Measured unfolded differential cross-section as a function of the dilepton transverse momentum $p^{ll}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the the four-body transverse momentum $p^{ll\gamma\gamma}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the diphoton invariant mass $m_{\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the four-body invariant mass $m_{ll\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Expected and observed $95\%$ confidence intervals for the coupling parameters $f_{T,j}/\Lambda^{4}$ of transverse dimension-8 operators. All parameter values outside of the stated range are excluded at the chosen confidence level. No unitarity constraints are applied.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,8}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,0}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,1}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,2}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,5}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,6}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,7}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,9}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

List of relative uncertainties in the measured cross sections of the $t\bar{t}Z$ and $t\bar{t}W$ processes from the fit, grouped in categories. All uncertainties are symmetrized. The sum in quadrature may not be equal to the total due to correlations between uncertainties introduced by the fit.

The expected and observed 68% and 95% confidence intervals, which include the value 0, for $\mathcal{C}_{i}/\Lambda^{2}$ for the EFT coefficients $\mathcal{C}_{\phi Q}^{(3)}$, $\mathcal{C}_{\phi t}$, $\mathcal{C}_{tB}$ and $\mathcal{C}_{tW}$. The intervals for $\mathcal{C}_{\phi Q}^{(3)}$ are derived setting $\mathcal{C}_{\phi Q}^{(1)}$ to zero; the measurement is sensitive to the difference $\mathcal{C}_{\phi Q}^{(3)}-\mathcal{C}_{\phi Q}^{(1)}$. All results are given in units of 1/TeV$^{2}$. Limits from fits for the EFT coefficients with only the linear term are also shown.

Expected 95% CL exclusion contour for the Gbb signal.

Observed 95% CL exclusion contour for the Gbb signal.

Expected 95% CL exclusion contour for the Gtt combination.

Observed 95% CL exclusion contour for the Gtt combination.

Acceptances for the Gbb model in SR-Gbb-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptance times efficiency for the Gbb model in SR-Gbb-A.

Acceptance times efficiency for the Gbb model in SR-Gbb-B.

Acceptance times efficiency for the Gbb model in SR-Gbb-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-B.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-B.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gbb model.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 0-lepton channel.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 1-lepton channel.

Combination of two 0-lepton and 1-lepton signal regions yielding the best expected sensitivity for each point of the parameter space in the Gtt model.

Comparison of data with estimated backgrounds in the $\tilde{E}_\text{T}^\text{miss}$ distribution with the TZCR1 event selection except for the requirement on $\tilde{E}_\text{T}^\text{miss}$. The variables $\tilde{E}_\text{T}^\text{miss}$ and $\tilde{m}_\text{T}$ are constructed in the same way as $E_\text{T}^\text{miss}$ and $m_\text{T}$ but treating the leading photon transverse momentum as invisible. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Comparison of data with estimated backgrounds in the $\tilde{m}_\text{T}$ distribution with the TZCR1 event selection except for the requirement on $\tilde{m}_\text{T}$. The variables $\tilde{E}_\text{T}^\text{miss}$ and $\tilde{m}_\text{T}$ are constructed in the same way as $E_\text{T}^\text{miss}$ and $m_\text{T}$ but treating the leading photon transverse momentum as invisible. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Comparison of the observed data ($n_\text{obs}$) with the predicted background ($n_\text{exp}$) in the validation and signal regions. The background predictions are obtained using the background-only fit configuration. The bottom panel shows the significance of the difference between data and predicted background, where the significance is based on the total uncertainty ($\sigma_\text{tot}$).

Jet multiplicity distributions for events where exactly two signal leptons are selected. No correction factors are included in the background normalizations. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

Jet multiplicity distributions for events where exactly one lepton plus one $\tau$ candidate are selected. No correction factors are included in the background normalizations. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin includes overflow.

The $E_\text{T}^\text{miss}$ distribution in SR1. In the plot, the full event selection in the corresponding signal region is applied, except for the requirement on $E_\text{T}^\text{miss}$. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin contains the overflow. Benchmark signal models are overlaid for comparison. The benchmark models are specified by the gluino and stop masses, given in TeV in the table.

The $m_\text{T}$ distribution in SR1. In the plot, the full event selection in the corresponding signal region is applied, except for the requirement on $m_\text{T}$. The predicted backgrounds are scaled with normalization factors. The uncertainty band includes statistical and all experimental systematic uncertainties. The last bin contains the overflow. Benchmark signal models are overlaid for comparison. The benchmark models are specified by the gluino and stop masses, given in TeV in the table.

Expected (black dashed) 95% excluded regions in the plane of $m_{\tilde{g}}$ versus $m_{\tilde{t}_1}$ for gluino-mediated stop production.

Observed (red solid) 95% excluded regions in the plane of $m_{\tilde{g}}$ versus $m_{\tilde{t}_1}$ for gluino-mediated stop production.

Expected (black dashed) 95% excluded regions in the plane of $m_{\tilde{t}_1}$ versus $m_{\tilde{\chi}_1^0}$ for direct stop production.

Observed (red solid) 95% excluded regions in the plane of $m_{\tilde{t}_1}$ versus $m_{\tilde{\chi}_1^0}$ for direct stop production.

The expected upper limits on $T$ quark pair production times the squared branching ratio for $T \rightarrow tZ$ as a function of the $T$ quark mass.

The observed upper limits on $T$ quark pair production times the squared branching ratio for $T \rightarrow tZ$ as a function of the $T$ quark mass.

The expected limits on $T$ quarks as a function of the branching ratios $B\left(T \rightarrow bW\right)$ and $B\left(T \rightarrow tH\right)$ for a $T$ quark with a mass of 800 GeV. The $T$ is assumed to decay in three possible ways: $T \to tZ$, $T \to tH$, and $T \to bW$.

The observed limits on $T$ quarks as a function of the branching ratios $B\left(T \rightarrow bW\right)$ and $B\left(T \rightarrow tH\right)$ for a $T$ quark with a mass of 800 GeV. The $T$ is assumed to decay in three possible ways: $T \to tZ$, $T \to tH$, and $T \to bW$.

The $m_\text{T}$ distribution in the WVR2-tail validation region which has the same preselection and jet $p_\text{T}$ requirements as SR2.

The $am_\text{T2}$ distribution in the WVR2-tail validation region which has the same preselection and jet $p_\text{T}$ requirements as SR2.

Large-radius jet mass ($R=1.2$), decomposed into the number of small-radius jet constituents. The lower panel shows the ratio of the total data to the total prediction (summed over all jet multiplicities). Events are required to have one lepton, four jets with $p_\text{T}>80,50,40,40$ GeV, at least one $b$-tagged jet, $E_\text{T}^\text{miss}>200$ GeV, and $m_\text{T}>30$ GeV.

Distribution of $m_\text{T2}^\tau$ in data for a selection enriched in $t\bar{t}$ events with one hadronically decaying $\tau$. Events that have no hadronic $\tau$ candidate (that passes the Loose identification criteria, as well as other requirements) are not shown in the plot.

Upper limits on the model cross-section in units of pb for the gluino-mediated stop models.

Upper limits on the model cross-section in units of pb for the models with direct stop pair production.

Illustration of the best expected signal region per signal grid point for the gluino-mediated stop models. This mapping is used for the final combined exclusion limits.

Illustration of the best expected signal region per signal grid point for models with direct stop pair production. This mapping is used for the final combined exclusion limits.

Expected $CL_s$ values for the gluino-mediated stop models.

Observed $CL_s$ values for the gluino-mediated stop models.

Expected $CL_s$ values for the direct stop pair production models.

Observed $CL_s$ values for the direct stop pair production models.

Expected limit using SR1 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR1 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR1 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR1 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR1 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR1 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Expected limit using SR2 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR2 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR2 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR2 for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR2 for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR2 for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production and an unpolarized stop (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Expected limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production and an unpolarized stop (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1=\tilde{t}_L$ (and bino LSP).

Observed limit using SR1+SR2 (best expected) for models with direct stop pair production with $\tilde{t}_1\sim\tilde{t}_R$ (and bino LSP).

Acceptance for SR1 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR1 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR2 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR2 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR3 in the gluino-mediated stop models. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Acceptance for SR3 in the direct stop pair production. The acceptance is defined as the fraction of signal events that pass the analysis selection performed on generator-level objects, therefore emulating an ideal detector with perfect particle identification and no measurement resolution effects.

Efficiency for SR1 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR1 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR2 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR2 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR3 in the gluino-mediated stop models. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Efficiency for SR3 in the direct stop pair production. The efficiency is the ratio between the expected signal rate calculated with simulated data passing all the reconstruction level cuts applied to reconstructed objects, and the signal rate for an ideal detector (with perfect particle identification and no measurement resolution effects).

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Cross-section upper limit in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA250.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA250.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA350.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA350.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA450.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRA450.

Expected CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Expected exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRB.

Observed exclusion limit at 95% CL in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for signal region SRB.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the best expected signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA250 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA350 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRA450 signal region.

Observed CLs values in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the SRB signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the best expected signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA250 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA350 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA450 signal region.

Signal efficiency (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRB signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the best expected signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA250 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA350 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRA450 signal region.

Signal acceptance (in %) in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane for the sbottom pair production scenario, for the SRB signal region.

Total experimental systematic uncertainty in percent on the signal efficiency times acceptance in the $m(\tilde b_1)$-$m(\tilde\chi^0_1)$ plane. The best expected signal region selection is used per point.

The distribution of the missing transverse momentum is shown in soft-lepton 2-jet W+jets control regions after normalising the ttbar and W+jets background processes in the simultaneous fit.

Expected background yields as obtained in the background-only fits in all hard-lepton and soft-lepton validation together with observed data are given. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties.

Expected background yields as obtained in the background-only fits in all hard-lepton and soft-lepton signal together with observed data are given. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties.

Distributions of mt for the hard-lepton 4-jet low-x signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met/meff for the 4-jet high-x signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of mt for the hard-lepton 5-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of mt for the hard-lepton 6-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met for the soft-lepton 2-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

Distributions of met for the soft-lepton 5-jet signal region. The requirement on the variable plotted is removed from the definitions of the signal regions, where the arrow indicates the position of the cut in the signal region. The lower panels of the plots show the ratio of the observed data to the total background prediction as derived in the background-only fit. The uncertainty bands plotted include all statistical and systematic uncertainties as discussed in Section 7. The component `Others' is the sum of Z+jets and ttbar+V. The last bin includes the overflow.

The observed combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The yellow band ($+ 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The yellow band ($- 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The observed combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The yellow band ($+ 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The yellow band ($- 1 \sigma$) of the combined 95% CL exclusion limits in the the gluino simplified models using for each model point the signal region with the best expected sensitivity. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$. The yellow band represents the $\pm 1 \sigma$ variation of the median expected limit due to the experimental and theoretical uncertainties.

The observed limits for the soft-lepton 2-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the soft-lepton 2-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The expected limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ models.

The observed limits for the soft-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the soft-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 4-jet low-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 4-jet high-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 4-jet high-x signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 5-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The observed limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

The expected limits for the hard-lepton 6-jet signal region. The limits are presented in the (gluino, x) plane for the chargino = 60 GeV models where $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Number of generated events in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Number of generated events in the (gluino, x) plane for the chargino = 60 GeV models.

Production cross-section in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Production cross-section in the (gluino, x) plane for the chargino = 60 GeV models.

Acceptance times efficiency obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

Acceptance times efficiency in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

Acceptance times efficiency obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

Acceptance times efficiency in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet low-x).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 4-jet high-x).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (hard-lepton 6-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$ (soft-lepton 2-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

The observed CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet low-x).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 4-jet high-x).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 5-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (hard-lepton 6-jet).

The expected CLs values as obtained in the different signal regions in the (gluino, x) plane for the chargino = 60 GeV models (soft-lepton 5-jet).

The signal region yielding in the best expected limit is indicated for every signal point used in the the gluino simplified models for the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

The signal region yielding in the best expected limit is indicated for every signal point used in the the gluino simplified models for the (gluino, x) mass plane where for the chargino = 60 GeV and $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Model-dependent 95% CL upper limits on the visible cross-section in addition to the observed and expected exclusion limits for the (gluino, chargino) mass plane for the scenario where the mass of the chargino is fixed to $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1)) = 1/2$.

Model-dependent 95% CL upper limits on the visible cross-section in addition to the observed and expected exclusion limits for the (gluino, x) mass plane where for the chargino = 60 GeV and $x=(m(\tilde\chi^\pm_1)-m(\tilde\chi^0_1))/(m(\tilde g) - m(\tilde\chi^0_1))$.

Simulated background event samples: the corresponding generator, parton shower, cross-section normalisation, PDF set and underlying-event tune are shown.

Overview of the selection criteria for the soft-lepton signal regions. The symbol $p_{T}^{l}$ refers to signal leptons.

Overview of the selection criteria for the hard-lepton signal regions. The symbol $p_{T}^{l}$ refers to signal leptons.

Background fit results for the hard-lepton and soft-lepton signal regions, for an integrated luminosity of 3.2 fb-1. Uncertainties in the fitted background estimates combine statistical (in the simulated event yields) and systematic uncertainties. The uncertainties in this table are symmetrised for propagation purposes but truncated at zero to remain within the physical boundaries.

Breakdown of upper limits. The columns show from left to right: the name of the respective signal region; the 95% confidence level (CL) upper limits on the visible cross-section and on the number of signal events the 95% CL upper limit on the number of signal events, given the expected number (and $\pm 1 \sigma$ variations on the expectation) of background events; the two-sided CLb value, i.e. the confidence level observed for the background-only hypothesis and the one-sided discovery p-value (p(s = 0)). The discovery p-values are capped to 0.5 in the case of observing less events than the fitted background estimates.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (top left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met/meff distribution shown in figure 5 (top right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (middle left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the mt distribution shown in figure 5 (middle right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met distribution shown in figure 5 (bottom left). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Table shows the data, fitted background and expected signal event counts for a benchmark signal point in each bin of the met distribution shown in figure 5 (bottom right). The fit results are shown for an integrated luminosity of 3.2 fb-1.

Cutflow table for the hard-lepton signal regions with representative target signal models. The weighted numbers are normalized to 3.2 fb-1 and rounded to the statistical error.

Cutflow table for the hard-lepton signal regions with representative target signal models. The weighted numbers are normalized to 3.2 fb-1 and rounded to the statistical error.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Observed 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the pMSSM grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the pMSSM grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the pMSSM grid.

+1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

-1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the 2Step grid.

Observed 95% CL limit for the 2Step grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the 2Step grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the 2Step grid.

+1 sigma excursion of the expected 95% CL limit for the 2Step grid.

-1 sigma excursion of the expected 95% CL limit for the 2Step grid.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Degree of multijet closure for signal and vaidation regions with at no b-jet requirement. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 1 b-jet. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 2 b-jets. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Summary of all 15 signal regions (post-fit).

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the 2Step grid.

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the pMSSM grid.

95% CLs observed upper limit on model cross-section for 2-step signal points for the best-expected signal region.

Performance of the 8j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.