The differential cross section as a function of the transverse momentum of the top quark/antiquark, PT(TOP/TOPBAR).

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of fourth jet rapidity for events with four or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of lepton transverse momentum for events with one or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of lepton transverse momentum for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of lepton transverse momentum for events with three or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of lepton transverse momentum for events with four or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of lepton pseudorapidity for events with one or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of lepton pseudorapidity for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of lepton pseudorapidity for events with three or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of lepton pseudorapidity for events with four or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of rapidity separation between the two highest pT jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of rapidity separation between the two highest pT jets for events with three or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of rapidity separation between the two most rapidity-separated hard (pT>20 GeV) jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of rapidity separation between the two most rapidity-separated hard (pT>20 GeV) jets for events with three or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of azimuthal angle separation between the two highest pT jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of azimuthal angle separation between the two most rapidity-separated hard (pT>20 GeV) jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of DeltaR separation between the two highest pT jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

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Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of W boson pT for events with one or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of W boson pT for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of W boson pT for events with three or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of W boson pT for events with four or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of the transverse momentum of the dijet system of the two highest pT jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of the transverse momentum of the dijet system of the two highest pT jets for events with three or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of dijet invariant mass of the two highest pT jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of dijet invariant mass of the two highest pT jets for events with three or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of HT for events with one or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of HT for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of HT for events with three or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Differential production cross-section, normalized to the measured inclusive W boson cross-section, as a function of HT for events with four or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Average number of jets as a function of HT for events with one or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Average number of jets as a function of HT for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Average number of jets as a function of the rapidity separation between the two highest pT jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Average number of jets as a function of the rapidity separation between the two most rapidity separated jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Probability of third jet emission as a function of the rapidity separation of the two highest pT jets for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Probability of third jet emission as a function of the rapidity separation of the two most rapidity-separated hard (pT>20 GeV) for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Probability of third jet emission as a function of rapidity separation between the two highest pT jets with the requirement that the additional jet be emitted into the rapidity interval defined by the two highest pT jets, for events with two or more jets produced in association with a W boson. First uncertainty is statistical, second uncertainty is systematic.

Fraction of events with two jets produced in association with a W boson that do not contain a third hard (pT>20 GeV) jet in the rapidity interval between the two highest pT jets, as a function of rapidity separation between the two highest pT jets. First uncertainty is statistical, second uncertainty is systematic.

Fraction of events with two jets produced in association with a W boson that do not contain a third hard (pT>20 GeV) jet in the rapidity interval between the two most rapidity-separated jets, as a function of rapidity separation between the two most rapidity-separated jets. First uncertainty is statistical, second uncertainty is systematic.

The measured differential distribution in the polar scattering angle in the Collins-Soper frame;.

The measured differential distribution in the two-photon mass for |azimuthal angle separation| < PI/2;.

The measured differential distribution in the two-photon transverse momentum for |azimuthal angle separation| < PI/2;.

The measured differential distribution in the polar scattering angle in the Collins-Soper frame for |azimuthal angle separation| < PI/2;.

The measured differential distribution in the two-photon mass for |azimuthal angle separation| > PI/2;.

The measured differential distribution in the two-photon transverse momentum for |azimuthal angle separation| > PI/2;.

The measured differential distribution in the polar scattering angle in the Collins-Soper frame for |azimuthal angle separation| > PI/2;.

The measured 3-jet differential cross section for |y|<2.4 and pT>70 GeV.

The measured 3-jet differential cross section for |y|<2.4 and pT>100 GeV.

Measured unfolded differential cross-section as a function of the dilepton transverse momentum $p^{ll}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the the four-body transverse momentum $p^{ll\gamma\gamma}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the diphoton invariant mass $m_{\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the four-body invariant mass $m_{ll\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Expected and observed $95\%$ confidence intervals for the coupling parameters $f_{T,j}/\Lambda^{4}$ of transverse dimension-8 operators. All parameter values outside of the stated range are excluded at the chosen confidence level. No unitarity constraints are applied.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,8}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,0}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,1}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,2}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,5}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,6}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,7}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,9}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Normalized differential cross-sections for the absolute rapidity (|y|) of the ttbar system. The cross-section in each bin is given as the integral of the normalized differential cross-section over the bin width, divided by the bin width. The calculation of the cross-sections in the last bins includes events falling outside of the bin edges, and the normalization is done within the quoted bin width. The full covariance matrice is provided in Table 8 below.

Bin-wise full covariance matrices for the normalized differential cross-sections of the hadronically decaying top-quark PT. The elements of the covariance matrices are in units of TeV$^{-2}$.

Bin-wise full covariance matrices for the normalized differential cross-sections of the mass of the ttbar system. The elements of the covariance matrices are in units of TeV$^{-2}$.

Bin-wise full covariance matrices for the normalized differential cross-sections of the PT of the ttbar system. The elements of the covariance matrices are in units of TeV$^{-2}$.

Bin-wise full covariance matrices for the normalized differential cross-sections of the absolute rapidity (|y|) of the ttbar system.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $p_T$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$.

Integrated $Z+\ge 2$ $b$-jets cross-section.

Breakdown of systematic uncertainties (in %) for the integrated $Z+\ge 2$ $b$-jets cross-section.

The cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$.

The total uncertainty covariance matrix for measured differential cross sections in $m_{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

The total uncertainty covariance matrix for measured differential cross sections in $p_\mathrm{T}^{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.