Measurement of the Reactions $e^+ e^- \to \mu^+ \mu^-$ and $e^+ e^- \to \tau^+ \tau^-$ Between $\sqrt{s}=50$-{GeV} and 60.8-{GeV}

The VENUS collaboration Abe, K. ; Amako, K. ; Arai, Y. ; et al.
Z.Phys.C 48 (1990) 13-22, 1990.
Inspire Record 294672 DOI 10.17182/hepdata.38414

The angular distributions of the reactione+e−→μ+μ− ande+e+→τ+τ− have been measured between\(\sqrt s= 50\) and 60.8 GeV with the VENUS detector at TRISTAN. The average total cross section and the forward-backward charge asymmetry for μ-pair production are observed to be 28.3±1.4±0.8 pb and (−29.0−4.8+5.0±0.5)%, and those for τ-pair production are 27.6±1.7±1.0 pb and (−32.8−6.2+6.4±1.5)% at\(\langle \sqrt s \rangle \). These values are consistent with the predictions of the standard model of electroweak interactions.

5 data tables

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MEASUREMENTS OF CROSS-SECTIONS AND CHARGE ASYMMETRIES FOR e+ e- ---> tau+ tau- AND e+ e- ---> mu+ mu- FOR S**(1/2) FROM 52-GeV TO 57-GeV

The AMY collaboration Bacala, A. ; Malchow, R.L. ; Sparks, K. ; et al.
Phys.Lett.B 218 (1989) 112-118, 1989.
Inspire Record 265797 DOI 10.17182/hepdata.51370

Measurements of the differential cross sections for e + e − →μ + μ − and e + e − →τ + τ − at values of s from 52 to 57 GeV are reported. The forward-backward asymmetries and the total cross sections for these reactions are found to be in agreement with predictions of the standard model of the electro-weak interactions. These measurements are used to extract values of the weak coupling constant g v e g v l and g A e g A l , where l = μ or τ .

11 data tables

Axis error includes +- 5/5 contribution (Included in the quoted errors for the total cross sections. The main contribution to SYS-ERR are the systematic uncertainty in the luminosity measurement and the uncertainty in the computer modeling of the various efficiencies and backgrounds).

Axis error includes +- 5/5 contribution (Included in the quoted errors for the total cross sections. The main contribution to SYS-ERR are the systematic uncertainty in the luminosity measurement and the uncertainty in the computer modeling of the various efficiencies and backgrounds).

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