Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 50$< p_{T}^{4l} <$100 GeV

Measured and expected differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 100$< p_{T}^{4l} <$600 GeV

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.0$< y_{4l} <$0.4

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.4$< y_{4l} <$0.8

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 0.8$< y_{4l} <$1.2

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ in bin of 1.2$< y_{4l} <$2.5

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$<$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for MELA$>$1.4 bin

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $\mu\mu\mu\mu$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $eeee$ events

Measured and expected double differential cross-section $\text{d}\sigma / \text{d} m_{4l}$ as a function of $m_{4l}$ for $ee\mu\mu$ events

Systematic covariance matrix for the differential $m_{4l}$ distribution.

Statistical covariance matrix for the differential $m_{4l}$ distribution.

Background covariance matrix for the differential $m_{4l}$ distribution.

Systematic covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution.<br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Statistical covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Background covariance matrix for the differential $m_{4l}$-$p_{T}^{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0$< p_{T}^{4l} < $20 GeV bin with $m_{4l}$ values as listed in Table 2.<br> Bins labelled 10-16 correspond to the 20$< p_{T}^{4l} <$50 GeV bin with $m_{4l}$ values as listed in Table 3.<br> Bins labelled 17-23 correspond to the 50$< p_{T}^{4l} <$100 GeV bin with $m_{4l}$ values as listed in Table 4.<br> Bins labelled 24-30 correspond to the 100$< p_{T}^{4l} <$600 GeV bin with $m_{4l}$ values as listed in Table 5.

Systematic covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Statistical covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Background covariance matrix for the differential $m_{4l}$-$y_{4l}$ distribution. <br><br> Bins labelled 1-9 correspond to the 0.0$< y_{4l} < $0.4 bin with $m_{4l}$ values as listed in Table 6.<br> Bins labelled 10-18 correspond to the 0.4$< y_{4l} <$0.8 bin with $m_{4l}$ values as listed in Table 7.<br> Bins labelled 19-26 correspond to the 0.8$< y_{4l} <$1.2 bin with $m_{4l}$ values as listed in Table 8.<br> Bins labelled 27-34 correspond to the 1.2$< y_{4l} <$2.5 bin with $m_{4l}$ values as listed in Table 9.

Systematic covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Statistical covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Background covariance matrix for the differential $m_{4l}$-MELA distribution. <br><br> Bins labelled 1-7 correspond to the MELA$<$ 0.4 bin with $m_{4l}$ values as listed in Table 10.<br> Bins labelled 8-12 correspond to the MELA$>$ 0.4 bin with $m_{4l}$ values as listed in Table 11.

Systematic covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Statistical covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

Background covariance matrix for the differential $m_{4l}$-lepton flavour distribution. <br><br> Bins labelled 1-9 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 12.<br> Bins labelled 10-18 correspond to $eeee$ events with $m_{4l}$ values as listed in Table 13.<br> Bins labelled 19-27 correspond to $\mu\mu\mu\mu$ events with $m_{4l}$ values as listed in Table 14.<br>

$\Upsilon(1S)$ production cross-section in $p$Pb and Pb$p$, as a function of $y^*$. The uncertainty is the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ production cross-section in $p$Pb and Pb$p$, as a function of $p_{T}$. The uncertainty is the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ production cross-section in $p$Pb and Pb$p$, as a function of $y^*$. The uncertainty is the sum in quadrature of the statistical and systematic components.

Scaled $pp$ differential cross-section in $p_{T}$ at $\sqrt{s_{NN}}=8.16$ TeV. The first uncertainty is statistical, the second is systematic, which includes the systematic uncertainty from the $pp$ measurement and that estimated by changing the interpolation function.

Scaled $pp$ differential cross-section in $y$ at $\sqrt{s_{NN}}=8.16$ TeV. The first uncertainty is statistical, the second is systematic, which includes the systematic uncertainty from the $pp$ measurement and that estimated by changing the interpolation function.

$\Upsilon(1S)$ nuclear modification factor, $R_{p{\rm Pb}}^{\Upsilon(1S)}$, in $p$Pb and Pb$p$ as a function of $p_{T}$ integrated over $y^*$ in the range $1.5 < y^* < 4.0$ for $p$Pb and $-5.0 < y^* < -2.5$ for Pb$p$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(1S)$ nuclear modification factor, $R_{p{\rm Pb}}^{\Upsilon(1S)}$, in $p$Pb and Pb$p$ as a function of $y^*$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV$/c$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ nuclear modification factor, $R_{p{\rm Pb}}^{\Upsilon(2S)}$, in $p$Pb and Pb$p$ as a function of $p_{T}$ integrated over $y^*$ in the range $1.5 < y^* < 4.0$ for $p$Pb and $-5.0 < y^* < -2.5$ for Pb$p$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ nuclear modification factor, $R_{p{\rm Pb}}^{\Upsilon(2S)}$, in $p$Pb and Pb$p$ as a function of $y^*$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV$/c$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(1S)$ forward-to-backward ratio, $R_{{\rm FB}}^{\Upsilon(1S)}$, as a function of $p_{T}$ integrated over $\vert y^* \vert$ in the range $2.5 < \vert y^* \vert < 4.0$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(1S)$ forward-to-backward ratio, $R_{{\rm FB}}^{\Upsilon(1S)}$, as a function of $\vert y^* \vert$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV/c. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ to $\Upsilon(1S)$ ratio, in $p$Pb and Pb$p$ as a function of $p_{T}$ integrated over $y^*$ in the range $1.5 < y^* < 4.0$ for $p$Pb and $-5.0 < y^* < -2.5$ for Pb$p$. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(2S)$ to $\Upsilon(1S)$ ratio, in $p$Pb and Pb$p$ as a function of $y^*$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV/c. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

$\Upsilon(1S)$ to non-prompt $J/\psi$, in $p$Pb and Pb$p$ as a function of $y^*$ integrated over $p_{T}$ in the range $0 < p_{T} < 25$ GeV/c. The quoted uncertainties are the sum in quadrature of the statistical and systematic components.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

No description provided.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

Inclusive Jet Cross Section for |rapidity| 1.5 TO 2.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.0 TO 2.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.5 TO 3.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 3.2 TO 4.7 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.7). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| < 0.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 0.5 TO 1.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 1.0 TO 1.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 1.5 TO 2.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.0 TO 2.5 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 2.5 TO 3.0 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

Inclusive Jet Cross Section for |rapidity| 3.2 TO 4.7 as a function of the jet transverse momentum. Jets are clustered with the anti-kt algorithm ( R = 0.4). The (sys) error is the total systematic error, including the luminosity uncertainty of 2.7%.

No description provided.

No description provided.

No description provided.

The double differential $\pi^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\pi^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^+$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^-$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential proton production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^0_S$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^0_S$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^0_S$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^0_S$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^0_S$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^0_S$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $K^0_S$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\Lambda$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\Lambda$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\Lambda$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\Lambda$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\Lambda$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\Lambda$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\Lambda$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.

The double differential $\Lambda$ production cross section in the laboratory system for p+C interactions at 31 GeV$/c$. The results are presented as a function of momentum, $p$ (in [GeV/$c$]), in different angular intervals, $\theta$ (in [mrad]). The statistical and systematic errors are quoted.