Expected exclusion limits at 95% CL from Fig 7(a) for $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(a) for $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Observed exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Expected exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Observed exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Expected exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Observed exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Expected exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Observed exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Expected exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Observed exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Expected exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

N-1 distribution for $m_{\mathrm{eff}}$of observed data and expected background in SRGGWZ-H.

N-1 distribution for $E_{\mathrm{T}}^{\mathrm{miss}}$of observed data and expected background in SRGGSlep-M.

N-1 distribution for $\sum{p_{\mathrm{T}}^\mathrm{jet}}$of observed data and expected background in SRUDD-ge2b.

N-1 distribution for $m_{\mathrm{eff}}$of observed data and expected background in SRLQD.

N-1 distribution for $m_{\mathrm{eff}}$of observed data and expected background in SRSSWZ-H.

N-1 distribution for $m_{\mathrm{eff}}$of observed data and expected background in SRSSSlep-H(loose).

Signal acceptance for SRGGWZ-H signal region from Fig 10(c) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGWZ-H signal region from Fig 15(c) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGWZ-M signal region from Fig 10(b) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGWZ-M signal region from Fig 15(b) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGWZ-L signal region from Fig 10(a) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGWZ-L signal region from Fig 15(a) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGSlep-L signal region from Fig 12(a) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGSlep-L signal region from Fig 17(a) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGSlep-M signal region from Fig 12(b) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGSlep-M signal region from Fig 17(b) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGSlep-H signal region from Fig 12(c) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGSlep-H signal region from Fig 17(c) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRUDD-1b signal region from Fig 14(b) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal efficiency for SRUDD-1b signal region from Fig 19(b) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal acceptance for SRUDD-2b signal region from Fig 14(c) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal efficiency for SRUDD-2b signal region from Fig 19(c) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal acceptance for SRUDD-ge2b signal region from Fig 14(d) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal efficiency for SRUDD-ge2b signal region from Fig 19(d) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal acceptance for SRUDD-ge3b signal region from Fig 14(e) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal efficiency for SRUDD-ge3b signal region from Fig 19(e) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal acceptance for SRLQD signal region from Fig 14(a) in a SUSY scenario where direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Signal efficiency for SRLQD signal region from Fig 19(a) in a SUSY scenario where direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Signal acceptance for SRSSWZ-L signal region from Fig 11(a) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSWZ-L signal region from Fig 16(a) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSWZ-ML signal region from Fig 11(b) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSWZ-ML signal region from Fig 16(b) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSWZ-MH signal region from Fig 11(c) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSWZ-MH signal region from Fig 16(c) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSWZ-H signal region from Fig 11(d) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSWZ-H signal region from Fig 16(d) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-H signal region from Fig 13(d) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-H signal region from Fig 18(d) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-MH signal region from Fig 13(c) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-MH signal region from Fig 18(c) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-L signal region from Fig 13(a) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-L signal region from Fig 18(a) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-ML signal region from Fig 13(b) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-ML signal region from Fig 18(b) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-H(loose) signal region from Fig 13(e) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-H(loose) signal region from Fig 18(e) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGWZ-H in a susy scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1400 GeV, $m(\tilde{\chi_{1}^{0}})$ = 1000 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGWZ-M in a susy scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1400 GeV, $m(\tilde{\chi_{1}^{0}})$ = 1000 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGWZ-L in a susy scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1400 GeV, $m(\tilde{\chi_{1}^{0}})$ = 1000 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGSlep-L in a susy scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 2000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 500 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGSlep-M in a susy scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 2000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 500 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGSlep-H in a susy scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 2000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 500 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRUDD-1b in a susy scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1600 GeV, $m(\tilde{t})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRUDD-2b in a susy scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1600 GeV, $m(\tilde{t})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRUDD-ge2b in a susy scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1600 GeV, $m(\tilde{t})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRUDD-ge3b in a susy scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1600 GeV, $m(\tilde{t})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRLQD in a susy scenario where direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 2200 GeV, $m(\tilde{\chi_{1}^{0}})$ = 1870 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSWZ-L in a susy scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 800 GeV, $m(\tilde{\chi_{1}^{0}})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSWZ-ML in a susy scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 800 GeV, $m(\tilde{\chi_{1}^{0}})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSWZ-MH in a susy scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 800 GeV, $m(\tilde{\chi_{1}^{0}})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSWZ-H in a susy scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 800 GeV, $m(\tilde{\chi_{1}^{0}})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-H in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-MH in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-L in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-ML in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-H(loose) in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Cross-section upper limits at 95% CL from Fig1(a) for $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Cross-section upper limits at 95% CL from Fig1(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Cross-section upper limits at 95% CL from Fig1(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Cross-section upper limits at 95% CL from Fig1(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Cross-section upper limits at 95% CL from Fig1(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Cross-section upper limits at 95% CL from Fig1(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Truth $P_{T}^{Z}$ distribution after reweghting to data.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 13 TeV data in fb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Correction factors for an assumed angular dependence $\propto 1+\lambda_{\theta} \cos^2\theta $ in the helicity frame, for several values of the parameter $\lambda_{\theta}$. The correction factors were found to be the same (within 1% - 2%) for $J\psi$ and $\psi(2S)$ mesons, for prompt and non-prompt production mechanisms, and for the three rapidity intervals considered in this paper.

Observed excluded cross-section at 95% CL for the WZ-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from Fig 8(aux).

Expected exclusion limits at 95% CL for the WZ-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production.

Observed exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from from Fig 13(a) and from Fig 7 and Fig 10(aux).

Observed excluded cross-section at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from Fig 7(aux) and Fig 10(aux).

positive one $\sigma$ observed exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from from Fig 13(a) and from Fig 7 and Fig 10(aux).

negative one $\sigma$ observed exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from from Fig 13(a) and from Fig 7 and Fig 10(aux).

Expected exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production.

Expected exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production.

Expected exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region $SR^{bRPV}_{2l-SS}$. in a susy scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV, tan$\beta$=5. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region $SR^{bRPV}_{3l}$. in a susy scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV, tan$\beta$=5. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region $SR^{WZ}_{high-m_{T2}}$. The wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{\pm} _{1}/\tilde{\chi}^{0} _{2})$ = 150 GeV, $m(\tilde{\chi}^{0} _{1})$ = 50 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region $SR^{WZ}_{low-m_{T2}}$. The wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{\pm} _{1}/\tilde{\chi}^{0} _{2})$ = 150 GeV, $m(\tilde{\chi}^{0} _{1})$ = 50 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the low mass $SR^{RPV}_{2l1b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the medium mass $SR^{RPV}_{2l1b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the low mass $SR^{RPV}_{2l2b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the medium mass $SR^{RPV}_{2l2b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the high mass $SR^{RPV}_{2l2b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the low mass $SR^{RPV}_{2l3b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the medium mass $SR^{RPV}_{2l3b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the high mass $SR^{RPV}_{2l3b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the $SR^{Wh}_{low-m_{T2} }$. The wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Higgs bosons. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{\pm} _{1}/\tilde{\chi}^{0} _{2})$ = 300 GeV, $m(\tilde{\chi}^{0} _{1})$ = 100 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the $SR^{Wh}_{high-m_{T2} }$. The wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Higgs bosons. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{\pm} _{1}/\tilde{\chi}^{0} _{2})$ = 300 GeV, $m(\tilde{\chi}^{0} _{1})$ = 100 GeV. Only statistical uncertainties are shown.

Signal Hepdataeptance for $SR^{bRPV}_{2l-SS}$ signal region from Fig 13(a)(aux) in a SUSY scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays.

Signal Hepdataeptance for $SR^{bRPV}_{3l}$ signal region from Fig 13(b)(aux) in a SUSY scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays.

Signal acceptance for $SR^{WZ}_{high-m_{T2}}$ in a SUSY scenario where the wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons.

Signal acceptance for $SR^{WZ}_{low-m_{T2}}$ in a SUSY scenario where the wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons.

Signal acceptance for $SR^{RPV}_{2l1b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l1b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l2b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l2b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l2b}-H$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l3b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l3b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l3b}-H$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{bRPV}_{2l-SS}$ signal region in a SUSY scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays.

Signal efficiency for $SR^{bRPV}_{3l}$ signal region in a SUSY scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays.

Signal efficiency for $SR^{WZ}_{high-m_{T2}}$ in a SUSY scenario where the wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons.

Signal efficiency for $SR^{WZ}_{low-m_{T2}}$ in a SUSY scenario where the wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons.

Signal efficiency for $SR^{RPV}_{2l1b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l1b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l2b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l2b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l2b}-H$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l3b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l3b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l3b}-H$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{Wh}_{high-m_{T2} }$ signal region from Fig 11(a)(aux) in a SUSY scenario where direct production of a lightest $\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$ , decay with 100% branching ratio to a final state with a same sign light lepton (e or $\mu$) pair and two lightest neutralino1, via the on-shell emission of SM W and Higgs bosons,

Signal acceptance for $SR^{Wh}_{low-m_{T2} }$ signal region from Fig 11(b)(aux) in a SUSY scenario where direct production of a lightest $\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$ , decay with 100% branching ratio to a final state with a same sign light lepton (e or $\mu$) pair and two lightest neutralino1, via the on-shell emission of SM W and Higgs bosons,

Signal efficiency for $SR^{Wh}_{high-m_{T2} }$ signal region from Fig 15(a)(aux) in a SUSY scenario where direct production of a lightest $\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$ , decay with 100% branching ratio to a final state with a same sign light lepton (e or $\mu$) pair and two lightest neutralino1, via the on-shell emission of SM W and Higgs bosons,

Signal efficiency for $SR^{Wh}_{low-m_{T2} }$ signal region from Fig 15(b)(aux) in a SUSY scenario where direct production of a lightest $\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$ , decay with 100% branching ratio to a final state with a same sign light lepton (e or $\mu$) pair and two lightest neutralino1, via the on-shell emission of SM W and Higgs bosons,

Observed 95% X-section upper limits as a function of higgsino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{1}/\tilde{\chi}^{0}_{2}$ mass in the bilinear RPV model from Fig 14.

Observed 95% X-section upper limits as a function of higgsino $\tilde{\chi}^{0}_{1}/\tilde{\chi}^{0}_{2}$ mass in the UDD RPV model from Fig 18.

Observed 95% X-section upper limits as a function of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ mass in the WZ-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from Fig 9(aux).

N-1 distributions for $m_{T2}$ of observed data and expected background towards $SR^{WZ}_{high-m_{T2}}$ from publication's Figure 11(a) . The last bin is inclusive.

N-1 distributions for $m_{T2}$ of observed data and expected background towards $SR^{WZ}_{low-m_{T2}}$ from publication's Figure 11(b) . The last bin is inclusive.

N-1 distributions for $m_{T2}$ of observed data and expected background towards $SR^{bRPV}_{2l-SS}$ from publication's Figure 11(c) . The last bin is inclusive.

N-1 distributions for $m_{T2}$ of observed data and expected background towards $SR^{bRPV}_{3l}$ from publication's Figure 11(d) . The last bin is inclusive.

N-1 distributions for $\sum p^{b-jet}_{T}/\sum p^{jet}_{T}$ of observed data and expected background towards $SR^{RPV}_{2l1b}-L$ from publication's Figure 16(a) . The last bin is inclusive.

N-1 distributions for $\sum p^{b-jet}_{T}/\sum p^{jet}_{T}$ of observed data and expected background towards $SR^{RPV}_{2l2b}-M$ from publication's Figure 16(b) . The last bin is inclusive.

N-1 distributions for $\sum p^{b-jet}_{T}/\sum p^{jet}_{T}$ of observed data and expected background towards $SR^{RPV}_{2l3b}-H$ from publication's Figure 16(c) . The last bin is inclusive.

N-1 distribution for $E_{T}^{miss}$ in $SR^{Wh}_{high-m_{T2} }$ in ee channel

N-1 distribution for $E_{T}^{miss}$ in $SR^{Wh}_{high-m_{T2} }$ in e$\mu$ channel

N-1 distribution for $E_{T}^{miss}$ in $SR^{Wh}_{high-m_{T2} }$ in $\mu\mu$ channel

N-1 distribution for $\mathcal{S}(E_{T}^{miss})$ in $SR^{Wh}_{low-m_{T2} }$ in ee channel

N-1 distribution for $\mathcal{S}(E_{T}^{miss})$ in $SR^{Wh}_{low-m_{T2} }$ in e$\mu$ channel

N-1 distribution for $\mathcal{S}(E_{T}^{miss})$ in $SR^{Wh}_{low-m_{T2} }$ in $\mu\mu$ channel

Charged-hadron spectrum in the centrality interval 5-10% for p+Pb, divided by 〈TPPB〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 10-20% for p+Pb, divided by 〈TPPB〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 20-30% for p+Pb, divided by 〈TPPB〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 30-40% for p+Pb, divided by 〈TPPB〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 40-60% for p+Pb, divided by 〈TPPB〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 60-90% for p+Pb, divided by 〈TPPB〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 0-90% for p+Pb, divided by 〈TPPB〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron cross-section in pp collisions. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 0-5% for Pb+Pb, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Charged-hadron spectrum in the centrality interval 5-10% for Pb+Pb, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Charged-hadron spectrum in the centrality interval 10-20% for Pb+Pb, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Charged-hadron spectrum in the centrality interval 20-30% for Pb+Pb, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Charged-hadron spectrum in the centrality interval 30-40% for Pb+Pb, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Charged-hadron spectrum in the centrality interval 40-50% for Pb+Pb, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Charged-hadron spectrum in the centrality interval 50-60% for Pb+Pb, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Charged-hadron spectrum in the centrality interval 60-80% for Pb+Pb, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Charged-hadron cross-section in pp collisions. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 0-5% for Xe+Xe, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 5-10% for Xe+Xe, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 10-20% for Xe+Xe, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 20-30% for Xe+Xe, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 30-40% for Xe+Xe, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 40-50% for Xe+Xe, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 50-60% for Xe+Xe, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Charged-hadron spectrum in the centrality interval 60-80% for Xe+Xe, divided by 〈TAA〉. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-60% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Nuclear modification factor in centrality interval 5-10% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Nuclear modification factor in centrality interval 10-20% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Nuclear modification factor in centrality interval 20-30% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Nuclear modification factor in centrality interval 30-40% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Nuclear modification factor in centrality interval 40-50% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Nuclear modification factor in centrality interval 50-60% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Nuclear modification factor in centrality interval 60-80% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature. The systematic uncertainty on momentum bias is negligible at low pT; in such cases, it is omitted in the table below.

Nuclear modification factor in centrality interval 0-5% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-50% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 50-60% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-80% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-60% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-60% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-60% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-60% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-90% for p+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-50% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-50% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-50% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-50% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 50-60% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 50-60% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 50-60% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 50-60% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-80% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-80% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-80% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-80% for Pb+Pb. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 0-5% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 5-10% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 10-20% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 20-30% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 30-40% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-50% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-50% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 40-50% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 50-60% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 50-60% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 50-60% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-80% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-80% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Nuclear modification factor in centrality interval 60-80% for Xe+Xe. The systematic uncertainties are described in the section 7 of the paper. The total systematic uncertainties are determined by adding the contributions from all relevant sources in quadrature.

Measured unfolded differential cross-section as a function of the dilepton transverse momentum $p^{ll}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the the four-body transverse momentum $p^{ll\gamma\gamma}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the diphoton invariant mass $m_{\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the four-body invariant mass $m_{ll\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Expected and observed $95\%$ confidence intervals for the coupling parameters $f_{T,j}/\Lambda^{4}$ of transverse dimension-8 operators. All parameter values outside of the stated range are excluded at the chosen confidence level. No unitarity constraints are applied.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,8}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,0}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,1}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,2}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,5}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,6}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,7}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,9}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the inclusive fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{inc}}/\sigma^{\text{pred.}}_{\text{inc}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{inc}}/\sigma^{\text{pred}}_{\text{inc}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.

Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the fiducial fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{fid}}/\sigma^{\text{pred.}}_{\text{fid}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{fid}}/\sigma^{\text{pred}}_{\text{fid}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.

Ranking of the systematic uncertainties on the measured cross-section, normalised to the predicted value, in the fiducial fit to data. The impact of each nuisance parameter, $\Delta \sigma_{\text{fid}}/\sigma^{\text{pred.}}_{\text{fid}}$, is computed by comparing the nominal best-fit value of $\sigma_{\text{fid}}/\sigma^{\text{pred}}_{\text{fid}}$ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\theta$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta$ ($\pm \Delta \hat{\theta}$). The figure shows the effect of the ten most significant uncertainties.

Impact of different categories of systematic uncertainties on the fiducial and inclusive measurements. The quoted values are obtained by repeating the fit, fixing a set of nuisance parameters of the sources corresponding to the considered category, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters built by the fit.

Impact of different categories of systematic uncertainties on the fiducial and inclusive measurements. The quoted values are obtained by repeating the fit, fixing a set of nuisance parameters of the sources corresponding to the considered category, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters built by the fit.

Fiducial region definition

Fiducial region definition

The rho-parameter, i.e. the ratio of the real to imaginary part of the elastic scattering amplitude extrapolated to t=0. The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter B from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter B from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter C from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter C from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter D from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter D from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The total elastic cross section measured inside the fiducial volume. The systematic uncertainty includes experimental uncertainties.

The total elastic cross section measured inside the fiducial volume. The systematic uncertainty includes experimental uncertainties.

The total elastic cross section obtained from the fitted parameters, extrapolated to full phase space using only the nuclear amplitude.

The total elastic cross section obtained from the fitted parameters, extrapolated to full phase space using only the nuclear amplitude.

The total inelastic cross section.

The total inelastic cross section.

The ratio of elastic to total cross section.

The ratio of elastic to total cross section.

The differential elastic cross section as function of t with statistical and systematic uncertainties. The systematic uncertainties are given as signed relative change for 20 sources of experimental uncertainty associated to nuisance parameters used in the fit for the extraction of physics parameters.

The differential elastic cross section as function of t with statistical and systematic uncertainties. The systematic uncertainties are given as signed relative change for 20 sources of experimental uncertainty associated to nuisance parameters used in the fit for the extraction of physics parameters.

Statistical covariance matrix for the measurement of the differential elastic cross section as function of t.

Statistical covariance matrix for the measurement of the differential elastic cross section as function of t.

The extrapolated ($\tau > 30$ ps) average charged-particle muliplicity per unit of rapidity for ETARAP=0 as a function of the centre-of-mass energy.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicity distribution in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicity distribution in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicity distributions in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicity distributions in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

The Bose-Einstein correlation (BEC) parameter R as a function of n_ch for HMT events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter R as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter &lambda; as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 71 &le; n_ch &lt; 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 231 &le; n_ch &lt; 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13&nbsp;TeV (black circles) and 7&nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative multiplicity region 3.09 &lt; m_ch &le; 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13 &nbsp;TeV (black circles) and 7 &nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative k_T region 400 &lt; k_T &le;500 &nbsp;MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

Systematic uncertainties (in percent) in the correlation strength, &lambda;, and source radius, R, for the exponential fit of the two-particle double-ratio correlation functions, R₂(Q), for p_T &gt; 100&nbsp;MeV at &radic;s= 13&nbsp;TeV for the MB and HMT events. The choice of MC generator gives rise to asymmetric uncertainties, denoted by uparrow and downarrow. This asymmetry propagates through to the cumulative uncertainty. The columns under ‘Uncertainty range’ show the range of systematic uncertainty from the fits in the various n_ch intervals.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the average rescaled charged-particle multiplicity, m_ch, for |&eta;| &lt; 2.5 and both p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV for the minimum-bias (MB) and the high-multiplicity track (HMT) events. The parameters &gamma; and &delta; resulting from a joint fit to the MB and HMT data are presented. The total uncertainties are shown.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the pair average transverse momentum, k_T, for various functional forms and for minimum-bias (MB) and high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. The total uncertainties are shown.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Post-fit $m_{T}$ distribution in the SR 2J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Pre-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Pre-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.

Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.

Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Observed 95% CL exclusion contours for the gluino one-step variable-x

Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Expected 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Observed 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step variable-x

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Expected 95% CL exclusion contours for the squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step x = 1/2

Expected 95% CL exclusion contours for the squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step variable-x

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Upper limits on the signal cross section for simplified model squark one-step x = 1/2

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Upper limits on the signal cross section for simplified model squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step x = 1/2

Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes

Upper limits on the signal cross section for simplified model gluino one-step variable-x

Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes

Upper limits on the signal cross section for simplified model squark one-step x = 1/2

Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step variable-x

Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes

Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes

Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the TR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.

Post-fit $m_{eff}$ distribution in the WR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.

Post-fit $m_{eff}$ distribution in the TR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the WR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models