The fiducial efficiency for electrons and taus in different $\eta$ ranges ($\epsilon_{\mathrm{fid}}(\eta)$). For electrons from tau decays, the $\eta$ is that of the electron, not the tau. The uncertainties shown reflect the statistical uncertainties of the simulated samples only. UPDATE (18 MAY 2015): Updated fiducial lepton efficiencies.

Expected and observed event yields for the $H_{\mathrm{T}}^{\mathrm{leptons}}$ signal regions.

Expected and observed event yields for the minimum $p_{\mathrm{T}}^{\ell}$ signal regions.

Expected and observed event yields for the $b$-tag signal regions.

Expected and observed event yields for the inclusive $m_{\mathrm{eff}}$ signal regions.

Expected and observed event yields for the high-$E_{\mathrm{T}}^{\mathrm{miss}}$, $m_{\mathrm{eff}}$ signal regions.

Expected and observed event yields for the high-$m_{\mathrm{T}}^{W}$, $m_{\mathrm{eff}}$ signal regions.

Expected and observed event yields for the high-$H_{\mathrm{T}}^{\mathrm{jets}}$, $E_{\mathrm{T}}^{\mathrm{miss}}$ signal regions.

Expected and observed event yields for the low-$H_{\mathrm{T}}^{\mathrm{jets}}$, $E_{\mathrm{T}}^{\mathrm{miss}}$ signal regions.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $H_{\mathrm{T}}^{\mathrm{leptons}}$.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $p_{\mathrm{T}}^{\ell\mathrm{,min}}$.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on the number of $b$-tagged jets.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $m_{\mathrm{eff}}$.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $m_{\mathrm{eff}}$ [GeV]. All these signal regions have an additional requirement of $E_{\mathrm{T}}^{\mathrm{miss}}\geq 100$ GeV.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $m_{\mathrm{eff}}$ [GeV]. All these signal regions have an additional requirement of $m_{\mathrm{T}}^{W}\geq 100$ GeV.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $E_{\mathrm{T}}^{\mathrm{miss}}$. All these signal regions have an additional requirement of $H_{\mathrm{T}}^{\mathrm{jets}}\geq 150$ GeV.

Expected and observed limits, and corresponding $p$-values and significances (in standard deviations), for signal regions based on cuts on $E_{\mathrm{T}}^{\mathrm{miss}}$. All these signal regions have an additional requirement of $H_{\mathrm{T}}^{\mathrm{jets}} < 150$ GeV.

The measured individual cross sections in the fiducial region and the combined cross sections for 4-muon and 4-electron final states at a centre-of-collision energy of 8 TeV.

The measured individual cross sections in the fiducial region and the combined cross sections for for 2-muon-2-electron final states at a centre-of-collision energy of 8 TeV.

The measured cross section for four-lepton final states at a centre-of-collision energy of 8 TeV.

The branching fraction for Z0 --> 4 LEPTON, summed over all final states, measured using both the 7 and 8 TeV datasets.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Measured fiducial cross section in all $\ell^+\ell^-\ell'^+\ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Cross section extrapolated to total phase space and all Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity uncertainty, the second is the luminosity uncertainty.

Measured jet multiplicity distribution in the $W\mu\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured dilepton invariant mass distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured $E_{T}^{miss}$ distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured leading jet $p_{T}$ distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured jet multiplicity distribution in the $Z\mu\mu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows. P P --> Z0 JET(S) X.

Measured transverse mass distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured $E_{T}^{miss}$ distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured leading jet $p_{T}$ distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured jet multiplicity distribution in the $We\nu$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured dilepton invariant mass distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured $E_{T}^{miss}$ distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured leading jet $p_{T}$ distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured jet multiplicity distribution in the $Zee$+jets control region for the inclusive SR1 selection, compared to the background expectations. The latter include the global normalization factors extracted from the data. Where appropriate, the last bin of the distribution includes overflows.

Measured distribution of the jet multiplicity for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of $E_{T}^{miss}$ for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of leading jet $p_{T}$ for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_{T}$ to $E_{T}^{miss}$ ratio for the SR1 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the jet multiplicity for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the jet multiplicity for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ for SR9 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ to $E_{T}^{miss}$ ratio for SR7 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Measured distribution of the leading jet $p_T$ to $E_{T}^{miss}$ ratio for SR9 selection compared to the SM expectations. The $Z\nu\nu$+jets contribution is shown as constrained by the $W\mu\nu$+jets control sample. Where appropriate, the last bin of the distribution includes overflows. The distribution of different ADD, WIMP and GMSB scenarios are included.

Observed and expected 95$\%$ CL limit on the fundamental Planck scale in $4+n$ dimensions, $M_D$, as a function of the number of extra dimensions. In the figure the two results overlap. The shaded areas around the expected limit indicate the expected $\pm 1\sigma$ and $\pm 2\sigma$ ranges of limits in the absence of a signal. The 95$\%$ CL observed limits after the suppression of the events with $\hat{s} > M_D^2$ is applied (truncated) are also given.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the scalar operator D1. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the vector operator D5. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the axial vector operator D8. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the tensor operator D9. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the gluon operator D11. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the gluon operator C5. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Observed 95% CL limits on the suppression scale M* as a function of the mediator mass Mmed, assuming a Z'-like boson in a simplified model and a DM mass of 50 GeV and 400 GeV. The width of the mediator is varied between Mmed/3 and Mmed/8pi.

Observed 95% CL upper limits on the product of couplings of the simplified model vertex in the plane of mediator and WIMP mass (Mmed versus m_chi).

Upper limits at 90% C.L. on the WIMP-nucleon scattering cross section as a function of m_chi for spin-independent interactions, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

Upper limits at 90% C.L. on the WIMP-nucleon scattering cross section as a function of m_chi for spin-dependent interactions, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

Upper limits at 90% C.L. on the WIMP-nucleon annihilation cross section as a function of m_chi, for a coupling strength of unity or the maximum value that keeps the model within its perturbative regime. The truncation procedure is applied for both cases.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for degenerate squark/gluino masses.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 1/2 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 1/4 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 2 \times m_{\tilde{q}}$.

95$\%$ CL lower limits on the gravitino mass $m_{\tilde{G}}$ as a function of the squark mass $m_{\tilde{q}}$ for non-degenerate squark/gluino masses: $ m_{\tilde{g}} = 4 \times m_{\tilde{q}}$.

Observed and expected 95$\%$ CL upper limit on $\sigma \times {\rm{BR}}(H \to {\rm{invisible}})$ as a function of the Higgs boson mass.

Limits at 95% C.L. on the EFT suppression scale M* as a function of the WIMP mass m_chi, for the scalar operator C1. Results where EFT truncation is applied are also shown for couplings of 1 and the perturbative limit.

Detector response matrix (PROB) for the acoplanarity variable (ACO) for mu+ mu- channel (empty bins are not reported).

Acoplanarity (ACO) distributions unfolded for detector resolution, and lepton pair trigger, reconstruction and identification efficiencies for e+ e- channel (empty bins are not reported).

Acoplanarity (ACO) distributions unfolded for detector resolution, and lepton pair trigger, reconstruction and identification efficiencies for mu+ mu- channel (empty bins are not reported).

The lepton pair exclusive selection efficiency in the fiducial region for signal MC events as a function of M and Y for e+ e- channel.

The lepton pair exclusive selection efficiency in the fiducial region for signal MC events as a function of M and Y for mu+ mu- channel.

The lepton pair exclusive selection efficiency in the fiducial region for single-dissociative MC events as a function of M and Y for e+ e- channel.

The lepton pair exclusive selection efficiency in the fiducial region for single-dissociative MC events as a function of M and Y for mu+ mu- channel.