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THE DEPENDENCE OF CHARACTERISTICS OF pi+- MESONS PRODUCED IN pi- C INTERACTIONS AT 40-GeV/c ON TOTAL ENERGY IN THE CMS AND QCD OF SEMIHARD PROCESS

Baatar, Ts. ; Ivanovskaya, I.A. ; Serdamba, L. ; et al.
JINR-P1-88-469, 1988.
Inspire Record 267040 DOI 10.17182/hepdata.38869

None

3 data tables
Table 1

THE MULTIPLICITY OF CHARGED PIONS HAS BEEN FITTED BY THE FORMULA: MULT(PI+-)=CONST(Q=1)+CONST(Q=2)*EXP(+SLOPE*2*SQRT(LN(S))), WHERE S IS THE TOTAL ENERGY SQUERED OF THE SYSTEM PROJECTILE - PARTICIPATOR AND IS DEFINED AS 2*E(P=1)*(TARGET MASS), WHERE TARGET MASS HAS BEEN OBTAINED AS A SUM OF (E-PL) OVER SECONDARY PARTICLES.

Table 2

THE AVERAGE PT OF CHARGED PIONS HAS BEEN FITTED BY THE FORMULA: MEAN(N=PT)=CONST(Q=1)+CONST(Q=2)*EXP(SLOPE*SQRT(LN(S))), WHERE S IS THE TOTAL ENERGY SQUERED OF THE SYSTEM PROJECTILE - PARTICIPATOR AND IS DEFINED AS 2*E(P=1)*(TARGET MASS), WHERE TARGET MASS HAS BEEN OBTAINED AS A SUM OF (E-PL) OVER SECONDARY PARTICLES.

Table 3

THE AVERAGE PT**2 OF CHARGED PIONS HAS BEEN FITTED BY THE FORMULA: MEAN(N=PT**2)=CONST(Q=1)+CONST(Q=2)*EXP(SLOPE*SQRT(LN(S))), WHERE S IS THE TOTAL ENERGY SQUERED OF THE SYSTEM PROJECTILE - PARTICIPATOR AND IS DEFINED AS 2*E(P=1)*(TARGET MASS), WHERE TARGET MASS HAS BEEN OBTAINED AS A SUM OF (E-PL) OVER SECONDARY PARTICLES.