Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the top quark rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the tt̄ system transverse momentum in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the tt̄ system transverse momentum in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the absolute value of the tt̄ system rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the tt̄ system rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the mass of the tt̄ system in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the mass of the tt̄ system in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the top quark transverse momentum in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the top quark transverse momentum in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the absolute value of the top quark rapidity in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the top quark rapidity in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Differential cross sections in the full phase space obtained from the H->gammagamma and H->4l combined measurement for the transverse momentum of the leading jet pTj1. The first bin in the pTj1 distribution corresponds to the 0-jet bin in the Njets distribution. The NNLOPS ggF prediction scaled to the N3LO cross section is also provided.

Acceptance factors to extrapolate from the fiducial phase space to the total phase space, in bins of Higgs transverse momentum, in the 4l channel.

Acceptance factors to extrapolate from the fiducial phase space to the total phase space, in bins of Higgs transverse momentum, in the gamma gamma channel.

Acceptance factors to extrapolate from the fiducial phase space to the total phase space, in bins of Higgs rapidity, in the 4l channel.

Acceptance factors to extrapolate from the fiducial phase space to the total phase space, in bins of Higgs rapidity, in the gamma gamma channel.

Acceptance factors to extrapolate from the fiducial phase space to the total phase space, in bins of number of jets, in the 4l channel.

Acceptance factors to extrapolate from the fiducial phase space to the total phase space, in bins of number of jets, in the gamma gamma channel.

Acceptance factors to extrapolate from the fiducial phase space to the total phase space, in bins of the transverse momentum of the leading jet, in the 4l channel.

Acceptance factors to extrapolate from the fiducial phase space to the total phase space, in bins of the transverse momentum of the leading jet, in the gamma gamma channel.

Exclusion limits on higgsino pair production divided by the theory cross-section.The results of the low-mass analysis are used below m(higgsino) = 300 GeV, while those of the high-mass analysis are used above. The figure shows the observed and expected 95% upper limits on the higgsino pair production cross-section as a function of m(higgsino).

Observed and expected 95% limits in the m(higgsino) vs BR(higgsino to higgs+gravitino) plane. The regions above the lines are excluded by the analyses.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the high-mass search. Only the high-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the high-mass search, divided by the theory cross section. Only the high-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the low-mass search. Only the low-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the low-mass search, divided by the theory cross section. Only the low-mass analysis results are used in this figure.

Particle-level acceptance for the low-mass discovery signal regions low-SR-MET0-meff440 and low-SR-MET150-meff440, shown as a function of higgsino mass. The acceptance is defined as the fraction of signal events passing the particle-level event selection that emulates the detector-level selection. The acceptance calculation considers only those signal events where both higgsinos decay to Higgs bosons that subsequently both decay to b-quarks.

The experimental efficiency of the low-mass analysis, for the two discovery signal regions low-SR-MET0-meff440 and low-SR-MET150-meff440, as a function of higgsino mass. The experimental efficiency is defined as the number of events passing the detector-level event selection divided by the number of events passing the event selection for a perfect detector. The denominator is obtained by implementing particle-level event selection that emulate the detector-level selection. Such particle-level selection is not applied on the numerator.

Particle-level acceptance for the high-mass discovery signal regions SR-4b-meff1-A-disc and SR-3b-meff3-A, shown as a function of higgsino mass. The acceptance is defined as the fraction of signal events passing the particle-level event selection that emulates the detector-level selection. The acceptance calculation considers only those signal events where both higgsinos decay to Higgs bosons that subsequently both decay to b-quarks.

The experimental efficiency of the high-mass analysis, for the two discovery signal regions SR-4b-meff1-A-disc and SR-3b-meff3-A, as a function of higgsino mass. The experimental efficiency is defined as the number of events passing the detector-level event selection divided by the number of events passing the event selection for a perfect detector. The denominator is obtained by implementing particle-level event selection that emulate the detector-level selection. Such particle-level selection is not applied on the numerator.

Example cutflow for SR-3b-meff3-A.

Example cutflow for SR-4b-meff1-A-disc.

Cutflow for low-mass analysis for each signal mass point.

Number of data events for the 2-tag category with the tight selection in bins of diphoton mass.

Number of data events for the 1-tag category with the loose selection in bins of four-body mass.

Number of data events for the 2-tag category with the loose selection in bins of four-body mass.

Number of data events for the 1-tag category with the tight selection in bins of four-body mass.

Number of data events for the 2-tag category with the tight selection in bins of four-body mass.

Expected and observed upper limits at the 95% CL on the cross-section of gluon-fusion initiated Higgs boson pair production as a function of $\kappa_{\lambda}$.

Expected and observed upper limits at the 95% CL on the cross-section of gluon-fusion initiated resonant production of a Higgs boson pair as a function of the mass of the resonance, $m_X$.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of leading $p_{T}^j$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of subleading $p_{T}^j$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_0,l)$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $min\Delta\phi(j_1,l)$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\eta_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $\Delta\phi_{ll}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $m_{jj}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{ee}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{\mu\mu}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{e\mu}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{ee}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{\mu\mu}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $p_{T}^{e\mu}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $H_{T}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $ee jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the $e\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $eejj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $\mu\mu jj$ measurement region.

Differential cross-section and uncertainty from each source, as a function of $S_{T}$ for the dominant process in the extreme $e\mu jj$ measurement region.

Expected and observed 95% CL lower limits on first- and second-generation leptoquark masses for different values of $\beta$.

Event yields in the dimuon channel control regions with total uncertainties. The observed number of events is given in the first row. The background event numbers as obtained from the fit are shown together with the total uncertainties. The second row shows the total background expectation, the further rows show the breakdown into different background components.

Event yields in the dielectron channel control regions with total uncertainties. The observed number of events is given in the first row. The background event numbers as obtained from the fit are shown together with the total uncertainties. The second row shows the total background expectation, the further rows show the breakdown into different background components.

Distribution of $m_{LQ}^{min}$ in the training region for the BDT for the $ee jj$ and $\mu\mu jj$ channels. Data are shown together with predicted total background expectation.

Distribution of $m_{LQ}^{T}$ in the training region for the BDT for the $e\nu jj$ and $\mu\nu jj$ channels. Data are shown together with predicted total background expectation.

Data (bold boxes) and background estimates (colour fill) for m_beta vs. m_betagamma for the gluino R-hadron search (1000 GeV). The blue thin-line boxes illustrate the expected signal (on top of background) for the given R-hadron mass hypothesis. The black dashed vertical/horizontal lines at 500 GeV show the mass selection (signal region in the top-right). Two events pass this selection.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of bottom-squark R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of top-squark R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Distribution of the truth-level beta for gluino R-hadrons in exemplary signal MC samples and muons in a Zmumu MC sample. All distributions have been normalised to one. The last bin contains the overflow of the histograms. The distributions illustrate the good discriminating power of the variables.

Distribution of the truth-level betagamma for gluino R-hadrons in exemplary signal MC samples and muons in a Zmumu MC sample. All distributions have been normalised to one. The last bin contains the overflow of the histograms. The distributions illustrate the good discriminating power of the variables.

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 50 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 30 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 10 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Normalized differential cross section, $(1/\sigma_\text{fid})d\sigma_\text{fid}/d\log(m_{bb}/p_\text{T})$, as a function of $\log(m_{bb}/p_\text{T})$ for $m_{bb}$ the invariant mass of the two b-jets.

Summary of the relative uncertainties in the measured fiducial cross section $\sigma^{\mathrm{fid}}_{W^\pm Z j j-EW}$ . The uncertainties are reported as percentages.

Numbers of observed and expected events in the $W^{\pm}Zjj$ signal region and in the three control regions, after the fit. The expected number of $WZjj-EW$ events from $SHERPA$ and the estimated number of background events from the other processes are shown. The sum of the background containing misidentified leptons is labelled "Misid. leptons". The total correlated post-fit uncertainties are quoted.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.