Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 and integrated over the region $|\Delta\Phi| < \Delta\Phi_{ZYAM}$ for pp data at $\sqrt{s} =$ 13 $TeV$. The associated yield as a function of $p_{T}$ for events with $N^{offline}_{trk} \geq$ 105. The $p_{T}$ value for each $p_{T}$ bin is the average $p_{T}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 for pp data at $\sqrt{s} =$ 7 $TeV$. The associated yield as a function of $p_{T}$ for events with $N^{offline}_{trk} \geq$ 110. The $p_{T}$ value for each $p_{T}$ bin is the average $p_{T}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 and integrated over the region $|\Delta\Phi| < \Delta\Phi_{ZYAM}$ for pp data at $\sqrt{s} =$ 13 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 for pp data at $\sqrt{s} =$ 7 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 pPb data at $\sqrt{s} =$ 5.02 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 PbPb data at $\sqrt{s} =$ 2.76 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Full covariance matrix of the total energy spectrum.

Full covariance matrix of the electromagnetic energy spectrum.

Full covariance matrix of the hadronic energy spectrum.

Inclusive Jet Cross Section for |rapidity| 1.5 TO 2.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.0 TO 2.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.5 TO 3.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 3.2 TO 4.7 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| < 0.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 0.5 TO 1.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 1.0 TO 1.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 1.5 TO 2.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.0 TO 2.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.5 TO 3.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 3.2 TO 4.7 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Absolute cross section at particle level.

Covariance matrix of absolute cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Normalized cross section at particle level.

Covariance matrix of normalized cross section at particle level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Absolute cross section at parton level.

Covariance matrix of absolute cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Normalized cross section at parton level.

Covariance matrix of normalized cross section at parton level.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with $+1\sigma$ theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with $-1\sigma$ theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses corresponding to a $+1\sigma$ variation of the experimental uncertainty.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses corresponding to a $-1\sigma$ variation of the experimental uncertainty.

Observed excluded region (95\% CL), shown in blue, in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane for a model combining T5tttt, gluino pair production, followed by gluino decay to an on-shell top squark, together with a model for direct top squark pair production. The top squarks decay via the two-body process $\tilde{t}\rightarrow t\tilde{\chi}^0_1$. The neutralino and top squark masses are related by the constraint $m_{\tilde{t}} = m_{\tilde{\chi}^0_1} + 175$ GeV.

Expected excluded region (95\% CL), shown in blue, in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane for a model combining T5tttt, gluino pair production, followed by gluino decay to an on-shell top squark, together with a model for direct top squark pair production. The top squarks decay via the two-body process $\tilde{t}\rightarrow t\tilde{\chi}^0_1$. The neutralino and top squark masses are related by the constraint $m_{\tilde{t}} = m_{\tilde{\chi}^0_1} + 175$ GeV.

A summary of benchmark simplified models, the most sensitive $n_{\mathrm{jet}}$ categories, and representative values for the corresponding experimental acceptance times efficiency ($\mathcal{A}\varepsilon$), the dominant systematic uncertainties, the theoretical production cross section ($\sigma_{\mathrm{theory}}$), and the expected and observed upper limits on the production cross section, expressed in terms of the signal strength parameter ($\mu$).

Summary of the mass limits obtained for the fourteen classes of simplified models. The limits indicate the strongest observed and expected (in parentheses) mass exclusions in $\tilde{g}$, $\tilde{q}$, $\tilde{b}$, $\tilde{t}$, and $\tilde{\chi}_1^0$. The quoted values have uncertainties of $\pm 25$ and $\pm 10$ GeV for models involving the pair production of, respectively, gluinos and squarks.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the observed exclusion.

Covariance matrix for the SM background estimates obtained using the simplified binning scheme, determined from a simultaneous fit to data in the control regions only (CR-only fit). The uncertainties in the background estimates are correlated in such a way that the covariance is typically positive. Small positive values, as well as the few negative values, are not shown.

Correlation matrix for the SM background estimates obtained using the simplified binning scheme, determined from a simultaneous fit to data in the control regions only (CR-only fit).

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the expected exclusion.

Observed data counts and "post-fit" background expectations based on the result of a combined fit to the signal region and multiple control regions under the SM-only hypothesis for the "monojet" event category. The rows labelled SM "pre-fit' show the background expectations when excluding the signal region from the fit. The uncertainties include statistical as well as systematic contributions.

Observed data counts and "post-fit" background expectations based on the result of a combined fit to the signal region and multiple control regions under the SM-only hypothesis for the "asymmetric" event categories. The rows labelled SM "pre-fit" show the background expectations when excluding the signal region from the fit. The uncertainties include statistical as well as systematic contributions.

Observed data counts and "post-fit" background expectations based on the result of a combined fit to the signal region and multiple control regions under the SM-only hypothesis for the "symmetric" event categories. The rows labelled SM "pre-fit" show the background expectations when excluding the signal region from the fit. The uncertainties include statistical as well as systematic contributions.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the observed exclusion.

Summary of a simplified binning scheme comprising $H_{\mathrm{T}}^{\mathrm{miss}}$ shapes for eight representative event topologies, defined in terms of requirements on $n_{\mathrm{jet}}$ both symmetric and asymmetric categories) and $n_{\mathrm{b}}$. For each topology, event yields are integrated over the full $H_{\mathrm{T}}$ range, $H_{\mathrm{T}} > 200$ GeV, and are categorised according to eight bins in $H_{\mathrm{T}}^{\mathrm{miss}}$ -- $130 < H_{\mathrm{T}}^{\mathrm{miss}} < 200$ GeV, six bins 100 GeV wide in the region $200 < H_{\mathrm{T}}^{\mathrm{miss}} < 800$ GeV, and an open final bin, $H_{\mathrm{T}}^{\mathrm{miss}} > 800$ GeV. This categorisation scheme leads to 64 bins that are exclusive, contiguous, and provide complete coverage of the signal region. The corresponding SM background estimates for these 64 bins are obtained using the nominal likelihood model. The $H_{\mathrm{T}}^{\mathrm{miss}}$ template for each topology is determined from simulation and the normalisation for each template is given by an aggregate of estimates from several ($n_{\mathrm{jet}}$, $n_{\mathrm{b}}$, $H_{\mathrm{T}}$) bins, defined according to the nominal binning scheme.

Observed data yields and "CR-only fit" SM background expectations using the simplified binning scheme, as a function of topology and $H_{\mathrm{T}}^{\mathrm{miss}}$. The SM backgrounds are determined from a simultaneous fit to data in the control regions. The data yields in the signal region are masked and excluded from the fit. The uncertainties include statistical as well as systematic contributions.

Expected ($\mu_{\mathrm{exp}}$) and observed ($\mu_{\mathrm{obs}}$) upper limits on the production cross section, expressed in terms of the signal strength parameter, obtained using both the nominal and simplified binning schema. Comparable values are obtained from the two schema for these benchmark SUSY models because the signal events typically populate bins at high values of $H_{\mathrm{T}}$ and $H_{\mathrm{T}}^{\mathrm{miss}}$ and so are at or near the limit of the search sensitivity. Larger differences in $\mu$ can be observed for models that populate the core of these distributions.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1qqqq model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{q} } }, m_{\tilde{\chi}^0_1 })$ plane for the T2qq model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1bbbb model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1tttt model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T1ttbb model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5tttt_DM175 model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{g} } }, m_{\tilde{\chi}^0_1 })$ plane for the T5ttcc model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ b } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bb model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tb model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2cc model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2tt_degen model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the expected exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2_mixed model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the $+1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the $-1\sigma $ expected exclusion due to experimental uncertainties.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the observed exclusion.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the $+1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

Upper limit on the cross section in the $(m_{ \tilde{ \mathrm{ t } } }, m_{\tilde{\chi}^0_1 })$ plane for the T2bW model. This line is the $-1\sigma $ observed exclusion due to theoretical uncertainties on the signal cross section.

95% CL upper limits on the product of the production cross section $\sigma(pp\to N_\mu)$ and the branching ratio $B(N_\mu\to \mu q\bar{q}^{\prime})$ in electron channel, compared with theoretical predictions for HCMN model calculated with CalcHEP.

The 95% CL exclusion curve in the parameters' space, obtained in the analysis of the electron channel.

The 95% CL exclusion curve in the parameters' space, obtained in the analysis of the muon channel.

Observed and expected likelihood scans $f_{\Lambda1}^{Z\gamma}\cos\phi_{\Lambda1}^{Z\gamma}$. See Section 2 of the paper for more details.