Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 1$^\text{st}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_1)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 2$^\text{nd}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 2$^\text{nd}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_2)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 3$^\text{rd}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_3)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 3$^\text{rd}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_3)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 4$^\text{th}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_4)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 4$^\text{th}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_4)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 5$^\text{th}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_5)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 5$^\text{th}$ jet $p_{\text{T}}$, $p_{\text{T}}(\text{j}_5)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 1$^\text{st}$ jet $|y|$, $|y(\text{j}_1)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 1$^\text{st}$ jet $|y|$, $|y(\text{j}_1)|$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 2$^\text{nd}$ jet $|y|$, $|y(\text{j}_2)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 2$^\text{nd}$ jet $|y|$, $|y(\text{j}_2)|$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 3$^\text{rd}$ jet $|y|$, $|y(\text{j}_3)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 3$^\text{rd}$ jet $|y|$, $|y(\text{j}_3)|$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 4$^\text{th}$ jet $|y|$, $|y(\text{j}_4)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 4$^\text{th}$ jet $|y|$, $|y(\text{j}_4)|$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 5$^\text{th}$ jet $|y|$, $|y(\text{j}_5)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the 5$^\text{th}$ jet $|y|$, $|y(\text{j}_5)|$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the Z boson $|y|$, $|y(\text{Z})|$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the Z boson $|y|$, $|y(\text{Z})|$, for events with at least one jet.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the Z boson $|y|$, $|y(\text{Z})|$ for events with at least one jet and $p_\text{T}(\text{Z}) > 150\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the Z boson $|y|$, $|y(\text{Z})|$ for events with at least one jet and $p_\text{T}(\text{Z}) > 150\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the Z boson $|y|$, $|y(\text{Z})|$ for events with at least $p_\text{T}(\text{Z}) > 300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the Z boson $|y|$, $|y(\text{Z})|$ for events with at least $p_\text{T}(\text{Z}) > 300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_1)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_1)$ for events with $p_{\text{T}}(\text{Z}) > 150\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_1)$ for events with $p_{\text{T}}(\text{Z}) > 150\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_1)$ for events with $p_{\text{T}}(\text{Z}) > 300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_1)$ for events with $p_{\text{T}}(\text{Z}) > 300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the 2$^\text{nd}$leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the 2$^\text{nd}$leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_2)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the 3$^\text{rd}$leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_3)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the 3$^\text{rd}$leading jet, $y_{\text{diff}}(\text{Z}, \text{j}_3)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the system constituted of the two leading jets, $y_{\text{diff}}(\text{Z}, \text{dijet})$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the Z boson and the system constituted of the two leading jets, $y_{\text{diff}}(\text{Z}, \text{dijet})$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the two leading jets, $y_{\text{diff}}(\text{j}_1, \text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{diff}}$ of the two leading jets, $y_{\text{diff}}(\text{j}_1, \text{j}_2)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the two leading jets, $y_{\text{sum}}(\text{j}_1, \text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the two leading jets, $y_{\text{sum}}(\text{j}_1, \text{j}_2)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_1)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_1)$ for events with $p_{\text{T}}(\text{Z}) > 150\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_1)$ for events with $p_{\text{T}}(\text{Z}) > 150\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_1)$ for events with $p_{\text{T}}(\text{Z}) > 300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_1)$ for events with $p_{\text{T}}(\text{Z}) > 300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the 2$^\text{nd}$leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the 2$^\text{nd}$leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_2)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the 3$^\text{rd}$leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_3)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the 3$^\text{rd}$leading jet, $y_{\text{sum}}(\text{Z}, \text{j}_3)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the system constituted of the two leading jets, $y_{\text{sum}}(\text{Z}, \text{dijet})$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the $y_{\text{sum}}$ of the Z boson and the system constituted of the two leading jets, $y_{\text{sum}}(\text{Z}, \text{dijet})$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least one jet, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least one jet.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least two jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least two jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least three jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least three jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least four jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least four jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least five jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of $H_\text{T}$ for events with at least five jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet for events with at least ine jet, $\Delta\Phi(\text{Z},\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet for events with at least ine jet, $\Delta\Phi(\text{Z},\text{j}_1)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet for events with at least two jets, $\Delta\Phi(\text{Z},\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet for events with at least two jets, $\Delta\Phi(\text{Z},\text{j}_1)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet for events with at least three jets, $\Delta\Phi(\text{Z},\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet for events with at least three jets, $\Delta\Phi(\text{Z},\text{j}_1)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 2$^\text{nd}$ leading jet for events with at least three jets, $\Delta\Phi(\text{Z},\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 2$^\text{nd}$ leading jet for events with at least three jets, $\Delta\Phi(\text{Z},\text{j}_1)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 3$^\text{rd}$ leading jet for events with at least three jets, $\Delta\Phi(\text{Z},\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 3$^\text{rd}$ leading jet for events with at least three jets, $\Delta\Phi(\text{Z},\text{j}_1)$.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet$\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least two jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet$\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least two jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet$\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least two jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet$\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least two jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet$\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least three jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet$\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least three jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 2$^{\text{nd}}$ leading jet$\Delta\Phi(\text{Z},\text{j}_2)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least three jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 2$^{\text{nd}}$ leading jet$\Delta\Phi(\text{Z},\text{j}_2)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least three jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 3$^{\text{rd}}$ leading jet$\Delta\Phi(\text{Z},\text{j}_3)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least three jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 3$^{\text{rd}}$ leading jet$\Delta\Phi(\text{Z},\text{j}_3)$, for events with $p_{\text{T}}(\text{Z})>150\,$GeV and at least three jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV and at least one jet, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV and at least one jet.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV and at least two jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV and at least two jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV and at least three jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV and at least three jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 2$^{\text{nd}}$ leading jet, $\Delta\Phi(\text{Z},\text{j}_2)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 2$^{\text{nd}}$ leading jet, $\Delta\Phi(\text{Z},\text{j}_2)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 3$^{\text{rd}}$ leading jet, $\Delta\Phi(\text{Z},\text{j}_3)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 3$^{\text{rd}}$ leading jet, $\Delta\Phi(\text{Z},\text{j}_3)$, for events with $p_{\text{T}}(\text{Z})>300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with at least three jets, $p_{\text{T}}(\text{Z})>150\,$GeV, and $H_{\text{T}}>300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with at least three jets, $p_{\text{T}}(\text{Z})>150\,$GeV, and $H_{\text{T}}>300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 2$^{\text{nd}}$ leading jet, $\Delta\Phi(\text{Z},\text{j}_2)$, for events with at least three jets, $p_{\text{T}}(\text{Z})>150\,$GeV, and $H_{\text{T}}>300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 2$^{\text{nd}}$ leading jet, $\Delta\Phi(\text{Z},\text{j}_2)$, for events with at least three jets, $p_{\text{T}}(\text{Z})>150\,$GeV, and $H_{\text{T}}>300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 3$^{\text{rd}}$ leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with at least three jets, $p_{\text{T}}(\text{Z})>150\,$GeV, and $H_{\text{T}}>300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the Z boson and the 3$^{\text{rd}}$ leading jet, $\Delta\Phi(\text{Z},\text{j}_1)$, for events with at least three jets, $p_{\text{T}}(\text{Z})>150\,$GeV, and $H_{\text{T}}>300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the two leading jets, $\Delta\Phi(\text{j}_1,\text{j}_2)$, for events with at least three jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the two leading jets, $\Delta\Phi(\text{j}_1,\text{j}_2)$, for events with at least three jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the two 1$^{\text{st}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the two 1$^{\text{st}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the two 2$^{\text{nd}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the two 2$^{\text{nd}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the two leading jets, $\Delta\Phi(\text{j}_1,\text{j}_2)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>150\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the two leading jets, $\Delta\Phi(\text{j}_1,\text{j}_2)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>150\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 1$^{\text{st}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>150\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 1$^{\text{st}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>150\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 2$^{\text{nd}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_2,\text{j}_3)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>150\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 2$^{\text{nd}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_2,\text{j}_3)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>150\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 1$^{\text{st}}$ and 2$^{\text{nd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_2)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 1$^{\text{st}}$ and 2$^{\text{nd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_2)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 1$^{\text{st}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 1$^{\text{st}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 2$^{\text{nd}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>300\,$GeV, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the azimuthal angle between the 2$^{\text{nd}}$ and 3$^{\text{rd}}$ leading jets, $\Delta\Phi(\text{j}_1,\text{j}_3)$, for events with at least three jets and $p_{\text{T}}(\text{Z})>300\,$GeV.

The cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the mass of the system made of the two leading jets, $m_{\text{j}_1\text{j}_1}$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production measured as a function of the mass of the system made of the two leading jets, $m_{\text{j}_1\text{j}_1}$.

The cross section for Z($\rightarrow\ell\ell$) + jets production as a function of the leading jet transverse momentum and rapidity

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production as a function of the leading jet transverse momentum and rapidity

The cross section for Z($\rightarrow\ell\ell$) + jets production as a function of the Z boson and leading jet rapidities

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production as a function of the Z boson and leading jet rapidities

The cross section for Z($\rightarrow\ell\ell$) + jets production as a function of the rapidities of the Z boson and leading jet, and of the transverse momentum of the jet for the same configuration.

Bin-to-bin correlation in the the cross section for Z($\rightarrow\ell\ell$) + jets production as a function of the rapidities of the Z boson and leading jet, and of the transverse momentum of the jet for the same configuration.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The FSR correction applied as a function of $\phi ^ * _ \eta$ for electrons.

The FSR correction applied as a function of the boson transverse momentum.

The measured differential cross-sections as a function of the boson rapidity for muons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of the boson rapidity for electrons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of $\phi ^ * _ \eta$ for muons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of $\phi ^ * _ \eta$ for electrons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of pT . The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The correlation matrix for the differential cross-section measurement as a function of Z boson rapidity, for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of the Z boson rapidity, for the dielectron final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurement as a function of $\phi ^ * _ \eta$ , for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of $\phi ^ * _ \eta$ , for the dielectron final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of boson pT , for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

Differential cross sections as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Differential cross sections as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events.

Area normalized distribution as function of Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events

Response matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events.

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation between the Wilson coefficients (in %), after the 5D fit to data.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of inclusive jet multiplicity, $N_{\text{jets}}^{\text{min}}$.

Measured cross section for Z+jets as a function of the transverse momementum of the Z boson, $p_{\text{T}}(\text{Z})$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momementum of the Z boson, $p_{\text{T}}(\text{Z})$, for events with at least one jet.

Measured cross section for Z+jets as a function of the transverse momenum of the first jet, $p_{\text{T}}(\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momenum of the first jet, $p_{\text{T}}(\text{j}_1)$.

Measured cross section for Z+jets as a function of the transverse momenum of the second jet, $p_{\text{T}}(\text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momenum of the second jet, $p_{\text{T}}(\text{j}_2)$.

Measured cross section for Z+jets as a function of the transverse momenum of the third jet, $p_{\text{T}}(\text{j}_3)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momenum of the third jet, $p_{\text{T}}(\text{j}_3)$.

Measured cross section for Z+jets as a function of the absolute rapidity of the first jet, $|y(\text{j}_1)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the absolute rapidity of the first jet, $|y(\text{j}_1)|$.

Measured cross section for Z+jets as a function of the absolute rapidity of the second jet, $|y(\text{j}_2)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the absolute rapidity of the second jet, $|y(\text{j}_2)|$.

Measured cross section for Z+jets as a function of the absolute rapidity of the third jet, $|y(\text{j}_3)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the absolute rapidity of the third jet, $|y(\text{j}_3)|$.

Measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least one jet.

Measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least two jets.

Measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the $H_{\text{T}}$ observable for event with at least three jets.

Measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least one jet.

Measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least two jets.

Measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the transverse momentum balance between the Z boson and the accompanying jets, $p_{\text{T}}^{\text{bal}}$, for events with at least three jets.

Measured cross section for Z+jets as a function of the JZB variable with no restriction on $p_{\text{T}}(\text{Z})$ and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the JZB variable with no restriction on $p_{\text{T}}(\text{Z})$.

Measured cross section for Z+jets as a function of the JZB variable for $p_{\text{T}}(\text{Z})\leq50\,$GeV) and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the JZB variable for $p_{\text{T}}(\text{Z})\leq50\,$GeV).

Measured cross section for Z+jets as a function of the JZB variable for $p_{\text{T}}(\text{Z})>50\,$GeV and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section for Z+jets as a function of the JZB variable for $p_{\text{T}}(\text{Z})>50\,$GeV.

Differential fiducial cross section (without the acceptance correction) for the DY process measured in the muon channel, as a function of $p_{\textrm{T}}$ for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential fiducial cross section (without the acceptance correction) for the DY process measured in the muon channel, as a function of $p_{\textrm{T}}$ for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential fiducial cross section (without the acceptance correction) for the DY process measured in the muon channel, as a function of $\phi^*$ for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential fiducial cross section (without the acceptance correction) for the DY process measured in the muon channel, as a function of $\phi^*$ for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Integrated fiducial cross section for the DY process measured in the muon channel. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of dimuon invariant mass. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of rapidity in the centre-of-mass frame for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of rapidity in the centre-of-mass frame for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of $p_{\textrm{T}}$ for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of $p_{\textrm{T}}$ for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of $\phi^*$ for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of $\phi^*$ for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Integrated cross section for the DY process measured in the muon channel. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Forward-backward ratios for $15<m_{\mu\mu}<60$ GeV. Quoted uncertainties are the quadratic sum of the statistical and systematic uncertainties.

Forward-backward ratios for $60<m_{\mu\mu}<120$ GeV. Quoted uncertainties are the quadratic sum of the statistical and systematic uncertainties.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of dimuon invariant mass.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of rapidity in the centre-of-mass frame for $15<m_{\mu\mu}<60$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of rapidity in the centre-of-mass frame for $60<m_{\mu\mu}<120$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $p_{\textrm{T}}$ for $15<m_{\mu\mu}<60$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $p_{\textrm{T}}$ for $60<m_{\mu\mu}<120$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $\phi^*$ for $15<m_{\mu\mu}<60$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $\phi^*$ for $60<m_{\mu\mu}<120$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of rapidity in the centre-of-mass frame, putting together low and high masses. Each bin is labeled lm_i or hm_i, where lm stands for $15<m_{\mu\mu}<60$ GeV, hm stands for $60<m_{\mu\mu}<120$ GeV, and i is the corresponding bin number in rapidity in the centre-of-mass frame. The global normalisation uncertainty of 3.5% is not included. Data from Figure [3, 4, 4].

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $p_{\textrm{T}}$, putting together low and high masses. Each bin is labeled lm_i or hm_i, where lm stands for $15<m_{\mu\mu}<60$ GeV, hm stands for $60<m_{\mu\mu}<120$ GeV, and i is the corresponding bin number in $p_{\textrm{T}}$. The global normalisation uncertainty of 3.5% is not included. Data from Figure [3, 4, 4].

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $\phi^*$, putting together low and high masses. Each bin is labeled lm_i or hm_i, where lm stands for $15<m_{\mu\mu}<60$ GeV, hm stands for $60<m_{\mu\mu}<120$ GeV, and i is the corresponding bin number in $\phi^*$. The global normalisation uncertainty of 3.5% is not included. Data from Figure [3, 4, 4].

The measured total fiducial cross sections. The values labeled 'stat.' and 'eff.' represent the statistical uncertainty and the systematic uncertainty estimated from the efficiencies, respectively. The value 'sys.' includes all remaining systematic uncertainties, with the exception of the luminosity. The 9\% uncertainty associated with the luminosity measurement is labeled as 'lumi'.

The measured total cross sections. The values labeled 'stat.' and 'eff.' represent the statistical uncertainty and the systematic uncertainty estimated from the efficiencies, respectively. The value 'sys.' includes all remaining systematic uncertainties, with the exception of the luminosity. The 9\% uncertainty associated with the luminosity measurement is labeled as 'lumi'.

Measurements for the ratio of the fiducial cross sections for production of $W^+$ and $W^-$ bosons in bins of the decay charged lepton pseudorapidity.

The measured $(W^+ + W^-)/Z$

Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Powheg based prediction for AFB in the central-central fiducial phase space, as reported in Fig 16 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Powheg based prediction for AFB in the central-fiducial fiducial phase space, as reported in Fig 17 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.