Event yields for a simulated $ZH(\rightarrow aa\rightarrow (b\bar{b})(b\bar{b}))$ sample with $m_a = 17.5\,\text{GeV}$. The signal sample is produced with cross section equals to the standard model $pp\to ZH$, i.e. $0.88\,\text{pb}$. Cut 0 corresponds to the initial number of events. Cut 1 requires the single lepton trigger. Cut 2 requires 2 identified leptons. Cut 3 requires the Z-boson mass window. Cut 4 requires 2 reconstructed $a\to b\bar{b}$ candidates. Cut 5a requires 2 identified $a\to b\bar{b}$ candidates in the 1HPC1LPC region. Cut 6a requires the 2 $a\to b\bar{b}$ candidates in the 1HPC1LPC region to be inside the Higgs mass window. Cut 5b requires 2 identified $a\to b\bar{b}$ candidates in the 2HPC region. Cut 6b requires the 2 $a\to b\bar{b}$ candidates in the 2HPC region to be inside the Higgs mass window.

Background yield table for Z+jets, $t\bar{t}$, and rare sources. Observed data yield. Signal $ZH(\rightarrow aa\rightarrow (b\bar{b})(b\bar{b}))$ yield with $m_a = 20\,\text{GeV}$. The signal sample is produced with cross section equals to the standard model $pp\to ZH$, i.e. $0.88\,\text{pb}$. The table includes the yields in two signal regions with leptons consistent with an on-shell Z-boson decay, one with 2 $a\to b\bar{b}$ candidates in the 2HPC region and one with 2 $a\to b\bar{b}$ candidates in the 1HPC1LPC region. The table also includes the yields in four control regions, one with leptons consistent with an on-shell Z-boson decay and 2 $a\to b\bar{b}$ candidates in the Low Purity Category (LPC), and three others where the leptons are not consistent an on-shell Z-boson decay.

The minus $1\sigma$ variation of observed exclusion contour obtained by varying the signal cross section within its uncertainty. The contour is given as a function of the $\it{m}_{\tilde{\chi}^{0}_{1}}$ vs. $\it{m}_{\tilde{t}}$.

The plus $1\sigma$ variation of observed exclusion contour obtained by varying the signal cross section within its uncertainty. The contour is given as a function of the $\it{m}_{\tilde{\chi}^{0}_{1}}$ vs. $\it{m}_{\tilde{t}}$.

The minus $1\sigma$ variation of expected exclusion contour obtained by varying MC statistical uncertainties, detector-related systematic uncertainties, and theoretical uncertainties (excluding signal cross section uncertainties). The contour is given as a function of the $\it{m}_{\tilde{\chi}^{0}_{1}}$ vs. $\it{m}_{\tilde{t}}$.

The plus $1\sigma$ variation of expected exclusion contour obtained by varying MC statistical uncertainties, detector-related systematic uncertainties, and theoretical uncertainties (excluding signal cross section uncertainties). The contour is given as a function of the $\it{m}_{\tilde{\chi}^{0}_{1}}$ vs. $\it{m}_{\tilde{t}}$.

The observed exclusion contour at 95% CL as a function of the $\it{m}_{LQ_{3}^{u}}$ vs. $\mathrm{BR}(\it{m}_{LQ_{3}^{u}}\rightarrow b \tau)$. Points that are within the contours are excluded.

The expected exclusion contour at 95% CL as a function of the $\it{m}_{LQ_{3}^{u}}$ vs. $\mathrm{BR}(\it{m}_{LQ_{3}^{u}}\rightarrow b \tau)$. Points that are within the contours are excluded.

The minus $1\sigma$ variation of observed exclusion contour obtained by varying the signal cross section within its uncertainty. The contour is given as a function of the $\it{m}_{LQ_{3}^{u}}$ vs. $\mathrm{BR}(\it{m}_{LQ_{3}^{u}}\rightarrow b \tau)$

The plus $1\sigma$ variation of observed exclusion contour obtained by varying the signal cross section within its uncertainty. The contour is given as a function of the $\it{m}_{LQ_{3}^{u}}$ vs. $\mathrm{BR}(\it{m}_{LQ_{3}^{u}}\rightarrow b \tau)$

The plus $1\sigma$ variation of expected exclusion contour obtained by varying MC statistical uncertainties, detector-related systematic uncertainties, and theoretical uncertainties (excluding signal cross section uncertainties). The contour is given as a function of the $\it{m}_{LQ_{3}^{u}}$ vs. $\mathrm{BR}(\it{m}_{LQ_{3}^{u}}\rightarrow b \tau)$

The minus $1\sigma$ variation of expected exclusion contour obtained by varying MC statistical uncertainties, detector-related systematic uncertainties, and theoretical uncertainties (excluding signal cross section uncertainties). The contour is given as a function of the $\it{m}_{LQ_{3}^{u}}$ vs. $\mathrm{BR}(\it{m}_{LQ_{3}^{u}}\rightarrow b \tau)$

Model dependent upper limit on the cross section for the $(\tilde{t},\tilde{\chi}^{0}_{1})$ signal grid. The column titled 'Leading Region' stores information on which of the fit regions (SRA-B, SRC or SRD) is the dominant based on the expected CLs values.

Expected model dependent upper limit on the cross section for the $(\tilde{t},\tilde{\chi}^{0}_{1})$ signal grid. The column titled 'Leading Region' stores information on which of the fit regions (SRA-B, SRC or SRD) is the dominant based on the expected CLs values.

Model dependent upper limit on the cross section for the $LQ_{3}^{u}$ signal grid with $\mathrm{BR}(\it{m}_{LQ_{3}^{u}}\rightarrow b \tau))=0$ %. Only the SRA-B fit region is considered in this interpretation.

Expected model dependent upper limit on the cross section for the $LQ_{3}^{u}$ signal grid with $\mathrm{BR}(\it{m}_{LQ_{3}^{u}}\rightarrow b \tau))=0$ %. Only the SRA-B fit region is considered in this interpretation.

The distributions of $S$ in SRA-TW. For each bin yields for the data, total SM prediction and a representative signal point are provided. The SM prediction is provided with the MC statistical uncertainties, labeled 'stat', and the remaining uncertainties, labeled 'syst' that include detector-related systematic uncertainties and theoretical uncertainties. The signal predictions is provided with the MC statistical uncertainties only. The rightmost bin includes overflow events.

The distributions of $\it{m}^{\mathrm{R=1.2}}_{1}$ in SRB-TT. For each bin yields for the data, total SM prediction and a representative signal point are provided. The SM prediction is provided with the MC statistical uncertainties, labeled 'stat', and the remaining uncertainties, labeled 'syst' that include detector-related systematic uncertainties and theoretical uncertainties. The signal predictions is provided with the MC statistical uncertainties only. The rightmost bin includes overflow events.

The distributions of R$_{ISR}$ in SRC signal regions before R$_{ISR}$ cuts are applied. For each bin yields for the data, total SM prediction and a representative signal point are provided. The SM prediction is provided with the MC statistical uncertainties, labeled 'stat', and the remaining uncertainties, labeled 'syst' that include detector-related systematic uncertainties and theoretical uncertainties. The signal predictions is provided with the MC statistical uncertainties only. The rightmost bin includes overflow events.

The distributions of $E^{miss}_{T}/\sqrt{H_{T}}$ in SRD0. For each bin yields for the data, total SM prediction and a representative signal point are provided. The SM prediction is provided with the MC statistical uncertainties, labeled 'stat', and the remaining uncertainties, labeled 'syst' that include detector-related systematic uncertainties and theoretical uncertainties. The signal predictions is provided with the MC statistical uncertainties only. The rightmost bin includes overflow events.

The distributions of $E^{miss}_{T}/\sqrt{H_{T}}$ in SRD1. For each bin yields for the data, total SM prediction and a representative signal point are provided. The SM prediction is provided with the MC statistical uncertainties, labeled 'stat', and the remaining uncertainties, labeled 'syst' that include detector-related systematic uncertainties and theoretical uncertainties. The signal predictions is provided with the MC statistical uncertainties only. The rightmost bin includes overflow events.

The distributions of $E^{miss}_{T}/\sqrt{H_{T}}$ in SRD2. For each bin yields for the data, total SM prediction and a representative signal point are provided. The SM prediction is provided with the MC statistical uncertainties, labeled 'stat', and the remaining uncertainties, labeled 'syst' that include detector-related systematic uncertainties and theoretical uncertainties. The signal predictions is provided with the MC statistical uncertainties only. The rightmost bin includes overflow events.

Cutflow for the reference point $(\it{m}_{\tilde{t}}, \it{m}_{\tilde{\chi}^{0}_{1}})= (1300,1)\ \mathrm{GeV} $ in SRA-TT. The column labelled ''Weighted yield'' shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$. A notable exception concerns results in the first row, labelled ''Total'', that corresponds to plain $\sigma \cdot \mathcal{L}$ expected. The ''Derivation skim'' includes the requirements that $H_{T}$, the scalar sum of $p_{T}$ of jets and leptons, $H_{T}>150\ \mathrm{GeV}$ or that a ''baseline'' electron or muon has $p_{T}>20\ \mathrm{GeV}$. The definition of ''baseline'' electron/muons, lepton and $\tau$ vetos are described in the main body of the paper. In total 30000 raw MC events were generated prior to the specified cuts, with the column ''Unweighted yield'' collecting the numbers after each cut.

Cutflow for the reference point $(\it{m}_{\tilde{t}}, \it{m}_{\tilde{\chi}^{0}_{1}})= (1300,1)\ \mathrm{GeV} $ in SRA-TW. The column labelled ''Weighted yield'' shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$. A notable exception concerns results in the first row, labelled ''Total'', that corresponds to plain $\sigma \cdot \mathcal{L}$ expected. The ''Derivation skim'' includes the requirements that $H_{T}$, the scalar sum of $p_{T}$ of jets and leptons, $H_{T}>150\ \mathrm{GeV}$ or that a ''baseline'' electron or muon has $p_{T}>20\ \mathrm{GeV}$. The definition of ''baseline'' electron/muons, lepton and $\tau$ vetos are described in the main body of the paper. In total 30000 raw MC events were generated prior to the specified cuts, with the column ''Unweighted yield'' collecting the numbers after each cut.

Cutflow for the reference point $(\it{m}_{\tilde{t}}, \it{m}_{\tilde{\chi}^{0}_{1}})= (1300,1)\ \mathrm{GeV} $ in SRA-T0. The column labelled ''Weighted yield'' shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$. A notable exception concerns results in the first row, labelled ''Total'', that corresponds to plain $\sigma \cdot \mathcal{L}$ expected. The ''Derivation skim'' includes the requirements that $H_{T}$, the scalar sum of $p_{T}$ of jets and leptons, $H_{T}>150\ \mathrm{GeV}$ or that a ''baseline'' electron or muon has $p_{T}>20\ \mathrm{GeV}$. The definition of ''baseline'' electron/muons, lepton and $\tau$ vetos are described in the main body of the paper. In total 30000 raw MC events were generated prior to the specified cuts, with the column ''Unweighted yield'' collecting the numbers after each cut.

Cutflow for the reference point $(\it{m}_{\tilde{t}}, \it{m}_{\tilde{\chi}^{0}_{1}})= (700,400)\ \mathrm{GeV} $ in signal regions SRB-TT, SRB-TW and SRB-T0. The regions differ by the last cut applied. The column labelled ''Weighted yield'' shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$. A notable exception concerns results in the first row, labelled ''Total'', that corresponds to plain $\sigma \cdot \mathcal{L}$ expected. The ''Derivation skim'' includes the requirements that $H_{T}$, the scalar sum of $p_{T}$ of jets and leptons, $H_{T}>150\ \mathrm{GeV}$ or that a ''baseline'' electron or muon has $p_{T}>20\ \mathrm{GeV}$. The definition of ''baseline'' electron/muons, lepton and $\tau$ vetos are described in the main body of the paper. In total 60000 raw MC events were generated prior to the specified cuts, with the column ''Unweighted yield'' collecting the numbers after each cut.

Cutflow for the reference point $(\it{m}_{\tilde{t}}, \it{m}_{\tilde{\chi}^{0}_{1}})= (500,327)\ \mathrm{GeV} $ in regions SRC-1, SRC-2, SRC-3, SRC-4 and SRC-5. The regions differ by the last cut applied. The column labelled ''Weighted yield'' shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$. A notable exception concerns results in the first row, labelled ''Total'', that corresponds to plain $\sigma \cdot \mathcal{L}$ expected. The ''Derivation skim'' includes the requirements that $H_{T}$, the scalar sum of $p_{T}$ of jets and leptons, $H_{T}>150\ \mathrm{GeV}$ or that a ''baseline'' electron or muon has $p_{T}>20\ \mathrm{GeV}$. The definition of ''baseline'' electron/muons, lepton and $\tau$ vetos are described in the main body of the paper. In total 150000 raw MC events with filter efficiency of 0.384 were generated prior to the specified cuts, with the column ''Unweighted yield'' collecting the numbers after each cut.

Cutflow for the reference point $(\it{m}_{\tilde{t}}, \it{m}_{\tilde{\chi}^{0}_{1}})= (550,500)\ \mathrm{GeV} $ in SRD0. The column labelled ''Weighted yield'' shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$. A notable exception concerns results in the first row, labelled ''Total'', that corresponds to plain $\sigma \cdot \mathcal{L}$ expected. The ''Derivation skim'' includes the requirements that $H_{T}$, the scalar sum of $p_{T}$ of jets and leptons, $H_{T}>150\ \mathrm{GeV}$ or that a ''baseline'' electron or muon has $p_{T}>20\ \mathrm{GeV}$. The definition of ''baseline'' electron/muons, lepton and $\tau$ vetos are described in the main body of the paper. In total 90000 raw MC events with filter efficiency of 0.428 were generated prior to the specified cuts, with the column ''Unweighted yield'' collecting the numbers after each cut.

Cutflow for the reference point $(\it{m}_{\tilde{t}}, \it{m}_{\tilde{\chi}^{0}_{1}})= (550,500)\ \mathrm{GeV} $ in SRD1. The column labelled ''Weighted yield'' shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$. A notable exception concerns results in the first row, labelled ''Total'', that corresponds to plain $\sigma \cdot \mathcal{L}$ expected. The ''Derivation skim'' includes the requirements that $H_{T}$, the scalar sum of $p_{T}$ of jets and leptons, $H_{T}>150\ \mathrm{GeV}$ or that a ''baseline'' electron or muon has $p_{T}>20\ \mathrm{GeV}$. The definition of ''baseline'' electron/muons, lepton and $\tau$ vetos are described in the main body of the paper. In total 90000 raw MC events with filter efficiency of 0.428 were generated prior to the specified cuts, with the column ''Unweighted yield'' collecting the numbers after each cut.

Cutflow for the reference point $(\it{m}_{\tilde{t}}, \it{m}_{\tilde{\chi}^{0}_{1}})= (550,500)\ \mathrm{GeV} $ in SRD2. The column labelled ''Weighted yield'' shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$. A notable exception concerns results in the first row, labelled ''Total'', that corresponds to plain $\sigma \cdot \mathcal{L}$ expected. The ''Derivation skim'' includes the requirements that $H_{T}$, the scalar sum of $p_{T}$ of jets and leptons, $H_{T}>150\ \mathrm{GeV}$ or that a ''baseline'' electron or muon has $p_{T}>20\ \mathrm{GeV}$. The definition of ''baseline'' electron/muons, lepton and $\tau$ vetos are described in the main body of the paper. In total 90000 raw MC events with filter efficiency of 0.428 were generated prior to the specified cuts, with the column ''Unweighted yield'' collecting the numbers after each cut.

Signal acceptance in SRA-TT for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{3}$

Signal efficiency in SRA-TT for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in %.

Signal acceptance in SRA-TW for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{3}$

Signal efficiency in SRA-TW for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in %.

Signal acceptance in SRA-T0 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{3}$

Signal efficiency in SRA-T0 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in %.

Signal acceptance in SRB-TT for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{3}$

Signal efficiency in SRB-TT for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in %.

Signal acceptance in SRB-TW for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{3}$

Signal efficiency in SRB-TW for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in %.

Signal acceptance in SRB-T0 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{3}$

Signal efficiency in SRB-T0 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in %.

Signal acceptance in SRC1 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{5}$ and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal efficiency in SRC1 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in % and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal acceptance in SRC2 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{5}$ and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal efficiency in SRC2 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in % and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal acceptance in SRC3 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{5}$ and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal efficiency in SRC3 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in % and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal acceptance in SRC4 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{5}$ and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal efficiency in SRC4 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in % and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ plane showed in the paper plot.

Signal acceptance in SRC5 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{5}$ and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ plane showed in the paper plot.

Signal efficiency in SRC5 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in % and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal acceptance in SRD0 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{5}$ and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal efficiency in SRD0 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in % and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal acceptance in SRD1 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{5}$ and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal efficiency in SRD1 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in % and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal acceptance in SRD2 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the acceptance given in the table is multiplied by factor of $10^{5}$ and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

Signal efficiency in SRD2 for simplified $(\tilde{t},\tilde{\chi^{0}_1})$ model. Please mind that the efficiency in the table is reported in % and the results are given here in the $\it{m}_{\tilde{t}}-\it{m}_{\tilde{\chi}^{0}_{1}}$ plane as opposed to the $\it{m}_{\tilde{t}}-\Delta(\it{m}_{\tilde{\chi}^{0}_{1}},\it{m}_{\tilde{t}})$ one showed in the paper plot.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels in the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

The product of acceptance, efficiency, and branching fraction of the qbX signal with $\mathrm{X} \rightarrow \tau\tau$ and $m_{\mathrm{B}}=170~\mathrm{GeV}$ in $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels of the 1b1f and 1b1c event categories, as a function of the X boson mass. The selections are as described in the paper. The uncertainty refers to the statistical uncertainty only.

Observed $m_{\tau\tau}$ distribution in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1f category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1c category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mu\tau_\mathrm{h}$ channel of the 1b1f category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mu\tau_\mathrm{h}$ channel of the 1b1c category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 300 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 450 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1f category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1c category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1b1f category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1b1c category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Measured misidentification probability distribution as a function of track multiplicity for the EMJ-1 criteria group defined in Table 2. The red up-pointing triangles are for b jets while the blue down-pointing triangles are for light-flavor jets. The horizontal lines on the data points indicate the variable bin width.

The $H_\mathrm{T}$ distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 8 (SM QCD-enhanced), requiring at least two jets tagged by loose emerging jet criteria.

The number of associated tracks distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 8 (SM QCD-enhanced), requiring at least two jets tagged by loose emerging jet criteria.

The $H_\mathrm{T}$ distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 9 (SM QCD-enhanced), requiring at least one jet tagged by loose emerging jet criteria and large $p_\mathrm{T}^\mathrm{miss}$.

The number of associated tracks distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 9 (SM QCD-enhanced), requiring at least one jet tagged by loose emerging jet criteria and large $p_\mathrm{T}^\mathrm{miss}$.

Upper limits at 95% CL on the signal cross section for models with dark pion mass $(m_{\pi_\mathrm{DK}})$ of 5 GeV in the proper decay length $(c\tau_{\pi_\mathrm{DK}})$ versus dark mediator mass $(m_{\mathrm{X_{DK}}})$ plane.

Dark mediator mass exclusion limits at 95% CL derived from theoretical cross sections for models with dark pion mass $(m_{\pi_\mathrm{DK}})$ of 5 GeV in the proper decay length $(c\tau_{\pi_\mathrm{DK}})$ versus dark mediator mass $(m_{\mathrm{X_{DK}}})$ plane.

Observed and predicted mTtot distribution in the b-tag category of the 2tau_h channel. Despite listing this as an exclusive final state (as there must be at least one b-jets), there is no explicit selection on the presence of additional light-flavour jets. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. The last bin includes overflows. The combined prediction for A and H bosons with masses of 300, 500 and 800 GeV and $\tan\beta$ = 10 in the hMSSM scenario are also provided.

Observed and predicted mTtot distribution for the b-inclusive selection in the 1l1tau_h channel. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. In the paper, the first bin is cut off at 60 GeV for aesthetics but contains underflows down to 50 GeV as in the HepData table. The last bin includes overflows. The prediction for a SSM Zprime with masses of 1500, 2000 and 2500 GeV are also provided.

Observed and predicted mTtot distribution for the b-inclusive selection in the 2tau_h channel. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. The last bin includes overflows. The prediction for a SSM Zprime with masses of 1500, 2000 and 2500 GeV are also provided.

Observed and expected 95% CL upper limits on the b-associated Higgs boson production cross section times ditau branching fraction as a function of the boson mass.

Observed and expected 95% CL upper limits on the Drell Yan production cross section times ditau branching fraction as a function of the Zprime boson mass.

Observed and expected 95% CL upper limits on the Higgs boson production cross section times ditau branching fraction as a function of the boson mass and the relative strength of the b-associated production.

Ratio of the 95% CL upper limits on the production cross section times branching fraction for alternate Zprime models with respect to the SSM, both observed and expected are shown.

Acceptance, acceptance times efficiency and b-tag category fraction for a scalar boson produced by gluon-gluon fusion as a function of the scalar boson mass.

Acceptance, acceptance times efficiency and b-tag category fraction for a scalar boson produced by b-associated production as a function of the scalar boson mass.

Acceptance and acceptance times efficiency for a heavy gauge boson produced by Drell Yan as a function of the gauge boson mass.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Observed and expected 95% CL upper limits on the gluon-gluon fusion Higgs boson production cross section times ditau branching fraction as a function of the boson mass.

Upper limits at the 95% CL on the cross section for SSM W' production and decay to the muon+neutrino channel as a function of the W' pole mass.

Combined (electron and muon channels) upper limits at the 95% CL on the cross section for SSM W' production and decay to a single lepton generation as a function of the W' pole mass.

Product of acceptance and efficiency for the electron and muon selections as a function of the W' pole mass.

Event yields for the different processes estimated with the fit to the $O_\mathrm{NN}$ distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The $Z,VV+\mathrm{jets}$ contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes.

Detailed list of the contribution from each source of uncertainty to the total uncertainty in the measured values of $\sigma_{\mathrm{fid}}(tq)$ and $\sigma_{\mathrm{fid}}(\bar tq)$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3\%$. Uncertainties contributing less than $0.5\%$ are marked with ‘<0.5’.

Significant contributions to the total relative uncertainty in the measured value of $R_{t}$. The estimation of the systematic uncertainties has a statistical uncertainty of $0.3~\%$. Uncertainties contributing less than $0.5~\%$ are not shown.

Slopes $a$ of the mass dependence of the measured cross$-$sections.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the neural network discriminant, $O_{\mathrm{NN}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Predicted (post-fit) and observed event yields for the signal region (SR), after the requirement on the second neural network discriminant, $O_{\mathrm{NN2}}~>~0.8$. The multijet background prediction is obtained from the fit to the $E_{\mathrm{T}}^{\mathrm{miss}}$ distribution described in Section 6, while all the other predictions and uncertainties are derived from the total cross$-$section measurement. In some cases there is no uncertainty quoted. In these cases the uncertainty is < 0.5.

Migration matrix for $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $p_{\mathrm{T}}(t)$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(\hat{t\hspace{-0.2mm}})|$ at the particle level. The pseudo top quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Migration matrix for $|y(t)|$ at the parton level. The parton-level quark is shown on the $y$-axis and the reconstructed variable is shown on the $x$-axis.

Uncertainties in the normalisations of the different backgrounds for all processes, as derived from the total cross-section measurement.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $p_{\mathrm{T}}(t)$ at parton level.

Absolute and normalised unfolded differential $tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Absolute and normalised unfolded differential $\bar tq$ production cross$-$section as a function of $|y(t)|$ at parton level.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events(at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $ \bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ for $\bar tq$ events (at the particle level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $p_{\mathrm{T}}(t)$ for $ \bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the absolute differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Statistical correlation matrix for the normalised differential cross-section as a function of $|y(t)|$ for $\bar tq$ events (at the parton level). It includes the statistical uncertainty due to the number of data events and MC statistics.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-quark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Fiducial acceptance $A_{\mathrm{fid}}$ for different $t$-channel single top-antiquark MC samples. $^{\mathrm{(a)}}$ Calculation taken from AcerMC $+$ $\mathrm{P{\scriptsize YTHIA}6}$. $^{\mathrm{(b)}}$ Calculation taken from $\mathrm{P{\scriptsize OWHEG}}$-$\mathrm{B{\scriptsize OX}}$ $+$ $\mathrm{P{\scriptsize YTHIA}6}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,200,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})$ at particle level per bin ([0,35,50,75,100,150,300] GeV) in percent of $\left( \dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{t\hspace{-0.2mm}})}$.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{t\hspace{-0.2mm}})|$ at particle level per bin ([0,0.15,0.3,0.45,0.7,1.0,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{t\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})$ at particle level per bin ([30,45,60,75,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(\hat{j\hspace{-0.2mm}})}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $\bar tq$ cross-section as a function of $|y(\hat{j\hspace{-0.2mm}})|$ at particle level per bin ([0.0, 1.2, 1.7, 2.2, 2.7, 3.3, 4.5]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(\hat{j\hspace{-0.2mm}})|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $tq$ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,200,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the normalised differential $\bar tq $ cross-section as a function of $p_{\mathrm{T}}(t)$ at parton level per bin ([0,50,100,150,300] GeV) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}p_{\mathrm{T}}(t)}$.

Uncertainties for the absolute differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the normalised differential $ tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

Uncertainties for the absolute differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$.

Uncertainties for the normalised differential $ \bar tq $ cross-section as a function of $|y(t)|$ at parton level per bin ([0,0.3,0.7,1.3,2.2]) in percent of $\left(\dfrac{1}{\sigma}\right)\dfrac{\mathrm{d}\sigma(\bar tq)}{\mathrm{d}|y(t)|}$. If the uncertainty reported in the paper is "0.0" for both the $\textit{plus}$ and $\textit{minus}$ variation, the value "+0.01" is assigned to the $\textit{plus}$ variation for technical reasons.

HT inclusive distribution in SRZ.

Jet multiplicity distribution in SRZ.

B-tagged jet multiplicity distribution in SRZ.

Dilepton invariant mass distribution in SRMedium.

Dilepton invariant mass distribution in SRMedium.

Dilepton invariant mass in SRHigh.

Expected 95% exclusion contour for the gluino simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Observed 95% exclusion contour for the gluino simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Expected 95% exclusion contour for the squark simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Observed 95% exclusion contour for the squark simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Expected 95% exclusion contour for the gluino simplified model with varying N1 mass and decays to quarks and Z bosons in SRZ.

Observed 95% exclusion contour for the gluino simplified model with varying N1 mass and decays to quarks and Z bosons in SRZ.

Expected 95% exclusion contour for the gluino simplified model with sleptons in the edge SRs.

Observed 95% exclusion contour for the gluino simplified model with sleptons in the edge SRs.

Expected 95% exclusion contour for the gluino simplified model with decays to on- or off-shell Z bosons in the edge SRs.

Observed 95% exclusion contour for the gluino simplified model with decays to on- or off-shell Z bosons in the edge SRs.

Expected 95% exclusion contour for the gluino simplified model with decays to on- or off-shell Z bosons in SRZ.

Observed 95% exclusion contour for the gluino simplified model with decays to on- or off-shell Z bosons in SRZ.

Cutflow table for three benchmark signal points from the $\tilde{g}$--$\chi_{2}^{0}$ on-shell grid in SRZ for the $ee$ and $\mu\mu$ channels separately. The number of generated events is N RAW, while N WEIGHTED corresponds to the number of events expected in 14.7/fb, after all MC simulation corrections have been applied.

Cutflow table for three benchmark signal points for the slepton model in SR-low, SR-medium and SR-high for the $ee$ and $\mu\mu$ channels separately. The number of generated events is N RAW, while N WEIGHTED corresponds to the number of events expected in 14.7/fb, after all MC simulation corrections have been applied. The event generation was filtered to require at least two leptons (electrons or muons) with $p_{T}>5$ GeV and $|\eta|<2.8$, with 20000 events required to pass the filter. The corresponding number of unfiltered events is provided in the ``Pre-filter events'' row of the table.

Signal acceptance for the gluino simplified model with decays to quarks and Z bosons in SRZ.

Signal efficiency for the gluino simplified model with decays to quarks and Z bosons in SRZ.

Signal acceptance for the gluino simplified model with decays via sleptons in SRLow.

Signal efficiency for the gluino simplified model with decays via sleptons in SRLow.

Signal acceptance for the gluino simplified model with decays via sleptons in SRMedium.

Signal efficiency for the gluino simplified model with decays via sleptons in SRMedium.

Signal acceptance for the gluino simplified model with decays via sleptons in SRHigh.

Signal efficiency for the gluino simplified model with decays via sleptons in SRHigh.

Upper limits on the signal cross-section at 95% CL for the gluino simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Upper limits on the signal cross-section at 95% CL for the squark simplified model with fixed N1 mass and decays to quarks and Z bosons in SRZ.

Upper limits on the signal cross-section at 95% CL for the gluino simplified model with varying N1 mass and decays to quarks and Z bosons in SRZ.

Upper limits on the signal cross-section at 95% CL for the gluino simplified model with decays via sleptons.

Upper limits on the signal cross-section at 95% CL for the gluino simplified model with decays to on-shell or off-shell Z bosons.