Two measurements of B0 anti-B0 mixing

The CLEO collaboration Bartelt, John E. ; Csorna, S.E. ; Egyed, Z. ; et al.
Phys.Rev.Lett. 71 (1993) 1680-1684, 1993.
Inspire Record 354226 DOI 10.17182/hepdata.47247

We have measured the B0B¯0 mixing probability, χd, using a sample of 965 000 BB¯ pairs from Υ(4S) decays. Counting dilepton events, we find χd=0.157±0.016±0.018−0.021+0.028. Using tagged B0 events, we find χd=0.149±0.023±0.019±0.010. The first (second) error is statistical (systematic). The third error reflects a ±15% uncertainty in the assumption, made in both cases, that charged and neutral B pairs contribute equally to dilepton events. We also obtain a limit on the CP impurity in the Bd0 system, ‖Re(εB0)‖<0.045 at 90% C.L.

4 data tables

No description provided.

Mixing parameter from counting dilepton events. CONST(N=MIXING PARAM) = 1/(1 - LAMBDA(C,N)) * (N(2LEPTON+) + N(2LEPTON-))/(N(LEPTON+,LEPTON-) + N(2LEPTON+) + N(2LEPTON-)). LAMBDA(C,N) is the fraction of dilepton events coming from B+B- decays, LAMBDA(C,N) = f(B+)*Br(B+)**2/(f(B+)*Br(B+)**2 + f(B0)*Br(B0)**2), where f(B+),f(B0) are the productiron fractions of the charged and neutral B's at the UPSI(4S), and Br(B+), Br(B0) are the semileptonic brancing fractions.

Mixing parameter from tagged B0 events.

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Measurement of Drell-Yan electron and muon pair differential cross-sections in anti-p p collisions at s**(1/2) = 1.8-TeV

The CDF collaboration Abe, F. ; Albrow, Michael G. ; Amidei, Dante E. ; et al.
Phys.Rev.D 49 (1994) R1-R6, 1994.
Inspire Record 355927 DOI 10.17182/hepdata.42543

We measure the Drell-Yan differential cross section d2σdMdy||y|<1 over the mass range 11<M<150 GeV/c2 using dielectron and dimuon data from p¯p collisions at a center-of-mass energy of s=1.8 TeV. Our results show the 1M3 dependence that is expected from the naive Drell-Yan model. In comparison to the predictions of recent QCD calculations we find our data favor those parton distribution functions with the largest quark contributions in the x interval 0.006 to 0.03.

3 data tables

Dielectron differential cross section.

Dimuon differential cross section.

Drell-Yan differential cross section for combined dielectron and dimuon data. Error includes both statistics and systematics.