Distributions of representative kinematic variables in the misidentified background-enriched same-sign region: (a) the Higgs boson transverse momentum ($p_\text{T}^H$) in the $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ category, (b) the missing transverse momentum (${E_{\mathrm{T}}^{\mathrm{miss}}}$) in the $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ category, (c) the radial distance (dR$(\ell,\ell)$) between the two light leptons associated to the $Z\to\ell{}\ell$ decay process in the $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ category, and (d) the invariant mass ($m_{\ell\ell}$) of the two light leptons associated to the $Z\to\ell{}\ell$ decay in the $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ category. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions and are normalized as predicted by the Standard Model.

Post-fit distributions for NN-based analysis of the NN-scores in the $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (a), $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (b), $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (c) and $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (d) categories. The hatched band indicates the total post-fit uncertainty of the total predicted yields. The post-fit signal contributions are considered as part of the predictions.

Post-fit distributions for NN-based analysis of the NN-scores in the $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (a), $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (b), $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (c) and $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (d) categories. The hatched band indicates the total post-fit uncertainty of the total predicted yields. The post-fit signal contributions are considered as part of the predictions.

Post-fit distributions for NN-based analysis of the NN-scores in the $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (a), $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (b), $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (c) and $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (d) categories. The hatched band indicates the total post-fit uncertainty of the total predicted yields. The post-fit signal contributions are considered as part of the predictions.

Post-fit distributions for NN-based analysis of the NN-scores in the $ZH(\\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (a), $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (b), $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (c) and $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (d) categories. The hatched band indicates the total post-fit uncertainty of the total predicted yields. The post-fit signal contributions are considered as part of the predictions.

Post-fit yields from the NN-based fit performed with $\mu_{VH}^{\tau\tau}=\mu_{ZH}^{\tau\tau}=\mu_{WH}^{\tau\tau}$. The symbol $-$ is used when no events or $<10^{-2}$ events are present.

Event yields as a function of $\log_{10}(S/B)$ for data, background, and a Higgs boson signal with $m_{H} = 125$ GeV. Final-discriminant bins in all regions are combined into bins of $\log_{10}(S/B)$, where $S$ is the fitted signal and $B$ is the fitted background from the NN-based fit. The Higgs boson signal contribution is shown after re-scaling the SM cross-section according to the value of the signal strength extracted from data ($\mu = 1.28$). In the lower panel, the pull of the data relative to the background-only expectation, evaluated as the difference between the data and the background-only expectation divided by the square-root sum of the data and background statistical uncertainty, is shown. The solid line shows the expected pull in each bin for the best-fit signal value.

The fitted values of the Higgs boson signal strength $\mu_{VH}^{\tau\tau}$ for $m_{H} = 125$ GeV for the $WH$ and $ZH$ processes and their combination from the NN-based fit. The individual $\mu_{VH}^{\tau\tau}$ values for the $(W/Z)H$ processes are obtained from a simultaneous fit with the signal strength for each of the $WH$ and $ZH$ processes floating independently. The probability of compatibility of the individual signal strengths is 56\%.

Post-fit distributions for mass-based analysis for $m_{\mathrm{MMC}}$ in the (a) $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$, (b) $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$, and for $m_{\mathrm{2T}}$ in the (c) $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ and (d) $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ categories. The hatched band indicates the total post-fit uncertainty of the total predicted yields. The post-fit signal contributions are considered as part of the predictions.

Post-fit distributions for mass-based analysis for $m_{\mathrm{MMC}}$ in the (a) $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$, (b) $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$, and for $m_{\mathrm{2T}}$ in the (c) $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ and (d) $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ categories. The hatched band indicates the total post-fit uncertainty of the total predicted yields. The post-fit signal contributions are considered as part of the predictions.

Post-fit distributions for mass-based analysis for $m_{\mathrm{MMC}}$ in the (a) $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$, (b) $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$, and for $m_{\mathrm{2T}}$ in the (c) $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ and (d) $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ categories. The hatched band indicates the total post-fit uncertainty of the total predicted yields. The post-fit signal contributions are considered as part of the predictions.

Post-fit distributions for mass-based analysis for $m_{\mathrm{MMC}}$ in the (a) $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$, (b) $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$, and for $m_{\mathrm{2T}}$ in the (c) $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})# and (d) $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ categories. The hatched band indicates the total post-fit uncertainty of the total predicted yields. The post-fit signal contributions are considered as part of the predictions.

The fitted values from the NN-based fit of the Higgs boson signal strength $\mu_{VH}^{\tau\tau}$ for $m_{H} = 125$ GeV are shown separately for the $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$, $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$, $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$, $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ categories, the $WH$ and $ZH$ processes, and their full combination. The individual $\mu_{VH}^{\tau\tau}$ values for the $(W/Z)H$ processes are obtained from a simultaneous fit with the signal strength for each of the $WH$ and $ZH$ processes floating independently.

Summary table with the expected (exp) and observed (obs) values of the $\mu^{\tau\tau}_{\text{VH}}$ and the significance resulting from the mass-based fit.

Event yields as a function of $\log_{10}(S/B)$ for data, background, and a Higgs boson signal with $m_{H} = 125$ GeV. Final-discriminant bins in all regions are combined into bins of $\log_{10}(S/B)$, where $S$ is the fitted signal and $B$ is the fitted background from the NN-based fit. The Higgs boson signal contribution is shown after re-scaling the SM cross-section according to the value of the signal strength extracted from data ($\mu = 1.28$). In the lower panel, the pull of the data relative to the background-only expectation, evaluated as the difference between the data and the background-only expectation divided by the square-root sum of the data and background statistical uncertainty, is shown. The solid line shows the expected pull in each bin for the best-fit signal value.

Summary table with the expected (exp) and observed (obs) values of the $\mu^{\tau\tau}_{\text{VH}}$ and the significance resulting from the mass-based fit.

The fitted values from the mass-based fit of the Higgs boson signal strength $\mu_{VH}^{\tau\tau}$ for $m_{H} = 125$ GeV are shown for the $WH$ and $ZH$ processes and their combination. The individual $\mu_{VH}^{\tau\tau}$ values for the $(W/Z)H$ processes are obtained from a simultaneous fit with the signal strength for each of the $WH$ and $ZH$ processes floating independently. The probability of compatibility of the individual signal strengths is 85\%.

The fitted values from the mass-based fit of the Higgs boson signal strength $\mu_{VH}^{\tau\tau}$ for $m_{H} = 125$ GeV are shown separately for the $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$, $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$, $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$, $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ categories, the $WH$ and $ZH$ processes, and their full combination. The individual $\mu_{VH}^{\tau\tau}$ values for the $(W/Z)H$ processes are obtained from a simultaneous fit with the signal strength for each of the $WH$ and $ZH$ processes floating independently.

Distributions of $d\phi({E_{\mathrm{T}}^{\mathrm{miss}}},\tau_{1})$ (left) and $\eta$ of the leading $p_\text{T}$ $\tau_{\mathrm{had}-\mathrm{vis}}$ (right) in the $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ $Z\to\tau\tau$ validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of $d\phi({E_{\mathrm{T}}^{\mathrm{miss}}},\tau_{1})$ (left) and $\eta$ of the leading $p_\text{T}$ $\tau_{\mathrm{had}-\mathrm{vis}}$ (right) in the $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ $Z\to\tau\tau$ validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the radial distance $dR(\tau_{1},\tau_{2})$ between the two $\tau_{\mathrm{had}-\mathrm{vis}}$ (left) and of the ${E_{\mathrm{T}}^{\mathrm{miss}}}$ (right) in the $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ $W\mathrm{ +jets}$ validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the radial distance $dR(\tau_{1},\tau_{2})$ between the two $\tau_{\mathrm{had}-\mathrm{vis}}$ (left) and of the ${E_{\mathrm{T}}^{\mathrm{miss}}}$ (right) in the $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ $W\mathrm{ +jets}$ validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the ${m_{\mathrm{MMC}}}$ (left) and of the $p_\text{T}$ of the leading $p_\text{T}$ light lepton (right) in the $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ $t\bar{t}$ validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the ${m_{\mathrm{MMC}}}$ (left) and of the $p_\text{T}$ of the leading $p_\text{T}$ light lepton (right) in the $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ $t\bar{t}$ validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the $m_{\mathrm{2T}}$ (left) and of the $\eta$ of the leading $p_\text{T}$ $\tau_{\mathrm{had}-\mathrm{vis}}$ in the $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ $Z\to\tau\tau$ validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the $m_{\mathrm{2T}}$ (left) and of the $\eta$ of the leading $p_\text{T}$ $\tau_{\mathrm{had}-\mathrm{vis}}$ in the $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ $Z\to\tau\tau$ validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the $dR({\tau_{\mathrm{lep}}},{\tau_{\mathrm{had}}})$ between the two objects associated to the Higgs boson decay and of the invariant mass $m_{\ell,\ell}$ of the two light leptons in the $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ all-same-sign validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the $dR({\tau_{\mathrm{lep}}},{\tau_{\mathrm{had}}})$ between the two objects associated to the Higgs boson decay and of the invariant mass $m_{\ell,\ell}$ of the two light leptons in the $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ all-same-sign validation region. The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions.

Distributions of the NN-score in the signal regions sidebands of the $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (a), $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (b), $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (c), $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (d) categories.The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions and are normalized to the fit result performed with one parameter of interest.

Distributions of the NN-score in the signal regions sidebands of the $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (a), $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (b), $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (c), $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (d) categories.The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions and are normalized to the fit result performed with one parameter of interest.

Distributions of the NN-score in the signal regions sidebands of the $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (a), $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (b), $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (c), $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (d) categories.The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions and are normalized to the fit result performed with one parameter of interest.

Distributions of the NN-score in the signal regions sidebands of the $ZH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (a), $ZH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (b), $WH(\tau_{\mathrm{lep}}\tau_{\mathrm{had}})$ (c), $WH(\tau_{\mathrm{had}}\tau_{\mathrm{had}})$ (d) categories.The hatched band represents the pre-fit statistical, experimental and theoretical uncertainties. The signal contributions are considered as part of the predictions and are normalized to the fit result performed with one parameter of interest.

Expected CLs values in the High mA SR, mA vs ma signal grid.

Observed CLs values in the High mA SR, mA vs ma signal grid.

Expected CLs values in the Low mA SR, mA vs ma signal grid.

Observed CLs values in the High mA SR, mA vs ma signal grid.

CLs+b values in the Low mA SR, mA vs tanB signal grid.

CLs+b values in the High mA SR, mA vs ma signal grid.

CLs+b values in the Low mA SR, mA vs ma signal grid.

Cut flow of the 2HDM+a signal points, gluon–gluon fusion production, Low mA SR. tanB = 1, $sin\theta$ = 0.35. The first two entries in the tables are number of raw MC events, third entry is theoretical prediction, and all other lines include the correct weights. Note that during the generation Higgs boson’s branching ratio to taus has been set to 1. An additional factor of 0.0627 is used to account for that, starting from the ‘Initial’ entry.

Cut flow of the 2HDM+a signal points, gluon–gluon fusion production, High mA SR. tanB = 1, $sin\theta$ = 0.35. The first two entries in the tables are number of raw MC events, third entry is theoretical prediction, and all other lines include the correct weights. Note that during the generation Higgs boson’s branching ratio to taus has been set to 1. An additional factor of 0.0627 is used to account for that, starting from the ‘Initial’ entry.

Cut flow of the 2HDM+a signal points, bb annihilation production, Low mA SR. tanB = 1, $sin\theta$ = 0.35. The first two entries in the tables are number of raw MC events, third entry is theoretical prediction, and all other lines include the correct weights. Note that during the generation Higgs boson’s branching ratio to taus has been set to 1. An additional factor of 0.0627 is used to account for that, starting from the ‘Initial’ entry.

Cut flow of the 2HDM+a signal points, bb annihilation production, High mA SR. tanB = 1, $sin\theta$ = 0.35. The first two entries in the tables are number of raw MC events, third entry is theoretical prediction, and all other lines include the correct weights. Note that during the generation Higgs boson’s branching ratio to taus has been set to 1. An additional factor of 0.0627 is used to account for that, starting from the ‘Initial’ entry.

A comparison of the observed and expected yields in the four bins of the Low mA SR.

A comparison of the observed and expected yields in the two bins of the High mA SR.

Expected exclusion contours at 95% CL as a function of mA and ma.

Observed exclusion contours at 95% CL as a function of mA and ma.

Expected +- 1sigma exclusion contours at 95% CL as a function of mA and ma.

Expected exclusion contours at 95% CL as a function of mA and ma.

Observed exclusion contours at 95% CL as a function of mA and ma.

Expected +- 1sigma exclusion contours at 95% CL as a function of mA and ma.

Acceptance, High mA SR, mA vs tanB grid, 400-750 GeV, bb prod

Acceptance, High mA SR, mA vs tanB grid, >750 GeV, bb prod

Acceptance, Low mA SR, mA vs tanB grid, 100-250 GeV, bb prod

Acceptance, Low mA SR, mA vs tanB grid, 250-400 GeV, bb prod

Acceptance, Low mA SR, mA vs tanB grid, 400-550 GeV, bb prod

Acceptance, Low mA SR, mA vs tanB grid, >550 GeV, bb prod

Acceptance, High mA SR, mA vs ma grid, 400-750 GeV, bb prod

Acceptance, High mA SR, mA vs ma grid, >750 GeV, bb prod

Acceptance, Low mA SR, mA vs ma grid, 100-250 GeV, bb prod

Acceptance, Low mA SR, mA vs ma grid, 250-400 GeV, bb prod

Acceptance, Low mA SR, mA vs ma grid, 400-550 GeV, bb prod

Acceptance, Low mA SR, mA vs ma grid, >550 GeV, bb prod

Acceptance, High mA SR, mA vs tanB grid, 400-750 GeV, ggF prod

Acceptance, High mA SR, mA vs tanB grid, >750 GeV, ggF prod

Acceptance, Low mA SR, mA vs tanB grid, 100-250 GeV, ggF prod

Acceptance, Low mA SR, mA vs tanB grid, 250-400 GeV, ggF prod

Acceptance, Low mA SR, mA vs tanB grid, 400-550 GeV, ggF prod

Acceptance, Low mA SR, mA vs tanB grid, >550 GeV, ggF prod

Acceptance, High mA SR, mA vs ma grid, 400-750 GeV, ggF prod

Acceptance, High mA SR, mA vs ma grid, >750 GeV, ggF prod

Acceptance, Low mA SR, mA vs ma grid, 100-250 GeV, ggF prod

Acceptance, Low mA SR, mA vs ma grid, 250-400 GeV, ggF prod

Acceptance, Low mA SR, mA vs ma grid, 400-550 GeV, ggF prod

Acceptance, Low mA SR, mA vs ma grid, >550 GeV, ggF prod

Efficiency, High mA SR, mA vs tanB grid, 400-750 GeV, bb prod

Efficiency, High mA SR, mA vs tanB grid, >750 GeV, bb prod

Efficiency, Low mA SR, mA vs tanB grid, 100-250 GeV, bb prod

Efficiency, Low mA SR, mA vs tanB grid, 250-400 GeV, bb prod

Efficiency, Low mA SR, mA vs tanB grid, 400-550 GeV, bb prod

Efficiency, Low mA SR, mA vs tanB grid, >550 GeV, bb prod

Efficiency, High mA SR, mA vs ma grid, 400-750 GeV, bb prod

Efficiency, High mA SR, mA vs ma grid, >750 GeV, bb prod

Efficiency, Low mA SR, mA vs ma grid, 100-250 GeV, bb prod

Efficiency, Low mA SR, mA vs ma grid, 250-400 GeV, bb prod

Efficiency, Low mA SR, mA vs ma grid, 400-550 GeV, bb prod

Efficiency, Low mA SR, mA vs ma grid, >550 GeV, bb prod

Efficiency, High mA SR, mA vs tanB grid, 400-750 GeV, ggF prod

Efficiency, High mA SR, mA vs tanB grid, >750 GeV, ggF prod

Efficiency, Low mA SR, mA vs tanB grid, 100-250 GeV, ggF prod

Efficiency, Low mA SR, mA vs tanB grid, 250-400 GeV, ggF prod

Efficiency, Low mA SR, mA vs tanB grid, 400-550 GeV, ggF prod

Efficiency, Low mA SR, mA vs tanB grid, >550 GeV, ggF prod

Efficiency, High mA SR, mA vs ma grid, 400-750 GeV, ggF prod

Efficiency, High mA SR, mA vs ma grid, >750 GeV, ggF prod

Efficiency, Low mA SR, mA vs ma grid, 100-250 GeV, ggF prod

Efficiency, Low mA SR, mA vs ma grid, 250-400 GeV, ggF prod

Efficiency, Low mA SR, mA vs ma grid, 400-550 GeV, ggF prod

Efficiency, Low mA SR, mA vs ma grid, >550 GeV, ggF prod