Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Predicted and observed yields as a function of $m_{4\ell}$ in the VBS-Suppressed region. Overflow events are included in the last bin of the distribution.

Relative systematic uncertainties in the unfolded differential cross section for 4ljj production in the VBS-Enhanced region as a function of m_{jj}

Relative systematic uncertainties in the unfolded differential cross section for 4ljj production in the VBS-Enhanced region as a function of m_{4\ell}

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $m_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $m_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $m_{4\ell}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $m_{4\ell}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $ p_{T,4l}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $ p_{T,4l}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $\Delta\phi_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $\Delta\phi_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $|\Delta y_{jj}|$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $|\Delta y_{jj}|$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $cos(\theta^{*}_{12})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $cos(\theta^{*}_{12})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $cos(\theta^{*}_{34})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $cos(\theta^{*}_{34})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $p_{T,jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $p_{T,jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $p_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $p_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $S_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $S_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Statistical correlation between different bins of the unfolded cross-section for all the measured observables in the VBS-Enhanced region.

Statistical correlation between different bins of the unfolded cross-section for all the measured observables in the VBS-Suppressed region.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $N_{ch}(p_T < 0.4 GeV)$ (EvSel_$N_{ch}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $N_{ch}(p_T < 0.4 GeV)$ (EvSel_$N_{ch}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $N_{ch}(p_T < 0.4 GeV)$ (EvSel_$N_{ch}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $N_{ch}(p_T < 0.4 GeV)$ (EvSel_$N_{ch}$) for PbPb collisions at $\sqrt{ s_{NN} }$=2.76 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{6\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{6\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{6\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{6\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{8\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{8\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_2\{8\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_2\{8\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_2\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{6\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{8\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{4\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{6\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{8\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{6\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{8\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{4\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{6\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{8\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{4\}/v_2\{2, | \Delta \eta > 2 \}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{6\}/v_2\{4\}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{8\}/v_2\{6\}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{4\}/v_2\{2, | \Delta \eta > 2 \}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{6\}/v_2\{4\}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{8\}/v_2\{6\}$ ratio for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{4\}/v_2\{2, | \Delta \eta > 2 \}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{6\}/v_2\{4\}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{8\}/v_2\{6\}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_2\{4\}/v_2\{2, | \Delta \eta > 2 \}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{6\}/v_2\{4\}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_2\{8\}/v_2\{6\}$ ratio for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_3\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_3\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_3\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_4\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$c_4\{2, | \Delta \eta > 2\}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$c_4\{2, | \Delta \eta > 2 \}$ cumulants for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_3\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_3\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_3\{2, | \Delta \eta > 2 \}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_3\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_3\{2, | \Delta \eta > 2 \}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_4\{2, | \Delta \eta > 2 \}$ harmonics for reference particles with 0.3 $< p_T <$ 3.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 5.02 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pp collisions at $\sqrt{s}$= 13 TeV.

$v_4\{2, | \Delta \eta > 2\}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for pPb collisions at $\sqrt{ s_{NN} }$= 5.02 TeV.

$v_4\{2, | \Delta \eta > 2 \}$ harmonics for reference particles with 0.5 $< p_T <$ 5.0 GeV selected according to $M_{ref}$ (EvSel_$M_{ref}$) for PbPb collisions at $\sqrt{ s_{NN} }$= 2.76 TeV.

$ v_2\{4\} $ harmonics for reference particles with 0.2 $ < p_{T} < $ 3.0 GeV as a function of $ < N_{ch}(|\eta|<1) > $ for p+Pb collisions at $ \sqrt{ s_{NN} } $= 5.02 TeV.

$ v_2\{4\} $ harmonics for reference particles with 0.2 $ < p_{T}< $ 3.0 GeV as a function of $ < N_{ch}(|\eta|<1) > $ for Pb+Pb collisions at $ \sqrt{ s_{NN} } $= 2.76 TeV.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Statistical correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Total correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

List of experimentally considered systematic uncertainties for the WW cross section measurement.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $p_\text{T}^{\text{lead }\ell}$.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $m_{e\mu}$.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $p_{T}^{e\mu}$.

The measured normalized differential cross section as a function of the photon $|\eta|$ in the single lepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the $\Delta R$ between the photon and the lepton in the single lepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the photon pT in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the photon $|\eta|$ in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of minimum $\Delta R) between the photon and the leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of $|\Delta\eta|$ between the two leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of $\Delta\phi$ between the two leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The total correlation matrix of the measured normalized differential cross section as a function of the photon pT in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon $|\eta|$ in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $\Delta R$ between the photon and the lepton in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon pT in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon $|\eta|$ in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the minimum $\Delta R$ between the photon and the leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $|\Delta\eta|$ between the two leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $\Delta\phi$ between the two leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The statistical correlation matrix of all the measured normalized differential cross sections in the single lepton channel.

The statistical correlation matrix of all the measured normalized differential cross sections in the dilepton channel.

Definition of the fiducial phase space.

The seven input variables to the NN ordered by their discriminating power. The jet that is not $b$-tagged is referred to as $\textit{untagged}~$jet.

The seven input variables to the NN ordered by their discriminating power. The jet that is not $b$-tagged is referred to as $\textit{untagged}~$jet.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events(at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-quark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-antiquark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the absolute differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$.

Uncertainties for the normalised differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.