Post-fit distributions of a background-only fit to the SR and the CRs of the NN output in the SR for the $tc\gamma$ left-handed coupling. In addition, the expected signal is overlaid for an effective coupling strength corresponding to the observed limit multiplied by a factor of ten.

Post-fit distributions of a background-only fit to the SR and the CRs of the NN output in the SR for the $tc\gamma$ right-handed coupling. In addition, the expected signal is overlaid for an effective coupling strength corresponding to the observed limit multiplied by a factor of ten.

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon1,Photon2).

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon1,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of DPhi(Photon2,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon1,Photon2)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon1,Photon3)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of |DEta(Photon2,Photon3)|.

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon2).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon2,Photon3).

The three isolated photons cross section with systematic and statistical uncertainties as a function of M(Photon1,Photon2,Photon3).

Correlation matrix for the measurement of STXS parameters in each of the 28 regions considered.

Fitted values for kappa_g and kappa_y.

Correlation matrix for the measurement of kappa_g and kappa_y.

Summary of the 68% CL confidence intervals for individual measurements of SMEFT parameters observed in data. In each case, SMEFT parameters other than the one measured are fixed to 0.

Results of the EV parameter measurement in data, in the linear and linear+quadratic parameterizations of the SMEFT. All the EVs parameters are free to vary in the fits. The ranges correspond to 68% CL confidence intervals.

Observed linear correlation coefficients of the EVs parameters in the linear parameterization.

Observed linear correlation coefficients of the EVs parameters in the linear+quadratic parameterization.

Cross-sections times H->yy branching ratio for ggF +bbH, VBF, VH, ttH, and tH production. The values are obtained from a simultaneous fit to all categories. The theory uncertainties in the predictions include uncertainties due to missing higher-order terms in the perturbative QCD calculations and choices of parton distribution functions and value of alpha_s, as well as the H->yy branching ratio uncertainty.

Best-fit values and uncertainties for STXS parameters in each of the 28 regions considered. The values for the gg->H process also include the contributions from bbH production.

Correlation matrix for the measurement of STXS parameters in each of the 33 regions considered.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.