Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

1$\tau$ MediumMass SR eff.

2$\tau$ Compressed SR eff.

2$\tau$ Compressed SR eff.

2$\tau$ HighMass SR eff.

2$\tau$ HighMass SR eff.

2$\tau$ multibin SR eff.

2$\tau$ multibin SR eff.

2$\tau$ GMSB SR eff.

2$\tau$ GMSB SR eff.

1$\tau$ Compressed SR eff.

1$\tau$ Compressed SR eff.

1$\tau$ MediumMass SR eff.

1$\tau$ MediumMass SR eff.

2$\tau$ Compressed SR eff.

2$\tau$ Compressed SR eff.

2$\tau$ HighMass SR eff.

2$\tau$ HighMass SR eff.

2$\tau$ multibin SR eff.

2$\tau$ multibin SR eff.

2$\tau$ GMSB SR eff.

2$\tau$ GMSB SR eff.

1$\tau$ Compressed SR acceptance.

1$\tau$ Compressed SR acceptance.

1$\tau$ MediumMass SR acceptance.

1$\tau$ MediumMass SR acceptance.

2$\tau$ Compressed SR acceptance.

2$\tau$ Compressed SR acceptance.

2$\tau$ HighMass SR acceptance.

2$\tau$ HighMass SR acceptance.

2$\tau$ multibin SR acceptance.

2$\tau$ multibin SR acceptance.

2$\tau$ GMSB SR acceptance.

2$\tau$ GMSB SR acceptance.

1$\tau$ Compressed SR acceptance.

1$\tau$ Compressed SR acceptance.

1$\tau$ MediumMass SR acceptance.

1$\tau$ MediumMass SR acceptance.

2$\tau$ Compressed SR acceptance.

2$\tau$ Compressed SR acceptance.

2$\tau$ HighMass SR acceptance.

2$\tau$ HighMass SR acceptance.

2$\tau$ multibin SR acceptance.

2$\tau$ multibin SR acceptance.

2$\tau$ GMSB SR acceptance.

2$\tau$ GMSB SR acceptance.

Cutflow table of the $1\tau$ compressed SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $1\tau$ compressed SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $1\tau$ medium-mass SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $1\tau$ medium-mass SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ compressed SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ compressed SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ high-mass SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ high-mass SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ multibin SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ multibin SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ GMSB SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ GMSB SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Best performing fit setups entering the final combination as a function of the LSP mass and the gluino mass. 'S' marks the simultaneous fit of the four simplified model single-bin SRs, 'M' denotes the simultaneous fit of the two $1\tau$ SRs and the $2\tau$ multibin SR.

Best performing fit setups entering the final combination as a function of the LSP mass and the gluino mass. 'S' marks the simultaneous fit of the four simplified model single-bin SRs, 'M' denotes the simultaneous fit of the two $1\tau$ SRs and the $2\tau$ multibin SR.

Observed exclusion contour at 95% CL as a function of tanBeta and the SUSY-breaking mass scale Lambda.

Observed exclusion contour at 95% CL as a function of tanBeta and the SUSY-breaking mass scale Lambda.

Expected exclusion contour at 95% CL as a function of tanBeta and the SUSY-breaking mass scale Lambda.

Expected exclusion contour at 95% CL as a function of tanBeta and the SUSY-breaking mass scale Lambda.

Observed exclusion contour at 95% CL as a function of the LSP mass and the gluino mass.

Observed exclusion contour at 95% CL as a function of the LSP mass and the gluino mass.

Expected exclusion contour at 95% CL as a function of the LSP mass and the gluino mass.

Expected exclusion contour at 95% CL as a function of the LSP mass and the gluino mass.

Observed upper limits on the production cross section at 95% CL in pb as a function of tanBeta and SUSY breaking mass scale Lambda.

Observed upper limits on the production cross section at 95% CL in pb as a function of tanBeta and SUSY breaking mass scale Lambda.

Observed upper limits on the production cross section at 95% CL in pb as a function of the LSP mass and the gluino mass.

Observed upper limits on the production cross section at 95% CL in pb as a function of the LSP mass and the gluino mass.

Yields of the expected background from the SM in the bins of the multibin SR of the $2\tau$ channel with all bins being simultaneously used to constrain the background prediction. Expectation is given with the scalings computed in the combined fit applied. Uncertainties are statistial plus systematrics. Only the subsamples contributing the respective region are considered.

Yields of the expected background from the SM in the bins of the multibin SR of the $2\tau$ channel with all bins being simultaneously used to constrain the background prediction. Expectation is given with the scalings computed in the combined fit applied. Uncertainties are statistial plus systematrics. Only the subsamples contributing the respective region are considered.

$m_{\mathrm{T}}^{\tau}$ in the compressed $m_{\mathrm{T}}^{\tau}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau}$ in the compressed $m_{\mathrm{T}}^{\tau}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$E_{\mathrm{T}}^{\mathrm{miss}}$ in the compressed $E_{\mathrm{T}}^{\mathrm{miss}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$E_{\mathrm{T}}^{\mathrm{miss}}$ in the compressed $E_{\mathrm{T}}^{\mathrm{miss}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau}$ in the medium-mass $m_{\mathrm{T}}^{\tau}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau}$ in the medium-mass $m_{\mathrm{T}}^{\tau}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$E_{\mathrm{T}}^{\mathrm{miss}}$ in the medium-mass $E_{\mathrm{T}}^{\mathrm{miss}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$E_{\mathrm{T}}^{\mathrm{miss}}$ in the medium-mass $E_{\mathrm{T}}^{\mathrm{miss}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$H_{\mathrm{T}}$ in the medium-mass $H_{\mathrm{T}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$H_{\mathrm{T}}$ in the medium-mass $H_{\mathrm{T}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau_1}$ + $m_{\mathrm{T}}^{\tau_2}$ in the top VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau_1}$ + $m_{\mathrm{T}}^{\tau_2}$ in the top VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$H_{\mathrm{T}}$ in the $W$ VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$H_{\mathrm{T}}$ in the $W$ VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau_1}$ + $m_{\mathrm{T}}^{\tau_2}$ in the $Z$ VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau_1}$ + $m_{\mathrm{T}}^{\tau_2}$ in the $Z$ VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau}$ in the compressed SR of the $1\tau$ channel before application of the $m_{\mathrm{T}}^{\tau}$ > 80 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$m_{\mathrm{T}}^{\tau}$ in the compressed SR of the $1\tau$ channel before application of the $m_{\mathrm{T}}^{\tau}$ > 80 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the medium-mass SR of the $1\tau$ channel before application of the $H_{\mathrm{T}}$ > 1000 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the medium-mass SR of the $1\tau$ channel before application of the $H_{\mathrm{T}}$ > 1000 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$m_{\mathrm{T}}^{\mathrm{sum}}$ in the compressed SR of the $2\tau$ channel before application of the $m_{\mathrm{T}}^{\mathrm{sum}}$ > 1600 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$m_{\mathrm{T}}^{\mathrm{sum}}$ in the compressed SR of the $2\tau$ channel before application of the $m_{\mathrm{T}}^{\mathrm{sum}}$ > 1600 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the high-mass SR of the $2\tau$ channel before application of the $H_{\mathrm{T}}$ > 1100 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the high-mass SR of the $2\tau$ channel before application of the $H_{\mathrm{T}}$ > 1100 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

mT(tau_1) + mT(tau_2) in the multibin SR of the 2T channel. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

mT(tau_1) + mT(tau_2) in the multibin SR of the 2T channel. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the GMSB SR of the $2\tau$ channel before application of the $H_{\mathrm{T}}$ > 1900 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the GMSB SR of the $2\tau$ channel before application of the $H_{\mathrm{T}}$ > 1900 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

The $p_T ^{miss}$ distributions for muon channel comparing the data and background model with systematic uncertainty.

The $m_T$ distributions for electron channel comparing the data and background model with systematic uncertainty, after fitting the background-only model to the data.

The $m_T$ distributions for muon channel comparing the data and background model with systematic uncertainty, after fitting the background-only model to the data.

Expected and observed limits on the product of cross section and branching fraction of a new spin-2 heavy resonance X$\rightarrow$ZZ, assuming zero width, based on the combined analysis of the electron and muon channels.

Expected and observed limits on the product of cross section and branching fraction of a new spin-2 heavy resonance X$\rightarrow$ZZ, assuming zero width, based on the combined analysis of the electron channels.

Expected and observed limits on the product of cross section and branching fraction of a new spin-2 heavy resonance X$\rightarrow$ZZ, assuming zero width, based on the combined analysis of the muon channels.

Expected and observed limits on the product of cross section and branching fraction of a new spin-2 heavy resonance X$\rightarrow$ZZ based on a combined analysis of the electron and muon channels. The more generic version of the bulk graviton model takes 0/10%/20%/30% mass width of the resonance into consideration, assuming gluon-gluon fusion production.

Expected and observed limits on the product of cross section and branching fraction of a new spin-2 heavy resonance X$\rightarrow$ZZ based on a combined analysis of the electron and muon channels. The more generic version of the bulk graviton model takes 0/10%/20%/30% mass width of the resonance into consideration, assuming qq annihilation production.

HT inclusive distribution in SRZ.

Jet multiplicity distribution in SRZ.

B-tagged jet multiplicity distribution in SRZ.

Dilepton invariant mass distribution in SRMedium.

Dilepton invariant mass distribution in SRMedium.

Dilepton invariant mass in SRHigh.

Expected 95% exclusion contour for the gluino simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Observed 95% exclusion contour for the gluino simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Expected 95% exclusion contour for the squark simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Observed 95% exclusion contour for the squark simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Expected 95% exclusion contour for the gluino simplified model with varying N1 mass and decays to quarks and Z bosons in SRZ.

Observed 95% exclusion contour for the gluino simplified model with varying N1 mass and decays to quarks and Z bosons in SRZ.

Expected 95% exclusion contour for the gluino simplified model with sleptons in the edge SRs.

Observed 95% exclusion contour for the gluino simplified model with sleptons in the edge SRs.

Expected 95% exclusion contour for the gluino simplified model with decays to on- or off-shell Z bosons in the edge SRs.

Observed 95% exclusion contour for the gluino simplified model with decays to on- or off-shell Z bosons in the edge SRs.

Expected 95% exclusion contour for the gluino simplified model with decays to on- or off-shell Z bosons in SRZ.

Observed 95% exclusion contour for the gluino simplified model with decays to on- or off-shell Z bosons in SRZ.

Cutflow table for three benchmark signal points from the $\tilde{g}$--$\chi_{2}^{0}$ on-shell grid in SRZ for the $ee$ and $\mu\mu$ channels separately. The number of generated events is N RAW, while N WEIGHTED corresponds to the number of events expected in 14.7/fb, after all MC simulation corrections have been applied.

Cutflow table for three benchmark signal points for the slepton model in SR-low, SR-medium and SR-high for the $ee$ and $\mu\mu$ channels separately. The number of generated events is N RAW, while N WEIGHTED corresponds to the number of events expected in 14.7/fb, after all MC simulation corrections have been applied. The event generation was filtered to require at least two leptons (electrons or muons) with $p_{T}>5$ GeV and $|\eta|<2.8$, with 20000 events required to pass the filter. The corresponding number of unfiltered events is provided in the ``Pre-filter events'' row of the table.

Signal acceptance for the gluino simplified model with decays to quarks and Z bosons in SRZ.

Signal efficiency for the gluino simplified model with decays to quarks and Z bosons in SRZ.

Signal acceptance for the gluino simplified model with decays via sleptons in SRLow.

Signal efficiency for the gluino simplified model with decays via sleptons in SRLow.

Signal acceptance for the gluino simplified model with decays via sleptons in SRMedium.

Signal efficiency for the gluino simplified model with decays via sleptons in SRMedium.

Signal acceptance for the gluino simplified model with decays via sleptons in SRHigh.

Signal efficiency for the gluino simplified model with decays via sleptons in SRHigh.

Upper limits on the signal cross-section at 95% CL for the gluino simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Upper limits on the signal cross-section at 95% CL for the squark simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Upper limits on the signal cross-section at 95% CL for the gluino simplified model with varying N1 mass and decays to quarks and Z bosons in SRZ.

Upper limits on the signal cross-section at 95% CL for the gluino simplified model with decays via sleptons.

Upper limits on the signal cross-section at 95% CL for the gluino simplified model with decays to on-shell or off-shell Z bosons.

The observed and expected $E_T^{miss}$ distribution in the dimuon SR-Z. The negigible estimated contribution from Z+jets is omitted in these distributions. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in SR-loose. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in SR-loose. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the two-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the two-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the four jet b-veto SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the four-jet $b$-veto SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the two-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in two-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dielectron invariant mass distribution in the four-jet $b$-tag SR. The last bin contains the overflow.

The observed and expected dimuon invariant mass distribution in the four-jet $b$-tag SR. The last bin contains the overflow.

Expected 95% exclusion contour for the GGM model with $\tan(\beta)=1.5$ in SR-Z.

Observed 95% exclusion contour for the GGM model with $\tan(\beta)=1.5$ in SR-Z.

Expected 95% exclusion contour for the GGM model with $\tan(\beta)=30$ in SR-Z.

Observed 95% exclusion contour for the GGM model with $\tan(\beta)=30$ in SR-Z.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons in the two-jet $b$-veto SR.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons in the two-jet $b$-veto SR.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Number of generated events in the two-step gluino simplified model with sleptons.

Production cross-section in the two-step gluino simplified model with sleptons.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Number of generated events in the GGM model with $\tan(\beta)=1.5$.

Production cross-section in the GGM model with $\tan(\beta)=1.5$.

Number of generated events in the GGM model with $\tan(\beta)=30$.

Production cross-section in the GGM model with $\tan(\beta)=30$.

Total experimental uncertainty [%] for the two-step gluino simplified model with sleptons.

Total experimental uncertainty [%] for the GGM model with $\tan(\beta)=1.5$.

Total experimental uncertainty for the GGM model with $\tan(\beta)=30$.

Signal acceptance for the GGM model with $\tan(\beta)=1.5$ in the combined electron and muon SR-Z.

Signal acceptance for the GGM model with $\tan(\beta)=30$ in the combined electron and muon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the dielectron SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the dielectron SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the dimuon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the dimuon SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=1.5$ in the electron and muon combined SR-Z.

Signal efficiency for the GGM model with $\tan(\beta)=30$ in the the electron and muon combined SR-Z.

Signal acceptance for the two-step first- and second-generation squarks simplified model with sleptons in the two-jet $b$-veto SR.

Signal acceptance for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Signal efficiency for the two-step first- and second-generation squarks simplified model with sleptons in the two-jet $b$-veto SR.

Signal efficiency for the two-step gluino simplified model with sleptons in the four-jet $b$-veto SR.

Upper limits on the signal cross-section at 95% CL for the GGM model with $\tan(\beta)=1.5$.

Observed CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=1.5$.

Expected CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=1.5$.

Upper limits on the signal cross-section at 95% CL for the GGM model with $\tan(\beta)=30$.

Observed CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=30$.

Expected CL$_{\text{S}}$ for the GGM model with $\tan(\beta)=30$.

Upper limits on the signal stength at 95% CL for the two-step first- and second-generation squark simplified model with sleptons. The excluded signal strength is defined as the ratio of the observed excluded production cross section to the expected production cross section calculated at NLO+NLL.

Upper limits on the signal stength at 95% CL for the two-step gluino simplified model with sleptons. The excluded signal strength is defined as the ratio of the observed excluded production cross section to the expected production cross section calculated at NLO+NLL.

Observed CL$_{\text{S}}$ for the two-step first- and second-generation squark simplified model with sleptons.

Expected CL$_{\text{S}}$ for the two-step first- and second-generation squark simplified model with sleptons.

Observed CL$_{\text{S}}$ for the two-step gluino simplified model with sleptons.

Expected CL$_{\text{S}}$ for the two-step gluino simplified model with sleptons.

Cutflow table for three benchmark signal points in SR-Z for the $ee$ and $\mu\mu$ channels separately. The three signal points are taken from the $\tan\beta = 1.5$ grid. 100000 events were generated for each of these points. Shown here are both the unweighted number of events and the number of events normalised to 20.3 fb$^{-1}$. The total experimental systematic uncertainty on the signal yields is indicated at the last cut, along with the corresponding observed and expected $CL_S$ values.

Cutflow table for three benchmark signal points in the two jet b-veto SR of the off-$Z$ search for the $ee$ and $\mu\mu$ channels separately. Shown here are both the unweighted number of events and the number of events normalised to 20.3$^{-1}$. Except for the last two rows indicating the dilepton mass requirements, quoted event yields include all requirements from the top of the table down to the given row.

Cutflow table for three benchmark signal points in the four jet b-veto SR of the off-$Z$ search for the $ee$ and $\mu\mu$ channels separately. Shown here are both the unweighted number of events and the number of events normalised to 20.3 fb$^{-1}$. Except for the last two rows indicating the dilepton mass requirements, quoted event yields include all requirements from the top of the table down to the given row.

Observed and expected $E_T^{miss}$ distribution in soft dimuon signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution in hard single-lepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution for hard single-lepton 5-jet signal region. The last bin includes the overflow.

Observed and expected $E_{T}^{miss}$ distribution for hard single-lepton 6-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton 3-jet opposite-flavour signal region. The last bin includes the overflow.

Observed 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Expected 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Observed 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Expected 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Observed 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Expected 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Observed 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Expected 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Observed 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Expected 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Observed 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Observed 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production, where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the combination of soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Number of generated events in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Production cross-section in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Number of generated events in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV. squark decaying to quark neutralino1 with varying x.

Production cross-section in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Number of generated evens in the minimal UED model.

Production cross-section in the minimal UED model in pb.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for the soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Acceptance for soft dimuon signal region in the minimal UED model (mUED).

Efficiency for soft dimuon signal region in minimal UED model (mUED).

Acceptance for hard dilepton 3-jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Best expected signal region in the minimal UED model (mUED).

Expected CLs from hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Observed CLs from the hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Expected CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Observed CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Acceptance for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% upper limit on the visible cross-section in the minimal UED model (mUED) from the combination of the soft dimuon and hard dilepton analyses.

The effective mass distribution in VR2Z.

The ETmiss distribution in SR0noZa.

The effective mass distribution in SR0noZa.

The ETmiss distribution in SR1noZa.

The effective mass distribution in SR1noZa.

The ETmiss distribution in SR2noZa.

The effective mass distribution in SR2noZa.

The ETmiss distribution in SR0noZb.

The effective mass distribution in SR0noZb.

The ETmiss distribution in SR1noZb.

The effective mass distribution in SR1noZb.

The ETmiss distribution in SR2noZb.

The effective mass distribution in SR2noZb.

The ETmiss distribution in SR0Z.

The effective mass distribution in SR0Z.

The ETmiss distribution in SR1Z.

The effective mass distribution in SR1Z.

The ETmiss distribution in SR2Z.

The effective mass distribution in SR2Z.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the R-slepton RPC model.

Expected 95% CL exclusion contour for the R-slepton RPC model.

Observed and expected 95% CL cross-section upper limits for the Stau RPC model, together with the theoretically predicted cross-section.

Observed and expected 95% CL cross-section upper limits for the Z RPC model, together with the theoretically predicted cross-section.

Observed 95% CL exclusion contour for the GGM tan beta = 1.5 model.

Expected 95% CL exclusion contour for the GGM tan beta = 1.5 model.

Observed 95% CL exclusion contour for the GGM tan beta = 30 model.

Expected 95% CL exclusion contour for the GGM tan beta = 30 model.

Observed 95% CL cross-section upper limit for the RPV chargino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV chargino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV gluino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV gluino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Lslepton NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Lslepton NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Rslepton NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Rslepton NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV sneutrino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV sneutrino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the R-slepton RPC model, and the selection of Z-veto signal regions used to set limits in this model. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bbb' means that the regions SR0noZb, SR1noZb and SR2noZb were used, in addition to the three Z-rich regions (SR0-2Z). For the RPC stau and Z models, the ``aaa' combination of regions was used throughout.

Performance of the SR0noZa selection in the R-slepton RPC model: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR0noZb selection in the RPV chargino NLSP model with lambda_121 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR1noZa selection in the RPV sneutrino NLSP model with lambda_233 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR1noZb selection in the RPV gluino NLSP model with lambda_133 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR2noZa selection in the RPV sneutrino NLSP model with lambda_233 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR2noZb selection in the RPV gluino NLSP model with lambda_133 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR0Z selection in the GGM tan beta = 30 model: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Cut flows for a representative selection of SUSY signal points in the Z-veto signal regions. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise.

Cut flows for a representative selection of SUSY signal points in the Z-rich signal regions. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses (or the value of mu in the case of GGM models). The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR0noZa signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The RPC R-slepton model is used, with (m2,m1) = (450,300) GeV.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR1noZb signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The RPV gluino NLSP model is used, with lambda_133 != 0 and (m2,m1) = (800,400) GeV.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR0Z signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the value of mu. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The GGM tan beta = 30 model is used, with (m2,m1) = (200,1000) GeV.