The observed mass distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the short lifetime regime.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the long lifetime regime.

The observed $p_{\rm T$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Expected and observed distributions in SR-Inclusive_Low of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal track selection efficiency as a function of CLLP $\beta\gamma$ for SR-Inclusive_Low and SR-Inclusive_High bins. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal selection efficiency by the mass window for SR-Inclusive_Low and SR-Inclusive_High bins.

Acceptance for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |eta| < 1.8 and r_decay > 500 mm.

Acceptance for the chargino pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the stau pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Event-level efficiency for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Passing events in event selection steps for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes.

Passing events in event selection steps for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes.

Passing events in event selection steps for the chargino pair-production model for various masses and lifetimes.

Passing events in event selection steps for the stau pair-production model for various masses and lifetimes.

Breakdown of expected and observed yields in the electroweak search Int, Low, and OffShell signal regions after a simultaneous fit to the signal regions and control regions. All statistical and systematic uncertainties are included.

Breakdown of expected and observed yields in the four edge signal regions, integrated over the $m_{\ell\ell}$ distribution after a separate simultaneous fit to each signal region and control region pair. The uncertainties include both the statistical and systematic sources.

Breakdown of expected and observed yields in the three on-$Z$ signal regions after a separate simultaneous fit to each signal region and control region pair. The uncertainties include both the statistical and systematic sources.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-High-Sideband-EWK (top-left), VR-High-R-EWK (top-right), VR-1J-High-EWK (bottom-left), and VR-$\ell\ell bb$-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-High-Sideband-EWK (top-left), VR-High-R-EWK (top-right), VR-1J-High-EWK (bottom-left), and VR-$\ell\ell bb$-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-High-Sideband-EWK (top-left), VR-High-R-EWK (top-right), VR-1J-High-EWK (bottom-left), and VR-$\ell\ell bb$-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-High-Sideband-EWK (top-left), VR-High-R-EWK (top-right), VR-1J-High-EWK (bottom-left), and VR-$\ell\ell bb$-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-Int-EWK (top-left), VR-Low-EWK (top-right), VR-Low-2-EWK (bottom-left), and VR-OffShell-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-Int-EWK (top-left), VR-Low-EWK (top-right), VR-Low-2-EWK (bottom-left), and VR-OffShell-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-Int-EWK (top-left), VR-Low-EWK (top-right), VR-Low-2-EWK (bottom-left), and VR-OffShell-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Distributions of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in VR-Int-EWK (top-left), VR-Low-EWK (top-right), VR-Low-2-EWK (bottom-left), and VR-OffShell-EWK (bottom-right) from the EWK search after a simultaneous fit of the control regions. The hatched band includes both the systematic and statistical uncertainties. The last bin includes the overflow.

Observed and expected dilepton mass distributions in VRC-STR (top-left), VRLow-STR (top-right), VRMed-STR (bottom-left), and VRHigh-STR (bottom-right). Each validation region is fit separately with the corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The entries are normalized to the bin width, and the last bin is the overflow.

Observed and expected dilepton mass distributions in VRC-STR (top-left), VRLow-STR (top-right), VRMed-STR (bottom-left), and VRHigh-STR (bottom-right). Each validation region is fit separately with the corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The entries are normalized to the bin width, and the last bin is the overflow.

Observed and expected dilepton mass distributions in VRC-STR (top-left), VRLow-STR (top-right), VRMed-STR (bottom-left), and VRHigh-STR (bottom-right). Each validation region is fit separately with the corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The entries are normalized to the bin width, and the last bin is the overflow.

Observed and expected dilepton mass distributions in VRC-STR (top-left), VRLow-STR (top-right), VRMed-STR (bottom-left), and VRHigh-STR (bottom-right). Each validation region is fit separately with the corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The entries are normalized to the bin width, and the last bin is the overflow.

Observed and expected jet multiplicity in VRLow-STR (top-left), VRMed-STR (top-right), and VRHigh-STR (bottom) after a fit performed on the $m_{\ell\ell}$ distribution and corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The last bin contains the overflow.

Observed and expected jet multiplicity in VRLow-STR (top-left), VRMed-STR (top-right), and VRHigh-STR (bottom) after a fit performed on the $m_{\ell\ell}$ distribution and corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The last bin contains the overflow.

Observed and expected jet multiplicity in VRLow-STR (top-left), VRMed-STR (top-right), and VRHigh-STR (bottom) after a fit performed on the $m_{\ell\ell}$ distribution and corresponding control region. All statistical and systematic uncertainties are included in the hatched band. The last bin contains the overflow.

Observed and expected dilepton mass distributions in VR3L-STR without a fit to the data. The 'Other' category includes the negligible contributions from $t\bar{t}$ and $Z/\gamma^*$+jets processes. The hatched band contains the statistical uncertainty and the theoretical systematic uncertainties of the $WZ$/$ZZ$ prediction, which are the dominant sources of uncertainty. No fit is performed. The last bin contains the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected distributions in five EWK search regions after a simultaneous fit to the SR and CR. In the top row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-High_8-EWK and $m_{bb}$ in SR-$\ell\ell bb$-EWK. In the middle row, left-to-right, are $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Int-EWK and $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ in SR-Low-EWK. In the bottom row is $m_{\ell\ell}$ in SR-OffShell-EWK. Overlaid are example C1N2 and GMSB signal models, where the numbers in the brackets indicate the masses, in $\mathrm{GeV}$, of the $\tilde{\chi}_1^\pm$ and $\tilde{\chi}_2^0$ or the mass of the $\tilde{\chi}_1^0$ and branching ratio to the Higgs boson respectively. All statistical and systematic uncertainties are included in the hatched bands. The last bin includes the overflow.

Observed and expected dilepton mass distributions in SRC-STR (top-left), SRLow-STR (top-right), SRMed-STR (bottom-left), and SRHigh-STR (bottom-right), with the binning used for interpretations after a separate simultaneous fit to each signal region and control region pair. The red dashed lines are example signal models overlaid on the figure. All statistical and systematic uncertainties are included in the hatched bands. The last bins are the overflow.

Observed and expected dilepton mass distributions in SRC-STR (top-left), SRLow-STR (top-right), SRMed-STR (bottom-left), and SRHigh-STR (bottom-right), with the binning used for interpretations after a separate simultaneous fit to each signal region and control region pair. The red dashed lines are example signal models overlaid on the figure. All statistical and systematic uncertainties are included in the hatched bands. The last bins are the overflow.

Observed and expected dilepton mass distributions in SRC-STR (top-left), SRLow-STR (top-right), SRMed-STR (bottom-left), and SRHigh-STR (bottom-right), with the binning used for interpretations after a separate simultaneous fit to each signal region and control region pair. The red dashed lines are example signal models overlaid on the figure. All statistical and systematic uncertainties are included in the hatched bands. The last bins are the overflow.

Observed and expected dilepton mass distributions in SRC-STR (top-left), SRLow-STR (top-right), SRMed-STR (bottom-left), and SRHigh-STR (bottom-right), with the binning used for interpretations after a separate simultaneous fit to each signal region and control region pair. The red dashed lines are example signal models overlaid on the figure. All statistical and systematic uncertainties are included in the hatched bands. The last bins are the overflow.

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294].

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294]. The grey numbers indicate the observed 95\% CLs upper limit on the cross section.

Expected and observed exclusion contours from the EWK analysis for the C1N2 model (left) and GMSB model (right). The dashed line indicates the expected limits at 95$\%$ CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties on the background prediction and experimental uncertainties on the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The gray shaded areas indicate observed limits on these models from the two lepton channels of Ref.~[arXiv: 1803.02762] and Ref.~[arXiv: 1403.5294]. The grey numbers indicate the observed 95$\%$ CLs upper limit on the cross section.

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$ ilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$ ilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$ ilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$ ilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].The grey numbers indicated the observed 95\% CL upper limit on the cross section.

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].The grey numbers indicated the observed 95\% CL upper limit on the cross section.

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].The grey numbers indicated the observed 95\% CL upper limit on the cross section.

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

Expected and observed exclusion contours derived from the combination of all of the Strong search SRs for the $\tilde{g}$--$\tilde{\ell}$ (top-left), $\tilde{g}$--$Z$ (top-right), and $\tilde{s}--Z$ (bottom) models. The dashed line indicates the expected limits at 95\% CL and the surrounding band shows the $1\sigma$ variation of the expected limit as a consequence of the uncertainties in the background prediction and experimental uncertainties of the signal ($\pm1\sigma_\mathrm{exp}$). The red dotted lines surrounding the observed limit contours indicate the variation resulting from changing the signal cross-section within its uncertainty ($\pm1\sigma_\mathrm{theory}^\mathrm{SUSY}$). The grey-shaded area indicates the observed limits on these models from Ref. [23].

The combined $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution of VRLow-STR and SRLow-STR (left), and the same region with the $\Delta\phi(\boldsymbol{j}_{1,2},\boldsymbol{\mathit{p}}_{ ext{T}}^{ ext{miss}})<0.4$ requirement, used as a control region to normalize the $Z/\gamma^*+\mathrm{jets}$ process (right). Separate fits for the SR and VR are performed, as for the results in the paper, and the resulting distributions are merged. All statistical and systematic uncertainties are included in the hatched bands. The last bins contain the overflow.

Cutflow of expected events in the four Strong search edge signal regions. `Leptons' refers to electrons and muons only. The gluino-$Z^{(*)}$ model with $m_{ ilde{g}}=800~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRC-STR with 60000 Monte Carlo (MC) events generated. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRMed-STR with 30000 (MC) events generated. The gluino-slepton model with $m_{ ilde{g}}=2~TeV$ and $m_{ ilde{\ell}}=1.3~TeV$ is used for SRLow-STR and SRHigh-STR with 30000 MC events generated. The Generator Filter requires two 5~GeV leptons and 100~GeV of \met. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~GeV$ or at least one lepton with $p_{\mathrm{T}}>25~GeV$ and a photon with $p_{\mathrm{T}}>40~GeV$, with all objects within $|\eta|=2.6$.

Cutflow of expected events in the four Strong search edge signal regions. `Leptons' refers to electrons and muons only. The gluino-$Z^{(*)}$ model with $m_{ ilde{g}}=800~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRC-STR with 60000 Monte Carlo (MC) events generated. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRMed-STR with 30000 (MC) events generated. The gluino-slepton model with $m_{ ilde{g}}=2~TeV$ and $m_{ ilde{\ell}}=1.3~TeV$ is used for SRLow-STR and SRHigh-STR with 30000 MC events generated. The Generator Filter requires two 5~GeV leptons and 100~GeV of \met. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~GeV$ or at least one lepton with $p_{\mathrm{T}}>25~GeV$ and a photon with $p_{\mathrm{T}}>40~GeV$, with all objects within $|\eta|=2.6$.

Cutflow of expected events in the four Strong search edge signal regions. `Leptons' refers to electrons and muons only. The gluino-$Z^{(*)}$ model with $m_{ ilde{g}}=800~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRC-STR with 60000 Monte Carlo (MC) events generated. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRMed-STR with 30000 (MC) events generated. The gluino-slepton model with $m_{ ilde{g}}=2~TeV$ and $m_{ ilde{\ell}}=1.3~TeV$ is used for SRLow-STR and SRHigh-STR with 30000 MC events generated. The Generator Filter requires two 5~GeV leptons and 100~GeV of \met. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~GeV$ or at least one lepton with $p_{\mathrm{T}}>25~GeV$ and a photon with $p_{\mathrm{T}}>40~GeV$, with all objects within $|\eta|=2.6$.

Cutflow of expected events in the four Strong search edge signal regions. `Leptons' refers to electrons and muons only. The gluino-$Z^{(*)}$ model with $m_{ ilde{g}}=800~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRC-STR with 60000 Monte Carlo (MC) events generated. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for SRMed-STR with 30000 (MC) events generated. The gluino-slepton model with $m_{ ilde{g}}=2~TeV$ and $m_{ ilde{\ell}}=1.3~TeV$ is used for SRLow-STR and SRHigh-STR with 30000 MC events generated. The Generator Filter requires two 5~GeV leptons and 100~GeV of \met. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~GeV$ or at least one lepton with $p_{\mathrm{T}}>25~GeV$ and a photon with $p_{\mathrm{T}}>40~GeV$, with all objects within $|\eta|=2.6$.

Cutflow of expected events in the three Strong search on-$Z$ signal regions. The cutflow up to the signal region specific requirements is the same as in the Strong search edge cutflow. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for all of the on-$Z$ signal regions with 30000 (MC) events generated.

Cutflow of expected events in the three Strong search on-$Z$ signal regions. The cutflow up to the signal region specific requirements is the same as in the Strong search edge cutflow. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for all of the on-$Z$ signal regions with 30000 (MC) events generated.

Cutflow of expected events in the three Strong search on-$Z$ signal regions. The cutflow up to the signal region specific requirements is the same as in the Strong search edge cutflow. The slepton-$Z^{(*)}$ model with $m_{ ilde{\ell}}=1200~GeV$ and $m_{ ilde{\chi}_1^0}=700~GeV$ is used for all of the on-$Z$ signal regions with 30000 (MC) events generated.

Table 36: Cutflow of expected events in the region SR-OffShell_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 36: Cutflow of expected events in the region SR-OffShell_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 37: Cutflow of expected events in the region SR-OffShell_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 37: Cutflow of expected events in the region SR-OffShell_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 38: Cutflow of expected events in the region SR-Low_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 38: Cutflow of expected events in the region SR-Low_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 39: Cutflow of expected events in the region SR-Low_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 39: Cutflow of expected events in the region SR-Low_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 40: Cutflow of expected events in the region SR-Low-2-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 40: Cutflow of expected events in the region SR-Low-2-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 41: Cutflow of expected events in the region SR-Int_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 41: Cutflow of expected events in the region SR-Int_a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 42: Cutflow of expected events in the region SR-Int_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 42: Cutflow of expected events in the region SR-Int_b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 43: Cutflow of expected events in the region SR-High_16a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 43: Cutflow of expected events in the region SR-High_16a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 44: Cutflow of expected events in the region SR-High_16b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 44: Cutflow of expected events in the region SR-High_16b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 45: Cutflow of expected events in the region SR-High_8a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 45: Cutflow of expected events in the region SR-High_8a-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 46: Cutflow of expected events in the region SR-High_8b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 46: Cutflow of expected events in the region SR-High_8b-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 47: Cutflow of expected events in the region SR-1J-High-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 47: Cutflow of expected events in the region SR-1J-High-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 48: Cutflow of expected events in the region SR-llbb-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

Table 48: Cutflow of expected events in the region SR-llbb-EWK. Requirements below the line are specific to this region. On the Generator Filter line, the total number of unweighted events simulated is given in brackets. `Leptons' refers to electrons and muons only. For C1N2 models, the Generator Filter requires at least two $7~\mathrm{GeV}$ leptons and for C1N2 models with mass splittings below the Z boson mass it also requires $75~\mathrm{GeV}$ of $E_{\mathrm{T}}^{\mathrm{miss}}$. For GMSB models, the Generator Filter requires at least two $3~\mathrm{GeV}$ leptons. For on-shell C1N2 models, the `Forced Decays' require each Z boson to decay to a charged lepton pair (electron, muon, or tau) and each W boson to decay hadronically. For off-shell C1N2 models, each neutralino is forced to produce a charged lepton pair in its decay, and each chargino can produce any fermion pair. The SUSY2 kernel requires at least two leptons with $p_{\mathrm{T}}>9~\mathrm{GeV}$ or at least one lepton with $p_{\mathrm{T}}>25~\mathrm{GeV}$ and a photon with $p_{\mathrm{T}}>40~\mathrm{GeV}$, with all objects within $|\eta|=2.6$.

The combined $m_{jj}$ distribution of CR-Z-EWK and SR-Low-EWK (left), and the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in CR-Z-met-EWK (right), which removes the upper limit of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}}) < 9$ from the definition of CR-Z-EWK. This $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ tail overlaps other control and validation regions, but not signal regions. The arrows indicate the signal region SR-Low-EWK (left), and the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ phase space which is not included in CR-Z-EWK (right). All EWK search control and signal regions are included in the fit. All statistical and systematic uncertainties are included in the hatched bands. The theoretical uncertainties from CR-Z-EWK are applied to CR-Z-met-EWK. The last bins contain the overflow.

The combined $m_{jj}$ distribution of CR-Z-EWK and SR-Low-EWK (left), and the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in CR-Z-met-EWK (right), which removes the upper limit of $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}}) < 9$ from the definition of CR-Z-EWK. This $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ tail overlaps other control and validation regions, but not signal regions. The arrows indicate the signal region SR-Low-EWK (left), and the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ phase space which is not included in CR-Z-EWK (right). All EWK search control and signal regions are included in the fit. All statistical and systematic uncertainties are included in the hatched bands. The theoretical uncertainties from CR-Z-EWK are applied to CR-Z-met-EWK. The last bins contain the overflow.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the GMSB model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-OffShell-EWK and SR-Low-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-Low-2-EWK and SR-Int-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-High-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) for the C1N2 model in the regions SR-1J-High-EWK and SR-$\ell\ell bb$-EWK. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. For models with mass splittings below the Z boson mass, this filter also requires $E_{\mathrm{T}}^{\mathrm{miss}} > 75~\mathrm{GeV}$. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_SLN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the GG_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Signal region acceptance (left) and efficiency (right) over the full \mll\ range for the SS_N2_ZN1 model in Strong search regions. Acceptance is calculated by applying the signal-region requirements to particle-level objects, which do not suffer from identification inefficiencies or mismeasurements. The efficiency is calculated with fully reconstructed objects with the acceptance divided out.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the dijet-1 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the dijet-2 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the dijet-3 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the untagged 1 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the untagged 2 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the untagged 3 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the untagged 4 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Observed signal strength ($\mu$) for a SM Higgs boson at 125.38 GeV. The labels untagged combined,dijet combined and combined represent the results obtained from simultaneous fits of the untagged categories, dijet categories, and full set of categories, respectively. The black solid line shows $\mu=1$, and the red dashed line shows the best fit value $\hat{\mu}=2.4$ of all categories combined.

Upper limit (95% CL) on the signal strength ($\mu$) relative to the SM prediction, as a function of the assumed value of the Higgs boson mass used in the fit.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 40 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 45 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 50 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 55 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 60 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 65 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 70 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 75 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 80 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 85 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 90 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 95 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 100 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

Data event yields and predicted signal and background yields (including subdominant $t\bar{t}$) in bins of dijet and average jet mass.

The W' boson 95% CL limits on the product of cross section and branching fraction. The expected and observed limits are shown for the high VLQ mass range.

The W' boson 95% CL limits on the product of cross section and branching fraction. The expected and observed limits are shown for the low VLQ mass range.

Expected 95% CL limits for generalized hypotheses varying the fraction of tB (F(VLQ=B)) and bT (F(VLQ=T)) from the W′ decay

Expected 95% CL limits for generalized hypotheses varying the VLQ branching fraction to qH and qZ

Observed 95% CL limits for generalized hypotheses varying the fraction of tB (F(VLQ=B)) and bT (F(VLQ=T)) from the W′ decay

Observed 95% CL limits for generalized hypotheses varying the VLQ branching fraction to qH and qZ

Corrected $m(HH)$ distribution in the resolved $4b$ signal region (dots), after the fit under the background-only hypothesis. The error bars on the $4b$ points represent the Poisson uncertainties corresponding to their event yields. The background model (teal histogram) is shown with its total post-fit uncertainty (gray band). The final bin includes overflow. Representative spin-0 signal hypotheses (dashed, dotted, and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. The bottom panel shows the difference between the $4b$ distribution and the background model, relative to the background model. No significant excess of data relative to the SM background is observed.

Corrected $m(HH)$ distribution in the resolved $4b$ signal region (dots), after the fit under the background-only hypothesis. The error bars on the $4b$ points represent the Poisson uncertainties corresponding to their event yields. The background model (teal histogram) is shown with its total post-fit uncertainty (gray band). The final bin includes overflow. Representative spin-2 signal hypotheses (dashed, dotted, and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. The bottom panel shows the difference between the $4b$ distribution and the background model, relative to the background model. No significant excess of data relative to the SM background is observed.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The steps up to the $b$-tag categorization are shown for the spin-0.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The steps up to the $b$-tag categorization are shown for the spin-2.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The efficiencies of the three b-tag categories are shown for the spin-0 scenario; this efficiency is obtained after the other selection steps including the SR definition. The signal efficiency in the 4b region has a maximum around 1.5 TeV. Above that value the track-jets start to merge together, and for the highest resonance masses the 2b category becomes the most efficient.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The efficiencies of the three b-tag categories are shown for the spin-2 scenario; this efficiency is obtained after the other selection steps including the SR definition. The signal efficiency in the 4b region has a maximum around 1.5 TeV. Above that value the track-jets start to merge together, and for the highest resonance masses the 2b category becomes the most efficient.

Comparison of the background model (stacked histograms) with data (dots) in the $2b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

Comparison of the background model (stacked histograms) with data (dots) in the $3b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

Comparison of the background model (stacked histograms) with data (dots) in the $4b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

The $m(HH)$ distributions in the boosted $2b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $2b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $3b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $3b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $4b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $4b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

Expected (dashed black lines) and observed (solid black lines) 95% CL upper limits on the cross-section of resonant $HH$ production in the spin-0 signal models. The $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty ranges for the expected limits (colored bands) are shown. Expected limits using each of the resolved and boosted channels individually (dashed colored lines) are shown. The nominal $H\rightarrow b\bar{b}$ branching ratio is taken as 0.582.

Expected (dashed black lines) and observed (solid black lines) 95% CL upper limits on the cross-section of resonant $HH$ production in the spin-2 signal models. The $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty ranges for the expected limits (colored bands) are shown. Expected limits using each of the resolved and boosted channels individually (dashed colored lines) are shown. The theoretical prediction for the bulk RS model with $k/\bar{M}_{\text{Pl}} = 1$ (solid red line) is shown; the decrease below 350 GeV is due to a sharp reduction in the $G^{*}_{\text{KK}} \rightarrow HH$ branching ratio. The nominal $H\rightarrow b\bar{b}$ branching ratio is taken as 0.582.

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR6.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Observed and expected 95% CL lower limits on the $T$-quark mass as a function of the $T$-quark width-to-mass ratio and the branching fraction of the $T \rightarrow Ht$ decay ($\Gamma_{T}$ is the $T$-quark width).

Cutflow table listing the number of events passing each criterion for a $T$-quark hypothesis with a mass of 1.6 TeV and $\kappa_{T} = 0.5$. The initial signal event yield is the predicted number of $T$-quark events inclusive in the Higgs-boson and top-quark decays for 139 fb$^{-1}$.

Observed 95% CL upper limits on the single $T$-quark production cross-section as a function of the $T$-quark coupling $\kappa_{T}$ and $m_{T}$.

Expected 95% CL upper limits on the single $T$-quark production cross-section as a function of the $T$-quark coupling $\kappa_{T}$ and $m_{T}$.

Observed and expected 95% CL lower limits on the $T$-quark mass as a function of the $T$-quark width-to-mass ratio and the branching fraction of the $T \rightarrow Wb$ decay ($\Gamma_{T}$ is the $T$-quark width).