Expected and observed 95% CL upper limits on $\sigma(pp\to H)B(H\to Z(\eta_c~\text{or}~J/\psi))/$pb. The smaller (larger) quoted ranges around the expected limits represent $\pm 1\sigma$ ($\pm 2\sigma$) fluctuations.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using dressed level leptons. The cross sections are normalized by the bin width.

The measured normalized cross sections in bins of Z pt, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of Z pt in |y(Z)| bins, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured normalized cross sections in bins of Z pt, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of |y(Z)|, using born level leptons.

The measured normalized cross sections (left) in bins of Z pt in |y(Z)| bins, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level. The cross sections are divided by the bin width and then the distributions are normalized to 1.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

The observed $m_{T}$ and $m_{jj}$ distributions in the ejj (upper left), $\mu$~jj (upper right), $\tau_{h}$~jj (lower left), and $0\ell$~jj (lower right) signal regions compared with the post-fit SM background yields from the fit described in the text. The pre-fit background yields and shapes are determined using data-driven methods for the major backgrounds, and based on simulation for the smaller backgrounds. Expected signal distributions are overlaid. The last bin in the $m_{T}$ distributions of the $1\ell$~jj channels include all events with $m_{T} > 210$~GeV. The last bin of the $m_{jj}$ distributions of the $0\ell$~jj channel include all events with $m_{jj} > 3800$~GeV.

The observed $m_{T}$ and $m_{jj}$ distributions in the ejj (upper left), $\mu$~jj (upper right), $\tau_{h}$~jj (lower left), and $0\ell$~jj (lower right) signal regions compared with the post-fit SM background yields from the fit described in the text. The pre-fit background yields and shapes are determined using data-driven methods for the major backgrounds, and based on simulation for the smaller backgrounds. Expected signal distributions are overlaid. The last bin in the $m_{T}$ distributions of the $1\ell$~jj channels include all events with $m_{T} > 210$~GeV. The last bin of the $m_{jj}$ distributions of the $0\ell$~jj channel include all events with $m_{jj} > 3800$~GeV.

Combined 95% CL UL on the cross section as a function of $m(\tilde{\chi}_{2}^{0})=m(\tilde{\chi}_{1}^{\pm})$. The results correspond to $\Delta m=1$ GeV (left) and $\Delta m=50$ GeV (right) mass gaps between the chargino and the lightest neutralino in the light slepton model. The top row shows the expected limits, and the bottom row shows the observed limits.

Combined 95% CL UL on the cross section as a function of $m(\tilde{\chi}_{2}^{0})=m(\tilde{\chi}_{1}^{\pm})$. The results correspond to $\Delta m=1$ GeV (left) and $\Delta m=50$ GeV (right) mass gaps between the chargino and the lightest neutralino in the light slepton model. The top row shows the expected limits, and the bottom row shows the observed limits.

Combined 95% CL UL on the cross section as a function of $m(\tilde{\chi}_{2}^{0})=m(\tilde{\chi}_{1}^{\pm})$. The results correspond to $\Delta m=1$ GeV (left) and $\Delta m=50$ GeV (right) mass gaps between the chargino and the lightest neutralino in the light slepton model. The top row shows the expected limits, and the bottom row shows the observed limits.

Combined 95% CL UL on the cross section as a function of $m(\tilde{\chi}_{2}^{0})=m(\tilde{\chi}_{1}^{\pm})$. The results correspond to $\Delta m=1$ GeV (left) and $\Delta m=50$ GeV (right) mass gaps between the chargino and the lightest neutralino in the light slepton model. The top row shows the expected limits, and the bottom row shows the observed limits.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the light slepton model with slepton mass defined as the average of the \tilde{\chi}_{2}^{0} and \tilde{\chi}_{1}^{\pm} masses, $x_{\widetilde{\ell}}=0.5$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) Combined 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, assuming the light slepton model.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the light slepton model with slepton mass defined as the average of the \tilde{\chi}_{2}^{0} and \tilde{\chi}_{1}^{\pm} masses, $x_{\widetilde{\ell}}=0.5$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) Combined 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, assuming the light slepton model.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the light slepton model with slepton mass defined as the average of the \tilde{\chi}_{2}^{0} and \tilde{\chi}_{1}^{\pm} masses, $x_{\widetilde{\ell}}=0.5$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) Combined 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, assuming the light slepton model.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the \tilde{\chi}_{1}^{\pm} and \tilde{\chi}_{2}^{0} decays proceed via $W^{*}$ and $Z^{*}$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) The 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, after combining 0 lepton and 1 lepton channels, assuming the \tilde{\chi}_{1}^{\pm} and \tilde{\chi}_{2}^{0} decays proceed via $W^{*}$ and $Z^{*}$.

(Left) Expected and observed 95% confidence level upper limit (UL) on the signal cross section as a function of $m(\tilde{\chi}_{1}^{\pm})$ and $\Delta m$, assuming the \tilde{\chi}_{1}^{\pm} and \tilde{\chi}_{2}^{0} decays proceed via $W^{*}$ and $Z^{*}$. The lower left edge of each bin represents the \{$m(\tilde{\chi}_{1}^{\pm})$,$\Delta m$\} combination used to calculate the UL on the signal cross section. For example, the lowest and leftmost bin corresponds to the UL on the signal cross section for the scenario with $m(\tilde{\chi}_{1}^{\pm}) = 100$ GeV and $\Delta m = 1$ GeV. (Right) The 95% CL UL on the cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$, for $\Delta m=1$ GeV and $\Delta m=30$ GeV mass gaps between the chargino and the neutralino, after combining 0 lepton and 1 lepton channels, assuming the \tilde{\chi}_{1}^{\pm} and \tilde{\chi}_{2}^{0} decays proceed via $W^{*}$ and $Z^{*}$.

Example description

Combined 95% CL expected upper limit on the signal cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$ for a $\Delta m=1$ GeV mass gap between the chargino and the lightest neutralino in the $W Z$ model.

Combined 95% CL expected upper limit on the signal cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$ for a $\Delta m=50$ GeV mass gap between the chargino and the lightest neutralino in the $W Z$ model.

Combined 95% CL observed upper limit on the signal cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$ for a $\Delta m=1$ GeV mass gap between the chargino and the lightest neutralino in the $W Z$ model.

Combined 95% CL observed upper limit on the signal cross section as a function of $m_{\tilde{\chi}_{2}^{0}}=m_{\tilde{\chi}_{1}^{\pm}}$ for a $\Delta m=50$ GeV mass gap between the chargino and the lightest neutralino in the $W Z$ model.

Covariance matrix from the combined fit of the $m_{ extrm{jj}}$ and $m_{ extrm{T}}$ distributions in the $0\ell extrm{jj}$ and $1\ell extrm{jj}$ search regions.

Expected and observed exclusion limits at the 95\% CL as a function of $m(\mathrm{H}^{\pm})$ for $\sigma_\mathrm{VBF}(\mathrm{H}^{\pm}) \, \mathcal{B}(\mathrm{H}^{\pm} \rightarrow \mathrm{W}^{\pm}\mathrm{Z})$ in the $\mathrm{ZV}$ final state.

Expected and observed exclusion limits at the 95\% CL as a function of $m(\mathrm{H}^{\pm\pm})$ for $\sigma_\mathrm{VBF}(\mathrm{H}^{\pm\pm}) \, \mathcal{B}(\mathrm{H}^{\pm\pm} \rightarrow \mathrm{W}^{\pm}\mathrm{W}^{\pm})$ in the $\mathrm{WV}$ final state.

Expected and observed exclusion limits at the 95\% CL for $s_{\mathrm{H}}$ in the Georgi-Machacek model.

$\mathrm{m_{\mathrm{WV}}}$ distribution in the $\mathrm{WV}$ channel. The predicted yields are shown with their best-fit normalizations from the background-only fit.

$\mathrm{m_{\mathrm{ZV}}}$ distribution in the $\mathrm{ZV}$ channel. The predicted yields are shown with their best-fit normalizations from the background-only fit.

Covariance matrix for all the $\mathrm{m_{\mathrm{WV}}}$ bins used in the $\mathrm{WV}$ channel. The mass distributions are binned as follows: $\mathrm{m_{\mathrm{WV}}}$ = [600, 700, 800, 900, 1000, 1200, 1500, 2000, $\infty$] GeV. The covariance matrix from the background-only fit is shown.

Covariance matrix for all the $\mathrm{m_{\mathrm{ZV}}}$ bins used in the $\mathrm{ZV}$ channel. The mass distributions are binned as follows: $\mathrm{m_{\mathrm{ZV}}}$ = [600, 700, 800, 900, 1000, 1200, 1500, 2000, $\infty$] GeV. The covariance matrix from the background-only fit is shown.

Dijet mass distributions for data in the (a) WW signal region.

Dijet mass distributions for data in the (b) WZ signal region.

Dijet mass distributions for data in the (c) ZZ signal region.

Dijet mass distributions for data in the (d) WZ+WW signal region.

Dijet mass distributions for data in the (e) WW+ZZ signal region.

Upper limits at the 95% CL on the cross section times branching ratio for WW+WZ production as a function of V' mass

Upper limits at the 95% CL on the cross section times branching ratio for WW+ZZ production as a function of GKK mass for the bulk RS model with k/M̄Pl=1.

Upper limits at the 95% CL on the cross section times branching ratio for (c) WW+ZZ production as a function of scalar mass.

Upper limits at the 95% CL on the cross section times branching ratio for WW production as a function of V' mass

Upper limits at the 95% CL on the cross section times branching ratio for WZ production as a function of V' mass

Upper limits at the 95% CL on the cross section times branching ratio for WW production as a function of GKK mass for the bulk RS model with k/M̄Pl=0.5.

Upper limits at the 95% CL on the cross section times branching ratio for ZZ production as a function of GKK mass for the bulk RS model with k/M̄Pl=0.5.

Upper limits at the 95% CL on the cross section times branching ratio for WW production as a function of GKK mass for the bulk RS model with k/M̄Pl=1.

Upper limits at the 95% CL on the cross section times branching ratio for ZZ production as a function of GKK mass for the bulk RS model with k/M̄Pl=1.

Upper limits at the 95% CL on the cross section times branching ratio for WW+ZZ production as a function of GKK mass for the bulk RS model with k/M̄Pl=0.5.

Upper limits at the 95% CL on the cross section times branching ratio for WW production as a function of scalar mass.

Upper limits at the 95% CL on the cross section times branching ratio for ZZ production as a function of scalar mass.