Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections for pT(gamma) > 15 GeV with statistical, systematic, and luminosity uncertainties, respectively. Combined result of electron and muon channels.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 30-45 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 45-60 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 60-120 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 120-200 GeV, as measured in the combined dilepton channel.

The Drell-Yan pre-FSR dilepton rapidity distribution D(SIG)/DABS(YRAP) within the detector acceptance, for the mass bin 200-1500 GeV, as measured in the combined dilepton channel.

Measured ratio of the Drell-Yan normalized differential cross sections at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel for the full phase space.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 20-30 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 30-45 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 45-60 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 60-120 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 120-200 GeV.

Measured ratio of the Drell-Yan normalized differential cross sections as a function of the absolute dilepton rapidity within the detector acceptance, at center-of-mass energies of 7 and 8 TeV in the combined dilepton channel. The mass bin 200-1500 GeV.

The modulus of the CKM matrix element V(TB), the first error comes from the uncertainties on the measurement of SIG(TOP TOPBAR) and the second error comes from the uncertainties on the theoretical value of SIG(TOP TOPBAR).