The sumPT distribution in the Z+jets control region (electron channel). Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the Z+jets control region (muon channel). Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the ttbar control region (electron channel). Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the ttbar control region (muon channel). Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the electron channel. The selection is that of the signal regions except for the final requirement on sumPT. Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

The sumPT distribution in the muon channel. The selection is that of the signal regions except for the final requirement on sumPT. Expected background yields are given along with the total background uncertainty. The ttbar, W+jets and Z+jets backgrounds are normalised by the factors 0.95, 0.81 and 1.01 as obtained from the background likelihood fit. The single-top-quark and diboson background normalisations are taken from the simulation. The multijet background is obtained using a data-driven method. Additionally, the likelihood fit may constrain nuisance parameters for certain systematic uncertainties, altering the normalisation and shape of some of the distributions.

Expected and observed exclusion contours in the MTH, MD plane for models of rotating black holes with two, four and six extra dimensions simulated with Charybdis2 1.0.4. Masses below the corresponding lines are excluded.

Best fit values of $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The values involving cross sections are given for $\sqrt{s}$=8 TeV, assuming the SM values for $\sigma_i(7 \mathrm{TeV})/\sigma_i(8 \mathrm{TeV})$. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\kappa_{gZ}= \kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and of the ratios of coupling modifiers, as defined in the most generic parameterisation described in the context of the $\kappa$ framework, from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The uncertainties in $\lambda_{tg}$ and $\lambda_{WZ}$, for which a negative solution is allowed, are calculated around the overall best fit value. The expected total uncertainties in the measurements are also shown. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Measured global signal strength $\mu$ and its total uncertainty, together with the breakdown of the uncertainty into its four components as defined in the text. The results are shown for the combination of ATLAS and CMS, and separately for each experiment. The expected uncertainty, with its breakdown, is also shown.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson production processes. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson branching fractions are the same as in the SM.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson decay channels. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson production process cross sections at $\sqrt{s}$ = 7 and 8 TeV are the same as in the SM.

Results of the ten-parameter fit of $\mu_F^f = \mu_{gg\mathrm{F}+ttH}^f$ and $\mu_V^f = \mu_{\mathrm{VBF}+VH}^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Results of the six-parameter fit of the global ratio $\mu_V/\mu_F = \mu_{\mathrm{VBF}+VH}/\mu_{gg\mathrm{F}+ttH}$ together with $\mu_F^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Fit results allowing BSM loop couplings, assuming that $|\kappa_{V}| \le$ 1, where $\kappa_{V}$ denotes $\kappa_{Z}$ or $\kappa_{W}$, and that $\mathrm{B_{BSM}} \ge$ 0. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results allowing BSM loop couplings, assuming that there are no additional BSM contributions to the Higgs boson width, i.e. $\mathrm{B_{BSM}}=0$. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $\mathrm{B_{BSM}}$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results for the parameterisation assuming the absence of BSM particles in the loops ($\mathrm{B_{BSM}}$=0). The results with their measured and expected uncertainties are reported for the combination of ATLAS and CMS, together with the individual results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ CL interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $|\kappa_\mu|$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for up-type versus down-type fermions. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{uu}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{du}$, for which both signs are allowed, the other 1$\sigma$ CL interval is shown on a second line. Negative values for the parameter $\lambda_{Vu}$ are excluded by more than 4$\sigma$.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for leptons versus quarks. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{qq}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{lq}$, for which there is no sensitivity to the sign, only the absolute values are shown. Negative values for the parameter $\lambda_{Vq}$ are excluded by more than 4$\sigma$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

ATLAS+CMS combined best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow bb$ channel.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The extrapolated ($\tau > 30$ ps) average charged-particle muliplicity per unit of rapidity for ETARAP=0 as a function of the centre-of-mass energy.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicity distribution in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Charged-particle multiplicity distribution in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of pseudorapidity for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicities in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of transverse momentum for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicity distributions in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) charged-particle multiplicity distributions in proton-proton collisions at a centre-of mass energy of 13000 GeV for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

Extrapolated ($\tau > 30$ ps) average transverse momentum in proton-proton collisions at a centre-of mass energy of 13000 GeV as a function of the number of charged particles in the event for events with the number of charged particles >=2 having transverse momentum >100 MeV and absolute(pseudorapidity) <2.5.

A2 for the yZ-integrated measurement (unregularised).

A3 for the yZ-integrated measurement (unregularised).

A4 for the yZ-integrated measurement (unregularised).

A5 for the yZ-integrated measurement (unregularised).

A6 for the yZ-integrated measurement (unregularised).

A7 for the yZ-integrated measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the yZ-integrated measurement (regularised).

A0 for the yZ-integrated measurement (regularised).

A1 for the yZ-integrated measurement (regularised).

A2 for the yZ-integrated measurement (regularised).

A3 for the yZ-integrated measurement (regularised).

A4 for the yZ-integrated measurement (regularised).

A5 for the yZ-integrated measurement (regularised).

A6 for the yZ-integrated measurement (regularised).

A7 for the yZ-integrated measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0-A2 for the 0<|yZ|<1 measurement (unregularised).

A0 for the 0<|yZ|<1 measurement (unregularised).

A1 for the 0<|yZ|<1 measurement (unregularised).

A2 for the 0<|yZ|<1 measurement (unregularised).

A3 for the 0<|yZ|<1 measurement (unregularised).

A4 for the 0<|yZ|<1 measurement (unregularised).

A5 for the 0<|yZ|<1 measurement (unregularised).

A6 for the 0<|yZ|<1 measurement (unregularised).

A7 for the 0<|yZ|<1 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the 0<|yZ|<1 measurement (regularised).

A0 for the 0<|yZ|<1 measurement (regularised).

A1 for the 0<|yZ|<1 measurement (regularised).

A2 for the 0<|yZ|<1 measurement (regularised).

A3 for the 0<|yZ|<1 measurement (regularised).

A4 for the 0<|yZ|<1 measurement (regularised).

A5 for the 0<|yZ|<1 measurement (regularised).

A6 for the 0<|yZ|<1 measurement (regularised).

A7 for the 0<|yZ|<1 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0-A2 for the 1<|yZ|<2 measurement (unregularised).

A0 for the 1<|yZ|<2 measurement (unregularised).

A1 for the 1<|yZ|<2 measurement (unregularised).

A2 for the 1<|yZ|<2 measurement (unregularised).

A3 for the 1<|yZ|<2 measurement (unregularised).

A4 for the 1<|yZ|<2 measurement (unregularised).

A5 for the 1<|yZ|<2 measurement (unregularised).

A6 for the 1<|yZ|<2 measurement (unregularised).

A7 for the 1<|yZ|<2 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the 1<|yZ|<2 measurement (regularised).

A0 for the 1<|yZ|<2 measurement (regularised).

A1 for the 1<|yZ|<2 measurement (regularised).

A2 for the 1<|yZ|<2 measurement (regularised).

A3 for the 1<|yZ|<2 measurement (regularised).

A4 for the 1<|yZ|<2 measurement (regularised).

A5 for the 1<|yZ|<2 measurement (regularised).

A6 for the 1<|yZ|<2 measurement (regularised).

A7 for the 1<|yZ|<2 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A2 for the 2<|yZ|<3.5 measurement (unregularised).

A3 for the 2<|yZ|<3.5 measurement (unregularised).

A5 for the 2<|yZ|<3.5 measurement (unregularised).

A7 for the 2<|yZ|<3.5 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A2 for the 2<|yZ|<3.5 measurement (regularised).

A3 for the 2<|yZ|<3.5 measurement (regularised).

A5 for the 2<|yZ|<3.5 measurement (regularised).

A7 for the 2<|yZ|<3.5 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0 for the 2<|yZ|<3.5 measurement (unregularised).

A4 for the 2<|yZ|<3.5 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0 for the 2<|yZ|<3.5 measurement (regularised).

A4 for the 2<|yZ|<3.5 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

Expected 95% CL exclusion contour for the Gbb signal.

Observed 95% CL exclusion contour for the Gbb signal.

Expected 95% CL exclusion contour for the Gtt combination.

Observed 95% CL exclusion contour for the Gtt combination.

Acceptances for the Gbb model in SR-Gbb-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gbb model in SR-Gbb-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-0L-C. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-A. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptances for the Gtt model in SR-Gtt-1L-B. Acceptance is evaluated at truth level, with only leptons from heavy bosons and taus considered, and no further quality or isolation criteria applied in their selection.

Acceptance times efficiency for the Gbb model in SR-Gbb-A.

Acceptance times efficiency for the Gbb model in SR-Gbb-B.

Acceptance times efficiency for the Gbb model in SR-Gbb-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-B.

Acceptance times efficiency for the Gtt model in SR-Gtt-0L-C.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-A.

Acceptance times efficiency for the Gtt model in SR-Gtt-1L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gbb model in SR-Gbb-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-B.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-0L-C.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-A.

95% CL upper limit on the cross-section times branching ratio (in fb) for the Gtt model in SR-Gtt-1L-B.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gbb model.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 0-lepton channel.

Signal region yielding the best expected sensitivity for each point of the parameter space in the Gtt model for the 1-lepton channel.

Combination of two 0-lepton and 1-lepton signal regions yielding the best expected sensitivity for each point of the parameter space in the Gtt model.

$R_{pPb}$ as a function of $p_{T}$ integrated over rapidity range $-1.8<y*<1.3$ for the 0--90% centrality interval for the three geometric models: (a) Glauber, (b) Glauber-Gribov with $\omega_{\sigma}=0.11$ and (c) Glauber-Gribov with $\omega_{\sigma}=0.2$.

$R_{pPb}$ values as a function of $p_{T}$ in the 0--90% centrality interval averaged over $|y*|<0.5$.The $\langle T_{Pb} \rangle$ value for the ATLAS centrality correction is calculated with the Glauber model. The total systematic uncertainties, which include the uncertainty in $\langle T_{Pb} \rangle$, are indicated by lines of the same colour. Strict quantitative agreement is not expected as each measurement uses different rapidity intervals for the centrality determination and apply different event selection criteria to reject diffractive collisions.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $-1.8<y*<1.3$ for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{CP}$ as a function of $p_{T}$ extracted from the invariant yields integrated over $|\eta|<2.3$ for seven centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $p_{T}$ extracted from the invariant yields for six rapidity ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

$R_{pPb}$ as a function of $y*$ extracted from the invariant yields for eight $p_{T}$ ranges, for eight centrality intervals, and for different geometrical models used to calculate $\langle T_{Pb} \rangle$.

NLO cross sections and selection efficiencies (assuming $\beta$ = 1) for different signal points.