Differential cross section of J/psi mesons from b hadrons as a function of dimuon pT in pp and PbPb collisions. The PbPb cross sections are normalised by TAA for direct comparison. Global uncertainties arise from the integrated luminosity uncertainty in pp collisions, and the number of minimum bias events and TAA uncertainties for PbPb collisions.

Differential cross section of prompt J/psi mesons as a function of dimuon rapidty in pp and PbPb collisions. The PbPb cross sections are normalised by TAA for direct comparison. Global uncertainties arise from the integrated luminosity uncertainty in pp collisions, and the number of minimum bias events and TAA uncertainties for PbPb collisions.

Differential cross section of J/psi mesons from b hadrons as a function of dimuon rapidty in pp and PbPb collisions. The PbPb cross sections are normalised by TAA for direct comparison. Global uncertainties arise from the integrated luminosity uncertainty in pp collisions, and the number of minimum bias events and TAA uncertainties for PbPb collisions.

Nuclear modification factor of prompt J/psi mesons as a function of dimuon rapidity. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of collision centrality. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of dimuon pT. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of dimuon pT in the mid-rapidity interval. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of dimuon pT in the most forward rapidity interval. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of collision centrality in the mid- and most forward rapidity intervals. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of pT in three centrality bins. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of collision centrality in the most forward rapidity range at moderate and high pT. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of collision centrality in the mid-rapidity range. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of prompt psi(2S) mesons as a function of collision centrality in the mid-rapidity range. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

95% CL intervals on the nuclear modification factor of prompt psi(2S) mesons as a function of collision centrality in the mid-rapidity range. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of prompt J/psi and psi(2S) mesons as a function of dimuon pT in the mid-rapidity range. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of collision centrality in the forward rapidity range. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of prompt psi(2S) mesons as a function of collision centrality in the forward rapidity range. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

95% CL intervals on the nuclear modification factor of prompt psi(2S) mesons as a function of collision centrality in the forward rapidity range. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of prompt J/psi mesons as a function of dimuon pT in the forward rapidity range. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of prompt psi(2S) mesons as a function of dimuon pT in the forward rapidity range. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

95% CL intervals on the nuclear modification factor of prompt psi(2S) mesons as a function of dimuon pT in the forward rapidity range. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of nonprompt J/psi mesons as a function of dimuon rapidity. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of nonprompt J/psi mesons as a function of collision centrality. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of nonprompt J/psi mesons as a function of dimuon pT. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of nonprompt J/psi mesons as a function of dimuon pT in the mid-rapidity interval. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of nonprompt J/psi mesons as a function of dimuon pT in the most forward rapidity interval. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of nonprompt J/psi mesons as a function of collision centrality in the mid- and most forward rapidity intervals. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Nuclear modification factor of nonprompt J/psi mesons as a function of pT in three centrality bins. Global uncertainties arise from the integrated luminosity uncertainty of the pp data, and the number of minimum bias events and TAA uncertainties of the PbPb data.

Nuclear modification factor of nonprompt J/psi mesons as a function of collision centrality in the most forward rapidity range at moderate and high pT. Global uncertainties arise from the full pp statistical and systematic uncertainties (including integrated luminosity uncertainty), and the number of minimum bias events uncertainty of the PbPb data.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{2\ell3j}$ signal region, which uses the invariant mass of the c-tagged jet and the geometrically closest b-tagged jet, $m_{\mathit{cb}}^{\mathrm{min}\Delta R}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{1\ell6ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{tight}}^{1\ell6ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{2\ell4ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{tight}}^{2\ell4ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Jet multiplicity and tagging criteria for the SRs and CRs in the single-lepton and dilepton channels. All single-lepton regions are defined in the 5-jet-exclusive and 6-jet-inclusive jet selections, all dilepton regions in the 3-jet-exclusive and 4-jet-inclusive jet selections. By construction, $\mathrm{SR}^{2\ell}_{\mathrm{tight}}$ only exists for the 4-jet-inclusive selection. Identical requirements on inclusive and exclusive working points, e.g., one c@22% and one c@11% in the $\mathrm{CR}_1^{1\ell}$, indicate a veto of additional tags at the inclusive working point.

Breakdown of the fiducial $t\bar{t}+{\geq}2c$ and $t\bar{t}+1c$ cross-section uncertainties. Systematic uncertainties are grouped into signal and background modeling, instrumental, and MC statistics categories. The table lists the fractional uncertainty in the measured cross-sections in percent and is estimated from the covariance matrix of the profile likelihood fit, following EPJC 84 (2024) 593. Individual groups of uncertainties can be added in quadrature to obtain the total uncertainty. JES and JER denote the jet energy scale and resolution uncertainties, respectively. The fractional uncertainties in the fitted $t\bar{t}+{\geq}1c$ and $t\bar{t}+\text{light}$ normalization factors are included in the data statistics category. For presentation purposes, all uncertainties are symmetrized.

Measured fiducial cross-section values in comparison with various NLO+PS predictions. The uncertainties in the predictions include independent and simultaneous variations of the $\mu_R$ and $\mu_F$ scales and uncertainties in the choice of the PDF set, but no uncertainties in the parton shower or hadronization. The uncertainties in the measured values include all statistical and systematic uncertainties. For presentation purposes, the quoted measurement and prediction uncertainties are symmetrized.

Measured and predicted values for the $t\bar{t}+{\geq}1b$, $t\bar{t}+{\geq}2c$, and $t\bar{t}+1c$ cross-sections and for the cross-section ratios of these processes to total $t\bar{t}+\text{jets}$ production. The quoted uncertainties in the measurements include statistical and systematic uncertainties. The predictions are taken from the nominal setup using inclusive $t\bar{t}$ Powheg+Pythia8 predictions for the $t\bar{t}+{\geq}2c$, $t\bar{t}+1c$, and $t\bar{t}+\text{light}$ processes, and $t\bar{t}+b\bar{b}$ Powheg+Pythia8 predictions for the $t\bar{t}+{\geq}1b$ process. The first use the 5FS, the latter the 4FS, where the $b$-quarks are treated as massive particles and are included in the matrix element calculation. The uncertainties in the predictions include independent and simultaneous variations of the $\mu_R$ and $\mu_F$ scales and uncertainties in the choice of the PDF set.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+{\geq}2c$ cross-section measurement. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+1c$ cross-section measurement. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+{\geq}2c$ ratio to total $t\bar{t}+\text{jets}$ production. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+1c$ ratio to total $t\bar{t}+\text{jets}$ production. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Efficiencies and rejection rates for the $b$- and $c$-jet tagging working points of the $b/c$-tagger, as well as the selection cuts on the discriminants, $\mathcal{D}_b'$ and $\mathcal{D}_c'$ that define the tagging bins. The primes indicate that a standard logistic function is applied to the discriminants. The b@70% and c@22% working points are inclusive of their respective tighter working points. The values were estimated from single-lepton and dilepton $t\bar{t}$ events simulated with Powheg + Pythia 8.

Efficiencies and rejection rates for the $b$- and $c$-jet tagging working points of the $b/c$-tagger, as well as the selection cuts on the discriminants, $\mathcal{D}_b'$ and $\mathcal{D}_c'$ that define the tagging bins. The primes indicate that a standard logistic function is applied to the discriminants. The b@70% and c@22% working points are inclusive of their respective tighter working points. The values were estimated from single-lepton and dilepton $t\bar{t}$ events simulated with Powheg + Pythia 8.

Pre-fit event yields in the twelve single-lepton and dilepton control regions (CRs) of the analysis. The quoted uncertainties include both statistical and systematic components, but all normalization factors are fixed to their pre-fit values with no uncertainties. All uncertainties are assumed to be uncorrelated. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Pre-fit event yields in the seven signal regions (SRs) of the analysis. The quoted uncertainties include both statistical and systematic components, but all normalization factors are fixed to their pre-fit values with no uncertainties. All uncertainties are assumed to be uncorrelated. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Post-fit event yields in the twelve single-lepton and dilepton control regions (CRs) of the analysis. The quoted uncertainties include both statistical and systematic components, and post-fit correlations between uncertainties are taken into account. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Post-fit event yields in the seven signal regions (SRs) of the analysis. The quoted uncertainties include both statistical and systematic components, and post-fit correlations between uncertainties are taken into account. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Invariant mass of the lepton pair plus jet system, for data, background (pre- and post-reweighting) and three $H\rightarrow Za$ signal hypotheses (for $a\rightarrow q\bar{q}/gg$ inclusively). Events are required to pass the complete event selection but not the classification NN requirement. The background normalization is set equal to that of the data for events passing the preselection and being in the $m_{\ell\ell j}$ 100-180 GeV region. The signal normalization assumes the SM Higgs boson inclusive production cross-section, $\mathcal{B}(H\to Za)=100\%$, and it is scaled up by a factor of 100. The error bars (hatched regions) represent the data (MC) sample's statistical uncertainty in the histograms and the ratio plots. Vertical arrows indicate data points that fall outside the displayed $y$-axis range.

Regression NN output variable, for data, reweighted background, and three $H\rightarrow Za$ signal hypotheses ($a\rightarrow q\bar{q}/gg$ inclusively). Events are required to pass the complete event selection, including a $120<m_{\ell\ell j}<140$ GeV requirement, but not the classification NN output variable requirement. The background normalization is set equal to that of the data for events passing the preselection and being in the $m_{\ell\ell j}$ 100-180 GeV region. The signal normalization assumes the SM Higgs boson inclusive production cross-section, $\mathcal{B}(H\to Za)=100\%$, and it is scaled up by a factor of 100. The error bars (hatched regions) represent the data (MC) sample's statistical uncertainty in the histograms and the ratio plots. Vertical arrows indicate data points that fall outside the displayed $y$-axis range.

Classification NN output variable, for data, reweighted background, and three $H\rightarrow Za$ signal hypotheses ($a\rightarrow q\bar{q}/gg$ inclusively). Events are required to pass the complete event selection, including a $120<m_{\ell\ell j}<140$ GeV requirement, but not the classification NN output variable requirement. The background normalization is set equal to that of the data for events passing the preselection and being in the $m_{\ell\ell j}$ 100-180 GeV region. The signal normalization assumes the SM Higgs boson inclusive production cross-section, $\mathcal{B}(H\to Za)=100\%$, and it is scaled up by a factor of 100. The error bars (hatched regions) represent the data (MC) sample's statistical uncertainty in the histograms and the ratio plots. Vertical arrows indicate data points that fall outside the displayed $y$-axis range.

Invariant mass of the lepton pair plus jet system for data, reweighted background, and various signal hypotheses. Events are required to pass the complete event selection (preselection and classification NN requirement). The pre-fit background distribution is shown along with three $H\rightarrow Za$ signal hypotheses coming from the pure MC sample ($a\rightarrow q\bar{q}/gg$ inclusively). The background normalization is set equal to that of the data for events passing the preselection and being in the region 100-180 GeV. The error bars represent the data sample's statistical uncertainty and the grey bands represent the full background model uncertainty before the fit (assuming all the uncertainties are uncorrelated). The lower panel shows the ratio of the data to the pre-fit background prediction.

Invariant mass of the lepton pair plus jet system for data, reweighted background, and 2.0 GeV signal hypotheses. Events are required to pass the complete event selection (preselection and classification NN requirement). The background shape and normalization come from the fit to the data. The signal includes only $gg$ decays, its shape comes from the fit, and it is normalized to $\mathcal{B}(H\rightarrow Za)=100\%$. The error bars represent the data sample's statistical uncertainty and the grey bands represent the full background model uncertainty after the fit. The lower panel shows the per-bin signal significance, $(N_\text{data}-N_\text{MC})\,\text{\Large{/}}\sqrt{\sigma_\text{data}^2+\sigma_\text{MC}^2}$. The post-fit background uncertainty is calculated from a fit under the background-only hypothesis. Vertical arrows indicate data points that fall outside the displayed $y$-axis range.

Observed 95$\%$ CL upper limits on $\mathcal{B}(H \to Za)=100\%$ for $\mathcal{B}(a \to gg)=100\%$, and the expectation under the background-only hypothesis together with its $\pm1\sigma$ and $\pm2\sigma$ intervals. The weaker limits from the previous version of the analysis (PRL 125(2020) 221802) are also shown. Linear interpolation is used to set limits between the mass points for which MC signal samples were generated.

Observed 95$\%$ confidence level upper limits on $\mathcal{B}(H \to Za)=100\%$ for $\mathcal{B}(a\rightarrow q\bar{q})=100\%$, and the expectation under the background-only hypothesis together with its $\pm1\sigma$ and $\pm2\sigma$ intervals. The weaker limits from the previous version of the analysis (PRL 125(2020) 221802) are also shown. Linear interpolation is used to set limits between the mass points for which MC signal samples were generated.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The contour for the excluded mass--lifetime region for stau pair production obtained with the di-track search. All masses and lifetimes shown that are below the curve and above 200 GeV are excluded by the observed data (while the expected exclusion is between the upper curve down to 210 GeV for lifetimes above 3000 ns). The sensitivity extends indefinitely to longer lifetimes.

The distribution of data and predicted background in the di-track Exclusion-SR. The observed data events are indicated as magenta circles if they are inside the mass-compatibility angle (shown as grey lines) and as orange diamonds if they are outside, while the blue area is the mass distribution of the expected background. The last bins include overflow events

The distribution of data and predicted background in the di-track Exclusion-SR. The observed data events are indicated as magenta circles if they are inside the mass-compatibility angle (shown as grey lines) and as orange diamonds if they are outside, while the blue area is the mass distribution of the expected background. The last bins include overflow events

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 3 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 10 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with 30 ns lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus mass for staus with a detector-stable lifetime.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 200 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 300 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 400 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 500 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

The 95\% CL exclusion limits from the di-track search on cross-section versus lifetime for 600 GeV staus.

Values of the test statistic $t_{\kappa_{g,\mathrm{off-shell}}}$ as a function of $\kappa_{g,\mathrm{off-shell}}$ while profiling $\kappa_{V,\mathrm{off-shell}}$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\kappa_{V,\mathrm{off-shell}}}$ as a function of $\kappa_{V,\mathrm{off-shell}}$ while profiling $\kappa_{g,\mathrm{off-shell}}$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\kappa_{H}}$ as a function of $\kappa_{H}=\Gamma_H/\Gamma_H^{\mathrm{SM}}$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{R_{gg}}$ as a function of $R_{gg}=\kappa_{g,\mathrm{on-shell}}^2/\kappa_{g,\mathrm{off-shell}}^2$ while profiling $R_{VV}=\kappa_{V,\mathrm{on-shell}}^2/\kappa_{V,\mathrm{off-shell}}^2$ and fixing $\kappa_H=1$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{R_{VV}}$ as a function of $R_{VV}=\kappa_{V,\mathrm{on-shell}}^2/\kappa_{V,\mathrm{off-shell}}^2$ while profiling $R_{gg}=\kappa_{g,\mathrm{on-shell}}^2/\kappa_{g,\mathrm{off-shell}}^2$ and fixing $\kappa_H=1$ obtained with an Asimov dataset and with data. The values with all nuisance parameters fixed at their best-fit values (stat-only) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\mu_{\mathrm{off-shell}}}$ assuming a single parameter of interest $\mu_{\mathrm{off-shell}}$ obtained with an Asimov dataset and with data when combining the $H^*\rightarrow ZZ\rightarrow 4\ell$ and $H^*\rightarrow ZZ\rightarrow 2\ell 2\nu$ decay channels. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\kappa_{H}}$ as a function of $\kappa_{H}=\Gamma_H/\Gamma_H^{\mathrm{SM}}$ obtained with an Asimov dataset and with data in the $H^*\rightarrow ZZ\rightarrow 4\ell$ decay channel. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{\kappa_{H}}$ as a function of $\kappa_{H}=\Gamma_H/\Gamma_H^{\mathrm{SM}}$ obtained with an Asimov dataset and with data when combining the $H^*\rightarrow ZZ\rightarrow 4\ell$ and $H^*\rightarrow ZZ\rightarrow 2\ell 2\nu$ decay channels. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{R_{gg}}$ as a function of $R_{gg}$ while profiling $R_{VV}$ and fixing $\kappa_H=1$ obtained with an Asimov dataset and with data. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Values of the test statistic $t_{R_{VV}}$ as a function of $R_{VV}$ while profiling $R_{gg}$ and fixing $\kappa_H=1$ obtained with an Asimov dataset and with data. The values from the histogram-based analysis (Phys. Lett. B 846 (2023) 138223) are added for comparison. The 68% and 95% confidence intervals obtained from the Neyman construction are also added.

Post-fit $m_{\mathrm{T}}$ distribution in the signal region for the SM background-only hypothesis. Data are shown as black markers with vertical error bars representing the statistical uncertainty. Filled histograms show contributions of various SM processes, with the hatched band representing the total uncertainty. The line shows the prediction of the GM model for $\sin \theta_{\mathrm{H}} = 0.17$ and $m_{\mathrm{H_5}} = 375$ GeV, where the $\sin \theta_{\mathrm{H}}$ value corresponds to the expected $95\%$ CL limit for that $H_5$ mass.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Ratio of the $e^\pm$- and $\mu^\pm$-channel single-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Ratio of the $e^\pm$- and $\mu^\pm$-channel double-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel single-differential cross-sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel double-differential cross sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.