Distribution of $S$, which is one of the discriminating variables used to define the $2\ell^{sc}$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $E_{T}^{miss}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $\Delta R_{\ell^{\pm}\ell^{\pm}}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $m_{x\ell}$ ($x$=3), which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $p_{T}^{leading jet}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $E_{T}^{miss}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $\Delta R_{\ell^{\pm}\ell^{\pm}}^{min}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $m_{x\ell}$ ($x$=4), which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $p_{T}^{\ell_{1}}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Contributions from different categories of uncertainties relative to the expected background yields in the defined SRs, as obtained after performing the likelihood ratio test discussed in Section 9 in the paper. The uncertainties are shown for the combination of the individual channels of the $2\ell^{sc}$, $3\ell$ and $4\ell$ SRs. The SRs are indicated along the horizontal axis. In the HEPData entry, the x-axis is simplified for easier visualisation. The first number indicates the sub channel (2:$2\ell^{sc}$, 3:$3\ell$, 4:$4\ell$), while the second number indicates the mass point (2:200, 3:300, 4:400, 5:500).

Data event yields compared with the expected contributions from relevant background sources, for the combination of the individual channels of the $2\ell^{sc}$, $3\ell$ and $4\ell$ SRs. The total uncertainties in the expected event yields are shown as the hatched bands. The SRs are indicated along the horizontal axis. In the HEPData entry, the x-axis is simplified for easier visualisation. The first number indicates the sub channel (2:$2\ell^{sc}$, 3:$3\ell$, 4:$4\ell$), while the second number indicates the mass point (2:200, 3:300, 4:400, 5:500).

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $2\ell^{sc}$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $3\ell$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $4\ell$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

Observed and expected upper limits of the $H^{\pm\pm}$ pair production cross section times branching fraction at 95% CL obtained from the combination of 2$\ell^{sc}$, 3$\ell$ and 4$\ell$ channels. The region above the observed limit is excluded by the measurement. The bands represent the expected exclusion curves within one and two standard deviations.

The theoretical prediction of Figure 9(a) in the paper.

Observed and expected upper limits of the $H^{\pm\pm}$ and $H^{\pm}$ production cross section times branching fraction at 95% CL obtained from the combination of 2$\ell^{sc}$, 3$\ell$ and 4$\ell$ channels. The region above the observed limit is excluded by the measurement. The bands represent the expected exclusion curves within one and two standard deviations.

The theoretical prediction of Figure 9(b) in the paper.

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 200~GeV$ or $m_{H^{\pm\pm}} = 220~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 300~GeV$ or $m_{H^{\pm\pm}} = 350~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 400~GeV$ or $m_{H^{\pm\pm}} = 450~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 500~GeV$ or $m_{H^{\pm\pm}} = 550~GeV$ or $m_{H^{\pm\pm}} = 600~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Cutflow for SR-$e\mu$ for 2 representative signal points. For the $\tilde{\tau}$ mass and lifetime points, the number of Monte Carlo events generated are: 30,000 for (200 GeV, 0.1 ns), and 104,000 for (300 GeV, 0.1 ns).

Cutflow for SR-$\mu\mu$ for 5 representative signal points. For the following $\tilde{\mu}$ mass and lifetime points, the number of Monte Carlo events generated are: 24,000 for (100 GeV, 0.01 ns), 16,000 for (300 GeV, 1 ns), and 12,000 for (500 GeV, 0.1 ns). For the $\tilde{\tau}$ mass and lifetime points, the number of Monte Carlo events generated are: 30,000 for (200 GeV, 0.1 ns), and 104,000 for (300 GeV, 0.1 ns).

Cutflow for SR-$\mu\mu$ for 5 representative signal points. For the following $\tilde{\mu}$ mass and lifetime points, the number of Monte Carlo events generated are: 24,000 for (100 GeV, 0.01 ns), 16,000 for (300 GeV, 1 ns), and 12,000 for (500 GeV, 0.1 ns). For the $\tilde{\tau}$ mass and lifetime points, the number of Monte Carlo events generated are: 30,000 for (200 GeV, 0.1 ns), and 104,000 for (300 GeV, 0.1 ns).

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, where all slepton flavors are mass degenerate (co-NLSP).

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, where all slepton flavors are mass degenerate (co-NLSP).

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the selectron signal model. Selectron ($\tilde{e}_{L, R}$) refers to the scalar superpartners of left- and right-handed electrons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the selectron signal model. Selectron ($\tilde{e}_{L, R}$) refers to the scalar superpartners of left- and right-handed electrons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed electrons, $\tilde{e}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed electrons, $\tilde{e}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed electrons, $\tilde{e}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed electrons, $\tilde{e}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the smuon signal model. Smuon ($\tilde{\mu}_{L, R}$) refers to the scalar superpartners of left- and right-handed muons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the smuon signal model. Smuon ($\tilde{\mu}_{L, R}$) refers to the scalar superpartners of left- and right-handed muons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed muons, $\tilde{\mu}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed muons, $\tilde{\mu}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed muons, $\tilde{\mu}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed muons, $\tilde{\mu}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the stau signal model. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin\theta_{\tilde\tau}=0.95$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the stau signal model. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin\theta_{\tilde\tau}=0.95$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for $\tilde{\tau}_L$ production, where $\tilde{\tau}_L$ is pure-state superpartner of the left-handed $\tau$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for $\tilde{\tau}_L$ production, where $\tilde{\tau}_L$ is pure-state superpartner of the left-handed $\tau$.

The expected and observed yields in the signal regions. Combined statistical and systematic uncertainties are presented. Estimates are truncated at 0 if the size of measured systematic uncertainties would yield a negative result.

The expected and observed yields in the signal regions. Combined statistical and systematic uncertainties are presented. Estimates are truncated at 0 if the size of measured systematic uncertainties would yield a negative result.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal electrons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.47 for electrons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Electron selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal electrons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.47 for electrons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Electron selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal muons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.5 for muons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Muon selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal muons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.5 for muons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Muon selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Acceptance for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Efficiency for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$ee$ from $\tilde{e}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47 for electrons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$ee$ from $\tilde{e}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47 for electrons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$\mu\mu$ from $\tilde{\mu}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 for muons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$\mu\mu$ from $\tilde{\mu}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 for muons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$e\mu$ from $\tilde{\tau}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$e\mu$ from $\tilde{\tau}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Post-fit event yields in the signal and control regions obtained from a scan over $\epsilon_{VV}$ exploiting both shape and rate information. The quoted uncertainties include the theoretical and experimental systematic sources and those due to sample statistics. The fit constrains the total expected yield to the observed yield. The diboson background is split into $W W$ and non-$W W$ contributions.

Best-fit values and their uncertainties as obtained from the shape-only and shape-plus-rate likelihood fits to the Asimov dataset and to ATLAS data. Results of both shape-only and shape+rate fits for $a_L$ and $a_T$ are shown. Results of fits to one parameter with the other one fixed or profiled are presented.

Best-fit values and their uncertainties as obtained from the shape-only and shape-plus-rate likelihood fits to the Asimov dataset and to ATLAS data. Results of both shape-only and shape+rate fits for $\epsilon_{VV}$ and $\kappa_{VV}$ are shown. Results of fits to one parameter with the other one fixed or profiled are presented.

The contributions of the leading individual systematic uncertainties together with the data statistical uncertainties, in the one dimensional fit for the pseudo-observables $\kappa_{VV}$ (a) and $\epsilon_{VV}$ (b) for electroweak-boson polarisation in the VBF $H\to WW$ channel. Both shape and rate informations are exploited in the fit. The theoretical and experimental uncertainties are subdivided further into categories.

The contributions of the leading individual systematic uncertainties together with the data statistical uncertainties, in the one dimensional fit for the pseudo-observables $\kappa_{VV}$ (a) and $\epsilon_{VV}$ (b) for electroweak-boson polarisation in the VBF $H\to WW$ channel. Both shape and rate informations are exploited in the fit. The theoretical and experimental uncertainties are subdivided further into categories.

Post-fit distribution of the BDT response observable presented in the four $|\Delta \eta jj|$ categories of the ggF +2 jets signal region, with signal and background yields fixed from the fit for $\mu^{\text{ggF+2jets}}$. The distributions of the ggF + 2 jets and VBF processes are overlaid with their respective contributions multiplied by 50.

The weighted $\Delta \Phi_{jj}$ post-fit distribution in the ggF +2 jets signal region, with signal and background yields fixed from the fit to $\tan \alpha$ using shape and rate information.

Expected and observed likelihood curves for scans over $\tan \alpha$ where only the shape is taken into account in the fit, $\mu_{VBF}$ is fixed.

Expected and observed likelihood curves for scans over $\tan \alpha$ where both shape and normalisation are taken into account in the fit, $\mu_{VBF}$ is fixed.

68% and 95% CL two-dimensional likelihood contours of the CP-even and CP-odd coupling parameters $K_{gg} \cos(\alpha)$ and $K_{gg} \sin(\alpha)$. The minima are represented by black stars, while the SM value is shown as a red star.

The weighted $\Delta \Phi jj$ distribution in the VBF signal region, with signal and background yields fixed from the fit for $\epsilon_{VV}$ using shape and rate information.

Likelihood scans over the transversally polarised couplings. The fit is using shape-only information. All relevant experimental and modelling systematic uncertainties are considered in the fit.

Likelihood scans over the transversally polarised couplings. The fit is using shape + rate information. All relevant experimental and modelling systematic uncertainties are considered in the fit.

Likelihood scans over the longitudinally polarised couplings. The fit is using shape + rate information. All relevant experimental and modelling systematic uncertainties are considered in the fit.

Likelihood scans over $\kappa_{VV}$ with the $\epsilon_{VV}$ profiled. The fit is performed using both shape and rate information. All relevant experimental and theoretical systematic uncertainties are considered in the fit.

Likelihood scans over $\epsilon_{VV}$ with the $\kappa_{VV}$ profiled. The fit is performed using both shape and rate information. All relevant experimental and theoretical systematic uncertainties are considered in the fit.

The contributions of the leading individual systematic uncertainties together with the data statistical uncertainties, in the one dimensional fit for electroweak-boson polarisation in the VBF $H\to WW$ channel, using (aL, aT) parametrisation. Both shape and rate informations are exploited in the fit. The theoretical and experimental uncertainties are subdivided further into categories.

The contributions of the leading individual systematic uncertainties together with the data statistical uncertainties, in the one dimensional fit for electroweak-boson polarisation in the VBF $H\to WW$ channel, using (aL, aT) parametrisation.. Both shape and rate informations are exploited in the fit. The theoretical and experimental uncertainties are subdivided further into categories.

The +1 $\sigma$ band of the observed exclusion contor for the $Z^{\prime}_{B}$ model in the $m_{\chi}$-$m_{Z^{\prime}_{B}}$ plane.

The -1 $\sigma$ band of the observed exclusion contor for the $Z^{\prime}_{B}$ model in the $m_{\chi}$-$m_{Z^{\prime}_{B}}$ plane.

A comparison of the inferred limits to the constraints from direct detection experiments on the spin-independent DM--nucleon cross section in the context of the $Z'_B$ simplified model with vector couplings. Limits are shown at 90% CL.

The observed exclusion contor for the $Z^{\prime}$-2HDM model in the $m_{A}$-$m_{Z^{\prime}}$ plane.

The expected exclusion contor for the $Z^{\prime}$-2HDM model in the $m_{A}$-$m_{Z^{\prime}}$ plane.

The +1 $\sigma$ band of the observed exclusion contor for the $m_{A}$-$Z^{\prime}$-2HDM model in the $m_{Z^{\prime}}$ plane.

The -1 $\sigma$ band of the observed exclusion contor for the $m_{A}$-$Z^{\prime}$-2HDM model in the $m_{Z^{\prime}}$ plane.

The observed exclusion contor for the 2HDM-a model in the $m_{A}$-$m_{a}$ plane.

The expected exclusion contor for the 2HDM-a model in the $m_{A}$-$m_{a}$ plane.

The +1 $\sigma$ band of the observed exclusion contor for the 2HDM-a model in the $m_{A}$-$m_{a}$ plane.

The -1 $\sigma$ band of the observed exclusion contor for the 2HDM-a model in the $m_{A}$-$m_{a}$ plane.

The observed exclusion contor for the 2HDM-a model in the $tan\beta$-$m_{a}$ plane.

The expected exclusion contor for the 2HDM-a model in the $tan\beta$-$m_{a}$ plane.

The +1 $\sigma$ band of the observed exclusion contor for the 2HDM-a model in the $tan\beta$-$m_{a}$ plane.

The -1 $\sigma$ band of the observed exclusion contor for the 2HDM-a model in the $tan\beta$-$m_{a}$ plane.

The exclusion limits at 95% CL for the 2HDM+a model as a function of $\sin \theta$ for $m_{A,H^{\pm},H}$= 600GeV, $m_a$ = 200GeV, $\tan \beta$ = 1.0$.

The exclusion limits at 95% CL for the 2HDM+a model as a function of $\sin \theta$ for $m_{A,H^{\pm},H}$= 1000GeV, $m_a$ = 350GeV, $\tan \beta$ = 1.0$.

Breakdown of the dominant systematic uncertainties.

Event yields in the range of 120 $<m_{\gamma\gamma}<$ 130 GeV for data, signal models, the SM Higgs boson background and non-resonant background in each analysis category, for an integrated luminosity of $139$fb$^{-1}$.

Detailed background contributions from the SM Higgs boson and continuum background for each cut

Detailed contributions from the signals for each cut.

Acceptance times efficiency for several signals in each category.

The \(m_{bb}\) distributions in the MediumBDT categories, overlaid with contributions from the \(H\gamma jj\) signal as well as the resonant \(Z\gamma jj\) and non-resonant \(b\bar{b} \gamma jj\) background fits. The combined \(\chi^2\) per degree of freedom is \(45.2/45\). The bottom panel in each plot presents the significance of the Higgs boson signal relative to the non-resonant \(b\bar{b} \gamma jj\) background in each bin.

The \(m_{bb}\) distributions in the MediumBDT categories, overlaid with contributions from the \(H\gamma jj\) signal as well as the resonant \(Z\gamma jj\) and non-resonant \(b\bar{b} \gamma jj\) background fits. The combined \(\chi^2\) per degree of freedom is \(45.2/45\). The bottom panel in each plot presents the significance of the Higgs boson signal relative to the non-resonant \(b\bar{b} \gamma jj\) background in each bin.

Comparisons of data and simulated event distributions of the BDT input variables \(\Delta R (b1, \gamma)\) in the two \(m_{bb}\) sidebands after kinematic reweighting of the non-resonant \(b\bar{b}\gamma jj\) background. The data are shown as black points, and the background contributions are stacked in coloured histograms. The Higgs boson signal contribution is scaled up and represented by the dashed red line. The bottom panel in each plot shows the ratio between the data and the SM prediction, where the uncertainty band corresponds to the statistical uncertainty only.

Comparisons of data and simulated event distributions of the BDT input variables \(m_{jj}\) in the two \(m_{bb}\) sidebands after kinematic reweighting of the non-resonant \(b\bar{b}\gamma jj\) background. The data are shown as black points, and the background contributions are stacked in coloured histograms. The Higgs boson signal contribution is scaled up and represented by the dashed red line. The bottom panel in each plot shows the ratio between the data and the SM prediction, where the uncertainty band corresponds to the statistical uncertainty only.

Comparisons of data and simulated event distributions of the BDT input variables \(\Delta R (b2, \gamma)\) in the two \(m_{bb}\) sidebands after kinematic reweighting of the non-resonant \(b\bar{b}\gamma jj\) background. The data are shown as black points, and the background contributions are stacked in coloured histograms. The Higgs boson signal contribution is scaled up and represented by the dashed red line. The bottom panel in each plot shows the ratio between the data and the SM prediction, where the uncertainty band corresponds to the statistical uncertainty only.

Comparisons of data and simulated event distributions of the BDT input variables \(\text{centrality}(\gamma, j1, j2)\) in the two \(m_{bb}\) sidebands after kinematic reweighting of the non-resonant \(b\bar{b}\gamma jj\) background. The data are shown as black points, and the background contributions are stacked in coloured histograms. The Higgs boson signal contribution is scaled up and represented by the dashed red line. The bottom panel in each plot shows the ratio between the data and the SM prediction, where the uncertainty band corresponds to the statistical uncertainty only.

Comparisons of data and simulated event distributions of the BDT input variables \(\Delta \phi(b\bar{b}, jj)\) in the two \(m_{bb}\) sidebands after kinematic reweighting of the non-resonant \(b\bar{b}\gamma jj\) background. The data are shown as black points, and the background contributions are stacked in coloured histograms. The Higgs boson signal contribution is scaled up and represented by the dashed red line. The bottom panel in each plot shows the ratio between the data and the SM prediction, where the uncertainty band corresponds to the statistical uncertainty only.

Comparisons of data and simulated event distributions of the BDT input variables \(p_{\mathrm{T}}^{jj}\) in the two \(m_{bb}\) sidebands after kinematic reweighting of the non-resonant \(b\bar{b}\gamma jj\) background. The data are shown as black points, and the background contributions are stacked in coloured histograms. The Higgs boson signal contribution is scaled up and represented by the dashed red line. The bottom panel in each plot shows the ratio between the data and the SM prediction, where the uncertainty band corresponds to the statistical uncertainty only.

Comparisons of data and simulated event distributions of the BDT input variables \(\cos \theta\) in the two \(m_{bb}\) sidebands after kinematic reweighting of the non-resonant \(b\bar{b}\gamma jj\) background. The data are shown as black points, and the background contributions are stacked in coloured histograms. The Higgs boson signal contribution is scaled up and represented by the dashed red line. The bottom panel in each plot shows the ratio between the data and the SM prediction, where the uncertainty band corresponds to the statistical uncertainty only.

Comparisons of data and simulated event distributions of the BDT input variables \(\Delta R(b1,j1)\) in the two \(m_{bb}\) sidebands after kinematic reweighting of the non-resonant \(b\bar{b}\gamma jj\) background. The data are shown as black points, and the background contributions are stacked in coloured histograms. The Higgs boson signal contribution is scaled up and represented by the dashed red line. The bottom panel in each plot shows the ratio between the data and the SM prediction, where the uncertainty band corresponds to the statistical uncertainty only.

Differential fiducial cross section of the Z boson $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the leading b-jet $|y|$ in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between Z boson and leading $b$-jet in events with $Z(\rightarrow ll)\ge+1$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta \phi$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta y$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $\Delta R$ between the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the Z boson $p_{\text{T}}$ in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the $p_{\text{T}}$ of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Differential fiducial cross section of the ratio between the $p_{\text{T}}$ and the invariant mass of the first two leading $b$-jets in events with $Z(\rightarrow ll)\ge+2$ b-jets. The statistical uncertainties and the individual components of systematic uncertainty are given in each bin. Statistical uncertainties are bin-to-bin uncorrelated.

Expected and observed 95% CL upper limits on $\sigma(pp\to H)B(H\to Z(\eta_c~\text{or}~J/\psi))/$pb. The smaller (larger) quoted ranges around the expected limits represent $\pm 1\sigma$ ($\pm 2\sigma$) fluctuations.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 0.33 < ln(R/#DeltaR) < 0.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 0.67 < ln(R/#DeltaR) < 1.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.00 < ln(R/#DeltaR) < 1.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.33 < ln(R/#DeltaR) < 1.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.67 < ln(R/#DeltaR) < 2.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.00 < ln(R/#DeltaR) < 2.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.33 < ln(R/#DeltaR) < 2.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.67 < ln(R/#DeltaR) < 3.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.00 < ln(R/#DeltaR) < 3.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.33 < ln(R/#DeltaR) < 3.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.67 < ln(R/#DeltaR) < 4.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 4.00 < ln(R/#DeltaR) < 4.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 0.69 < ln(1/z) < 0.97.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 0.97 < ln(1/z) < 1.25.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.25 < ln(1/z) < 1.52.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.52 < ln(1/z) < 1.80.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.80 < ln(1/z) < 2.08.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.08 < ln(1/z) < 2.36.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.36 < ln(1/z) < 2.63.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.63 < ln(1/z) < 2.91.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.91 < ln(1/z) < 3.19.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.19 < ln(1/z) < 3.47.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.47 < ln(1/z) < 3.74.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.74 < ln(1/z) < 4.02.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.02 < ln(1/z) < 4.30.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.30 < ln(1/z) < 4.57.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.57 < ln(1/z) < 4.85.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.85 < ln(1/z) < 5.13.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.13 < ln(1/z) < 5.41.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.41 < ln(1/z) < 5.68.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.68 < ln(1/z) < 5.96.

The summed covariance matrix of all systematic and statistical uncertainties associated with the measurement in bins of $\ln{(1/z)} \times \ln{(R/\Delta R)}$.

The summed covariance matrix of all statistical uncertainties associated with the measurement in bins of $\ln{(1/z)} \times \ln{(R/\Delta R)}$.

The measured fiducial production cross-sections times branching ratio for $W^+\rightarrow\mu^+\nu$ and $W^-\rightarrow\mu^-\bar{\nu}$, their sum, and their ratio for data

The measured fiducial production cross-sections times branching ratio for $W^+\rightarrow\mu^+ u$ and $W^-\rightarrow\mu^-\bar{\nu}$, their sum, and their ratio for the predictions from DYNNLO (CT14 NNLO PDF set)

Size of the $W^{+}$ the cross-section (differential in $\eta_{\mu}$, as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. gThe uncertainties are given in percent.

Size of the $W^{+}$ the cross-section (differential in $\eta_{\mu}$, as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. gThe uncertainties are given in percent.

Size of the asymmetry as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The uncertainties are given as an absolute difference from the nominal.