Measured values of $R(\tau/e)$ in the different $p_T$ bins. The first row gives the main inclusive measurement of $R(\tau/e)$.

Breakdown of systematic uncertainties in the fit to data. Different individual components used in the fit are combined into categories. The size of the impact each group of uncertainties has on $R(\tau/e)$, which is shown in the second column, is assessed by subtracting in quadrature the uncertainty from the nominal fit and the fit with the relevant nuisance parameters fixed to their post-fit values. The group 'Other sources' includes the uncertainties due to trigger, JVT, luminosity, and pile-up.

Distributions of $|d_0|$ for the $\mu e$ channel of the nominal sample in $7 < p_T < 10$ GeV bin. The data are represented by black markers. The different contributions to the nominal sample, taken from simulation after the fit (`Post-Fit'), are shown by stacked histograms. The bottom panels show the ratio of the data to the simulation prediction after the fit. The systematic uncertainties in the prediction with the constraints from the fit and the correlation between the nuisance parameters applied are represented by the blue hatched bands.

Distributions of $|d_0|$ for the $\mu e$ channel of the nominal sample in $10 < p_T < 20$ GeV bin. The data are represented by black markers. The different contributions to the nominal sample, taken from simulation after the fit (`Post-Fit'), are shown by stacked histograms. The bottom panels show the ratio of the data to the simulation prediction after the fit. The systematic uncertainties in the prediction with the constraints from the fit and the correlation between the nuisance parameters applied are represented by the blue hatched bands.

Distributions of $|d_0|$ for the $\mu e$ channel of the nominal sample in $20 < p_T < 250$ GeV bin. The data are represented by black markers. The different contributions to the nominal sample, taken from simulation after the fit (`Post-Fit'), are shown by stacked histograms. The bottom panels show the ratio of the data to the simulation prediction after the fit. The systematic uncertainties in the prediction with the constraints from the fit and the correlation between the nuisance parameters applied are represented by the blue hatched bands.

Distributions of $|d_0|$ for the $e e$ channel of the nominal sample in $5 < p_T < 10$ GeV bin. The data are represented by black markers. The different contributions to the nominal sample, taken from simulation after the fit (`Post-Fit'), are shown by stacked histograms. The bottom panels show the ratio of the data to the simulation prediction after the fit. The systematic uncertainties in the prediction with the constraints from the fit and the correlation between the nuisance parameters applied are represented by the blue hatched bands.

Distributions of $|d_0|$ for the $e e$ channel of the nominal sample in $10 < p_T < 20$ GeV bin. The data are represented by black markers. The different contributions to the nominal sample, taken from simulation after the fit (`Post-Fit'), are shown by stacked histograms. The bottom panels show the ratio of the data to the simulation prediction after the fit. The systematic uncertainties in the prediction with the constraints from the fit and the correlation between the nuisance parameters applied are represented by the blue hatched bands.

Distributions of $|d_0|$ for the $e e$ channel of the nominal sample in $20 < p_T < 250$ GeV bin. The data are represented by black markers. The different contributions to the nominal sample, taken from simulation after the fit (`Post-Fit'), are shown by stacked histograms. The bottom panels show the ratio of the data to the simulation prediction after the fit. The systematic uncertainties in the prediction with the constraints from the fit and the correlation between the nuisance parameters applied are represented by the blue hatched bands.

Signal region detector-level distribution for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$.

Signal region detector-level distribution for the observable $m_{e\mu}$.

Signal region detector-level distribution for the observable $p_{\mathrm{T}}^{e\mu}$.

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

Summary of the impact of different categories of systematic uncertainties on the background estimate in BDT bins, after the background-only fit. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Observed and expected exclusion limits at 95% CL on BR(H$\to\gamma\gamma_d$) as function of the $\gamma_d$ mass.

Background, data and signal yields in bins of BDT, in the SR and in the VV$\gamma$ CR, before the background-only fit. The expectations for the signal are shown for the massless dark photon and for dark photon mass values of 20 GeV and 40 GeV, assuming BR(H$\to\gamma\gamma_d$) = 5%. Uncertainties are statistical for data, while for backgrounds include statistical and systematic sources.

Number of events after each cut in SR for 139fb$^{-1}$ for ZH, H$\to\gamma\gamma_d$ considering BR=5% and massless dark photon. Generator-level filters are applied on the total events. Only the statistical uncertainty is shown.

Distribution of the BDT classifier response in data and for the expected SM background after the background-only fit, in the ee channel. The expectations for signal are also shown for the massless dark photon and for dark photon mass values of 20 GeV and 40 GeV, assuming BR(H$\to\gamma\gamma_d$) = 5%. Uncertainties shown are statistical for data, while for backgrounds include statistical and systematic sources.

Distribution of the BDT classifier response for data and for the expected SM background after the background-only fit, in the $\mu\mu$ channel. The expectations for signal are also shown for the massless dark photon and for dark photon mass values of 20 GeV and 40 GeV, assuming BR(H$\to\gamma\gamma_d$) = 5%. Uncertainties shown are statistical for data, while for backgrounds include statistical and systematic sources.