The distribution of $\mathrm{p_{T}^{miss}}$ (GeV) in 2L1T MisID CR events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The distribution of $\mathrm{M_{T}}$ (GeV) in 3L OnZ CR events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The distribution of $\mathrm{H_{T}}$ (GeV) in 3L ttZ CR events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

Distribution of BDT score from the SS-M ($\mathrm{B_{e}=B_{\mu}=B_{\tau}}$) BDT for the 3L+2L1T CR events for the combined 2016-2018 data set. The 3L+2L1T CR consists of the 3L OnZ, 3L Z$\mathrm{\gamma}$, and 2L1T MisID CRs. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The distribution of visible diboson $\mathrm{p_{T}}$ (GeV) in 4L ZZ CR events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

Distribution of BDT score from the SS-M ($\mathrm{B_{e}=B_{\mu}=B_{\tau}}$) BDT for the 4L ZZ CR events for the combined 2016-2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The distribution of $\mathrm{L_{T}}$ in all seven multilepton channels for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton of $\mathrm{m_{\tau'}}$ = 1 TeV in the doublet scenario, before the fit, is also overlaid.

The distribution of $\mathrm{p_{T}^{miss}}$ in all seven multilepton channels for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermion of $\mathrm{m_{\Sigma}}$ = 1 TeV in the flavor-democratic scenario, before the fit, is also overlaid.

The distribution of $\mathrm{H_{T}}$ in all seven multilepton channels for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. For illustration, an example signal hypothesis for the production of the scalar leptoquark of $mathrm{m_{S}}$ = 1 TeV coupled to a top quark and a $\tau$ lepton, before the fit, is also overlaid.

The distribution of $\mathrm{M_{OSSF}}$ in channels with at least one light lepton pair (4L, 3L1T, 3L, 2L2T, and 2L1T) for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermion of $\mathrm{m_{\Sigma}}$ = 1 TeV in the flavor-democratic scenario, before the fit, is also overlaid.

The $\mathrm{N_{b}}$ distribution in 4L, 3L1T, 3L, 2L2T, 2L1T, 1L3T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The invariant mass distribution of the opposite-sign same-flavor ($\mathrm{M_{OSSF}}$) tau lepton pair distribution in 2L2T, 1L3T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The $\mathrm{M_{T}^{12}}$ distribution in 4L, 3L1T, 3L, 2L2T, 2L1T, 1L3T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The $\mathrm{N_{b}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{L_{T}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{p_{T}^{miss}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{H_{T}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{M_{OSSF}}$ distribution in 3L, and 2L1T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The invariant mass distribution of the opposite-sign different-flavor ($\mathrm{M_{OSDF}}$) light lepton pair distribution in 3L, and 2L1T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The invariant mass distribution of the opposite-sign same-flavor ($\mathrm{M_{OSSF}}$) tau lepton pair distribution in 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The invariant mass distribution of the opposite-sign different-flavor ($\mathrm{M_{OSDF}}$) light lepton and tau lepton pair distribution in 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{M_{T}^{1}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{M_{T}^{12}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The model independent fundamental table categories for the combined 2016-2018 data set, as defined in Table 1. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{N_{b}}$ distribution in 4L, 3L1T, 2L2T, and 1L3T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 3L channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 2L1T and 1L2T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 3L channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 2L1T and 1L2T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 4L, 3L1T, 2L2T, and 1L3T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 4L, 3L1T, 2L2T, and 1L3T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 3L channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 2L1T and 1L2T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 3L channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 2L1T and 1L2T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 4L, 3L1T, 2L2T, and 1L3T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 4L, 3L1T, 2L2T, and 1L3T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 1B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 1B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 1L2T channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. An example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid. For this category, the signal yield is negligible and is not visible in the figure.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 1B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 1B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 1L2T channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. An example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid. For this category, the signal yield is negligible and is not visible in the figure.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 4L 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 4L 1B/2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L1T, 2L2T, and 1L3T channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 4L 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 4L 1B/2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L1T, 2L2T, and 1L3T channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

Observed and expected upper limits at 95%% CL on the production cross section for the type-III seesaw fermions in the flavor-democratic scenario using the table schemes and the BDT regions of the SS-M and the SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDTs. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95%% CL on the production cross section for the vector-like $\mathrm{\tau}$ leptons: doublet model. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{\tau}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{e}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{\mu}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\mathrm{\tau}$ leptons: singlet model. The limit is shown from the advanced $\mathrm{S_{T}}$ table for all masses.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed lower limits at 95% CL on the mass of the type-III seesaw fermions in the plane defined by $\mathrm{B_{e}}$ and $\mathrm{B_{\tau}}$, with the constraint that $\mathrm{B_{e}+B_{\mu}+B_{\tau}=1}$. These limits arise from the SS-H $\mathrm{B_{\tau}=1}$ BDT when $\mathrm{B_{\tau}\geq0.9}$, and by the SS-H $\mathrm{B_{e}+B_{\mu}+B_{\tau}=1}$ BDT for the other decay branching fraction combinations.

Median Expected lower limits at 95% CL on the mass of the type-III seesaw fermions in the plane defined by $\mathrm{B_{e}}$ and $\mathrm{B_{\tau}}$, with the constraint that $\mathrm{B_{e}+B_{\mu}+B_{\tau}=1}$. These limits arise from the SS-H $\mathrm{B_{\tau}=1}$ BDT when $\mathrm{B_{\tau}\geq0.9}$, and by the SS-H $\mathrm{B_{e}+B_{\mu}+B_{\tau}=1}$ BDT for the other decay branching fraction combinations.

Acceptance times efficiency values for the major SM backgrounds WZ, ZZ, and ttZ in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample. The statistical uncertainty on the acceptance times efficiency values is insignificant with respect to the quoted precision.

Acceptance times efficiency values with statistical uncertainty for the vector-like $\mathrm{\tau}$ lepton model in the doublet scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the vector-like $\mathrm{\tau}$ lepton model in the singlet scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{e}=B_{\mu}=B_{\tau})}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{e}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{\mu}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

The SR distributions of the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the Fundamental $\mathrm{S_{T}}$ table for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the Advanced $\mathrm{S_{T}}$ table for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

Corrected $m(HH)$ distribution in the resolved $4b$ signal region (dots), after the fit under the background-only hypothesis. The error bars on the $4b$ points represent the Poisson uncertainties corresponding to their event yields. The background model (teal histogram) is shown with its total post-fit uncertainty (gray band). The final bin includes overflow. Representative spin-0 signal hypotheses (dashed, dotted, and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. The bottom panel shows the difference between the $4b$ distribution and the background model, relative to the background model. No significant excess of data relative to the SM background is observed.

Corrected $m(HH)$ distribution in the resolved $4b$ signal region (dots), after the fit under the background-only hypothesis. The error bars on the $4b$ points represent the Poisson uncertainties corresponding to their event yields. The background model (teal histogram) is shown with its total post-fit uncertainty (gray band). The final bin includes overflow. Representative spin-2 signal hypotheses (dashed, dotted, and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. The bottom panel shows the difference between the $4b$ distribution and the background model, relative to the background model. No significant excess of data relative to the SM background is observed.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The steps up to the $b$-tag categorization are shown for the spin-0.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The steps up to the $b$-tag categorization are shown for the spin-2.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The efficiencies of the three b-tag categories are shown for the spin-0 scenario; this efficiency is obtained after the other selection steps including the SR definition. The signal efficiency in the 4b region has a maximum around 1.5 TeV. Above that value the track-jets start to merge together, and for the highest resonance masses the 2b category becomes the most efficient.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The efficiencies of the three b-tag categories are shown for the spin-2 scenario; this efficiency is obtained after the other selection steps including the SR definition. The signal efficiency in the 4b region has a maximum around 1.5 TeV. Above that value the track-jets start to merge together, and for the highest resonance masses the 2b category becomes the most efficient.

Comparison of the background model (stacked histograms) with data (dots) in the $2b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

Comparison of the background model (stacked histograms) with data (dots) in the $3b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

Comparison of the background model (stacked histograms) with data (dots) in the $4b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

The $m(HH)$ distributions in the boosted $2b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $2b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $3b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $3b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $4b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $4b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

Expected (dashed black lines) and observed (solid black lines) 95% CL upper limits on the cross-section of resonant $HH$ production in the spin-0 signal models. The $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty ranges for the expected limits (colored bands) are shown. Expected limits using each of the resolved and boosted channels individually (dashed colored lines) are shown. The nominal $H\rightarrow b\bar{b}$ branching ratio is taken as 0.582.

Expected (dashed black lines) and observed (solid black lines) 95% CL upper limits on the cross-section of resonant $HH$ production in the spin-2 signal models. The $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty ranges for the expected limits (colored bands) are shown. Expected limits using each of the resolved and boosted channels individually (dashed colored lines) are shown. The theoretical prediction for the bulk RS model with $k/\bar{M}_{\text{Pl}} = 1$ (solid red line) is shown; the decrease below 350 GeV is due to a sharp reduction in the $G^{*}_{\text{KK}} \rightarrow HH$ branching ratio. The nominal $H\rightarrow b\bar{b}$ branching ratio is taken as 0.582.

The Bose-Einstein correlation (BEC) parameter R as a function of n_ch for HMT events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter R as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter &lambda; as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 71 &le; n_ch &lt; 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 231 &le; n_ch &lt; 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13&nbsp;TeV (black circles) and 7&nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative multiplicity region 3.09 &lt; m_ch &le; 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13 &nbsp;TeV (black circles) and 7 &nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative k_T region 400 &lt; k_T &le;500 &nbsp;MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

Systematic uncertainties (in percent) in the correlation strength, &lambda;, and source radius, R, for the exponential fit of the two-particle double-ratio correlation functions, R₂(Q), for p_T &gt; 100&nbsp;MeV at &radic;s= 13&nbsp;TeV for the MB and HMT events. The choice of MC generator gives rise to asymmetric uncertainties, denoted by uparrow and downarrow. This asymmetry propagates through to the cumulative uncertainty. The columns under ‘Uncertainty range’ show the range of systematic uncertainty from the fits in the various n_ch intervals.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the average rescaled charged-particle multiplicity, m_ch, for |&eta;| &lt; 2.5 and both p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV for the minimum-bias (MB) and the high-multiplicity track (HMT) events. The parameters &gamma; and &delta; resulting from a joint fit to the MB and HMT data are presented. The total uncertainties are shown.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the pair average transverse momentum, k_T, for various functional forms and for minimum-bias (MB) and high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. The total uncertainties are shown.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

Distribution of $m_{\mathrm{T},3l}$ in the JNLow SR after the background-only fit. The uncertainty on the expected number of background events includes all statistical and systematic post-fit uncertainties with the correlations between various background sources taken into account.

Distribution of $H_\text{T} + E_\text{T}^\text{miss}$ in the Q0 SR after the background-only fit. The uncertainty on the expected number of background events includes all statistical and systematic post-fit uncertainties with the correlations between various background sources taken into account.

Distribution of $H_\text{T} + E_\text{T}^\text{miss}$ in the Q2 SR after the background-only fit. The uncertainty on the expected number of background events includes all statistical and systematic post-fit uncertainties with the correlations between various background sources taken into account.

Distribution of $m_{\mathrm{T},3l}$ in the ZL-CR after the background-only fit.

Distribution of $m_{\mathrm{T},3l}$ in the Fake-CR after the background-only fit.

Distribution of $H_\text{T} + E_\text{T}^\text{miss}$ in the Q0 DB-CR after the background-only fit.

Distribution of $H_\text{T} + E_\text{T}^\text{miss}$ in the Q0 RT-CR after the background-only fit.

Expected and observed exclusion limit for the combination of the two- (from Ref. EXOT-2018-33), three- and four-lepton channels, for the type-III seesaw process with the corresponding one- and two-standard-deviation uncertainty bands, showing the 95% CL upper limit on the cross-section.

Expected and observed 95% ( $CL_s$ ) exclusion limits in the three lepton channel for the type-III seesaw process with the corresponding one- and two-standard-deviation bands, showing the 95% CL upper limit on the cross-section.

Expected and observed 95% ( $CL_s$ ) exclusion limits in the four lepton channel for the type-III seesaw process with the corresponding one- and two-standard-deviation bands, showing the 95% CL upper limit on the cross-section.

Cross-sections of signal Monte Carlo samples for each mass point considered in this analysis. Leading order cross-sections ( $\sigma_{LO}$ ) are computed by the generator and then rescaled to next-to-leading cross-sections ( $\sigma_{NLO+NLL}$ ), with their corresponding uncertainties, using information taken from Refs. C1C1 and N2C1.

Expected signal and background yields after each of the analysis selection cuts for the 800 GeV mass hypothesis in the ZL SR. Preselection represents events with at least three leptons.

Expected signal and background yields after each of the analysis selection cuts for the 800 GeV mass hypothesis in the ZLVeto SR. Preselection represents events with at least three leptons.

Expected signal and background yields after each of the analysis selection cuts for the 800 GeV mass hypothesis in the JNLow SR. Preselection represents events with at least three leptons.

Expected signal and background yields after each of the analysis selection cuts for the 800 GeV mass hypothesis in the Q0 SR. Preselection represents events with at least three leptons.

Expected signal and background yields after each of the analysis selection cuts for the 800 GeV mass hypothesis in the Q2 SR. Preselection represents events with at least three leptons.

Expected signal and background yields after each of the analysis selection cuts for the 800 GeV mass hypothesis in the ZL CR. Preselection represents events with at least three leptons.

Expected signal and background yields after each of the analysis selection cuts for the 800 GeV mass hypothesis in the Q0-DB CR. Preselection represents events with at least three leptons.

Expected signal and background yields after each of the analysis selection cuts for the 800 GeV mass hypothesis in the Q0-RT CR. Preselection represents events with at least three leptons.

Expected background yields and observed data after the background-only fit, in the three-lepton CRs and VRs.

Expected background yields and observed data after the background-only fit, in the four-lepton CRs and VRs.

Expected and observed 95% ( $CL_s$ ) exclusion limits in the three and four lepton channels for the type-III seesaw process with the corresponding one- and two-standard-deviation bands, showing the 95% CL upper limit on the cross-section.

Measured differential cross section with associated uncertainties as a function of $N$($b$-jets). Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate. For the meaning of the bins please refer to the figure.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $m_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Observed statistical correlations, evaluated with a bootstrapping technique, between $p_\mathrm{T}^{\gamma\gamma}$, $N_\mathrm{jets}$, $m_{jj}$, $\Delta\phi_{jj}$, and $p_\mathrm{T}^{j1}$

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N_\mathrm{jets}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N$($b$-jets).

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$ in the VBF fiducial region.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$.

Measured differential cross section with associated uncertainties as a function of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $|y_{\gamma\gamma}|$.

Measured differential cross section with associated uncertainties as a function of $m_{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{\gamma\gamma j}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma j}$.

Measured differential cross section with associated uncertainties as a function of $H_{T}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $H_{T}$.

Measured differential cross section with associated uncertainties as a function of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\tau_{C,j1}$.

Measured differential cross section with associated uncertainties as a function of $\sum\tau_{C,j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\sum\tau_{C,j}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $|\eta^*|$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $|\eta^*|$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. The bins are the same as in the corresponding plot of the differential cross section.

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR6.

Observed yields in the boost_1_ge2J signal region category of the hh channel.

Observed yields in the boost_2 signal region category of the hh channel.

Observed yields in the boost_3 signal region category of the hh channel.

Observed yields in the ttH_0 signal region category of the hh channel.

Observed yields in the ttH_1 signal region category of the hh channel.

Observed yields in the VH_0 signal region category of the hh channel.

Observed yields in the VH_1 signal region category of the hh channel.

Observed yields in the VBF_0 signal region category of the hh channel.

Observed yields in the VBF_1 signal region category of the hh channel.

Observed yields in the boost_0_1J signal region category of the lh channel.

Observed yields in the boost_0_ge2J signal region category of the lh channel.

Observed yields in the boost_1_1J signal region category of the lh channel.

Observed yields in the boost_1_ge2J signal region category of the lh channel.

Observed yields in the boost_2 signal region category of the lh channel.

Observed yields in the boost_3 signal region category of the lh channel.

Observed yields in the VH_0 signal region category of the lh channel.

Observed yields in the VH_1 signal region category of the lh channel.

Observed yields in the VBF_0 signal region category of the lh channel.

Observed yields in the VBF_1 signal region category of the lh channel.

Observed yields in the boost_0_1J signal region category of the ll channel.

Observed yields in the boost_0_ge2J signal region category of the ll channel.

Observed yields in the boost_1_1J signal region category of the ll channel.

Observed yields in the boost_1_ge2J signal region category of the ll channel.

Observed yields in the boost_2 signal region category of the ll channel.

Observed yields in the boost_3 signal region category of the ll channel.

Observed yields in the VH_0 signal region category of the ll channel.

Observed yields in the VH_1 signal region category of the ll channel.

Observed yields in the VBF_0 signal region category of the ll channel.

Observed yields in the VBF_1 signal region category of the ll channel.

Best-fit values and uncertainties for the pp $\rightarrow H\rightarrow\tau\tau$ cross-section measurement and the measurement in the four dominant production modes. All measurements include the branching ratio of $H\rightarrow\tau\tau$ and are performed with true Higgs boson rapidity $|y_{H}|<2.5$. The SM predictions for each region, computed using the inclusive cross-section calculations and the simulated event samples are also shown. The contributions to the total uncertainty in the measurements from statistical (Stat. unc.) or systematic uncertainties (Syst. unc.) are given separately.

The measured correlations between each parameter of interest in the measurement of the cross-sections per production mode

Best-fit values and uncertainties for the $H\rightarrow\tau\tau$ cross-sections, in the reduced stage 1.2 STXS scheme. The EW production mode includes vector-boson fusion and qq$\rightarrow$V($\rightarrow$qq)H processes. All measurements include the branching ratio of $H\rightarrow\tau\tau$ and are performed with true Higgs boson rapidity $|y_{H}|<2.5$. The SM predictions for each region, computed using the inclusive cross-section calculations and the simulated event samples are also shown. The contributions to the total uncertainty in the measurements from statistical (Stat. unc.) or systematic uncertainties (Syst. unc.) are given separately. The asterisk symbol (*) indicates that the criteria for m$_{jj}$ only apply to events with at least two reconstructed jets.

The measured correlations between each pair of parameters of interest in the STXS measurement. The asterisk symbol (*) indicates that the criteria for mjj only apply to events with at least two reconstructed jets.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiencies for simulated tau_h decays with |eta| < 2.3 to pass the following reconstruction and identification requirements: to be reconstructed in any decay mode with pt > 20 GeV and |eta| < 2.3 (black dashed line), to be reconstructed in a decay mode except for those with missing charged hadrons (labelled ''2-prong'' and shown as full black line), and to be reconstructed in a decay mode except the 2-prong ones and to pass the Loose, Medium, or Tight working point of the Djet discriminator (blue lines), obtained with a Z to tau tau event sample. The efficiencies are shown as a function of the visible genuine tau_h pt obtained from simulated decay products.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%