This paper presents a measurement of the triple-differential cross section for the Drell--Yan process $Z/\gamma^*\rightarrow \ell^+\ell^-$ where $\ell$ is an electron or a muon. The measurement is performed for invariant masses of the lepton pairs, $m_{\ell\ell}$, between $46$ and $200$ GeV using a sample of $20.2$ fb$^{-1}$ of $pp$ collisions data at a centre-of-mass energy of $\sqrt{s}=8$ TeV collected by the ATLAS detector at the LHC in 2012. The data are presented in bins of invariant mass, absolute dilepton rapidity, $|y_{\ell\ell}|$, and the angular variable $\cos\theta^{*}$ between the outgoing lepton and the incoming quark in the Collins--Soper frame. The measurements are performed in the range $|y_{\ell\ell}|<2.4$ in the muon channel, and extended to $|y_{\ell\ell}|<3.6$ in the electron channel. The cross sections are used to determine the $Z$ boson forward-backward asymmetry as a function of $|y_{\ell\ell}|$ and $m_{\ell\ell}$. The measurements achieve high-precision, below the percent level in the pole region, excluding the uncertainty in the integrated luminosity, and are in agreement with predictions. These precision data are sensitive to the parton distribution functions and the effective weak mixing angle.
Detailed breakdown of systematic uncertainties for the measurement in the central rapidity muon channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.
Detailed breakdown of systematic uncertainties for the measurement in the central rapidity muon channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.
Detailed breakdown of systematic uncertainties for the measurement in the central rapidity muon channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.
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