Contributions from individual sources of systematic uncertainty for the ($p^{\mu}_{T} > 35$, $E_T^{missing} > 35$) GeV kinematic region. All uncertainty values are multiplied by 100. The columns (1-7) correspond to: 1.0 = Electro-Weak background 2.0 = Multi-Jet background 3.0 = Charge mis-identification 4.0 = Relative charge efficiency 5.0 = Magnet polarity weighting 6.0 = Momentum/$E_T^{missing}$ resolution 7.0 = Trigger isolation.

The normalised differential cross section of the azmiuthal decorrelation variable DELTA for the GAMMA+2JET sample for the PT of the second jet in the range 25 TO 30 GeV.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+e- final state.

Measured fiducial cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for W+/- production in the combined W+ -> mu+ nu and W- -> mu- nubar final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> e+ nu and W- -> e- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> mu+ nu and W- -> mu- nubar final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> l+ nu (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for W- production in the W- -> l- nubar (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for W+/- production in the combined W+ -> l+ nu and W- -> l- nubar (l = e, mu) final states.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final states.

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> e+ nu) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> e- nubar) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> e+/- nu/nubar) / sigma (Z/gamma^* -> e+ e-).

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> mu+ nu) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> mu- nubar) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> mu+/- nu/nubar) / sigma (Z/gamma^* -> mu+ mu-).

Measured total cross-section ratio R_{W+/Z} = sigma (W+ -> l+ nu) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured total cross-section ratio R_{W-/Z} = sigma (W- -> l- nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured total cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where (l = e, mu).

Measured lepton asymmetry from W+ -> e+ nu and W- -> e- nubar, binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> e+ nu and W- -> e- nubar.

Measured lepton asymmetry from W+ -> mu+ nu and W- -> mu- nubar, binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> mu+ nu and W- -> mu- nubar.

Measured lepton asymmetry from W+ -> l+ nu and W- -> l- nubar (l = e, mu), binned as a function pseudorapidity.

Measured lepton asymmetry from W+ -> l+ nu and W- -> l- nubar (l = e, mu).

CHI distribution for mass bin > 1200 GeV.

Centrality Ratio.

Probability of finding at least one TAR jet, where the p_T-leading TAR jet passes the m_Wcand and D₂^β=1 requirements, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=500 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1000 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=1700 GeV, with the preselections applied that do not pass the requirements of the merged category.

Probability of finding a W_had candidate reconstructed as a pair of R=0.4 PFlow jets, as a function of m_s. The probability is determined in a sample of signal events with m_Z'=2100 GeV, with the preselections applied that do not pass the requirements of the merged category.

Observed exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected+1σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected-1σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected+2σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Expected-2σ exclusion contour at 95% C.L. for the dark Higgs model in the (m_Z', m_s) plane for g_q=0.25, g_χ=1, m_χ=200 GeV, and sinθ=0.01.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=0.5 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=0.5 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=1 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=1.7 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=1.7 TeV, shown in dashed blue.

Observed upper limits at 95% C.L. on σ(pp → s χχ) × B(s → W^± W^∓) for m_Z'=2.1 TeV as a function of m_s. The expected limits, varied up and down by one and two standard deviations, are shown as green and yellow bands, respectively. The observed and expected limits are compared to the theoretical LO cross section for the σ(pp → s χχ) × B(s → W^± W^∓) process for m_Z'=2.1 TeV, shown in dashed blue.

Data overlaid on SM background yields stacked in each SR and CR category after the fit to data ('Post-fit'). The yields in the SR are broken down into their contributions to the individual bins. The maximum-likelihood estimators are set to the conditional values of the CR-only fit, and propagated to SR and CRs.

Dominant sources of uncertainty for three dark Higgs scenarios after the fit to data. The uncertainties are quantified in terms of their contribution to the fitted signal uncertainty that is expressed relative to the theory prediction. Three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01 and m_χ=200 GeV are considered, which are indicated using the (m_Z', m_s) format in units of GeV in the table columns.

Cumulative efficiencies in the merged category for three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01, m_Z' = 1 TeV, and m_χ=200 GeV considering s→W(ℓν)W(qq) decays only.

Cumulative efficiencies in the resolved category for three representative dark Higgs signal scenarios with g_q=0.25, g_χ=1.0, sinθ=0.01, m_Z' = 1 TeV, and m_χ=200 GeV considering s→W(ℓν)W(qq) decays only.

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={300, 350, 400, 500, 750} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={1000, 1700} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Theoretical cross section for &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) for each of the dark Higgs signal points at m_Z′ ={2100, 2500, 2900, 3300} GeV, with g_q = 0.25, g<sub>&chi; = 1.0, sin&theta; = 0.01, m_Z′ = 1 TeV , and m_&chi; = 200 GeV. Also shown are experimentally excluded cross sections of &sigma;(pp &rarr; s&chi;&chi;) &times; B(s &rarr; W^&plusmn;W^&#8723;) (Obs.) together with the expectations (Exp.) varied up and down by one standard deviation (&plusmn;1&sigma;).

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.2$.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.2$ at NNLO QCD.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

The observed mass distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the short lifetime regime.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the long lifetime regime.

The observed $p_{\rm T$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Expected and observed distributions in SR-Inclusive_Low of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal track selection efficiency as a function of CLLP $\beta\gamma$ for SR-Inclusive_Low and SR-Inclusive_High bins. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal selection efficiency by the mass window for SR-Inclusive_Low and SR-Inclusive_High bins.

Acceptance for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |eta| < 1.8 and r_decay > 500 mm.

Acceptance for the chargino pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the stau pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Event-level efficiency for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Passing events in event selection steps for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes.

Passing events in event selection steps for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes.

Passing events in event selection steps for the chargino pair-production model for various masses and lifetimes.

Passing events in event selection steps for the stau pair-production model for various masses and lifetimes.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.