Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 2\gamma_d + X$ with $m_H$ = 800 GeV in the hadron-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 2\gamma_d + X$ with $m_H$ = 800 GeV in the muon-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the muon-muon final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the muon-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the hadron-hadron final state.

Expected allowed ranges for 8 dimensional aQGC, no cutoff).

Inclusive Cross Section.

Extrapolation factors AWW and CWW for emu channel.

Extrapolation factors AWW and CWW for ee channel.

Extrapolation factors AWW and CWW for mumu channel.

Uncertainty on extrapolation factors AWW and CWW for emu channel.

Uncertainty on extrapolation factors AWW and CWW for ee channel.

Uncertainty on extrapolation factors AWW and CWW for mumu channel.

Measured differential cross sections as function of the leading lepton transverse momentum of WW production in the fiducial region for same different final states corresponding to different W decay channels: both W's decaying into electrons, both decaying to muon, and final states with one prompt electron and one prompt muon. The cross sections are defined for direct decays of the W bosons into prompt electrons or muons, intermediate decays into tau leptons are disregarded. The electrons are required to be contained within abs(eta)<2.47 and to lie outside of 1.37 < abs(eta) < 1.53, muons are required to lie within abs(eta)<2.4. The leading and subleading leptons in the events are required to have a transverse momentum above 25 and 20 GeV respectively. The transverse momentum of the vectorial sum of the neutrinos in the event should be larger than 20 GeV (PT(C=SUM(NU))). The transverse momentum of the vectorial sum of the neutrinos multiplied by the sin of azimuthal difference between lepton and the vectorial sum of the neutrinos in the event should be larger than 15 GeV. The invariant mass of the leptons should exceed 10 GeV. Particle-level jets are defined using the anti-kT algorithm with radius of 0.4. No jets above 25 GeV and within abs(eta)<4.5 are allowed in the event. Both, resonant and non-resonant WW production processes, are included in the cross sections. All differential distributions are obtained using this selections.

All differential distributions are obtained using the selection described for the transverse momentum distribution of leading lepton (PT(C=LEADING LEPTON)).

All differential distributions are obtained using the selection described for the transverse momentum distribution of leading lepton (PT(C=LEADING LEPTON)).

All differential distributions are obtained using the selection described for the transverse momentum distribution of leading lepton (PT(C=LEADING LEPTON)).

All differential distributions are obtained using the selection described for the transverse momentum distribution of leading lepton (PT(C=LEADING LEPTON)).

All differential distributions are obtained using the selection described for the transverse momentum distribution of leading lepton (PT(C=LEADING LEPTON)). Costheta is defined as: abs( tanh(DELTA-ETA(C=DILEPTON)/2 )).

Bin-to-bin correlation matrix for the differential cross section measurements for the pt(leading lepton) distribution.

Bin-to-bin correlation matrix for the normalised differential distribution for the pt(leading lepton) distribution.

Bin-to-bin correlation matrix for the differential cross section measurements for the transverse momentum distribution of the dilepton system.

Bin-to-bin correlation matrix for the normalised differential distribution for the transverse momentum distribution of the dilepton system.

Bin-to-bin correlation matrix for the differential cross section measurements for the invariant mass of the dilepton system.

Bin-to-bin correlation matrix for the normalised differential distribution for the invariant mass of the dilepton system.

Bin-to-bin correlation matrix for the differential cross section measurements for the difference in azimuthal angle between the two leptons.

Bin-to-bin correlation matrix for the normalised differential distribution for the difference in azimuthal angle between the two leptons.

Bin-to-bin correlation matrix for the differential cross section measurements for the absolute rapidity of the dilepton system.

Bin-to-bin correlation matrix for the normalised differential distribution for the absolute rapidity of the dilepton system.

Bin-to-bin correlation matrix for the differential cross section measurements for costheta distribution of the two leptons.

Bin-to-bin correlation matrix for the normalised differential distribution for the costheta distribution of the two leptons.

The expected and observed 95% confidence intervals for the anomalous coupling parameters defined in the no constraints scenario, LEP, HISZ and Equal Couplings scenarios. The results are shown with Lambda = infinity and Lamdba = 7 TeV.

The expected and observed 95% confidence intervals for the anomalous coupling parameters defined in the EFT frame work.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Measured fiducial cross sections for successive exclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\righarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for Deltaphijj in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for mjj in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for mjj in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for the jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events.

Non-perturbative corrections for the jet pT in Z/gamma*(->ll)+1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=2 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=3 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=4 jet events.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for $H_{\text{T}}$.

Non-perturbative corrections for HT.

Non-perturbative corrections for $\Delta\phi_{jj}$.

Non-perturbative corrections for Deltaphijj.

Non-perturbative corrections for $m_{jj}$.

Non-perturbative corrections for mjj.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet pT for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet $p_{\text{T}}$ for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of HT averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $H_{\text{T}}$ averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of Deltaphijj for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $\Delta\phi_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the mjj for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the $m_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Observed and expected 95% CL upper limits on the cross section in the ZH channel.

Signal acceptance times efficiency of HVT WH(qqbb) events as a function of the resonance mass at different cut stages. Auxiliary table attached for 2 TeV mass point.

Signal acceptance times efficiency of HVT WH(qqbb) events as a function of the resonance mass at different cut stages. Auxiliary table attached for 2 TeV mass point.

Signal acceptance times efficiency of HVT ZH(qqbb) events as a function of the resonance mass at different cut stages. Auxiliary table attached for 4 TeV mass point.

Signal acceptance times efficiency of HVT ZH(qqbb) events as a function of the resonance mass at different cut stages. Auxiliary table attached for 4 TeV mass point.

Dijet mass distributions in the WH 1-tag signal region. Uncertainties in the background and signal histograms are set to zero. The signal corresponds to that expected for HVT model B with resonance mass of 2 TeV.

Dijet mass distributions in the WH 2-tag signal region. Uncertainties in the background and signal histograms are set to zero. The signal corresponds to that expected for HVT model B with resonance mass of 2 TeV.

Dijet mass distributions in the ZH 1-tag signal region. Uncertainties in the background and signal histograms are set to zero. The signal corresponds to that expected for HVT model B with resonance mass of 2 TeV.

Dijet mass distributions in the ZH 2-tag signal region. Uncertainties in the background and signal histograms are set to zero. The signal corresponds to that expected for HVT model B with resonance mass of 2 TeV.

rapidity bin 1.5 < |Y| < 2.0 anti-kt R=0.4

rapidity bin 2.0 < |Y| < 2.5 anti-kt R=0.4

rapidity bin 2.5 < |Y| < 3.0 anti-kt R=0.4

rapidity bin 0 < y* < 0.5 anti-kt R=0.4

rapidity bin 0.5 < y* < 1.0 anti-kt R=0.4

rapidity bin 1.0 < y* < 1.5 anti-kt R=0.4

rapidity bin 1.5 < y* < 2.0 anti-kt R=0.4

rapidity bin 2.0 < y* < 2.5 anti-kt R=0.4

rapidity bin 2.5 < y* < 3.0 anti-kt R=0.4

Ratios of integrated fiducial CC and NC cross sections obtained from the combination of electron and muon channels with statistical (stat) and systematic (syst) uncertainties. The common fiducial regions are defined in Section 2.3.

Total cross sections times leptonic branching ratios obtained from the combination of electron and muon channels with statistical and systematic uncertainties, for $W^+$, $W^-$, their sum and the $Z/\gamma^*$ process measured at $\sqrt{s}=7$ TeV. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), the luminosity (lumi), and acceptance extrapolation (acc) contributions.

Ratios of total CC and NC cross sections obtained from the combination of electron and muon channels with statistical and systematic uncertainties. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), and acceptance extrapolation (acc) contributions.

The correlation coefficients of the $W^+$, $W^-$ and $Z$ fiducial cross-section measurements.

Measurement of the electron-to-muon cross-section ratios for the $W$ and $Z$ production, $R_W$ and $R_Z$. The uncertainties denote the statistical (stat) and the experimental systematic (syst) contributions.

Differential cross section for the $W^+ \to \ell^+\nu$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \ell^-\bar{\nu}$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to e^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to e^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \mu^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to \mu^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Values of $E(W[Z])$ and $A(W[Z])$ correction factors for integrated $W\to\ell\nu$ and $Z\to\ell\ell$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W[Z])$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. The $A(W[Z])$ factors, defined in Eq. (9), are used to extract a total cross section. Finally, the ratios of $A(W[Z])$ correction factors are given for four combinations of $W^+$, $W^-$ and $Z$ treating all components of the $A(W[Z])$ uncertainties as correlated between processes, which is relevant for the acceptance uncertainties on the total cross-section ratios.

Values of $E(W)$ correction factors for the differential $W\to\ell\nu$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. This only affects the bin of highest $\eta_\ell$, all other $E(W)$ factors are exactly 1 without uncertainties.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to \mu^+\mu^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential forward $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Correlation coefficients between integrated cross sections extrapolated to the total phase space, $\sigma^\mathrm{tot}_{W \to \ell\nu}$ and $\sigma^\mathrm{tot}_{Z/\gamma^* \to \ell\ell}$ for four combinations of $W^+, W^-, W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

Correlation coefficients between integrated fiducial cross sections in electron and muon channels for $W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

The differential W charge asymmetry $A_{\ell}$ as defined in Eq. (19) from the combined electron and muon channel measurements. All uncertainties are quoted in % with respect to the $A_{\ell}$ values. The statistical (stat), uncorrelated (uncor) and correlated (cor) systematic uncertainties are reported.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the integrated common fiducial cross sections using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^+ \to \ell^+\nu$ process using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^- \to \ell^-\bar{\nu}$ process$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial W charge asymmetry $A_{\ell}$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$). All predictions are corrected for leading two-loop EW contributions.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^+ \to \ell^+\nu$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^- \to \ell^-\bar{\nu}$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the integrated common fiducial cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties are negligible on these correction factors.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to e^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to e^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to \mu^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to \mu^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to \mu\mu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial forward $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.