Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

The FSR correction applied as a function of $\phi ^ * _ \eta$ for electrons.

The FSR correction applied as a function of the boson transverse momentum.

The measured differential cross-sections as a function of the boson rapidity for muons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of the boson rapidity for electrons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of $\phi ^ * _ \eta$ for muons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of $\phi ^ * _ \eta$ for electrons. The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The measured differential cross-sections as a function of pT . The first uncertainty is due to the size of the dataset, the second is due to experimental systematic uncertainties, and the third is due to the luminosity.

The correlation matrix for the differential cross-section measurement as a function of Z boson rapidity, for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of the Z boson rapidity, for the dielectron final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurement as a function of $\phi ^ * _ \eta$ , for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of $\phi ^ * _ \eta$ , for the dielectron final state, excluding the luminosity uncertainty, which is fully correlated between bins.

The correlation matrix for the differential cross-section measurements as a function of boson pT , for the dimuon final state, excluding the luminosity uncertainty, which is fully correlated between bins.

Summary of the 95% C.L. upper limits on $\sigma_{ZH} BR(H\rightarrow aa \rightarrow (b\bar{b})(b\bar{b}))$ for the dilepton channel in the resolved analysis. The observed limits are shown, together with the expected limits (dotted black lines). In the case of the expected limits, one- and two-standard-deviation uncertainty bands are also displayed. The data was published in JHEP 10 (2018) 031.

Efficiency and acceptance for simulated $ZH(\rightarrow aa\rightarrow (b\bar{b})(b\bar{b}))$ samples in two signal regions (SR) of the analysis, one with two $a\to b\bar{b}$ candidates in the High Purity Category (HPC), and the other with one $a\to b\bar{b}$ candidate in the High Purity Category (HPC) and one in the Low Purity Category (LPC).

Efficiency and acceptance for simulated $ZH(\rightarrow aa\rightarrow (b\bar{b})(b\bar{b}))$ samples in two signal regions (SR) of the analysis, one with two $a\to b\bar{b}$ candidates in the High Purity Category (HPC), and the other with one $a\to b\bar{b}$ candidate in the High Purity Category (HPC) and one in the Low Purity Category (LPC).

Event yields for a simulated $ZH(\rightarrow aa\rightarrow (b\bar{b})(b\bar{b}))$ sample with $m_a = 17.5\,\text{GeV}$. The signal sample is produced with cross section equals to the standard model $pp\to ZH$, i.e. $0.88\,\text{pb}$. Cut 0 corresponds to the initial number of events. Cut 1 requires the single lepton trigger. Cut 2 requires 2 identified leptons. Cut 3 requires the Z-boson mass window. Cut 4 requires 2 reconstructed $a\to b\bar{b}$ candidates. Cut 5a requires 2 identified $a\to b\bar{b}$ candidates in the 1HPC1LPC region. Cut 6a requires the 2 $a\to b\bar{b}$ candidates in the 1HPC1LPC region to be inside the Higgs mass window. Cut 5b requires 2 identified $a\to b\bar{b}$ candidates in the 2HPC region. Cut 6b requires the 2 $a\to b\bar{b}$ candidates in the 2HPC region to be inside the Higgs mass window.

Event yields for a simulated $ZH(\rightarrow aa\rightarrow (b\bar{b})(b\bar{b}))$ sample with $m_a = 17.5\,\text{GeV}$. The signal sample is produced with cross section equals to the standard model $pp\to ZH$, i.e. $0.88\,\text{pb}$. Cut 0 corresponds to the initial number of events. Cut 1 requires the single lepton trigger. Cut 2 requires 2 identified leptons. Cut 3 requires the Z-boson mass window. Cut 4 requires 2 reconstructed $a\to b\bar{b}$ candidates. Cut 5a requires 2 identified $a\to b\bar{b}$ candidates in the 1HPC1LPC region. Cut 6a requires the 2 $a\to b\bar{b}$ candidates in the 1HPC1LPC region to be inside the Higgs mass window. Cut 5b requires 2 identified $a\to b\bar{b}$ candidates in the 2HPC region. Cut 6b requires the 2 $a\to b\bar{b}$ candidates in the 2HPC region to be inside the Higgs mass window.

Background yield table for Z+jets, $t\bar{t}$, and rare sources. Observed data yield. Signal $ZH(\rightarrow aa\rightarrow (b\bar{b})(b\bar{b}))$ yield with $m_a = 20\,\text{GeV}$. The signal sample is produced with cross section equals to the standard model $pp\to ZH$, i.e. $0.88\,\text{pb}$, with a branching ratio set to 1 for the $H \rightarrow aa$ decay, whereas the ATLAS figure attached to this entry instead uses the upper-limit branching ratio (smaller than 1). The table includes the yields in two signal regions with leptons consistent with an on-shell Z-boson decay, one with 2 $a\to b\bar{b}$ candidates in the 2HPC region and one with 2 $a\to b\bar{b}$ candidates in the 1HPC1LPC region. The table also includes the yields in four control regions, one with leptons consistent with an on-shell Z-boson decay and 2 $a\to b\bar{b}$ candidates in the Low Purity Category (LPC), and three others where the leptons are not consistent an on-shell Z-boson decay.

Background yield table for Z+jets, $t\bar{t}$, and rare sources. Observed data yield. Signal $ZH(\rightarrow aa\rightarrow (b\bar{b})(b\bar{b}))$ yield with $m_a = 20\,\text{GeV}$. The signal sample is produced with cross section equals to the standard model $pp\to ZH$, i.e. $0.88\,\text{pb}$. The table includes the yields in two signal regions with leptons consistent with an on-shell Z-boson decay, one with 2 $a\to b\bar{b}$ candidates in the 2HPC region and one with 2 $a\to b\bar{b}$ candidates in the 1HPC1LPC region. The table also includes the yields in four control regions, one with leptons consistent with an on-shell Z-boson decay and 2 $a\to b\bar{b}$ candidates in the Low Purity Category (LPC), and three others where the leptons are not consistent an on-shell Z-boson decay.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the central rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the measurement in the forward rapidity electron channel. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. Correlated systematic uncertainties with the suffix :A should be treated as additive and with the suffix :M should be treated as multiplicative. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level. 'C Dressed' represents the multiplicative correction factor to translate the cross sections to the dressed level with the cone radius of 0.1: SigmaDressed = C Dressed * SigmaBorn.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement of muon, electron central and electron central-forward channels. Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS (differential in y, Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Detailed breakdown of systematic uncertainties for the combined measurement, integerated in cos theta_CS and y (differential in Mll) Common systematic uncertainty on the luminosity measurment of 1.8% is not included. The source 'sys,uncor' represents bin-to-bin uncorrelated systematic uncertainty. The cross sections are given at the Born QED level.

Powheg based prediction for AFB in the central-central fiducial phase space, as reported in Fig 16 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Powheg based prediction for AFB in the central-fiducial fiducial phase space, as reported in Fig 17 of the paper. Powheg prediction is corrected to NNLO QCD and NLO EWK, as described in the paper. PDF uncertainties are computed using CT10 PDF set scaled to 68%.

Normalized fiducial differential cross sections of W+ boson and W- boson decaying to muon and neutrino at pre-FSR level.

Normalized fiducial differential cross sections of Z0 boson decaying to dimuon at pre-FSR level.

Normalized fiducial differential cross sections of Z0 boson decaying to dimuon at pre-FSR level.

Ratio of normalized fiducial differential cross sections of W- boson to W+ boson decaying to muons at pre-FSR level.

Ratio of normalized fiducial differential cross sections of W- boson to W+ boson decaying to muons at pre-FSR level.

Ratio of normalized fiducial differential cross section of Z0 boson to W+ boson and W- boson at pre-FSR level of muon decay channel.

Ratio of normalized fiducial differential cross section of Z0 boson to W+ boson and W- boson at pre-FSR level of muon decay channel.

Ratio of the normalized fiducial differential cross section of Z0 boson production at center-of-energy 8 TeV to Z0 boson production at center-of-energy 7 TeV decaying to dimuon for boson PT < 20 GeV.

Ratio of the normalized fiducial differential cross section of Z0 boson production at center-of-energy 8 TeV to Z0 boson production at center-of-energy 7 TeV decaying to dimuon for boson PT < 20 GeV.

Ratio of the normalized fiducial differential cross section of Z0 boson production at center-of-energy 8 TeV to Z0 boson production at center-of-energy 7 TeV decaying to dimuon for boson PT > 20 GeV.

Ratio of the normalized fiducial differential cross section of Z0 boson production at center-of-energy 8 TeV to Z0 boson production at center-of-energy 7 TeV decaying to dimuon for boson PT > 20 GeV.

Normalized fiducial differential cross sections of W+ boson and W- boson decaying to muon and neutrino at post-FSR level.

Normalized fiducial differential cross sections of Z0 boson decaying to dimuon at post-FSR level.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Combined fiducial cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined fiducial cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Combined total cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined total cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined total cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined total cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Measured fiducial cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where l = e, mu.

Measured fiducial cross-section ratio R_{W+/W-} = sigma (W+ -> l+ nu) / sigma (W- -> l- nubar) where l = e, mu.

Measured charge asymmetry in W-boson production A_{l} = ( sigma (W+ -> l+ nu) - sigma (W- -> l- nubar) ) / ( sigma (W+ -> l+ nu) + sigma (W- -> l- nubar) ) where l = e, mu.

The ratio of measured W+ cross-sections in the electron and muon decay channels R_{W+} = sigma (W+ -> e+ nu) / sigma (W+ -> mu+ nu)

The ratio of measured W- cross-sections in the electron and muon decay channels R_{W-} = sigma (W- -> e- nu) / sigma (W- -> mu- nu)

The ratio of measured W cross-sections in the electron and muon decay channels R_{W} = sigma (W -> e nu) / sigma (W -> mu nu)

The ratio of measured Z/gamma^* cross-sections in the electron and muon decay channels R_{Z/gamma^*} = sigma (Z/gamma^* -> e+ e-) / sigma (Z/gamma^* -> mu+ mu-)

Correlation coefficients among (W- -> l- nubar), (W+ -> l+ nu), (Z/gamma^* -> l+ l-) where (l = e, mu) excluding the common normalisation uncertainty due to the luminosity calibration.

Summary of the measured values of $ d\sigma / d{m}$ (pb/GeV) in the dielectron channel with the statistical ($\delta_{\text{stat}}$), experimental ($\delta_{\text{exp}}$) and theoretical ($\delta_{\text{theo}}$) uncertainties, respectively. Here, $\delta_{\text{tot}}$ is the quadratic sum of the three components.

Summary of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dimuon channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

of the measured values of fiducial $ d\sigma / d{m}$ (pb/GeV) (with no FSR correction applied) in the dielectron channel with the statistical ($\delta_{\text{stat}}$) and experimental ($\delta_{\text{exp}}$) uncertainties shown separately. Here, $\delta_{\text{tot}}$ is the quadratic sum of the two components.

Summary of the combined values of $ d\sigma / d{m}$ (pb/GeV) using the results from both the dimuon and dielectron channels. Here, $\delta_{\text{tot}}$ is the quadratic sum of the statistical, experimental and theoretical uncertainties.

Covariance matrix of the Drell-Yan differential cross section as a function of the dimuon invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the Drell-Yan differential cross section as a function of the dielectron invariant mass, measured in the full phase space, with FSR correction is applied. Luminosity uncertainty is not included in the covariance.

Covariance matrix of the differential DY cross section measured for the combination of the two channels in the full phase space.

Ratios of integrated fiducial CC and NC cross sections obtained from the combination of electron and muon channels with statistical (stat) and systematic (syst) uncertainties. The common fiducial regions are defined in Section 2.3.

Total cross sections times leptonic branching ratios obtained from the combination of electron and muon channels with statistical and systematic uncertainties, for $W^+$, $W^-$, their sum and the $Z/\gamma^*$ process measured at $\sqrt{s}=7$ TeV. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), the luminosity (lumi), and acceptance extrapolation (acc) contributions.

Ratios of total CC and NC cross sections obtained from the combination of electron and muon channels with statistical and systematic uncertainties. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), and acceptance extrapolation (acc) contributions.

The correlation coefficients of the $W^+$, $W^-$ and $Z$ fiducial cross-section measurements.

Measurement of the electron-to-muon cross-section ratios for the $W$ and $Z$ production, $R_W$ and $R_Z$. The uncertainties denote the statistical (stat) and the experimental systematic (syst) contributions.

Differential cross section for the $W^+ \to \ell^+\nu$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \ell^-\bar{\nu}$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to e^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to e^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \mu^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to \mu^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Values of $E(W[Z])$ and $A(W[Z])$ correction factors for integrated $W\to\ell\nu$ and $Z\to\ell\ell$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W[Z])$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. The $A(W[Z])$ factors, defined in Eq. (9), are used to extract a total cross section. Finally, the ratios of $A(W[Z])$ correction factors are given for four combinations of $W^+$, $W^-$ and $Z$ treating all components of the $A(W[Z])$ uncertainties as correlated between processes, which is relevant for the acceptance uncertainties on the total cross-section ratios.

Values of $E(W)$ correction factors for the differential $W\to\ell\nu$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. This only affects the bin of highest $\eta_\ell$, all other $E(W)$ factors are exactly 1 without uncertainties.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to \mu^+\mu^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential forward $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Correlation coefficients between integrated cross sections extrapolated to the total phase space, $\sigma^\mathrm{tot}_{W \to \ell\nu}$ and $\sigma^\mathrm{tot}_{Z/\gamma^* \to \ell\ell}$ for four combinations of $W^+, W^-, W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

Correlation coefficients between integrated fiducial cross sections in electron and muon channels for $W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

The differential W charge asymmetry $A_{\ell}$ as defined in Eq. (19) from the combined electron and muon channel measurements. All uncertainties are quoted in % with respect to the $A_{\ell}$ values. The statistical (stat), uncorrelated (uncor) and correlated (cor) systematic uncertainties are reported.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the integrated common fiducial cross sections using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^+ \to \ell^+\nu$ process using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^- \to \ell^-\bar{\nu}$ process$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial W charge asymmetry $A_{\ell}$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$). All predictions are corrected for leading two-loop EW contributions.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^+ \to \ell^+\nu$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^- \to \ell^-\bar{\nu}$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the integrated common fiducial cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties are negligible on these correction factors.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to e^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to e^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to \mu^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to \mu^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to \mu\mu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial forward $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\righarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for Deltaphijj in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for mjj in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for mjj in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for the jet pT in Z/gamma*(->ll)+1 jet events.

Non-perturbative corrections for the jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=2 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=3 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=4 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for HT.

Non-perturbative corrections for $H_{\text{T}}$.

Non-perturbative corrections for Deltaphijj.

Non-perturbative corrections for $\Delta\phi_{jj}$.

Non-perturbative corrections for mjj.

Non-perturbative corrections for $m_{jj}$.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet pT for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet $p_{\text{T}}$ for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of HT averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $H_{\text{T}}$ averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of Deltaphijj for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $\Delta\phi_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the mjj for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the $m_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Breakdown of systematic uncertainties in percent for the measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+mu- final state at 13TeV.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured total cross-section for ttbar events using e-mu events with b-tagged jets.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV, omitting the common normalisation uncertainty due to the luminosity calibration and beam energy.

Z-boson and ttbar production cross-section single ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both numerator and denominator. In the second column, the total cross section is used for the numerator while the fiducial (FID) cross section is used for the denominator. In the third column, the fiducial cross sections are used for both numerator and denominator. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections. The luminosity uncertainty almost entirely cancels in some of the ratio measurements.

Z-boson and ttbar production cross-section double ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both ttbar and Z processes. In the second column, the total cross section is used for ttbar while the fiducial (FID) cross section is used for Z. In the third column, the fiducial cross sections are used for both ttbar and Z. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections.

Measured fiducial cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured fiducial cross-section ratios (lepton universality) R_{W} = sigma(W+/- -> e+/- nu/nubar)/sigma (W+/- -> mu+/- nu/nubar) and R_{Z} = sigma (Z/gamma^* -> e+ e-)/sigma (Z/gamma* -> mu+ mu-), and the correlation coefficient.

Measured fiducial cross section times leptonic branching ratio for W+ production in the combined W+ -> l+ nu (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the combined W- -> l- nubar (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the combined W+ -> l+ nu (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W- production in the combined W- -> l- nubar (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured fiducial cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured fiducial cross-section ratio R_{W+/W-} = sigma (W+ -> l+ nu) / sigma (W- -> l- nubar) where (l = e, mu).

Correlation coefficients among (W- -> l- nubar), (W+ -> l+ nu), (Z/gamma^* -> l+ l-) where (l = e, mu) excluding the common normalisation uncertainty due to the luminosity calibration.

The amplitude of the transverse single-spin asymmetry for $W^{+-}$ boson production as a function of $P_T^W$, in the |$y^W$| < 1 region, measured by STAR in proton+proton collisions at $\sqrt{s}=500$ GeV with a recorded luminosity of 25 $pb^{-1}$. The average boson's rapidity value for each $P_T^W$ bin is $y^W=0.0$.

The amplitude of the transverse single-spin asymmetry for $W^{+-}$ boson production as a function of $y^W$, in the 0.5 GeV/c < $P_T^W$ < 10 GeV/c region, measured by STAR in proton+proton collisions at $\sqrt{s}=500$ GeV with a recorded luminosity of 25 $pb^{-1}$. The average boson's transverse-momentum value for each $y^W$-bin is $P_T^W=5.3$ GeV/c.

The amplitude of the transverse single-spin asymmetry for $Z^0$ boson production, measured by STAR in proton+proton collisions at $\sqrt{s}=500$ GeV with a recorded luminosity of 25 $pb^{-1}$.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Covariance matrix of total experimental uncertainties (statistical and systematic uncertainties added in quadrature) of absolute double differential fiducial cross section. The bin index is PT_i + 10*y_j.

Inclusive cross-section for $Z$ boson production in bins of PHI*. The uncertainties are statistical, systematic, beam and luminosity.

Inclusive cross-section for $Z$ boson production in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

$W^{\pm}$ to $Z$ boson cross-section ratio in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

Ratio of $W^+$ to $W^-$ cross-section in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Lepton charge asymmetry in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Ratios of $W^{\pm}$ to $Z$ boson cross-section ratios at differnent centre-of-mass energy (8 TeV to 7 TeV) in bins of muon pseudorapidity. The uncertainties are statistical and systematic.

Inclusive cross-section for $Z$ boson production in bins of muon pseudorapidity at centre-of-mass energy of 7 TeV. The uncertainties are statistical, systematic, beam and luminosity.

$W^{\pm}$ to $Z$ boson cross-section ratio in bins of muon pseudorapidity at centre-of-mass energy of 7 TeV. The uncertainties are statistical, systematic, beam and luminosity.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists bin-to-bin correlations for $W^{+}$.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists bin-to-bin correlations for $W^{-}$.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded. This table lists differential cross-section correlations between $W^{-}$ and $W^{+}$ bins.

Correlation coefficients of differential cross-section measurements as a function of $y_{Z}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of transverse momentum. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\phi^{*}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{+}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{-}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{+}}$ of the Z boson. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{-}}$ of the Z boson. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{+}}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\eta^{\mu^{-}}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+e- final state.

Measured fiducial cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for W+/- production in the combined W+ -> mu+ nu and W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> e+ nu and W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> mu+ nu and W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> l+ nu (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for W- production in the W- -> l- nubar (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final states.

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> e+ nu) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> e- nubar) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> e+/- nu/nubar) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> mu+ nu) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> mu- nubar) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> mu+/- nu/nubar) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> l+ nu) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> l- nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured lepton asymmetry from W+ -> e+ nu and W- -> e- nubar, binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> e+ nu and W- -> e- nubar.

Measured lepton asymmetry from W+ -> mu+ nu and W- -> mu- nubar, binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> mu+ nu and W- -> mu- nubar.

Measured lepton asymmetry from W+ -> l+ nu and W- -> l- nubar (l = e, mu), binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> l+ nu and W- -> l- nubar (l = e, mu).

Inclusive cross-section for $W^+$ and $W^-$ boson production in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

Ratio of $W^+$ to $W^-$ cross-section in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Lepton charge asymmetry in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Correlation coefficients of differential cross-section measurements as a function of $y_{Z}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of transverse momentum. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\phi^{*}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{\pm}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 30-45 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 45-60 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 60-120 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 120-200 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 200-1500 GeV, as measured in the combined dilepton channel.

Measured ratio of the Drell-Yan normalized differential cross sections at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel for the full phase space.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 20-30 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 30-45 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 45-60 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 60-120 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 120-200 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 200-1500 GeV.

Measured differential cross section dsigma/dET in pb/GeV given q_T < 10 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dET in pb/GeV given q_T > 50 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians given q_T < 10 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians given q_T > 50 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

The measured Z boson production cross section in pp collisions as a function of the Z boson rapidity for the dielectron decay channel.

Event centrality dependence of the $\mbox{Z}\rightarrow\mu^{+}\mu^{-}$ yields per MB event in PbPb collisions, divided by the expected average nuclear overlap function, $T_{\rm AA}$. On the horizontal axis, event centrality is depicted as the average number of participating nucleons, $N_{\rm part}$.

Event centrality dependence of the $\mbox{Z}\rightarrow e^{+}e^{-}$ yields per MB event in PbPb collisions, divided by the expected average nuclear overlap function, $T_{\rm AA}$. On the horizontal axis, event centrality is depicted as the average number of participating nucleons, $N_{\rm part}$.

The measured Z boson yields per MB event in PbPb collisions as a function of the Z boson $p_{\rm T}$ for the dimuon decay channel.

The measured Z boson yields per MB event in PbPb collisions as a function of the Z boson $p_{\rm T}$ for the dielectron decay channel.

The measured Z boson yields per MB event in PbPb collisions as a function of the Z boson rapidity for the dimuon decay channel.

The measured Z boson yields per MB event in PbPb collisions as a function of the Z boson rapidity for the dielectron decay channel.

The measured Z boson yields per MB event in PbPb collisions as a function of the Z boson rapidity for the combined leptonic decay channel.

The measured Z boson yields per MB event in PbPb collisions as a function of the Z boson $p_{\rm T}$ for the combined leptonic decay channel.

Event centrality dependence of the $\mbox{Z}\rightarrow l^{+}l^{-}$ yields per MB event in PbPb collisions, divided by the expected average nuclear overlap function, $T_{\rm AA}$. On the horizontal axis, event centrality is depicted as the average number of participating nucleons, $N_{\rm part}$.

The measured Z boson production cross section in pp collisions as a function of the Z boson rapidity for the combined leptonic decay channel.

The measured Z boson production cross section in pp collisions as a function of the Z boson pT for the combined leptonic decay channel in |y|<1.44.

The measured PHI* distributions for the dimuon events corrected back to the born level. The distributions are normalised to unity inidividually for each abs(yrap) bin and channel.

The measured PHI* distributions for the dimuon events corrected back to the dress level. The distributions are normalised to unity inidividually for each abs(yrap) bin and channel.

The measured PHI* distributions for the dimuon events corrected back to the bare level. The distributions are normalised to unity inidividually for each abs(yrap) bin and channel.

The combined normalised differential PHI* distributions at the Born level in the different rapidity ranges.