Observed and expected numbers of events with exactly three leptons with the scalar sum of jet transverse momentum values HT < 200 GeV. "On-Z" refers to events with at least one E+ E- or MU+ MU- (OSSF) pair with dilepton mass between 75 and 105 GeV, while "Off-Z" refers to events with one or two OSSF pairs, none of which fall in this mass range. The OSSFN designation refers to the number of E+ E- and MU+ MU- pairs in the event. Search channels binned in ET have been combined into coarse ET bins for the purposes of presentation.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the natural Higgsino NLSP scenario with BR(NEUTRALINO1 --> HIGGS GRAVITINO) = BR(NEUTRALINO1 --> Z GRAVITINO) = 0.5 for strong plus electroweak production.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the natural Higgsino NLSP scenario with BR(NEUTRALINO1 --> HIGGS GRAVITINO) = 1.0 for strong plus electroweak production.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the natural Higgsino NLSP scenario with BR(NEUTRALINO1 --> Z0 GRAVITINO) = 1.0 for strong plus electroweak production.

The product of acceptance and efficiency for the calculation of the 95% C.L. limit for the natural Higgsino NLSP scenario with strong plus electroweak production for BR(NEUTRALINO1 --> HIGGS GRAVITINO) = BR(NEUTRALINO1 --> Z0 GRAVITINO) = 0.5. The chargino-Higgsino mass is fixed at 150 GeV.

The product of acceptance and efficiency for the calculation of the 95% C.L. limit for the natural Higgsino NLSP scenario with strong plus electroweak production for BR(NEUTRALINO1 --> HIGGS GRAVITINO) = BR(NEUTRALINO1 --> Z0 GRAVITINO) = 0.5. The chargino-Higgsino mass is fixed at 350 GeV.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the natural Higgsino NLSP scenario with strong plus electroweak production for BR(NEUTRALINO1 --> HIGGS GRAVITINO) = 1.0. The chargino-Higgsino mass is fixed at 150 GeV.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the natural Higgsino NLSP scenario with strong plus electroweak production for BR(NEUTRALINO1 --> HIGGS GRAVITINO) = 1.0. The chargino-Higgsino mass is fixed at 350 GeV.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the natural Higgsino NLSP scenario with strong plus electroweak production for BR(NEUTRALINO1 --> Z0 GRAVITINO) = 1.0. The chargino-Higgsino mass is fixed at 150 GeV.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the natural Higgsino NLSP scenario with strong plus electroweak production for BR(NEUTRALINO1 --> Z0 GRAVITINO) = 1.0. The chargino-Higgsino mass is fixed at 350 GeV.

The product of acceptance and efficiency for the calculation of the 95% C.L. limit on BR(NEUTRALINO1 --> HIGGS GRAVITINO) for the natural Higgsino NLSP scenario with fixed chargino-Higgsino mass of 150 GeV assuming BR(NEUTRALINO1 --> HIGGS GRAVITINO) + BR(NEUTRALINO1 --> Z GRAVITINO) = 1.0 and strong plus weak production.

The product of acceptance and efficiency for the calculation of the 95% C.L. limit on BR(NEUTRALINO1 --> HIGGS GRAVITINO) for the natural Higgsino NLSP scenario with fixed chargino-Higgsino mass of 250 GeV assuming BR(NEUTRALINO1 --> HIGGS GRAVITINO) + BR(NEUTRALINO1 --> Z0 GRAVITINO) = 1.0 and strong plus weak production.

The product of acceptance and efficiency for the calculation of the 95% C.L. limit on BR(NEUTRALINO1 --> HIGGS GRAVITINO) for the natural Higgsino NLSP scenario with fixed chargino-Higgsino mass of 350 GeV assuming BR(NEUTRALINO1 --> HIGGS GRAVITINO) + BR(NEUTRALINO1 --> Z0 GRAVITINO) = 1.0 and strong plus weak production.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the slepton co-NLSP model in the gluino-chargino (wino-like chargino) mass plane.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the stau-NLSP and stau-NNLSP scenario in the degenerate smuon- and selectron- stau mass plane.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the T1tttt model in the gluino-neutralino mass plane.

The product of acceptance and efficiency for the calculation of the 95% C.L. limits for the T6ttWW model in the sbottom-chargino mass plane.

Observed 95% C.L. exclusion contour for the T1tttt scenario.

Observed - 1sig(theoretical) 95% C.L. exclusion contour for the T1tttt scenario.

Observed + 1sig(theoretical) 95% C.L. exclusion contour for the T1tttt scenario.

Expected 95% C.L. exclusion contour for the T1tttt scenario.

Expected - 1sig 95% C.L. exclusion contour for the T1tttt scenario.

Expected + 1sig 95% C.L. exclusion contour for the T1tttt scenario.

Observed 95% C.L. exclusion contour for the T6ttWW scenario.

Observed - 1sig(theoretical) 95% C.L. exclusion contour for the T6ttWW scenario.

Observed + 1sig(theoretical) 95% C.L. exclusion contour for the T6ttWW scenario.

Expected 95% C.L. exclusion contour for the T6ttWW scenario.

Expected - 1sig 95% C.L. exclusion contour for the T6ttWW scenario.

Expected + 1sig 95% C.L. exclusion contour for the T6ttWW scenario.

Observed and expected 95% C.L. limits for the natural Higgsino NLSP scenario with BR(NEUTRALINO1 --> HIGGS GRAVITINO) = BR(NEUTRALINO1 --> Z GRAVITINO) = 0.5 for strong plus electroweak production.

Observed and expected 95% C.L. limits for the natural Higgsino NLSP scenario with BR(NEUTRALINO1 --> HIGGS GRAVITINO) = 1.0 for strong plus electroweak production. Successive instances of SIG(OBS) = SIG(EXP) =0 have been rebinned over M(STOP) to reduce the size of the table.

Observed and expected 95% C.L. limits for the natural Higgsino NLSP scenario with BR(NEUTRALINO1 --> Z0 GLUINO) = 1.0 for strong plus electroweak production.

Observed 95% C.L. limits on BR(NEUTRALINO1 --> HIGGS GRAVITINO) for the natural Higgsino NLSP scenario with fixed chargino-Higgsino mass of 150 GeV assuming BR(NEUTRALINO1 --> HIGGS GRAVITINO) + BR(NEUTRALINO1 --> Z GRAVITINO) = 1.0 and strong plus weak production.

Observed 95% C.L. limits on BR(NEUTRALINO1 --> HIGGS GRAVITINO) for the natural Higgsino NLSP scenario with fixed chargino-Higgsino mass of 250 GeV assuming BR(NEUTRALINO1 --> HIGGS GRAVITINO) + BR(NEUTRALINO1 --> Z GRAVITINO) = 1.0 and strong plus weak production.

Observed 95% C.L. limits on BR(NEUTRALINO1 --> HIGGS GRAVITINO) for the natural Higgsino NLSP scenario with fixed chargino-Higgsino mass of 350 GeV assuming BR(NEUTRALINO1 --> HIGGS GRAVITINO) + BR(NEUTRALINO1 --> Z GRAVITINO) = 1.0 and strong plus weak production.

Observed and expected 95% C.L. limits for the slepton co-NLSP model in the gluino-chargino (wino-like chargino) mass plane are shown.

Observed and expected 95% C.L. limits for the stau-NLSP and stau-NNLSP scenario in the degenerate smuon- and selectron- stau mass plane are shown. Successive instances of SIG(OBS) = SIG(EXP) =0 have been rebinned over M(SELECTRON) to reduce the size of the table.

Observed and expected 95% C.L. limits for the T1tttt model in the gluino-neutralino mass plane are shown.

Observed and expected 95% C.L. limits for the T6ttWW model in the sbottom-chargino mass plane are given.

The observed and expected 95% CL upper limits on model-independent visible cross-sections, along with the observed $p0$ values, for the stable signal region, as a function of different mass windows, for which the lower bound is shown. The upper boundary on the mass window is 5 TeV for all windows.

The observed and expected 95% CL upper limits on model-independent visible cross-sections, along with the observed $p0$ values, for the metastable signal region, as a function of different mass windows, for which the lower bound is shown. The upper boundary on the mass window is 5 TeV for all windows.

For each gluino lifetime and mass in the signal samples, the lower boundary of the mass window in which at least $70\%$ of the reconstructed signal appears. The upper boundary for all mass windows is 5 TeV.

Acceptance and efficiency for a representative set of pair-produced gluino signal samples. The mass of the gluino ($m(\tilde{g})$), its lifetime ($\tau(\tilde{g})$) and the mass of the neutralino ($m(\tilde{\chi}^{0})$) are given in the first three columns. The Pythia 6.4.27 signal samples shown in this table are not reweighted to match the transverse momentum of the gluino-gluino system as simulated by MadGraph5_aMC@NLO. The acceptance is defined as the fraction of events passing a loose set of fiducial requirements. The full simulation efficiency (Full sim. $\epsilon$) is defined as the ratio of the number of reconstructed events, as expected by the full ATLAS simulation, and the number of events passing the fiducial requirements. The parameterised simulation efficiency (Param. sim. $\epsilon$) is defined as the ratio of the number of events estimated using a set of parametrised efficiencies (see auxiliary Figures 9,10,11,12) and the number of events passing the fiducial requirements alone.

The reconstructed candidate track mass distributions for observed data, predicted background, and the expected contribution from two signal models in the metastable R-hadron signal region. The yellow band around the background estimation includes both the statistical and systematic uncertainties.

The reconstructed candidate track mass distributions for observed data, predicted background, and the expected contribution from two signal models in the stable R-hadron signal region. The yellow band around the background estimation includes both the statistical and systematic uncertainties.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 10$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for stable gluino $R$-hadrons, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

Observed 95% lower limits on the gluino mass in the gluino lifetime--mass plane. The excluded area is to the left of the curves.

Expected 95% lower limits on the gluino mass in the gluino lifetime--mass plane. The excluded area is to the left of the curves.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 1$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 3$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 30$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The 95% CL upper limit on the cross-section as a function of mass for gluinos with lifetime $\tau = 50$ ns decaying into $q\bar{q}$ and a 100 GeV neutralino, with the observed limit shown as a solid black line. The predicted production cross-section values are shown in purple along with their uncertainty. The expected upper limit in the case of only background is shown by the dashed black line, with a green $\pm 1\sigma$ and a yellow $\pm 2\sigma$ band.

The relationship between generated and reconstructed mass for gluino $R$-hadrons. Above 1500 GeV, the reconstructed mass falls below the generated mass due to bias in the reconstructed momentum. The uncertainty on the reconstructed mass is dominated by momentum uncertainty. The black dots represent the reconstructed mass computed as the most probable value of a Gaussian fit function, with the error bars showing its statistical uncertainty, while the orange band is the full-width at half maximum of the reconstructed mass distribution.

The parameterised efficiency for events to pass metastable event selections (including trigger, E$_{T}^{miss}$, and event cleaning requirements) as a function of the true E$_{T}^{miss}$ in the system, which is calculated at generator level. Event-level efficiencies are evaluated for events which have at least true E$_{T}^{miss} > 50$ GeV. The metastable event efficiencies are evaluated for different radial regions depending on the smallest radial distance, R, at which an R-hadron decays in the detector.

The parameterised efficiency for events to pass metastable event selections (including trigger, E$_{T}^{miss}$, and event cleaning requirements) as a function of the true E$_{T}^{miss}$ in the system, which is calculated at generator level. Event-level efficiencies are evaluated for events which have at least true E$_{T}^{miss} > 50$ GeV. The stable event efficiencies are evaluated for samples in which no R-hadron decays within the detector.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$, and for different radial decay positions of the particle. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

The parameterised efficiency for particles to pass full track selections in the metastable signal region, as function of the particle’s $\beta$, in different bins of transverse momentum, $p_{T}$. The stable efficiency is evaluated for samples which do not decay within the detector. The efficiency is evaluated for particles which pass a loose set of fiducial requirements at generator level.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Efficiency for the calorimetric MET>80 GeV trigger as a function of the metastable R-hadron mass. The R-hadron decays to g/qq plus neutralino of mass = m(gluino) - 100 GeV with a lifetime of 1 ns.

Efficiency for the calorimetric MET>80 GeV trigger as a function of the metastable R-hadron mass. The R-hadron decays to g/qq plus neutralino of mass 100 GeV with a lifetime of 1 ns.

Efficiency for the calorimetric MET>80 GeV trigger as a function of the stable chargino mass.

Total selection efficiency as a function of the stable R-hadron mass.

Total selection efficiency as a function of the metastable R-hadron mass. The R-hadron decays to g/qq plus neutralino of mass 100 GeV with a lifetime of 10 ns.

Total selection efficiency as a function of the metastable R-hadron mass. The R-hadron decays to g/qq plus neutralino of mass = m(gluino) - 100 GeV with a lifetime of 10 ns.

Total selection efficiency as a function of the metastable R-hadron mass. The R-hadron decays to g/qq plus neutralino of mass 100 GeV with a lifetime of 1 ns.

Total selection efficiency as a function of the stable chargino mass.

Ionisation distribution of all the CR2 tracks, and those not matched to a reconstructed muon. The two distributions are normalised to their total number of entries.

Distribution of the mass of selected candidates, derived from the specific ionisation loss, for an example of gluino R-hadron signal, for searches for stable particles. The signal distributions are stacked on the expected background, and a narrower binning is used for them to allow the signal shape to be seen more clearly. The number of signal events is that expected according to the theoretical cross sections.

Distribution of the mass of selected candidates, derived from the specific ionisation loss, for one example of chargino signal, for searches for stable particles. The signal distributions are stacked on the expected background, and a narrower binning is used for them to allow the signal shape to be seen more clearly. The number of signal events is that expected according to the theoretical cross sections.

Distribution of the mass of selected candidates, derived from the specific ionisation loss, for background and data, for searches for stable particles. The expected background is shown with its total uncertainty (sum in quadrature of statistical, normalisation and systematic errors).

Distribution of the mass of selected candidates, derived from the specific ionisation loss, for an example of gluino R-hadron signal, for searches for metastable particles. The signal distributions are stacked on the expected background, and a narrower binning is used for them to allow the signal shape to be seen more clearly. The number of signal events is that expected according to the theoretical cross sections.

Distribution of the mass of selected candidates, derived from the specific ionisation loss, for an example of chargino signal, for searches for metastable particles. The signal distributions are stacked on the expected background, and a narrower binning is used for them to allow the signal shape to be seen more clearly. The number of signal events is that expected according to the theoretical cross sections.

Distribution of the mass of selected candidates, derived from the specific ionisation loss, for background and data. The expected background is shown with its total uncertainty (sum in quadrature of statistical, normalisation and systematic errors).

Theoretical values for the cross section of gluino pairs production with their uncertainty.

Expected upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau =10 ns, decaying into g/qq plus a light neutralino of mass 100 GeV, in the background-only case, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau =10 ns, decaying into g/qq plus a light neutralino of mass 100 GeV.

Expected upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau =10 ns, decaying into g/qq plus a heavy neutralino of mass(gluino) - 100 GeV, in the background-only case, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau =10 ns, decaying into g/qq plus a heavy neutralino of mass(gluino) - 100 GeV.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section, plus 1 experimental sigma.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section, minus 1 experimental sigma.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section minus its uncertainty.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section plus its uncertainty.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section, plus 1 experimental sigma.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section, minus 1 experimental sigma.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section minus its uncertainty.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into g/qq plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section plus its uncertainty.

Expected upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau =10 ns, decaying into tt plus a light neutralino of mass 100 GeV, in the background-only case, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau =10 ns, decaying into tt plus a light neutralino of mass 100 GeV.

Expected upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau =10 ns, decaying into tt plus a heavy neutralino of mass(gluino) - 100 GeV, in the background-only case, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau =10 ns, decaying into tt plus a heavy neutralino of mass(gluino) - 100 GeV.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section, plus 1 experimental sigma.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section, minus 1 experimental sigma.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section minus its uncertainty.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a light neutralino of mass 100 GeV, with respect to the nominal theoretical cross section plus its uncertainty.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section, plus 1 experimental sigma.

The expected excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section, minus 1 experimental sigma.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section minus its uncertainty.

The observed excluded range of lifetimes as a function of gluino mass for gluino R-hadrons decaying into tt plus a heavy neutralino of mass = m(gluino) - 100 GeV, with respect to the nominal theoretical cross section plus its uncertainty.

Theoretical values for the production cross section of charginos or chargino/neutralino pairs, with their uncertainty.

Expected upper limits on the production cross section as a function of mass for metastable charginos, with lifetime tau =1.0 ns, decaying into neutralino + pion, in the background-only case, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable charginos, with lifetime tau =1.0 ns, decaying into neutralino + pion.

The expected excluded range of lifetimes as a function of chargino mass for charginos decaying into neutralino plus pion, with respect to the nominal theoretical cross section.

The expected excluded range of lifetimes as a function of chargino mass for charginos decaying into neutralino plus pion, with respect to the nominal theoretical cross section, plus 1 experimental sigma.

The expected excluded range of lifetimes as a function of chargino mass for charginos decaying into neutralino plus pion, with respect to the nominal theoretical cross section, minus 1 experimental sigma.

The observed excluded range of lifetimes as a function of chargino mass for charginos decaying into neutralino plus pion, with respect to the nominal theoretical cross section.

The observed excluded range of lifetimes as a function of chargino mass for charginos decaying into neutralino plus pion, with respect to the nominal theoretical cross section minus its uncertainty.

The observed excluded range of lifetimes as a function of gluino mass for chargino mass for charginos decaying into neutralino plus pion, with respect to the nominal theoretical cross section plus its uncertainty.

dEdx ionization for data, 1 TeV gluino R-hadrons stable and decaying in 100 GeV neutralinos with a 10 ns lifetime and for charginos of 350 GeV. Tracks that fulfil all the requirements up to including the High-m_T (see Tab.1 in the paper) are considered at this stage and normalised to an integrated luminosity of 18.4 fb^-1.

Expected upper limits on the production cross section as a function of mass for stable gluino R-hadrons, in case of background only, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for stable gluino R-hadrons.

Theoretical values for the cross section of squark pairs production with their uncertainty.

Expected upper limits on the production cross section as a function of mass for stable sbottom R-hadrons, in case of background only, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for stable sbottom $R$-hadrons. Cross section IN PB.

Expected upper limits on the production cross section as a function of mass for stop R-hadrons, in case of background only, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for stop R-hadrons.

Expected upper limits on the production cross section as a function of mass for stable charginos, in case of background only, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for stable charginos.

Expected upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau=1.0 ns, decaying to g/qq plus a light neutralino of mass 100 GeV.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau=1.0 ns, decaying to g/qq plus a light neutralino of mass 100 GeV.

Expected upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau=1.0 ns, decaying to g/qq plus a heavy neutralino of mass = m(gluino) - 100 GeV.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau=1.0 ns, decaying to g/qq plus a heavy neutralino of mass = m(gluino) - 100 GeV.

Expected upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau=1.0 ns, decaying to tt plus a light neutralino of mass 100 GeV.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau=1.0 ns, decaying to tt plus a light neutralino of mass 100 GeV.

Expected upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau=1.0 ns, decaying to tt plus a heavy neutralino of mass = m(gluino) - 100 GeV.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable gluino R-hadrons, with lifetime tau=1.0 ns, decaying to tt plus a heavy neutralino of mass = m(gluino) - 100 GeV.

Expected upper limits on the production cross section as a function of mass for metastable charginos, with lifetime tau =15 ns, decaying to neutralino and pion, in case of background only, with its 1 sigma band.

Observed 95 PCT upper limits on the production cross section as a function of mass for metastable charginos, with lifetime tau =15 ns, decaying to neutralino and pion, in case of background only, with its 1 sigma band.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Observed 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the pMSSM grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the pMSSM grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the pMSSM grid.

+1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

-1 sigma excursion of the expected 95% CL limit for the pMSSM grid.

Observed 95% CL limit for the 2Step grid.

Observed 95% CL limit for the 2Step grid when the signal cross section is increased by one standard deviation.

Observed 95% CL limit for the 2Step grid when the signal cross section is decreased by one standard deviation.

Expected 95% CL limit for the 2Step grid.

+1 sigma excursion of the expected 95% CL limit for the 2Step grid.

-1 sigma excursion of the expected 95% CL limit for the 2Step grid.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 9j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 10j50 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 7j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 0b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 1b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

$E_{\mathrm{T}}^{\mathrm{miss}} / \sqrt{H_{\mathrm{T}}}$ distribution in signal region 8j80 2b. Two benchmark signal models are overlaid on the plot for comparison. Labelled `pMSSM' and `2-step', they show signal distributions from the example SUSY models (as described in the paper): a pMSSM slice model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{\pm}}$) = (1300, 200) GeV and a cascade decay model with ($m \tilde{g}$, $m \tilde{\chi_{1}^{0}}$) = (1300, 200) GeV.

Degree of multijet closure for signal and vaidation regions with at no b-jet requirement. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 1 b-jet. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Degree of multijet closure for signal and vaidation regions with at least 2 b-jets. The solid lines are the pre-fit predicted numbers of events and the points are the observed numbers. The blue hatched band shows only the statistical (MC and data) uncertainty on the background estimate. The bins labelled in bold are signal regions, while the others are validation regions. The template closure uncertainty for each SR bin is given by the maximal deviation of data from prediction in any non-SR bin to its left on this plot (although those for 80 GeV regions are independent of deviations in 50 GeV regions).

Summary of all 15 signal regions (post-fit).

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the 2Step grid.

Signal region yielding the best-expected CLs value, the best expected CLs value, and the corresponding observed CLs value for the pMSSM grid.

95% CLs observed upper limit on model cross-section for 2-step signal points for the best-expected signal region.

Performance of the 8j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the pMSSM grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 9j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 10j50-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 7j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-0b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-1b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Performance of the 8j80-2b selection for the 2Step grid: number of generated signal events; total signal cross-section; acceptance; efficiency (fractional); observed CL using this region alone; expected CL using this region alone.

Observed and expected dilepton mass distributions, with the bin boundaries considered for the interpretation, in SRC of the low-pT edge search. All statistical and systematic uncertainties of the expected background are included in the hatched band. An example signal from the $Z^{*}$ model with m(gluino) = 1000 GeV and m(neutralino1) = 900 GeV is overlaid.

Observed and expected dilepton mass distributions, with the bin boundaries considered for the interpretation, in SRC-MET of the low-pT edge search. All statistical and systematic uncertainties of the expected background are included in the hatched band. An example signal from the $Z^{*}$ model with m(gluino) = 1000 GeV and m(neutralino1) = 900 GeV is overlaid.

Observed 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Expected 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Observed 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Expected 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Observed 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Expected 95% CL exclusion contours on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Observed 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Expected 95% CL exclusion contours from the low-p$_{T}$ signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson and the lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the gluino and next-to-lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the gluino and next-to-lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the squark and next-to-lightest neutralino masses in a SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the squark and next-to-lightest neutralino masses in a SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Observed 95% CL exclusion contours from the on-Z signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino.

Expected 95% CL exclusion contours from the on-Z signal regions on the gluino and lightest neutralino masses in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and the lightest neutralino.

Acceptance and efficiency in the on-Z bin for SR-medium for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Acceptance and efficiency in the on-Z bin for SR-high for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-low for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-medium for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SR-high for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SRC for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

Acceptance and efficiency over the full $m_{ll}$ range for SRC-MET for a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the on-Z $m_{ll}$ windows of SR-medium and SR-high, in a SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the signal regions, in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the low-p$_{T}$ signal regions, in a SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the signal regions, in a SUSYscenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson.

The grey numbers show the 95% CL upper limits on the production cross section at each model point, derived from the best expected combination of results in the low-p$_{T}$ signal regions, in a SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson.

Cutflow table for three benchmark signal points from the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, with m(gluino) = 1395 GeV and m(neutralino2) = 505 GeV, m(gluino) = 920 GeV and m(neutralino2) = 230 GeV and m(gluino) = 940 GeV and m(neutralino2) = 660 GeV, in the on-$Z$ $m_{ll}$ bins of SR-medium and SR-high for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow table for a signal point from the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, with m(gluino) = 1000 GeV and m(neutralino1) = 800 GeV, m(gluino) = 1200 GeV and m(neutralino1) = 500 GeV and m(gluino) = 1400 GeV and m(neutralino1) = 100 GeV, in all m_{ll}$ bins of SR-low, SR-medium and SR-high for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Cutflow table for a signal point from the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, with m(gluino) = 600 GeV and m(neutralino1) = 560 GeV and m(gluino) = 1000 GeV and m(neutralino1) = 960 GeV, in all $m_{ll}$ bins of SRC and SRC-MET for the electron and muon channels separately. The numbers are normalized to a luminosity of 36.1 fb$^{-1}$.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where squarks are produced in pairs and decay to an on-shell Z-boson and a 1 GeV lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on-shell Z-boson the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, corresponding to the SR determined to give the best expected limit for a given signal point.

Low-$p_{T}$ signal region used to derive the exclusion limit in the compressed region for the SUSY scenario where gluinos are produced in pairs and decay to an on- or off-shell $Z$ boson, corresponding to the SR determined to give the best expected limit for a given signal point.

Signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Low-$p_{T}$ signal region used to derive the exclusion limit for the SUSY scenario where gluinos are produced in pairs and decay via sleptons into the lightest neutralino, corresponding to the SR determined to give the best expected limit for a given signal point.

Expected 95% CL exclusion contour for the Gbb signal.

Observed 95% CL exclusion contour for the Gbb signal.

Expected 95% CL exclusion contour for the Gtt combination.

Observed 95% CL exclusion contour for the Gtt combination.

Acceptances for the Gbb model in SR-Gbb-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptance times efficiency for the Gbb model in SR-Gbb-A.

Acceptance times efficiency for the Gbb model in SR-Gbb-B.

Acceptance times efficiency for the Gbb model in SR-Gbb-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-B.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-B.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gbb model.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 0-lepton channel.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 1-lepton channel.

Combination of two 0-lepton and 1-lepton signal regions yielding the best expected sensitivity for each point of the parameter space in the Gtt model.

Expected exclusion limits in the gluino-neutralino mass plane, for the higgsino-bino GGM model with $\mu < 0$, using the merged $\rm{SR}^{\gamma b}_{L}$ and $\rm{SR}^{\gamma b}_{H}$ analyses.

Observed exclusion limits in the $M_3$-$\mu$ plane, for the higgsino-bino GGM model with $\mu > 0$, using the merged $\rm{SR}^{\gamma j}_{L}$ and $\rm{SR}^{\gamma j}_{H}$ analyses.

Expected exclusion limits in the $M_3$-$\mu$ plane, for the higgsino-bino GGM model with $\mu > 0$, using the merged $\rm{SR}^{\gamma j}_{L}$ and $\rm{SR}^{\gamma j}_{H}$ analyses.

Contour of exclusion in wino production cross section from the photon+$\ell$ analysis, as a function of the wino mass parameter $m_{\tilde{W}}$. The expected limit is shown along with its $\pm 1$ and $\pm 2$ standard deviation values.

Numbers of selected data events at progressive stages of the selection, for each SR for the diphoton, photon+j and photon+$\ell$ analyses. Where no number is shown the cut was not applied.

Expected number of signal events at progressive stages of the selection, shown for points in the parameter space that typify the region for which each selection of the diphoton, photon+j and photon+$\ell$ analyses is optimized, and scaled to an integrated luminosity of $20.3\,\mathrm{fb}^{-1}$. Where no number is shown the cut was not applied.

Expected number of signal events at progressive stages of the $\rm{SR}^{\gamma b}_{H}$ selection, shown for data and signal Monte Carlo datasets.

Expected number of signal events at progressive stages of the $\rm{SR}^{\gamma b}_{L}$ selection, shown for data and signal Monte Carlo datasets.

$\rm{SR}^{\gamma\gamma}_{S-H}$ and $\rm{SR}^{\gamma\gamma}_{S-L}$ signal acceptance*efficiency across the strong-production parameter space, for $m_{\tilde{g}}$ between 1550 and 1600 GeV.

$\rm{SR}^{\gamma\gamma}_{S-H}$ and $\rm{SR}^{\gamma\gamma}_{S-L}$ signal acceptance*efficiency across the strong-production parameter space, for $m_{\tilde{g}} = 1500$ GeV.

$\rm{SR}^{\gamma\gamma}_{S-H}$ and $\rm{SR}^{\gamma\gamma}_{S-L}$ signal acceptance*efficiency across the strong-production parameter space, for $m_{\tilde{g}}$ between 1350 and 1450 GeV.

$\rm{SR}^{\gamma\gamma}_{S-H}$ and $\rm{SR}^{\gamma\gamma}_{S-L}$ signal acceptance*efficiency across the strong-production parameter space, for $m_{\tilde{g}}$ between 1250 and 1300 GeV.

$\rm{SR}^{\gamma\gamma}_{S-H}$ and $\rm{SR}^{\gamma\gamma}_{S-L}$ signal acceptance*efficiency across the strong-production parameter space, for $m_{\tilde{g}}$ between 1150 and 1200 GeV.

$\rm{SR}^{\gamma\gamma}_{S-H}$ and $\rm{SR}^{\gamma\gamma}_{S-L}$ signal acceptance*efficiency across the strong-production parameter space, for $m_{\tilde{g}}$ between 1000 and 1100 GeV.

$\rm{SR}^{\gamma\gamma}_{W-H}$ and $\rm{SR}^{\gamma\gamma}_{W-L}$ signal acceptance*efficiency for $m_{\tilde{W}}$ between 650 and 800 GeV.

$\rm{SR}^{\gamma\gamma}_{W-H}$ and $\rm{SR}^{\gamma\gamma}_{W-L}$ signal acceptance*efficiency for $m_{\tilde{W}}$ between 400 and 600 GeV.

$\rm{SR}^{\gamma\gamma}_{W-H}$ and $\rm{SR}^{\gamma\gamma}_{W-L}$ signal acceptance*efficiency for $m_{\tilde{W}}$ between 100 and 400 GeV.

$\rm{SR}^{\gamma b}_{H}$ signal acceptance*efficiency for combined strong and weak production across the $\mu<0$ higgsino-bino parameter space.

$\rm{SR}^{\gamma b}_{L}$ signal acceptance*efficiency for combined strong and weak production across the $\mu<0$ higgsino-bino parameter space.

$\rm{SR}^{\gamma j}_{H}$ signal acceptance*efficiency for combined strong and weak production across the $\mu>0$ higgsino-bino parameter space.

$\rm{SR}^{\gamma j}_{L}$ signal acceptance*efficiency for combined strong and weak production across the $\mu>0$ higgsino-bino parameter space.

Acceptance-times-efficiency (a*e) for the photon+$\ell$ analysis SRs.

The total NLO+NLL strong production cross sections with uncertainties for GGM gluino-neutralino signal points for the diphoton and photon+b analyses. In the variant of the grid used in the diphoton analysis, the electroweak production cross section is negligible.

The total NLO cross sections with uncertainties for GGM wino-bino signal points, for all final states, for the diphoton analysis. The direct bino production cross section is negligible.

The NLO gaugino pair production cross sections with relative uncertainties for GGM gluino-neutralino signal points for the photon+b analysis.

The best signal region used for each signal point in the photon+b analysis.

The total NLO+NLL cross sections with uncertainties for the strong production GGM signal grid for the photon+j analysis.

The total NLO cross sections with uncertainties for the electroweak production GGM signal grid for the photon+j analysis.

The best signal region used for each signal point in the photon+j analysis.

Observed and expected $E_T^{miss}$ distribution in soft dimuon signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution in hard single-lepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution for hard single-lepton 5-jet signal region. The last bin includes the overflow.

Observed and expected $E_{T}^{miss}$ distribution for hard single-lepton 6-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton 3-jet opposite-flavour signal region. The last bin includes the overflow.

Observed 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Expected 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Observed 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Expected 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Observed 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Expected 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Observed 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Expected 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Observed 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Expected 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Observed 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Observed 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production, where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the combination of soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Number of generated events in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Production cross-section in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Number of generated events in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV. squark decaying to quark neutralino1 with varying x.

Production cross-section in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Number of generated evens in the minimal UED model.

Production cross-section in the minimal UED model in pb.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for the soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Acceptance for soft dimuon signal region in the minimal UED model (mUED).

Efficiency for soft dimuon signal region in minimal UED model (mUED).

Acceptance for hard dilepton 3-jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Best expected signal region in the minimal UED model (mUED).

Expected CLs from hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Observed CLs from the hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Expected CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Observed CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Acceptance for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% upper limit on the visible cross-section in the minimal UED model (mUED) from the combination of the soft dimuon and hard dilepton analyses.