The expected exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The +1 $\sigma$ expected exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The -1 $\sigma$ expected exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The +1 $\sigma$ observed exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The -1 $\sigma$ observed exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The observed and expected exclusion limit at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

Expected and observed 95% CL exclusion upper limits on the higgsino production ($\tilde{\chi}\tilde{\chi} \equiv \tilde{\chi}^{0}_{1}\tilde{\chi}^{0}_{2}, \tilde{\chi}^{0}_{1}\tilde{\chi}^{\pm}_{1}, \tilde{\chi}^{0}_{2}\tilde{\chi}^{\pm}_{1}, \tilde{\chi}^{\pm}_{1}\tilde{\chi}^{\mp}_{1}$) cross-section in the signal of $h \tilde{G} h \tilde{G} $ as a function of the higgsino mass.

The distribution of $S_{E_\mathrm{T}^{\mathrm{miss}}}$ after the selection of diphoton candidates with $120~GeV < m_{\gamma\gamma} < 130~GeV$. Expected distributions are shown for the $\tilde{\chi}^{\pm}_{1} \tilde{\chi}^{0}_{2} \to W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1} $ signal with $m(\tilde{\chi}^{\pm}_{1} \tilde{\chi}^{0}_{2})=200~GeV$ and $m(\tilde{\chi}^{0}_{1})=0.5~GeV$, and the $h\tilde{G} h\tilde{G}$ signal with $m(\tilde{\chi}^{0}_{1})=150~GeV$ and $m(\tilde{G})=1~MeV$. These overlaid signal points are representative of the model kinematics. The sum in quadrature of the MC statistical and experimental systematic uncertainties in the total background is shown as the hatched bands, while the theoretical uncertainties in the background normalisation are not included. The $t\bar{t}\gamma$ and $t\bar{t}\gamma\gamma$ processes have a negligible contribution and are not represented. Overflow events are included in the rightmost bin. The lower panel shows the ratio of the data to the background.

Acceptance and efficiency for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signal in each category.

Acceptance and efficiency for the $h \tilde{G} h \tilde{G}$ signal in each category.

Cut flow for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signal sample at $m(\tilde{\chi}^{\pm}_{1} \tilde{\chi}^{0}_{2})=200~GeV$, $m(\tilde{\chi}^{0}_{1})=0.5~GeV$, with 260000 entries.

Cut flow for the $h \tilde{G} h \tilde{G}$ signal sample at $m(\tilde{\chi}^{0}_{1})=150~GeV$, $m(\tilde{G})=1~MeV$, with 50000 entries.

Event yields in the range 120 <$m\gamma\gamma$< 130 GeV for data, signal models, the SM Higgs boson background and non-resonant background in each analysis category after the fit.

Event yields in the range 120 <$m\gamma\gamma$< 130 GeV for data, signal models, the SM Higgs boson background and non-resonant background in each analysis category before the fit.

Acceptance for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the leptonic channel.

Efficiency for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the leptonic channel.

Acceptance for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the hadronic channel.

Efficiency for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the hadronic channel.

Acceptance for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the rest channel.

Efficiency for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the rest channel.

Acceptance for the $h \tilde{G} h \tilde{G}$ signals in the each channel.

Efficiency for the $h \tilde{G} h \tilde{G}$ signals in the each channel.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 0.33 < ln(R/#DeltaR) < 0.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 0.67 < ln(R/#DeltaR) < 1.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.00 < ln(R/#DeltaR) < 1.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.33 < ln(R/#DeltaR) < 1.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.67 < ln(R/#DeltaR) < 2.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.00 < ln(R/#DeltaR) < 2.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.33 < ln(R/#DeltaR) < 2.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.67 < ln(R/#DeltaR) < 3.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.00 < ln(R/#DeltaR) < 3.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.33 < ln(R/#DeltaR) < 3.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.67 < ln(R/#DeltaR) < 4.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 4.00 < ln(R/#DeltaR) < 4.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 0.69 < ln(1/z) < 0.97.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 0.97 < ln(1/z) < 1.25.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.25 < ln(1/z) < 1.52.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.52 < ln(1/z) < 1.80.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.80 < ln(1/z) < 2.08.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.08 < ln(1/z) < 2.36.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.36 < ln(1/z) < 2.63.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.63 < ln(1/z) < 2.91.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.91 < ln(1/z) < 3.19.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.19 < ln(1/z) < 3.47.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.47 < ln(1/z) < 3.74.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.74 < ln(1/z) < 4.02.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.02 < ln(1/z) < 4.30.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.30 < ln(1/z) < 4.57.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.57 < ln(1/z) < 4.85.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.85 < ln(1/z) < 5.13.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.13 < ln(1/z) < 5.41.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.41 < ln(1/z) < 5.68.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.68 < ln(1/z) < 5.96.

The summed covariance matrix of all systematic and statistical uncertainties associated with the measurement in bins of $\ln{(1/z)} \times \ln{(R/\Delta R)}$.

The summed covariance matrix of all statistical uncertainties associated with the measurement in bins of $\ln{(1/z)} \times \ln{(R/\Delta R)}$.

Vertex selection efficiency for the $\tilde{t}$ $R$-hadron benchmark model as a function of the transverse decay distance $r_{DV}$.

Track multiplicity $n_{Tracks}$ for preselected DVs in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Track multiplicity $n_{Tracks}$ for preselected DVs in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in MET-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

Invariant mass $m_{DV}$ for the highest-mass preselected DV with at least three associated tracks in muon-triggered events with at least one muon passing the full selection. Along with the data shown with black markers, the stacked filled histograms represent the background estimates, and predictions for signal scenarios are overlaid with dashed lines. The errors include statistical and systematic uncertainties and are indicated by hatched bands. The DV full selection requirements, $n_{Tracks} \geq 3$ and $m_{DV} > 20$ GeV are visualized with a black arrow.

The observed event yields in the control, validation and signal regions are shown for the MET Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the MET Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the Muon Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

The observed event yields in the control, validation and signal regions are shown for the Muon Trigger selections, along with the predicted background yields. The bottom panel shows the ratio of observed events to the total background yields. The errors represent the total uncertainty of the backgrounds prediction, including the statistical and systematic uncertainties added in quadrature.

Expected exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (1 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (1 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (2 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Expected (2 sigma band) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (+1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (+1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (-1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Observed (-1 sigma) exclusion limits at 95% CL on m($\tilde{t}$) as a function of $\tau(\tilde{t})$.

Exclusion limits on the production cross section as a function of m($\tilde{t}$) are shown for several values of $\tau(\tilde{t})$ along with the nominal signal production cross section and its theoretical uncertainty.

Exclusion limits on the production cross section as a function of m($\tilde{t}$) are shown for several values of $\tau(\tilde{t})$ along with the nominal signal production cross section and its theoretical uncertainty.

Parameterized event selection efficiencies for the $E_{T}^{miss}$ Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the $E_{T}^{miss}$ Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the Muon Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized event selection efficiencies for the Muon Trigger SR. The event-level efficiencies for each SR are extracted for all events passing the acceptance of the corresponding SR.

Parameterized muon-level reconstruction efficiencies as a function of the muon $p_{T}$ and $d_{0}$. The muon-level efficiencies are extracted using muons passing the muon acceptance criteria.

Parameterized muon-level reconstruction efficiencies as a function of the muon $p_{T}$ and $d_{0}$. The muon-level efficiencies are extracted using muons passing the muon acceptance criteria.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated independent of the muons originating from this truth vertex.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated independent of the muons originating from this truth vertex.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated only for truth vertices which have a muon originating from them which is matched to a reconstructed muon.

Parameterized vertex-level reconstruction efficiencies as a function of the radial position of the truth vertex. The efficiency is calculated only for truth vertices which have a muon originating from them which is matched to a reconstructed muon.

The $p_{T}$ distribution of all muons originating from LLP decays in the samples used to calculate and validate the efficiencies.

The $p_{T}$ distribution of all muons originating from LLP decays in the samples used to calculate and validate the efficiencies.

The invariant mass and multiplicity of selected decay products of all truth vertices used in the calculation and validation of the reconstructed efficiencies.

The invariant mass and multiplicity of selected decay products of all truth vertices used in the calculation and validation of the reconstructed efficiencies.

Fit correlations between the physical parameters of interest, obtained from the fit for solution (b).

Values of the physical parameters extracted in the combination of solution (a) of 13 TeV results with those obtained from 7 TeV and 8 TeV data.

Values of the physical parameters extracted in the combination of solution (b) of 13 TeV results with those obtained from 7 TeV and 8 TeV data.

Correlation matrix of the BLUE combination of the 7 TeV and 8 TeV results and the solution (a) of the 13 TeV result.

Correlation matrix of the BLUE combination of the 7 TeV and 8 TeV results and the solution (b) of the 13 TeV result.

Summary of systematic uncertainties assigned to the physical parameters of interest.

Acceptance x efficiency versus $\kappa_{2V}$ for non-resonant signal of $HH$.

Acceptance x efficiency versus resonance mass for both narrow and broad resonance $X$ to $HH$.

Acceptance x efficiency versus resonance mass for both narrow and broad resonance $X$ to $HH$.

Acceptance x efficiency versus resonance mass for both narrow and broad resonance $X$ to $HH$.

Acceptance x efficiency versus resonance mass for both narrow and broad resonance $X$ to $HH$.

Post-fit mass distribution of the $HH$ candidates in the signal region. The expected background is shown after the profile-likelihood fit to data with the background-only hypothesis; the narrow-width resonant signal at 800 GeV and the non-resonant signal at $\kappa_{2V}$ = 3 are overlaid, both normalised to the corresponding observed upper limits on the cross-section.

Post-fit mass distribution of the $HH$ candidates in the signal region. The expected background is shown after the profile-likelihood fit to data with the background-only hypothesis; the narrow-width resonant signal at 800 GeV and the non-resonant signal at $\kappa_{2V}$ = 3 are overlaid, both normalised to the corresponding observed upper limits on the cross-section.

Post-fit mass distribution of the $HH$ candidates in the signal region. The expected background is shown after the profile-likelihood fit to data with the background-only hypothesis; the narrow-width resonant signal at 800 GeV and the non-resonant signal at $\kappa_{2V}$ = 3 are overlaid, both normalised to the corresponding observed upper limits on the cross-section.

Post-fit mass distribution of the $HH$ candidates in the signal region. The expected background is shown after the profile-likelihood fit to data with the background-only hypothesis; the narrow-width resonant signal at 800 GeV and the non-resonant signal at $\kappa_{2V}$ = 3 are overlaid, both normalised to the corresponding observed upper limits on the cross-section.

Observed and expected limits at 95% CL on the cross-sections of narrow resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of narrow resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of narrow resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-section of narrow resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of broad resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of broad resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of broad resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-section of broad resonance $X$ to $HH$ as a function of the mass $m_{X}$.

Observed and expected limits at 95% CL on the cross-sections of non-resonant $HH$ production via VBF as a function of the di-vector-boson-di-Higgs-boson coupling modifier $\kappa_{2V}$. The theory prediction of the cross-section as a function of $\kappa_{2V}$ is also shown. The minimum theory cross-section is 1.37 fb at $\kappa_{2V}=1.17$.

Observed and expected limits at 95% CL on the cross-sections of non-resonant $HH$ production via VBF as a function of the di-vector-boson-di-Higgs-boson coupling modifier $\kappa_{2V}$. The theory prediction of the cross-section as a function of $\kappa_{2V}$ is also shown. The minimum theory cross-section is 1.37 fb at $\kappa_{2V}=1.17$.

Observed and expected limits at 95% CL on the cross-sections of non-resonant $HH$ production via VBF as a function of the di-vector-boson-di-Higgs-boson coupling modifier $\kappa_{2V}$. The theory prediction of the cross-section as a function of $\kappa_{2V}$ is also shown. The minimum theory cross-section is 1.37 fb at $\kappa_{2V}=1.17$.

Observed and expected limits at 95% CL on the cross-sections of non-resonant $HH$ production via VBF as a function of the di-vector-boson-di-Higgs-boson coupling modifier $\kappa_{2V}$. The theory prediction of the cross-section as a function of $\kappa_{2V}$ is also shown. The minimum theory cross-section is 1.37 fb at $\kappa_{2V}=1.17$.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the total phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $E_{\mathrm{T}}^{\gamma}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $p_{\mathrm{T}}^{\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $|y^{\textrm{jet}}|$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the fragmentation-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $E_{\mathrm{T}}^{\gamma}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $p_{\mathrm{T}}^{\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $|y^{\textrm{jet}}|$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\gamma-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\gamma-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta y^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $\Delta \phi^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Measured cross sections for isolated-photon plus two-jet production as functions of $m^{\gamma-\textrm{jet}-\textrm{jet}}$ for the direct-enriched phase-space. The predictions from Sherpa NLO are also included.

Distributions in SR-low of the data and post-fit background prediction for H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3&#8467;/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for m_eff^3&#8467;/H^boost. The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3&#8467;). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3&#8467;). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

The observed upper limits on the model cross-section in units of pb for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production. Three points at $M({\tilde{\chi}}^{0}_{1})=200GeV$ were removed from the plot but kept in the table because they overlapped with the plot's legend and are far from the exclusion contour.

The observed 95\% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95\% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

The measured fiducial cross section vs $E_{\mathrm{T}}^\gamma$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.