The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using dressed level leptons. The cross sections are normalized by the bin width.

The measured normalized cross sections in bins of Z pt, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of Z pt in |y(Z)| bins, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured normalized cross sections in bins of Z pt, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of |y(Z)|, using born level leptons.

The measured normalized cross sections (left) in bins of Z pt in |y(Z)| bins, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level. The cross sections are divided by the bin width and then the distributions are normalized to 1.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Transverse mass $m_T$ spectrum at midrapidity of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c. $m_0$ is the PDG mass of the $\phi$ meson.

Transverse mass $m_T$ spectrum at midrapidity of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c. $m_0$ is the PDG mass of the $\phi$ meson.

Dependence of the slope parameter $T$ of the transverse momentum spectrum on rapidity $y$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Dependence of the slope parameter $T$ of the transverse momentum spectrum on rapidity $y$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Dependence of the width $\sigma_y$ of the rapidity distributions on $p_T$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Dependence of the width $\sigma_y$ of the rapidity distributions on $p_T$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 40 GeV/c.

Energy dependence of ratios of total yields of $\phi$ mesons to mean total yields of pions produced in in minimum bias p+p collisions at CERN SPS energies.

Energy dependence of double ratios of total yields of $\phi$ mesons to mean total yields of pions in central Pb+Pb collisions over minimum bias p+p collisions at CERN SPS energies.

Energy dependence of total yields of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies.

Energy dependence of midrapidity yields of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies.

Widths of rapidity distributions of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies, as a function of beam rapidity.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> ee. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the transverse decay radius Rxy of the long-lived Z' for Z' -> emu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> emu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the transverse decay radius Rxy of the long-lived Z' for Z' -> mumu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> mumu. The error bars indicate the total uncertainties.

Overall signal efficiency as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model. The error bars indicate the total uncertainties.

Overall signal efficiency as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model. The error bars indicate the total uncertainties.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model and a 700 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model and a 700 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model and a 1600 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model and a 1600 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

Fraction of detector volume covered by the material veto as a function of z and Rxy of the displaced dilepton vertex.

Fraction of detector volume covered by the disabled pixel modules veto veto as a function of z and Rxy of the displaced dilepton vertex.

Observed Rxy distribution of vertices composed of two non-leptonic tracks in a control sample in the data and the predicted distribution obtained from the event mixing. The error bars indicate the statistical uncertainties.

Rxy distributions of Kshort vertices from the large radius tracking in the data and background MC samples. Data has been normalised such that the total number of Kshort from the standard tracking in the data agrees with the total number of Kshort from the standard tracking in the MC. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the statistical uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the total uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the total uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the total uncertainties.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> mumu.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 100 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 250 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 500 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 750 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 1000 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Summary of typical systematic uncertainties for the signal.

Numbers of observed events for all signal regions, including predicted background contributions and expected signal yields.

Limits on anomalous quartic couplings at 95% CL.

Expected and observed 95% CL upper limits on the cross section times the branching ratio sigma(P P --> W+- a)B(a --> W+- W-+) as a function of ALP mass

Expected and observed 95% CL upper limits on the photophobic ALP model parameter 1/f_a as a function of ALP mass.

Observed signal strength, and observed signal cross section.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels in the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

The product of acceptance, efficiency, and branching fraction of the qbX signal with $\mathrm{X} \rightarrow \tau\tau$ and $m_{\mathrm{B}}=170~\mathrm{GeV}$ in $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels of the 1b1f and 1b1c event categories, as a function of the X boson mass. The selections are as described in the paper. The uncertainty refers to the statistical uncertainty only.

Observed $m_{\tau\tau}$ distribution in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1f category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1c category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mu\tau_\mathrm{h}$ channel of the 1b1f category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mu\tau_\mathrm{h}$ channel of the 1b1c category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 300 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 450 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1f category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1c category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1b1f category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1b1c category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

The $S_{\rm T}$ distribution for group D before fitting.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = 100%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → tH) = 50%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → bW) = 50%

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using electron channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using muon channel in the four event groups.

The $S_{\rm T}$ distribution for 1b event category for data and the expected background before fitting.

The $S_{\rm T}$ distribution for 2b event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted t event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted H event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted Z event category for data and the expected background.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = 100%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → bH) = 50%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → tW) = 50%

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using electron channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

Summary of the relative uncertainties in the measured fiducial cross section $\sigma^{\mathrm{fid}}_{W^\pm Z j j-EW}$ . The uncertainties are reported as percentages.

Numbers of observed and expected events in the $W^{\pm}Zjj$ signal region and in the three control regions, after the fit. The expected number of $WZjj-EW$ events from $SHERPA$ and the estimated number of background events from the other processes are shown. The sum of the background containing misidentified leptons is labelled "Misid. leptons". The total correlated post-fit uncertainties are quoted.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. The last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

Measured $W^{pm}Zjj$ differential cross-section in the VBS fiducial phase space. The relative uncertainties are reported as percentages. The systematic uncertainties are in order of appearance: total uncorrelated systematic and correlated systematics related respectively to unfolding, electrons, muons, jets, reducible and irreducible backgrounds, pileup and luminosity. the last bin is a cross section for all events above the lower end of the bin.

Correlation matrix for the unfolded fiducial cross-section.

The distributions of likelihood discriminant for data, simulated QCD multijet events, and simulated signal events. Data and simulated events are selected with the displaced-jet trigger. The offline $H_{T}$ is required to be larger than 400 GeV, and the jets are required to have $p_{T}>50\ \mathrm{GeV}$ and $|\eta|<2.0$. Three benchmark signal distributions are shown (dashed lines) for the jet-jet model with $m_{X}=300\ \mathrm{GeV}$ and varying lifetimes. For visualization each signal process is given a cross section, $\sigma$, such that $\sigma\ 35.9 \mathrm{fb}^{-1} = 1 \times 10^{6}$.

Numbers of predicted and observed background events for the nominal background method and the three cross-checks in the control region. Shown are the comparisons for likelihood discriminant thresholds of 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, and 0.9. The error bars represent the statistical uncertainties of the predictions and the observations. The data points at different likelihood discriminant thresholds are correlated, since the events passing higher likelihood discriminant thresholds also pass lower likelihood discriminant thresholds.

Numbers of predicted and observed background events for the nominal background method and the three cross-checks in the control region. Shown are the comparisons for likelihood discriminant thresholds of 0.95, 0.96, 0.97, 0.98, 0.99, and 0.9993. The error bars represent the statistical uncertainties of the predictions and the observations. The data points at different likelihood discriminant thresholds are correlated, since the events passing higher likelihood discriminant thresholds also pass lower likelihood discriminant thresholds.

The expected and observed $95\%$ $\text{CL}$ upper limits on the pair production cross section of the long-lived particle X, assuming a $100\%$ branching fraction for X to decay to a quark-antiquark pair, shown at different masses and different proper decay lengths for the jet-jet model.

the expected and observed $95\%$ $\text{CL}$ upper limits on the pair production cross section of the long-lived gluino, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{g}}\to\mathrm{g}\widetilde{\mathrm{G}}$ decays.

the expected and observed $95\%$ $\text{CL}$ limits for the long-lived gluino model in the mass-lifetime plane, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{g}}\to\mathrm{g}\widetilde{\mathrm{G}}$ decays, based on the NLO+NLL calculation of the gluino pair production cross section at $\sqrt{s}=13\ \mathrm{TeV}$.

the expected and observed $95\%$ $\text{CL}$ upper limits on the pair production cross section of the long-lived gluino, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{g}}\to\mathrm{tbs}$ decays.

the expected and observed $95\%$ $\text{CL}$ limits for the long-lived gluino model in the mass-lifetime plane, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{g}}\to\mathrm{tbs}$ decays, based on the NLO+NLL calculation of the gluino pair production cross section at $\sqrt{s}=13\ \mathrm{TeV}$.

the expected and observed $95\%$ $\text{CL}$ upper limits on the pair production cross section of the long-lived top squark, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{t}}\to\mathrm{b}\ell$ decays.

the expected and observed $95\%$ $\text{CL}$ limits for the long-lived top squark model in the mass-lifetime plane, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{t}}\to\mathrm{b}\ell$ decays, based on the NLO+NLL calculation of the top squark pair production cross section at $\sqrt{s}=13\ \mathrm{TeV}$.

the expected and observed $95\%$ $\text{CL}$ upper limits on the the pair production cross section of the long-lived top squark, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{t}}\to\mathrm{\overline{d}\overline{d}}$ decays.

the expected and observed $95\%$ $\text{CL}$ limits for the long-lived top squark model in the mass-lifetime plane, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{t}}\to\mathrm{\overline{d}\overline{d}}$ decays, based on an NLO+NLL calculation of the top squark pair production cross section at $\sqrt{s}=13\ \mathrm{TeV}$.

The likelihood ratio for vertex track multiplicity

The likelihood ratio for vertex $L_{xy}$ significance

The likelihood ratio for cluster RMS, the point where cluster RMS equals $-1.0$ represents the case where there is no cluster being reconstructed for the dijet candidate