{miss}$ ratio for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the jet multiplicity for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the jet multiplicity for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ for SR9 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ to $E_{T}^{miss}$ ratio for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ to $E_{T}^{miss}$ ratio for SR9 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Observed and expected 95$\%$ CL limit on the fundamental Planck scale in $4+n$ dimensions, $M_D$, as a function of the number of extra dimensions. In the figure the two results overlap. The shaded areas around the expected limit indicate the expected $\pm 1\sigma$ and $\pm 2\sigma$ ranges of limits in the absence of a signal. The 95$\%$ CL observed limits after the suppression of the events with $\hat{s} > M_D^2$ is applied (truncated) are also given.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the scalar operator D1. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the vector operator D5. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the axial vector operator D8. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the tensor operator D9. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the gluon operator D11. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the gluon operator C5. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Observed 95% CL limits on the suppression scale M* as a function of the mediator mass Mmed, assuming a Z'-like boson in a simplified model and a DM mass of 50 GeV and 400 GeV. The width of the mediator is varied between Mmed/3 and Mmed/8pi.

Observed 95% CL upper limits on the product of couplings of the simplified model vertex in the plane of mediator and WIMP mass (Mmed versus m_chi).

Upper limits at 90% C.L. on the WIMP-nucleon scattering cross section as a function of m_chi for spin-independent interactions, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

Upper limits at 90% C.L. on the WIMP-nucleon scattering cross section as a function of m_chi for spin-dependent interactions, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

Upper limits at 90% C.L. on the WIMP-nucleon annihilation cross section as a function of m_chi, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for degenerate squark/gluino masses.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 1/2 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 1/4 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 2 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 4 \times m_{\tilde{q}}$.

Observed and expected 95$\%$ CL upper limit on $\sigma \times {\rm{BR}}(H \to {\rm{invisible}})$ as a function of the Higgs boson mass.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the scalar operator C1. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 30-45 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 45-60 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 60-120 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 120-200 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 200-1500 GeV, as measured in the combined dilepton channel.

Measured ratio of the Drell-Yan normalized differential cross sections at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel for the full phase space.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 20-30 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 30-45 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 45-60 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 60-120 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 120-200 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 200-1500 GeV.