Measured differential cross section with associated uncertainties as a function of $N$($b$-jets). Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate. For the meaning of the bins please refer to the figure.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $m_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Observed statistical correlations, evaluated with a bootstrapping technique, between $p_\mathrm{T}^{\gamma\gamma}$, $N_\mathrm{jets}$, $m_{jj}$, $\Delta\phi_{jj}$, and $p_\mathrm{T}^{j1}$

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N_\mathrm{jets}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N$($b$-jets).

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$ in the VBF fiducial region.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$.

Measured differential cross section with associated uncertainties as a function of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $|y_{\gamma\gamma}|$.

Measured differential cross section with associated uncertainties as a function of $m_{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{\gamma\gamma j}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma j}$.

Measured differential cross section with associated uncertainties as a function of $H_{T}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $H_{T}$.

Measured differential cross section with associated uncertainties as a function of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\tau_{C,j1}$.

Measured differential cross section with associated uncertainties as a function of $\sum\tau_{C,j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\sum\tau_{C,j}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $|\eta^*|$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $|\eta^*|$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. The bins are the same as in the corresponding plot of the differential cross section.

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR6.

Observed yields in the boost_1_ge2J signal region category of the hh channel.

Observed yields in the boost_2 signal region category of the hh channel.

Observed yields in the boost_3 signal region category of the hh channel.

Observed yields in the ttH_0 signal region category of the hh channel.

Observed yields in the ttH_1 signal region category of the hh channel.

Observed yields in the VH_0 signal region category of the hh channel.

Observed yields in the VH_1 signal region category of the hh channel.

Observed yields in the VBF_0 signal region category of the hh channel.

Observed yields in the VBF_1 signal region category of the hh channel.

Observed yields in the boost_0_1J signal region category of the lh channel.

Observed yields in the boost_0_ge2J signal region category of the lh channel.

Observed yields in the boost_1_1J signal region category of the lh channel.

Observed yields in the boost_1_ge2J signal region category of the lh channel.

Observed yields in the boost_2 signal region category of the lh channel.

Observed yields in the boost_3 signal region category of the lh channel.

Observed yields in the VH_0 signal region category of the lh channel.

Observed yields in the VH_1 signal region category of the lh channel.

Observed yields in the VBF_0 signal region category of the lh channel.

Observed yields in the VBF_1 signal region category of the lh channel.

Observed yields in the boost_0_1J signal region category of the ll channel.

Observed yields in the boost_0_ge2J signal region category of the ll channel.

Observed yields in the boost_1_1J signal region category of the ll channel.

Observed yields in the boost_1_ge2J signal region category of the ll channel.

Observed yields in the boost_2 signal region category of the ll channel.

Observed yields in the boost_3 signal region category of the ll channel.

Observed yields in the VH_0 signal region category of the ll channel.

Observed yields in the VH_1 signal region category of the ll channel.

Observed yields in the VBF_0 signal region category of the ll channel.

Observed yields in the VBF_1 signal region category of the ll channel.

Best-fit values and uncertainties for the pp $\rightarrow H\rightarrow\tau\tau$ cross-section measurement and the measurement in the four dominant production modes. All measurements include the branching ratio of $H\rightarrow\tau\tau$ and are performed with true Higgs boson rapidity $|y_{H}|<2.5$. The SM predictions for each region, computed using the inclusive cross-section calculations and the simulated event samples are also shown. The contributions to the total uncertainty in the measurements from statistical (Stat. unc.) or systematic uncertainties (Syst. unc.) are given separately.

The measured correlations between each parameter of interest in the measurement of the cross-sections per production mode

Best-fit values and uncertainties for the $H\rightarrow\tau\tau$ cross-sections, in the reduced stage 1.2 STXS scheme. The EW production mode includes vector-boson fusion and qq$\rightarrow$V($\rightarrow$qq)H processes. All measurements include the branching ratio of $H\rightarrow\tau\tau$ and are performed with true Higgs boson rapidity $|y_{H}|<2.5$. The SM predictions for each region, computed using the inclusive cross-section calculations and the simulated event samples are also shown. The contributions to the total uncertainty in the measurements from statistical (Stat. unc.) or systematic uncertainties (Syst. unc.) are given separately. The asterisk symbol (*) indicates that the criteria for m$_{jj}$ only apply to events with at least two reconstructed jets.

The measured correlations between each pair of parameters of interest in the STXS measurement. The asterisk symbol (*) indicates that the criteria for mjj only apply to events with at least two reconstructed jets.

Correlation matrix between the four W boson decay branching fraction components.

Values of the QCD coupling constant at the W mass, the charm-strange CKM mixing element, and the squared sum of the first two rows of the CKM matrix.

Observed and expected 95% CL lower limits on the $T$-quark mass as a function of the $T$-quark width-to-mass ratio and the branching fraction of the $T \rightarrow Ht$ decay ($\Gamma_{T}$ is the $T$-quark width).

Cutflow table listing the number of events passing each criterion for a $T$-quark hypothesis with a mass of 1.6 TeV and $\kappa_{T} = 0.5$. The initial signal event yield is the predicted number of $T$-quark events inclusive in the Higgs-boson and top-quark decays for 139 fb$^{-1}$.

Observed 95% CL upper limits on the single $T$-quark production cross-section as a function of the $T$-quark coupling $\kappa_{T}$ and $m_{T}$.

Expected 95% CL upper limits on the single $T$-quark production cross-section as a function of the $T$-quark coupling $\kappa_{T}$ and $m_{T}$.

Observed and expected 95% CL lower limits on the $T$-quark mass as a function of the $T$-quark width-to-mass ratio and the branching fraction of the $T \rightarrow Wb$ decay ($\Gamma_{T}$ is the $T$-quark width).

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Number of predicted signal events in the $\mu\mu X$ final states, for several benchmark signal hypotheses for Majorana HNL. The quoted uncertainties include statistical and systematic uncertainties.

The 95% CL limits on $|V_{Ne}|^2$ as a function of the HNL mass for a Majorana HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{N\mu}|^2$ as a function of the HNL mass for a Majorana HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{Ne}|^2$ as a function of the HNL mass for a Dirac HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{N\mu}|^2$ as a function of the HNL mass for a Dirac HNL. Values of $-1$ indicate that no limit is available for the mass point.

Covariance matrix for the background prediction in the signal region bins for the $eeX$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Covariance matrix for the background prediction in the signal region bins for the $\mu\mu X$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Correlation matrix for the background prediction the signal region bins for the $eeX$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Correlation matrix for the background prediction the signal region bins for the $\mu\mu X$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Mean lifetime and production cross section for HNLs of Majorana nature, assuming the decay to three charged leptons and coupling to only electrons or muons, as evaluated from simulated event samples.