$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 20--40\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 40--60\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 60--100\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to charged $\pi$ ($\pi^{+} + \pi^{-}$) at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to charged $\pi$ ($\pi^{+} + \pi^{-}$) as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to K$^{-}$ at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to K$^{-}$ as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to its ground state particle $\Lambda$ ($\Lambda + \bar{\Lambda}$) at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to its ground state particle $\Lambda$ ($\Lambda + \bar{\Lambda}$) as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

Azimuthal correlation distribution between heavy-flavour decay electrons and charged hadrons, scaled by the number of electrons in EMCal triggered events in the electron transverse momentum range 4.5-6 GeV/c.

Relative beauty contribution to the heavy-flavour electron yield obtained with the method based on the track impact parameter.

Relative beauty contribution to the heavy-flavour electron yield obtained with the method based on the track impact parameter.

Relative beauty contribution to the heavy-flavour electron yield obtained from the method based on the azimuthal correlation of heavy-flavour decay electrons and charged tracks.

Relative beauty contribution to the heavy-flavour electron yield obtained from the method based on the azimuthal correlation of heavy-flavour decay electrons and charged tracks.

The $p_{\rm T}$-differential inclusive cross section of electrons (multiplied by $10^3$ for readability) from beauty hadron decays using the electron-hadron azimuthal correlation method.

The pT-differential inclusive cross section of electrons from beauty hadron decays using the electron-hadron azimuthal correlation method.

The $p_{\rm T}$-differential inclusive cross section of electrons (multiplied by $10^3$ for readability) from beauty hadron decays. A 1.9% normalization uncertainty not shown.

The pT-differential inclusive cross section of electrons from beauty hadron decays. A 1.9% normalization uncertainty not shown.

Inclusive bbbar production cross section per rapidity unit measured in mid-rapidity.

Inclusive bbbar production cross section per rapidity unit measured.

Total bbbar production cross section.

Total bbbar production cross section.

Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.

Fiducial $W+b$-jets cross-section correlations of statistical errors in the 1-jet region in bins of $p_T^{b-jet}$.

Fiducial $W+b$-jets cross-section correlations of systematic errors in the 1-jet region in bins of $p_T^{b-jet}$.

Fiducial $W+b$-jets cross-section correlations of statistical errors in the 1-jet region in bins of $p_T^{b-jet}$ without single-top subtraction.

Fiducial $W+b$-jets cross-section correlations of systematic errors in the 1-jet region in bins of $p_T^{b-jet}$ without single-top subtraction.

Measured fiducial $W+b$-jets cross-section in the 2-jet region with statistical and systematic uncertainties in bins of $p_T^{b-jet}$. Also shown are the cross sections obtained without single-top subtraction. UPDATE (04 MAY 2019): units corrected from nb/GeV to fb/GeV.

Fiducial $W+b$-jets cross-section correlations of statistical errors in the 2-jet region in bins of $p_T^{b-jet}$.

Fiducial $W+b$-jets cross-section correlations of systematic errors in the 2-jet region in bins of $p_T^{b-jet}$.

Fiducial $W+b$-jets cross-section correlations of statistical errors in the 2-jet region in bins of $p_T^{b-jet}$ without single-top subtraction.

Fiducial $W+b$-jets cross-section correlations of systematic errors in the 2-jet region in bins of $p_T^{b-jet}$ without single-top subtraction.

Multiplicative correction factors for non-perturbative effects and additive corrections for double-parton interactions, derived from the ALPGEN simulation, applied to the MCFM and POWHEG predictions for the comparisons with unfolded results. The non-perturbative uncertainties include the hadronization and underlying event modelling, while the DPI uncertainties are based on the ATLAS measurement of $\sigma_{\rm eff}$.

Multiplicative correction factors for non-perturbative effects and additive corrections for double-parton interactions, derived from the ALPGEN simulation, applied to the MCFM and POWHEG predictions for the comparisons with unfolded results. The non-perturbative uncertainties include the hadronization and underlying event modelling, while the DPI uncertainties are based on the ATLAS measurement of $\sigma_{\rm eff}$.

Theoretical NLO predictions for the $W+b$-jet fiducial cross-section for one lepton flavour calculated with the MCFM program, corrected for non-perturbative effects and DPI contributions.

Differential cross section as function of the jet multiplicity.

Differential cross section as function of the pT of the pT-leading jet. The jet must have pT>30 GeV and must be separated from the charged leptons from the W and Z decays by DeltaR(jet,lepton) > 0.5.

Differential cross section for prompt D+ production.

Differential cross section for prompt D*+ production.

Differential cross section for prompt D*+ production.

Integrated cross sections for prompt charm particle production extraplated to PT=0. The second (sys) error is the uncertainty in the branching ratio The third (sys) error is the uncertainty in the extrapolation procedure.

Integrated cross sections for prompt charm particle production extraplated to PT=0. The second (sys) error is the uncertainty in the branching ratio The third (sys) error is the uncertainty in the extrapolation procedure.

Measured charged jet differential cross section ratios for INEL proton-proton collisions at $\sqrt{s}$ = 7 TeV for $15<p_{T}^{ch jet}<20$ GeV/$c$.