Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Differential cross sections as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Differential cross sections as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events.

Area normalized distribution as function of Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events

Response matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events.

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Differential fiducial cross section (without the acceptance correction) for the DY process measured in the muon channel, as a function of $p_{\textrm{T}}$ for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential fiducial cross section (without the acceptance correction) for the DY process measured in the muon channel, as a function of $p_{\textrm{T}}$ for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential fiducial cross section (without the acceptance correction) for the DY process measured in the muon channel, as a function of $\phi^*$ for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential fiducial cross section (without the acceptance correction) for the DY process measured in the muon channel, as a function of $\phi^*$ for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Integrated fiducial cross section for the DY process measured in the muon channel. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of dimuon invariant mass. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of rapidity in the centre-of-mass frame for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of rapidity in the centre-of-mass frame for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of $p_{\textrm{T}}$ for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of $p_{\textrm{T}}$ for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of $\phi^*$ for $15<m_{\mu\mu}<60$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Differential cross section for the DY process measured in the muon channel, as a function of $\phi^*$ for $60<m_{\mu\mu}<120$ GeV. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Integrated cross section for the DY process measured in the muon channel. The quoted error is the quadratic sum of the statistical and systematic uncertainties. The global normalisation uncertainty of 3.5% is listed separately.

Forward-backward ratios for $15<m_{\mu\mu}<60$ GeV. Quoted uncertainties are the quadratic sum of the statistical and systematic uncertainties.

Forward-backward ratios for $60<m_{\mu\mu}<120$ GeV. Quoted uncertainties are the quadratic sum of the statistical and systematic uncertainties.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of dimuon invariant mass.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of rapidity in the centre-of-mass frame for $15<m_{\mu\mu}<60$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of rapidity in the centre-of-mass frame for $60<m_{\mu\mu}<120$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $p_{\textrm{T}}$ for $15<m_{\mu\mu}<60$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $p_{\textrm{T}}$ for $60<m_{\mu\mu}<120$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $\phi^*$ for $15<m_{\mu\mu}<60$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $\phi^*$ for $60<m_{\mu\mu}<120$ GeV.

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of rapidity in the centre-of-mass frame, putting together low and high masses. Each bin is labeled lm_i or hm_i, where lm stands for $15<m_{\mu\mu}<60$ GeV, hm stands for $60<m_{\mu\mu}<120$ GeV, and i is the corresponding bin number in rapidity in the centre-of-mass frame. The global normalisation uncertainty of 3.5% is not included. Data from Figure [3, 4, 4].

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $p_{\textrm{T}}$, putting together low and high masses. Each bin is labeled lm_i or hm_i, where lm stands for $15<m_{\mu\mu}<60$ GeV, hm stands for $60<m_{\mu\mu}<120$ GeV, and i is the corresponding bin number in $p_{\textrm{T}}$. The global normalisation uncertainty of 3.5% is not included. Data from Figure [3, 4, 4].

Correlation matrix for the systematic uncertainties, excluding integrated luminosity, as a function of $\phi^*$, putting together low and high masses. Each bin is labeled lm_i or hm_i, where lm stands for $15<m_{\mu\mu}<60$ GeV, hm stands for $60<m_{\mu\mu}<120$ GeV, and i is the corresponding bin number in $\phi^*$. The global normalisation uncertainty of 3.5% is not included. Data from Figure [3, 4, 4].

$v_{2}$ of $\Upsilon(\mathrm{1S})$ as a function of $p_{\mathrm{T}}$ in three centrality ranges, 10-30%, 30-50% and 50-90%.

$v_{2}$ of $\Upsilon(\mathrm{1S})$ as a function of $p_{\mathrm{T}}$ in 5-60% centrality range.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

$p_{T}$-distributions of kaons ($K^{+}+K^{-}$) measured in pp collisions at $\sqrt{s}$ = 5.02 TeV.

$p_{T}$-distributions of protons ($p+pbar$) measured in Pb-Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV.

$p_{T}$-distributions of protons ($p+pbar$) measured in pp collisions at $\sqrt{s}$ = 5.02 TeV.

$p_{T}$-distributions of kaons ($K^{+}+K^{-}$)/pions ($\pi^{+}+\pi^{-}$) measured in Pb-Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV.

$p_{T}$-distributions of kaons ($K^{+}+K^{-}$)/pions ($\pi^{+}+\pi^{-}$) measured in pp collisions at $\sqrt{s}$ = 5.02 TeV.

$p_{T}$-distributions of protons ($p+pbar$)/pions ($\pi^{+}+\pi^{-}$) measured in Pb-Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV.

$p_{T}$-distributions of protons ($p+pbar$)/pions ($\pi^{+}+\pi^{-}$) measured in pp collisions at $\sqrt{s}$ = 5.02 TeV.

Integrated yield ratios of kaons ($K^{+}+K^{-}$) to pions ($\pi^{+}+\pi^{-}$) measured in Pb-Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV.

Integrated yield ratios of kaons ($K^{+}+K^{-}$) to pions ($\pi^{+}+\pi^{-}$) measured in pp collisions at $\sqrt{s}$ = 5.02 TeV.

Integrated yield ratios of protons ($p+pbar$) to pions ($\pi^{+}+\pi^{-}$) measured in Pb-Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV.

Integrated yield ratios of protons ($p+pbar$) to pions ($\pi^{+}+\pi^{-}$) measured in pp collisions at $\sqrt{s}$ = 5.02 TeV.

$p_{T}$-dependent nuclear modification factor of pions ($\pi^{+}+\pi^{-}$) measured in Pb-Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV.

$p_{T}$-dependent nuclear modification factor of kaons ($K^{+}+K^{-}$) measured in Pb-Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV.

$p_{T}$-dependent nuclear modification factor of protons ($p+pbar$) measured in Pb-Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV.