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This paper presents a search for direct electroweak gaugino or gluino pair production with a chargino nearly mass-degenerate with a stable neutralino. It is based on an integrated luminosity of 36.1 $\mathrm{fb}^{-1}$ of $pp$ collisions at $\sqrt{s} = 13$ TeV collected by the ATLAS experiment at the LHC. The final state of interest is a disappearing track accompanied by at least one jet with high transverse momentum from initial-state radiation or by four jets from the gluino decay chain. The use of short track segments reconstructed from the innermost tracking layers significantly improves the sensitivity to short chargino lifetimes. The results are found to be consistent with Standard Model predictions. Exclusion limits are set at 95% confidence level on the mass of charginos and gluinos for different chargino lifetimes. For a pure wino with a lifetime of about 0.2 ns, chargino masses up to 460 GeV are excluded. For the strong production channel, gluino masses up to 1.65 TeV are excluded assuming a chargino mass of 460 GeV and lifetime of 0.2 ns.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Within the theory of supersymmetry, the lightest neutralino is a dark matter candidate and is often assumed to be the lightest supersymmetric particle (LSP) as well. If the neutral wino or higgsino is dark matter, the upper limit of the LSP mass is determined by the observed relic density of dark matter. If the LSP is a nearly-pure neutral state of the wino or higgsino, the lightest chargino state is expected to have a significant lifetime due to a tiny mass difference between the LSP and the chargino. This article presents discovery potential of the 100 TeV future circular hadron collider (FCC) for the wino and higgsino dark matter using a disappearing-track signature. The search strategy to extend the discovery reach to the thermal limits of wino/higgsino dark matter is discussed with detailed studies on the background rate and the reference design of the FCC-hadron detector under possible running scenarios of the FCC-hadron machine. A proposal of modifying the detector layout and several ideas to improve the sensitivity further are also discussed.
One of three barrel inner-tracker layouts considered in this study; the default layout $\#$1. The contour drawn behind the layouts shows the number of chargino decays in 3 TeV wino signal events with 30 ab$^{-1}$ at a given position. The analysis considers the region $|\eta|<1$, denoted by the dotted lines.
Leading jet $p_{T}$ distributions after removing events containing isolated leptons with 30 ab$^{-1}$ at $\sqrt{s}=100$ TeV. The SM backgrounds from $W/Z$+jets and top production processes are shown as filled histograms. Also shown as dashed (dotted) line is the 3 (1) TeV wino (higgsino) signal scaled up by a factor 1000.
$E_{\text{T}}^{\text{miss}}$ distributions after removing events containing isolated leptons with 30 ab$^{-1}$ at $\sqrt{s}=100$ TeV. The SM backgrounds from $W/Z$+jets and top production processes are shown as filled histograms. Also shown as dashed (dotted) line is the 3 (1) TeV wino (higgsino) signal scaled up by a factor 1000.
$\eta$ distributions of fake tracks in minimum-bias collision events and chargino tracks in 3 TeV wino signal events. The normalization is arbitrary. The details of fake track reconstruction is described in Sect. 5.2. The fake-track distribution is shown only within the range $|\eta|<2$.
Probability of finding a fake track in an event as a function of the average number of $pp$ interactions per bunch crossing ($\left<\mu\right>$). The probabilities for the tracks reconstructed with $N_{\mathrm{layer}}^{\mathrm{hit}}=4$ (5) are shown by the open (filled) markers, and they are presented separately for the three tracker layouts, the default layout ($\#$1) in black circles, the alternative layouts of $\#$2 in magenta squares and $\#$3 in red upward triangles. The probabilities for the layout $\#$2 are shown only at $\left<\mu\right>=200$. The estimate from the mixed sample of non-diffractive and diffractive events for the default layout is shown by the blue diamond for comparison purpose.
Expected discovery significance for the wino model with 30 ab$^{-1}$ with the requirement of $N_{\mathrm{layer}}^{\mathrm{hit}}=5$. The grey (red) bands show the significance using the default (alternative) layout $\#$1 ($\#$3). The difference between the solid and hatched bands corresponds to the different pileup conditions of $\left<\mu\right>=200$ and 500. The band width corresponds to the significance variation due to the two models assumed for soft QCD processes.
Expected discovery significance for the higgsino model with 30 ab$^{-1}$ with the requirement of $N_{\mathrm{layer}}^{\mathrm{hit}}=5$. The grey (red) bands show the significance using the default (alternative) layout $\#$1 ($\#$3). The difference between the solid and hatched bands corresponds to the different pileup conditions of $\left<\mu\right>=200$ and 500. The band width corresponds to the significance variation due to the two models assumed for soft QCD processes.
Expected discovery significance for the wino model with 30 ab$^{-1}$ with the requirements of $N_{\mathrm{layer}}^{\mathrm{hit}}=5$ and a good time-fit quality. The background reduction rate with the time information is assumed to be the same for both pileup conditions. The grey (red) bands show the significance using the default (alternative) layout $\#$1 ($\#$3). The difference between the solid and hatched bands corresponds to the different pileup conditions of $\left<\mu\right>=200$ and 500. The band width corresponds to the significance variation due to the two models assumed for soft QCD processes.
Expected discovery significance for the higgsino model with 30 ab$^{-1}$ with the requirements of $N_{\mathrm{layer}}^{\mathrm{hit}}=5$ and a good time-fit quality. The background reduction rate with the time information is assumed to be the same for both pileup conditions. The grey (red) bands show the significance using the default (alternative) layout $\#$1 ($\#$3). The difference between the solid and hatched bands corresponds to the different pileup conditions of $\left<\mu\right>=200$ and 500. The band width corresponds to the significance variation due to the two models assumed for soft QCD processes.
Summary of reach for charginos using a disappearing-track signature. The FCC-hh 5$\sigma$-discovery reach assuming the alternative layout, the average number of $pp$ interactions per bunch crossing of 500, only non-diffractive soft-QCD processes and a use of the time information of the pixel detector is shown in blue. The reach for the wino scenario is obtained by extrapolating the sensitivity curve in Fig. 6. The 5$\sigma$-discovery reach and the 95% CL exclusion sensitivity are taken from [46]. The observed exclusion in the ATLAS search with 36 fb$^{-1}$ of Run 2 data [39, 47] are shown as well.
Radial distances (in mm) of the first five layers from the beam line for the three inner-tracker layouts considered in this study.
Signal acceptance for the 3 TeV wino and 1 TeV higgsino with $|\eta|<1$ for the three inner-tracker layouts. The acceptances are provided separately for the requirements of $N_{\mathrm{layer}}^{\mathrm{hit}}=4$ and 5. The alternative layout $\#$3 has significantly higher acceptance than the others because the relevant layers are located closer to the beam line, particularly for the higgsino case with $N_{\mathrm{layer}}^{\mathrm{hit}}=5$.
Signal and background yields as well as the discovery significance for the 3 TeV wino and 1 TeV higgsino with 30 ab$^{-1}$ with the requirements of $N_{\mathrm{layer}}^{\mathrm{hit}}=5$ under the pileup condition of $\left<\mu\right>=200$. The fake-track background rate is assumed to be same for both alternative layouts. The kinematic selection requirements on the leading jet $p_{T}$ and $E_{\text{T}}^{\text{miss}}$ are also given.
Signal and background yields as well as the discovery significance for the 3 TeV wino and 1 TeV higgsino with 30 ab$^{-1}$ with the requirements of $N_{\mathrm{layer}}^{\mathrm{hit}}=5$ under the pileup condition of $\left<\mu\right>=500$. The fake-track background rate is assumed to be same for both alternative layouts. The kinematic selection requirements on the leading jet $p_{T}$ and $E_{\text{T}}^{\text{miss}}$ are also given.
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