The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

Response matrix for pT ll mass 50-76 (electron channel)

Response matrix for pT ll mass 50-76 (muon channel)

Response matrix for pT ll mass 76-106 (electron channel)

Response matrix for pT ll mass 76-106 (muon channel)

Response matrix for pT ll mass 106-170 (electron channel)

Response matrix for pT ll mass 106-170 (muon channel)

Response matrix for pT ll mass 170-350 (electron channel)

Response matrix for pT ll mass 170-350 (muon channel)

Response matrix for pT ll mass 350-1000 (electron channel)

Response matrix for pT ll mass 50-76 jet (electron channel)

Response matrix for pT ll mass 50-76 jet (muon channel)

Response matrix for pT ll mass 76-106 jet (electron channel)

Response matrix for pT ll mass 76-106 jet (muon channel)

Response matrix for pT ll mass 106-170 jet (electron channel)

Response matrix for pT ll mass 106-170 jet (muon channel)

Response matrix for pT ll mass 170-350 jet (electron channel)

Response matrix for pT ll mass 170-350 jet (muon channel)

Response matrix for phistar mass 50-76 (electron channel)

Response matrix for phistar mass 50-76 (muon channel)

Response matrix for phistar mass 76-106 (electron channel)

Response matrix for phistar mass 76-106 (muon channel)

Response matrix for phistar mass 106-170 (electron channel)

Response matrix for phistar mass 106-170 (muon channel)

Response matrix for phistar mass 170-350 (electron channel)

Response matrix for phistar mass 170-350 (muon channel)

Response matrix for phistar mass 350-1000 (electron channel)

Response matrix for phistar mass 350-1000 (muon channel)

Correlation between the Wilson coefficients (in %), after the 5D fit to data.

Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Combined fiducial cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined fiducial cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Combined total cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined total cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined total cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined total cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Measured fiducial cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where l = e, mu.

Measured fiducial cross-section ratio R_{W+/W-} = sigma (W+ -> l+ nu) / sigma (W- -> l- nubar) where l = e, mu.

Measured charge asymmetry in W-boson production A_{l} = ( sigma (W+ -> l+ nu) - sigma (W- -> l- nubar) ) / ( sigma (W+ -> l+ nu) + sigma (W- -> l- nubar) ) where l = e, mu.

The ratio of measured W+ cross-sections in the electron and muon decay channels R_{W+} = sigma (W+ -> e+ nu) / sigma (W+ -> mu+ nu)

The ratio of measured W- cross-sections in the electron and muon decay channels R_{W-} = sigma (W- -> e- nu) / sigma (W- -> mu- nu)

The ratio of measured W cross-sections in the electron and muon decay channels R_{W} = sigma (W -> e nu) / sigma (W -> mu nu)

The ratio of measured Z/gamma^* cross-sections in the electron and muon decay channels R_{Z/gamma^*} = sigma (Z/gamma^* -> e+ e-) / sigma (Z/gamma^* -> mu+ mu-)

Correlation coefficients among (W- -> l- nubar), (W+ -> l+ nu), (Z/gamma^* -> l+ l-) where (l = e, mu) excluding the common normalisation uncertainty due to the luminosity calibration.

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 50$< p_{T}^{4l} <$100 GeV

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 100$< p_{T}^{4l} <$600 GeV

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.0$< y_{4l} <$0.4

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.4$< y_{4l} <$0.8

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.8$< y_{4l} <$1.2

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 1.2$< y_{4l} <$2.5

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$<$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$>$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $\mu\mu\mu\mu$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $eeee$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $ee\mu\mu$ events

Systematic covariance matrix for the differential $m_{4l}$ distribution.

Statistical covariance matrix for the differential $m_{4l}$ distribution.

Background covariance matrix for the differential $m_{4l}$ distribution.

Systematic covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution.<br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Statistical covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Background covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Systematic covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Statistical covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Background covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Systematic covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Statistical covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Background covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Systematic covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Statistical covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Background covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Measured ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Predicted ratio of cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<1.37$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Predicted double ratio of cross sections for inclusive isolated-photon production and Z-boson production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.37$.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Powheg based prediction for AFB in the central-central fiducial phase space, as reported in Fig 16 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Powheg based prediction for AFB in the central-fiducial fiducial phase space, as reported in Fig 17 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Data minus non-Zjj backgrounds in the EW-enriched fiducial region, statistical errors included