Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

SM background observation/prediction in the WH signal region

SM background prediction vs. observation in the W signal region

SM background observation/prediction in the W signal region

SM background prediction vs. observation in the H signal region

SM background observation/prediction in the H signal region

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a Z boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a H boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for mass-degenerate higgsino-like$\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_3$ and $\widetilde{\chi}^0_2$ $\widetilde{\chi}^0_3$ as functions of the NLSP and LSP masses.

Efficiency of bb-tagger for H(bb), Z(bb) and Z(cc) decays.

Efficiency of W- and V-tagger for W(qq) and Z(qq) decays.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the HSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WHSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the HSR region.

Covariance matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

Correlation matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

Left pannel. The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 2.3%) is not graphically represented. The blue line represents the average for $p_T > 18$ GeV. For comparison, the LHCb measurement [10.1103/PhysRevLett.124.122002] is also shown. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (2.3%)

Left pannel. The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 2.3%) is not graphically represented. The blue line represents the average for $p_T > 18$ GeV. For comparison, the LHCb measurement [10.1103/PhysRevLett.124.122002] is also shown. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (2.3%)

Left pannel. The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 2.3%) is not graphically represented. The blue line represents the average for $p_T > 18$ GeV. For comparison, the LHCb measurement [10.1103/PhysRevLett.124.122002] is also shown. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (2.3%)

Right pannel. The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 2.3%) is not graphically represented. The blue line represents the average for $p_T > 18$ GeV. For comparison, the LHCb measurement [10.1103/PhysRevLett.124.122002] is also shown. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (2.3%)

Right pannel. The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 2.3%) is not graphically represented. The blue line represents the average for $p_T > 18$ GeV. For comparison, the LHCb measurement [10.1103/PhysRevLett.124.122002] is also shown. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (2.3%)

Right pannel. The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 2.3%) is not graphically represented. The blue line represents the average for $p_T > 18$ GeV. For comparison, the LHCb measurement [10.1103/PhysRevLett.124.122002] is also shown. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (2.3%)

Left panel.The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 4.9\%) is not graphically represented. The blue line represents the average of all the points. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (4.9%)

Left panel.The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 5.7%) is not graphically represented. The blue line represents the average of all the points. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (5.7%)

Left panel.The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 5.7%) is not graphically represented. The blue line represents the average of all the points. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (5.7%)

Right panel.The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 4.9\%) is not graphically represented. The blue line represents the average of all the points. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (4.9%)

Right panel.The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 5.7%) is not graphically represented. The blue line represents the average of all the points. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (5.7%)

Right panel.The vertical bars (boxes) represent the statistical (bin-to-bin systematic) uncertainties, while the horizontal bars give the bin widths. The global uncertainty (of 5.7%) is not graphically represented. The blue line represents the average of all the points. $ 12 < \mathrm{B} \, p_T < 70$ GeV and $ 0 < |y| < 2.4 $. Global uncertanties are not included in the table (5.7%)

The distributions of the transfer factor ($\alpha$) versus $m_T$ in the HP VBF category is shown. The last bin corresponds to the value obtained by integrating events above the penultimate bin.

The distributions of the transfer factor ($\alpha$) versus $m_T$ in the HP ggF/DY category is shown. The last bin corresponds to the value obtained by integrating events above the penultimate bin.

The distributions of the transfer factor ($\alpha$) versus $m_T$ in the LP VBF category is shown. The last bin corresponds to the value obtained by integrating events above the penultimate bin.

The distributions of the transfer factor ($\alpha$) versus $m_T$ in the LP ggF/DY category is shown. The last bin corresponds to the value obtained by integrating events above the penultimate bin.

Distributions of mT for high-purity ggF/DY CR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for high-purity VBF CR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for low-purity ggF/DY CR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for low-purity VBF CR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for high-purity ggF/DY SR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for high-purity VBF SR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for low-purity ggF/DY SR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Distributions of mT for low-purity VBF SR events after performing background-only fits. The last bin corresponds to the yields integrated above the penultimate bin. Both the ggF and VBF-produced 1 TeV graviton signals (normalized to 10 fb) are shown in the plot. Nonresonant background corresponds to the Z+jets and W+jets events. Resonant background corresponds to the ttbar, single top, and di/tri-boson events.

Expected and observed 95% CL upper limits on the product of the radion (R) production (gluon-gluon fusion) cross section and the R -> ZZ branching fraction versus the radion mass.

Expected and observed 95% CL upper limits on the product of the radion (R) production (vector boson fusion) cross section and the R -> ZZ branching fraction versus the radion mass.

Expected and observed 95% CL upper limits on the product of the W' (W') production (Drell-Yan) cross section and the W' -> WZ branching fraction versus the W' mass.

Expected and observed 95% CL upper limits on the product of the W' (W') production (vector boson fusion) cross section and the W' -> WZ branching fraction versus the W' mass.

Expected and observed 95% CL upper limits on the product of the graviton (G) production (gluon-gluon fusion) cross section and the G -> ZZ branching fraction versus the graviton mass.

Expected and observed 95% CL upper limits on the product of the graviton (G) production (vector boson fusion) cross section and the G -> ZZ branching fraction versus the graviton mass.

Correlated dihadron yield, per radian per unit of pseudorapidity, as a function of $\Delta\phi$ for -4.5 < $\Delta\eta$ < -2 in d+Au collisions, for high ZDC-Au activity data. Both the trigger and associated particles have 1 < $p_T$ < 3 GeV/c.

Correlated dihadron yield, per radian per unit of pseudorapidity, as a function of $\Delta\phi$ for 2 < $\Delta\eta$ < 4.5 in d+Au collisions, for low ZDC-Au activity data. Both the trigger and associated particles have 1 < $p_T$ < 3 GeV/c.

Correlated dihadron yield, per radian per unit of pseudorapidity, as a function of $\Delta\phi$ for 2 < $\Delta\eta$ < 4.5 in d+Au collisions, for high ZDC-Au activity data. Both the trigger and associated particles have 1 < $p_T$ < 3 GeV/c.

The $\Delta\eta$ dependence of the near-side (|$\Delta\phi$| < $\pi/3$) correlated yield. Positive(negative) $\eta$ corresponds to d(Au)-going direction. Only high ZDC-Au activity data are shown.

The $\Delta\eta$ dependence of the away-side (|$\Delta\phi - \pi$| < $\pi/3$) correlated yield. Positive(negative) $\eta$ corresponds to d(Au)-going direction. Only high ZDC-Au activity data are shown.

The $\Delta\eta$ dependence of the ratio of the near- to away-side correlated yields in d+Au collisions. Positive(negative) $\eta$ corresponds to d(Au)-going direction. Only high ZDC-Au activity data are shown.

The $\Delta\eta$ dependence of the second harmonic Fourier coefficient, V2, in low ZDC-Au activity d+Au collisions.

The $\Delta\eta$ dependence of the second harmonic Fourier coefficient, V2, in high ZDC-Au activity d+Au collisions.

Fourier coefficient V1 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by FTPC-Au. Trigger particles are from TPC, and associated particles from TPC. Systematic uncertainties are estimated to be 10% on V1. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V1 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC. Trigger particles are from TPC, and associated particles from FTPC-Au. Systematic uncertainties are estimated to be 10% on V1. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V1 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC. Trigger particles are from TPC, and associated particles from FTPC-d. Systematic uncertainties are estimated to be 10% on V1. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V1 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC-Au. Trigger particles are from TPC, and associated particles from TPC. Systematic uncertainties are estimated to be 10% on V1. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V2 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by FTPC-Au. Trigger particles are from TPC, and associated particles from TPC. Systematic uncertainties are estimated to be 10% on V2. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V2 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC-Au. Trigger particles are from TPC, and associated particles from FTPC-Au. Systematic uncertainties are estimated to be 10% on V2. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V2 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC-Au. Trigger particles are from TPC, and associated particles from FTPC-d. Systematic uncertainties are estimated to be 10% on V2. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V2 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC-Au. Trigger particles are from TPC, and associated particles from TPC. Systematic uncertainties are estimated to be 10% on V2. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V3 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selections is by FTPC-Au. Trigger particles are from TPC, and associated particles from TPC. Systematic uncertainties are estimated to be smaller than statistical errors for V3. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V3 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC-Au. Trigger particles are from TPC, and associated particles from FTPC-Au. Systematic uncertainties are estimated to be smaller than statistical errors for V3. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V3 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC-Au. Trigger particles are from TPC, and associated particles from FTPC-d. Systematic uncertainties are estimated to be smaller than statistical errors for V3. Errors shown are the quadratic sum of statistical and systematic errors.

Fourier coefficient V3 versus the measured mid-rapidity charged particle $dN_{ch}/d\eta$. Event activity selection is by ZDC-Au. Trigger particles are from TPC, and associated particles from TPC. Systematic uncertainties are estimated to be smaller than statistical errors for V3. Errors shown are the quadratic sum of statistical and systematic errors.

The acceptance-corrected excess dielectron mass spectra, normalized to the charged particle multiplicity at mid-rapidity dNch/dy, in Au+Au collisions at $\sqrt{s_{NN}}$ = 19.6 GeV. The dNch/dy values in Au+Au collisions at $\sqrt{s_{NN}}$ = 19.6 GeV are from Ref. [38]. The normalization uncertainty from the STAR measured dN/dy is about 10%, which is not shown in the table.

The acceptance-corrected excess dielectron mass spectra, normalized to the charged particle multiplicity at mid-rapidity dNch/dy, in Au+Au collisions at $\sqrt{s_{NN}}$ = 200 GeV. The dNch/dy values in Au+Au collisions at $\sqrt{s_{NN}}$ = 200 GeV are from Ref. [39]. The normalization uncertainty from the STAR measured dN/dy is about 10%, which is not shown in the table.

Integrated yields of the normalized dilepton excesses for 0.4 < $M^{ll}$ < 0.75 GeV/c$^2$ as a function of dNch/dy. From top to bottom: 0-80% Au+Au collisions at $\sqrt{s_{NN}}$ = 19.6 GeV, then 0-10%, 10-40%, 40-80% and 0-80% Au+Au collisions at $\sqrt{s_{NN}}$ = 200 GeV.

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ks(pTs) = N(Omega+Anti-Omega)_(pT=3pTs)/2N(phi)_(pT=2pTs) N is the invariant yield.

ks(pTs) = N(Omega+Anti-Omega)_(pT=3pTs)/2N(phi)_(pT=2pTs) N is the invariant yield.

ks(pTs) = N(Omega+Anti-Omega)_(pT=3pTs)/2N(phi)_(pT=2pTs) N is the invariant yield.

ks(pTs) = N(Omega+Anti-Omega)_(pT=3pTs)/2N(phi)_(pT=2pTs) N is the invariant yield.

ks(pTs) = N(Omega+Anti-Omega)_(pT=3pTs)/2N(phi)_(pT=2pTs) N is the invariant yield.

ks(pTs) = N(Omega+Anti-Omega)_(pT=3pTs)/2N(phi)_(pT=2pTs) N is the invariant yield.

Forward-backward asymmetry, $N_{\ell}(+\eta_{\textrm{lab}})/ N_{\ell}(-\eta_{\textrm{lab}})$, for the negative leptons.

Forward-backward asymmetry, $N_{\ell}(+\eta_{\textrm{lab}})/ N_{\ell}(-\eta_{\textrm{lab}})$, for the positive leptons.

Forward-backward asymmetry, $N_{\ell}(+\eta_{\textrm{lab}})/ N_{\ell}(-\eta_{\textrm{lab}})$, for the charged-summed W bosons, as a function of the lepton pseudorapidity.