Single-differential production cross-sections for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Single-differential production cross-sections for prompt $J/\psi$ mesons as a function of $y$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Single-differential production cross-sections for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Fraction of nonprompt $J/\psi$ mesons (in \%) in ($p_\text{T},y$) intervals. The first uncertainty is statistical and the second is systematic.

Nuclear modification factor $R_{p\text{Pb}}$ for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Nuclear modification factor $R_{p\text{Pb}}$ for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=-0.2$ rather than zero, in ($p_\text{T},y$) intervals.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=-1$ rather than zero, in ($p_\text{T},y$) intervals.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=+1$ rather than zero, in ($p_\text{T},y$) intervals.

$\Upsilon(1S)$ production cross-section in $p$Pb and Pb$p$, as a function of $y^*$. The uncertainty is the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ production cross-section in $p$Pb and Pb$p$, as a function of $p_{T}$. The uncertainty is the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ production cross-section in $p$Pb and Pb$p$, as a function of $y^*$. The uncertainty is the sum in quadrature of the statistical and systematic components.

Scaled $pp$ differential cross-section in $p_{T}$ at $\sqrt{s_{NN}}=8.16$ TeV. The first uncertainty is statistical, the second is systematic, which includes the systematic uncertainty from the $pp$ measurement and that estimated by changing the interpolation function.

Scaled $pp$ differential cross-section in $y$ at $\sqrt{s_{NN}}=8.16$ TeV. The first uncertainty is statistical, the second is systematic, which includes the systematic uncertainty from the $pp$ measurement and that estimated by changing the interpolation function.

$\Upsilon(1S)$ nuclear modification factor, $R_{p{\rm Pb}}^{\Upsilon(1S)}$, in $p$Pb and Pb$p$ as a function of $p_{T}$ integrated over $y^*$ in the range $1.5 < y^* < 4.0$ for $p$Pb and $-5.0 < y^* < -2.5$ for Pb$p$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(1S)$ nuclear modification factor, $R_{p{\rm Pb}}^{\Upsilon(1S)}$, in $p$Pb and Pb$p$ as a function of $y^*$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV$/c$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ nuclear modification factor, $R_{p{\rm Pb}}^{\Upsilon(2S)}$, in $p$Pb and Pb$p$ as a function of $p_{T}$ integrated over $y^*$ in the range $1.5 < y^* < 4.0$ for $p$Pb and $-5.0 < y^* < -2.5$ for Pb$p$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ nuclear modification factor, $R_{p{\rm Pb}}^{\Upsilon(2S)}$, in $p$Pb and Pb$p$ as a function of $y^*$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV$/c$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(1S)$ forward-to-backward ratio, $R_{{\rm FB}}^{\Upsilon(1S)}$, as a function of $p_{T}$ integrated over $\vert y^* \vert$ in the range $2.5 < \vert y^* \vert < 4.0$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(1S)$ forward-to-backward ratio, $R_{{\rm FB}}^{\Upsilon(1S)}$, as a function of $\vert y^* \vert$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV/c. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ to $\Upsilon(1S)$ ratio, in $p$Pb and Pb$p$ as a function of $p_{T}$ integrated over $y^*$ in the range $1.5 < y^* < 4.0$ for $p$Pb and $-5.0 < y^* < -2.5$ for Pb$p$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ to $\Upsilon(1S)$ ratio, in $p$Pb and Pb$p$ as a function of $y^*$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV/c. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(1S)$ to non-prompt $J/\psi$, in $p$Pb and Pb$p$ as a function of $y^*$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV/c. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

Double differential cross-section for $J/\psi$-from-$b$ mesons as a function of $p_\perp$ in bins of $y$. The first uncertainties are statistical, the second are the correlated systematic uncertainties shared between bins and the last are the uncorrelated systematic uncertainties.

The fraction of $J/\psi$-from-$b$ mesons (in %) in bins of the $J/\psi$ $p_\perp$ and $y$. The uncertainties are statistical only. The systematic uncertainties are negligible.

The fraction of $J/\psi$-from-$b$ mesons (in %) in bins of the $J/\psi$ $p_\perp$ and $y$. The uncertainties are statistical only. The systematic uncertainties are negligible.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are uncorrelated (correlated) systematic uncertainties amongst bins.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Differential cross-sections as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The first uncertainties are statistical and the second (third) are the correlated (uncorrelated) systematic uncertainties.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ in bins of $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for prompt $J/\psi$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $y$ integrated over $p_\perp$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for prompt $J/\psi$ mesons.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Ratios of differential cross-sections between measurements at $\sqrt{s} = 13$ TeV and $\sqrt{s} = 8$ TeV as a function of $p_\perp$ integrated over $y$ for $J/\psi$-from-$b$ mesons. The systematic errors are negligible.

Differential production cross-sections for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

Differential production cross-sections for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{0} + \bar{D}^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{0} + \bar{D}^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{+} + D^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D_{s}^{+} + D_{s}^{-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-sections, $R_{13/5}$, for prompt $D^{*+} + D^{*-}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{0}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D^{*+}$ and $D^{+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{*+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The ratios of differential production cross-section-times-branching fraction measurements for prompt $D_{s}^{+}$ and $D^{*+}$ mesons in bins of $(p_{\mathrm{T}}, y)$. The first uncertainty is statistical, and the second is the total systematic. All values are given in percent.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $2.0 < y < 4.5$.

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ [pb] for $p_T < 30$ GeV.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T )$ for $2.0 < y < 4.5$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y )$ for $p_T < 30$ GeV/$c$.

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Double-differential cross-section $\mathrm{d}^2 \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d}y$ [pb/(GeV/$c$)].

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $2.0 < y < 4.5$.

Differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ [pb] for $p_T < 30$ GeV.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(1S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

Ratio of double-differential cross-sections $( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(3S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y ) / ( \mathrm{d}^2 \sigma ( pp \to ( \Upsilon(2S) \to \mu^+ \mu^- ) X ) / \mathrm{d} p_T/\mathrm{d} y )$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T )$ for $2.0 < y < 4.5$.

The ratio of differential cross-sections $( \mathrm{d} \sigma ( pp \to ( \Upsilon(iS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y ) / ( \mathrm{d} \sigma ( pp \to ( \Upsilon(jS) \to \mu^+ \mu^- ) X ) / \mathrm{d}y )$ for $p_T < 30$ GeV/$c$.

The ratio of differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}p_T$ [pb/(GeV/$c$)] for $\sqrt{s}=8$ and $\sqrt{s}=7$ TeV in $2.0 < y < 4.5$.

The ratio of differential cross-section $\mathrm{d} \sigma ( pp \to ( \Upsilon \to \mu^+ \mu^- ) X ) / \mathrm{d}y$ for $\sqrt{s}=8$ and $\sqrt{s}=7$ TeV and $p_T < 30$ GeV/$c$.

Covariance matrix of total experimental uncertainties (statistical and systematic uncertainties added in quadrature) of absolute double differential fiducial cross section. The bin index is PT_i + 10*y_j.

Differential production cross sections of $\psi$(2S) as a function of $p_{\rm T}$.

Differential production cross sections of $\psi$(2S) as a function of rapidity.

integrated production cross section of $\psi$(2S).

Differential production cross sections of $\Upsilon$(1S) as a function of $p_{\rm T}$.

Differential production cross sections of $\Upsilon$(1S) as a function of rapidity.

integrated production cross section of $\Upsilon$(1S).

Differential production cross sections of $\Upsilon$(2S) as a function of rapidity.

integrated production cross section of Upsilon (2S).

integrated production cross section of Upsilon (3S).

$\psi$(2S) over J/$\psi$ ratio as a function of $p_{\rm T}$.

$\psi$(2S) over J/$\psi$ ratio as a function of rapidity.

integrated $\psi$(2S) over J/$\psi$ production cross section ratio.

integrated $\Upsilon$(2S) over $\Upsilon$(1S) production cross section ratio.

integrated $\Upsilon$(3S) over $\Upsilon$(1S) production cross section ratio.

Summary of results for cross-section of non-prompt $J/\psi$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of prompt $\psi(2S)$ decaying to a muon pair for 7 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of prompt $\psi(2S)$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 7 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 8 TeV data in nb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 7 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 8 TeV data. Uncertainties are statistical and systematic, respectively.

Mean weight correction factor for $J/\psi$ under the "longitudinal" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse zero" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse positive" spin-alignment transverse positive hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "transverse negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "longitudinal" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse zero" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "transverse negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 7 TeV.

Mean weight correction factor for $J/\psi$ under the "longitudinal" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse zero" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "transverse negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $J/\psi$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "longitudinal" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse zero" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "transverse negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane positive" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

Mean weight correction factor for $\psi(2S)$ under the "off-($\lambda_{\theta}$--$\lambda_{\phi}$)-plane negative" spin-alignment hypothesis for 8 TeV. Those intervals not measured in the analysis at low $p_{T}$, high rapidity are also excluded here.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 30-45 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 45-60 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 60-120 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 120-200 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 200-1500 GeV, as measured in the combined dilepton channel.

Measured ratio of the Drell-Yan normalized differential cross sections at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel for the full phase space.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 20-30 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 30-45 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 45-60 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 60-120 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 120-200 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 200-1500 GeV.