Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 1.5, 1.0, and 0.75 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 1.5, 1.0, and 0.75 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 0.5, 0.35, and 0.25 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 0.5, 0.35, and 0.25 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Fraction of events where both bosons are longitudinally polarized in the region with $p_T^Z>200$ GeV using two unconstrained parameters.

Numbers of observed and expected events in the 00-enhanced signal regions, before the fit. The total uncertainties are quoted.

Summary of the relative uncertainties in the measured longitudinal-longitudinal fractions $f_{00}$. The uncertainties are reported as percentages.

Numbers of observed and expected events in the 00-enhanced signal regions, after the fit. The total uncertainties are quoted.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 20$ GeV of the TT state.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 40$ GeV of the TT state.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 70$ GeV of the TT state.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 20$ GeV of of the sum of all polarization.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 40$ GeV of of the sum of all polarization.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 70$ GeV of of the sum of all polarization.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 20$ GeV of the TT state.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 40$ GeV of the TT state.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 70$ GeV of the TT state.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 20$ GeV of of the sum of all polarization.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 40$ GeV of of the sum of all polarization.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 70$ GeV of of the sum of all polarization.

The $\mathcal{D}$ value for the unfolded $|\Delta Y(l_{W}Z)|$ distributions of the TT polarization state as a function of the $p_T^{WZ}$ cut value.

The $\mathcal{D}$ value for the unfolded $|\Delta Y(WZ)|$ distributions of the TT polarization state as a function of the $p_T^{WZ}$ cut value.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 20$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 40$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 70$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 20$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 40$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 70$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 20$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 40$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 70$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 20$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 40$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 70$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<20$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<40$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<70$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<20$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<40$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<70$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<20$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<40$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<70$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<20$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<40$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<70$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Pre-fit background composition of the SR$3\ell$ Prod. The table shows the event yields as opposed to just the percentages of the relevant background processes.

Post-fit plot of $H_\text{T}(\text{jets})$ in the SR$2\ell$ Dec from a signal-blinded background-only fit.

Post-fit plot of $m(t_\text{SM}, b\text{-jet}_0)$ in the SR$2\ell$ Prod from a signal-blinded background-only fit.

Post-fit plot of $m(\ell_\text{OS},\ell_\text{SS,1})$ in the SR$3\ell$ Dec from a signal-blinded background-only fit.

Post-fit plot of $m(\ell_\text{OS},\ell_\text{SS,1})$ in the SR$3\ell$ Prod from a signal-blinded background-only fit.

Post-fit plot of $D_\text{NN}(tHc)$ in the SR$2\ell$ Dec from the full fit to data.

Post-fit plot of $D_\text{NN}(tHc)$ in the SR$2\ell$ Prod from the full fit to data.

Post-fit plot of $D_\text{NN}(tHc)$ in the SR$3\ell$ Dec from the full fit to data.

Post-fit plot of $D_\text{NN}(tHc)$ in the SR$3\ell$ Prod from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ HF$e$ from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ HF$\mu$ from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ $t\bar{t}V$ from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_2)$ in the CR$3\ell$ HF$e$ from the full fit to data.

Post-fit plot of $p_\text{T}(\ell_2)$ in the CR$3\ell$ HF$\mu$ from the full fit to data.

Post-fit plot of $p_\text{T}(b\text{-jet}_0)$ in the CR$3\ell$ $t\bar{t}W$ from the full fit to data.

Post-fit plot of $p_\text{T}(b\text{-jet}_0)$ in the CR$3\ell$ $t\bar{t}Z$ from the full fit to data.

Observed and expected upper exclusion limits on the branching ratio $\mathcal{B}(t\to Hu)$ for different analyses and their statistical combination.

Observed and expected upper exclusion limits on the branching ratio $\mathcal{B}(t\to Hc)$ for different analyses and their statistical combination.

Post-fit normalisation factors of free-floating background processes and the signal normalisation.

Post-fit predicted and observed yields in all $2\ell$SS signal and control regions. Pre-fit signal contributions for a signal cross section equivalent to $\mathcal{B}(t\to Hq)=0.1\,\%$ are given as well.

Post-fit predicted and observed yields in all $3\ell$ signal and control regions. Pre-fit signal contributions for a signal cross section equivalent to $\mathcal{B}(t\to Hq)=0.1\,\%$ are given as well.

Expected upper limits on $\mathcal{B}(t\to Hq)$ for the nominal fit and alternative fit configurations. One contains the full phase space but only considers statistical uncertainties. Two other configurations consider the full set of systematic uncertainties, but only encompass one final state.

Expected and observed upper limits on $\mathcal{B}(t\to Hq)$ and $|C_{u\phi}^{qt,tq}|$ for the full fit containing all systematic uncertainties.

Pre-fit plot of $H_\text{T}(\text{jets})$ in the SR$2\ell$ Dec from a signal-blinded background-only fit.

Pre-fit plot of $m(t_\text{SM}, b\text{-jet}_0)$ in the SR$2\ell$ Prod from a signal-blinded background-only fit.

Pre-fit plot of $m(\ell_\text{OS},\ell_\text{SS,1})$ in the SR$3\ell$ Dec from a signal-blinded background-only fit.

Pre-fit plot of $m(\ell_\text{OS},\ell_\text{SS,1})$ in the SR$3\ell$ Prod from a signal-blinded background-only fit.

Post-fit plot of $D_\text{NN}(tHu)$ in the SR$2\ell$ Dec from the full fit to data.

Post-fit plot of $D_\text{NN}(tHu)$ in the SR$2\ell$ Prod from the full fit to data.

Post-fit plot of $D_\text{NN}(tHu)$ in the SR$3\ell$ Dec from the full fit to data.

Post-fit plot of $D_\text{NN}(tHu)$ in the SR$3\ell$ Prod from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHc)$ in the SR$2\ell$ Dec from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHc)$ in the SR$2\ell$ Prod from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHc)$ in the SR$3\ell$ Dec from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHc)$ in the SR$3\ell$ Prod from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHu)$ in the SR$2\ell$ Dec from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHu)$ in the SR$2\ell$ Prod from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHu)$ in the SR$3\ell$ Dec from the full fit to data.

Pre-fit plot of $D_\text{NN}(tHu)$ in the SR$3\ell$ Prod from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ HF$e$ from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ HF$\mu$ from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_1)$ in the CR$2\ell$ $t\bar{t}V$ from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_2)$ in the CR$3\ell$ HF$e$ from the full fit to data.

Pre-fit plot of $p_\text{T}(\ell_2)$ in the CR$3\ell$ HF$\mu$ from the full fit to data.

Pre-fit plot of $p_\text{T}(b\text{-jet}_0)$ in the CR$3\ell$ $t\bar{t}W$ from the full fit to data.

Pre-fit plot of $p_\text{T}(b\text{-jet}_0)$ in the CR$3\ell$ $t\bar{t}Z$ from the full fit to data.

Ranking of fit nuisance parameters according to their impact on the post-fit $tHu$ signal normalisation when fixed to $\pm1\sigma$

Ranking of fit nuisance parameters according to their impact on the post-fit $tHc$ signal normalisation when fixed to $\pm1\sigma$

Expected upper exclusion limits on the branching ratio $\mathcal{B}(t\to Hu)$ for each individual final state and the full analysis.

Expected upper exclusion limits on the branching ratio $\mathcal{B}(t\to Hc)$ for each individual final state and the full analysis.

Signal selection efficiency times acceptance for charged Higgs boson with masses between $60\,$GeV to $168\,$GeV. The efficiency times acceptance drops at high masses rapidly due to the low momentum of the $b$-quark produced together with the charged Higgs boson. For the $168\,$GeV mass point the efficiency times acceptance is larger than for the $160\,$GeV mass point due to having a higher probability that the top quark, which decays into the charged Higgs boson and a $b$-quark, is off-shell.

Best fit values of $\mu_{t\bar{t}}$ and $f_{\mathrm{HF}}$ parameters at charged Higgs masses between $60\,$GeV and $168\,$GeV.