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This paper presents a search for direct electroweak gaugino or gluino pair production with a chargino nearly mass-degenerate with a stable neutralino. It is based on an integrated luminosity of 36.1 $\mathrm{fb}^{-1}$ of $pp$ collisions at $\sqrt{s} = 13$ TeV collected by the ATLAS experiment at the LHC. The final state of interest is a disappearing track accompanied by at least one jet with high transverse momentum from initial-state radiation or by four jets from the gluino decay chain. The use of short track segments reconstructed from the innermost tracking layers significantly improves the sensitivity to short chargino lifetimes. The results are found to be consistent with Standard Model predictions. Exclusion limits are set at 95% confidence level on the mass of charginos and gluinos for different chargino lifetimes. For a pure wino with a lifetime of about 0.2 ns, chargino masses up to 460 GeV are excluded. For the strong production channel, gluino masses up to 1.65 TeV are excluded assuming a chargino mass of 460 GeV and lifetime of 0.2 ns.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.
The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).
The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).
The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.
A search for new phenomena in final states characterized by high jet multiplicity, an isolated lepton (electron or muon) and either zero or at least three $b$-tagged jets is presented. The search uses 36.1 fb$^{-1}$ of $\sqrt{s}$ = 13 TeV proton-proton collision data collected by the ATLAS experiment at the Large Hadron Collider in 2015 and 2016. The dominant sources of background are estimated using parameterized extrapolations, based on observables at medium jet multiplicity, to predict the $b$-tagged jet multiplicity distribution at the higher jet multiplicities used in the search. No significant excess over the Standard Model expectation is observed and 95% confidence-level limits are extracted constraining four simplified models of $R$-parity-violating supersymmetry that feature either gluino or top-squark pair production. The exclusion limits reach as high as 2.1 TeV in gluino mass and 1.2 TeV in top-squark mass in the models considered. In addition, an upper limit is set on the cross-section for Standard Model $t\bar{t}t\bar{t}$ production of 60 fb (6.5 $\times$ the Standard Model prediction) at 95% confidence level. Finally, model-independent limits are set on the contribution from new phenomena to the signal-region yields.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eleven jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eleven jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eleven jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with twelve-or-more jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with twelve-or-more jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with twelve-or-more jets in the different b-tag multiplicity bins for the 40 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten-or-more jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten-or-more jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten-or-more jets in the different b-tag multiplicity bins for the 60 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with five jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with six jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with seven jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with eight jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with nine jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten-or-more jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten-or-more jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
The expected background and observed data with ten-or-more jets in the different b-tag multiplicity bins for the 80 GeV jet pT threshold. The background shown is estimated by including all bins in the fit.
Observed exclusion contours on the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Observed exclusion contours on the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Observed exclusion contours on the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Expected exclusion contours on the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Expected exclusion contours on the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Expected exclusion contours on the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Observed exclusion contours on the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Observed exclusion contours on the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Observed exclusion contours on the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Expected exclusion contours on the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Expected exclusion contours on the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Expected exclusion contours on the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Observed exclusion contours on the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Observed exclusion contours on the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Observed exclusion contours on the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Expected exclusion contours on the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Expected exclusion contours on the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Expected exclusion contours on the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Observed exclusion contours on the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Observed exclusion contours on the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Observed exclusion contours on the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Expected exclusion contours on the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Expected exclusion contours on the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Expected exclusion contours on the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Observed exclusion contours on the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Observed exclusion contours on the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Observed exclusion contours on the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Expected exclusion contours on the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Expected exclusion contours on the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Expected exclusion contours on the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and neutralino masses in a model where the gluino decays via a virtual top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino --> uds) via the RPV coupling lambda''_112.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Observed upper limits on the model cross-section in units of pb as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Observed upper limits on the model cross-section in units of pb as a function of the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Observed upper limits on the model cross-section in units of pb as a function of the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Observed upper limits on the model cross-section in units of pb as a function of the stop and neutralino masses in a model where the stop decays to a third-generation quark and a higgsino, which decays via the RPV coupling lambda''_323.
Observed upper limits on the model cross-section in units of pb as a function of the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Observed upper limits on the model cross-section in units of pb as a function of the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Observed upper limits on the model cross-section in units of pb as a function of the stop and neutralino masses in a model where the stop decays to a top and a bino-like neutralino, which decays via the RPV coupling lambda''_323.
Acceptance as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Acceptance as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Acceptance as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Efficiency as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Efficiency as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Efficiency as a function of the gluino and stop masses in a model where the gluino decays to a top quark and a top squark, with the top squark decaying to an s-quark and a b-quark via a non-zero lambda''_323 RPV coupling.
Acceptance as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Acceptance as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Acceptance as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Efficiency as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Efficiency as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Efficiency as a function of the gluino and neutralino masses in a model with a gluino decaying to two light quarks (q=u,d,s,c) and the neutralino, which then decays to two light quarks and a charged lepton or a neutrino.
Cut flow for a model of gluino pair production where the gluino decays to two (u, d, s, c) quarks and the neutralino, which then decays to two (u, d, s, c) quarks and a lepton via a lambda' RPV coupling, where each RPV decay can produce any of the four first and second generation leptons (e, mu, nu_e, nu_mu) with equal probability (m_gluino = 1800 GeV, m_neutralino = 900 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of gluino pair production where the gluino decays to two (u, d, s, c) quarks and the neutralino, which then decays to two (u, d, s, c) quarks and a lepton via a lambda' RPV coupling, where each RPV decay can produce any of the four first and second generation leptons (e, mu, nu_e, nu_mu) with equal probability (m_gluino = 1800 GeV, m_neutralino = 900 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of gluino pair production where the gluino decays to two (u, d, s, c) quarks and the neutralino, which then decays to two (u, d, s, c) quarks and a lepton via a lambda' RPV coupling, where each RPV decay can produce any of the four first and second generation leptons (e, mu, nu_e, nu_mu) with equal probability (m_gluino = 1800 GeV, m_neutralino = 900 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of gluino pair production where each gluino decays to a top quark and a top squark, with the top squark decaying to an s- and a b- quark via a non-zero lambda''_323 RPV coupling (m_gluino = 1600 GeV, m_stop = 1000 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of gluino pair production where each gluino decays to a top quark and a top squark, with the top squark decaying to an s- and a b- quark via a non-zero lambda''_323 RPV coupling (m_gluino = 1600 GeV, m_stop = 1000 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of gluino pair production where each gluino decays to a top quark and a top squark, with the top squark decaying to an s- and a b- quark via a non-zero lambda''_323 RPV coupling (m_gluino = 1600 GeV, m_stop = 1000 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of gluino pair production where each gluino decays via an off-shell top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino -> uds) via the RPV coupling lambda''_112 (m_gluino = 2000 GeV, m_neutralino = 941 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of gluino pair production where each gluino decays via an off-shell top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino -> uds) via the RPV coupling lambda''_112 (m_gluino = 2000 GeV, m_neutralino = 941 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of gluino pair production where each gluino decays via an off-shell top squark to two top quarks and the lightest neutralino, with the neutralino decaying to three light quarks (neutralino -> uds) via the RPV coupling lambda''_112 (m_gluino = 2000 GeV, m_neutralino = 941 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of right-handed top squark pair production with the top squark decaying to the lightest supersymmetric particle (LSP) which is considered to be purely higgsino. The higgsino-like LSP decays through the non-zero RPV coupling lambda''_323 (m_stop = 975 GeV, m_neutralino = 600 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of right-handed top squark pair production with the top squark decaying to the lightest supersymmetric particle (LSP) which is considered to be purely higgsino. The higgsino-like LSP decays through the non-zero RPV coupling lambda''_323 (m_stop = 975 GeV, m_neutralino = 600 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
Cut flow for a model of right-handed top squark pair production with the top squark decaying to the lightest supersymmetric particle (LSP) which is considered to be purely higgsino. The higgsino-like LSP decays through the non-zero RPV coupling lambda''_323 (m_stop = 975 GeV, m_neutralino = 600 GeV). The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies pT > 25 GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed.
A measurement of $J/\psi$ and $\psi(2\mathrm{S})$ production is presented. It is based on a data sample from Pb+Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ = 5.02 TeV and $pp$ collisions at $\sqrt{s}$ = 5.02 TeV recorded by the ATLAS detector at the LHC in 2015, corresponding to an integrated luminosity of $0.42\mathrm{nb}^{-1}$ and $25\mathrm{pb}^{-1}$ in Pb+Pb and $pp$, respectively. The measurements of per-event yields, nuclear modification factors, and non-prompt fractions are performed in the dimuon decay channel for $9 < p_{T}^{\mu\mu} < 40$ GeV in dimuon transverse momentum, and $-2.0 < y_{\mu\mu} < 2.0$ in rapidity. Strong suppression is found in Pb+Pb collisions for both prompt and non-prompt $J/\psi$, as well as for prompt and non-prompt $\psi(2\mathrm{S})$, increasing with event centrality. The suppression of prompt $\psi(2\mathrm{S})$ is observed to be stronger than that of $J/\psi$, while the suppression of non-prompt $\psi(2\mathrm{S})$ is equal to that of the non-prompt $J/\psi$ within uncertainties, consistent with the expectation that both arise from \textit{b}-quarks propagating through the medium. Despite prompt and non-prompt $J/\psi$ arising from different mechanisms, the dependence of their nuclear modification factors on centrality is found to be quite similar.
Per-event-yield of prompt jpsi production in 5.02 TeV PbPb collision data as a function of pT for three different centrality slices in the rapidity range |y| < 2.
Per-event-yield of non-prompt jpsi production in 5.02 TeV PbPb collision data as a function of pT for three different centrality slices in the rapidity range |y| < 2.
Non-prompt fraction of jpsi production in 5.02 TeV PbPb collision data as a function of pT for three different centrality slices in the rapidity range |y| < 2.
Non-prompt fraction of jpsi production in 5.02 TeV PbPb collision data as a function of pT for integrated centrality in the rapidity range |y| < 2.
The nuclear modification factor as a function of pT for the prompt jpsi for |y|<2, in 0--80% centrality bin.
The nuclear modification factor as a function of pT for the prompt jpsi for |y|<2, in 0--10%, 20--40%, and 40--80% centrality bin.
The nuclear modification factor as a function of pT for the non-prompt jpsi for |y|<2, in 0--80% centrality bin.
The nuclear modification factor as a function of pT for the non-prompt jpsi for |y|<2, in 0--10%, 20--40%, and 40--80% centrality bin.
The nuclear modification factor as a function of pT for the prompt and non-prompt jpsi for |y|<2, in 0--20% centrality bin.
The nuclear modification factor as a function of eta for the prompt jpsi for 9 < pT < 40 GeV, in 0--80% centrality bin.
The nuclear modification factor as a function of eta for the prompt jpsi for 9 < pT < 40 GeV, in 0--10%, 20--40%, and 40--80% centrality bin.
The nuclear modification factor as a function of eta for the non-prompt jpsi for 9 < pT < 40 GeV, in 0--80% centrality bin.
The nuclear modification factor as a function of eta for the non-prompt jpsi for 9 < pT < 40 GeV, in 0--10%, 20--40%, and 40--80% centrality bin.
The nuclear modification factor as a function of Npart for the prompt jpsi for |y|<2, and 9 < pT < 40 GeV
The nuclear modification factor as a function of Npart for the non-prompt jpsi for |y|<2, and 9 < pT < 40 GeV
The double ratio of nuclear modification factor as a function of Npart for the prompt jpsi and psi(2S) for |y|<2, and 9 < pT < 40 GeV
The double ratio nuclear modification factor as a function of Npart for the non-prompt jpsi and psi(2S) for |y|<2, and 9 < pT < 40 GeV
Observables sensitive to the anomalous production of events containing hadronic jets and missing momentum in the plane transverse to the proton beams at the Large Hadron Collider are presented. The observables are defined as a ratio of cross sections, for events containing jets and large missing transverse momentum to events containing jets and a pair of charged leptons from the decay of a $Z/\gamma^\ast$ boson. This definition minimises experimental and theoretical systematic uncertainties in the measurements. This ratio is measured differentially with respect to a number of kinematic properties of the hadronic system in two phase-space regions; one inclusive single-jet region and one region sensitive to vector-boson-fusion topologies. The data are found to be in agreement with the Standard Model predictions and used to constrain a variety of theoretical models for dark-matter production, including simplified models, effective field theory models, and invisible decays of the Higgs boson. The measurements use 3.2 fb$^{-1}$ of proton--proton collision data recorded by the ATLAS experiment at a centre-of-mass energy of 13 TeV and are fully corrected for detector effects, meaning that the data can be used to constrain new-physics models beyond those shown in this paper.
Measured and expected $R^\text{miss}$ as a function of $p_\text{T}^\text{miss}$ in the $\geq 1$ jet phase space. The fiducial SM predictions for the numerator and the denominator are also given.
Measured and expected $R^\text{miss}$ as a function of $p_\text{T}^\text{miss}$ in the $\geq 1$ jet phase space. The fiducial SM predictions for the numerator and the denominator are also given.
Measured and expected $R^\text{miss}$ as a function of $p_\text{T}^\text{miss}$ in the VBF jet phase space. The fiducial SM predictions for the numerator and the denominator are also given.
Measured and expected $R^\text{miss}$ as a function of $p_\text{T}^\text{miss}$ in the VBF phase space. The fiducial SM predictions for the numerator and the denominator are also given.
Measured and expected $R^\text{miss}$ as a function of $M_\text{jj}$ in the VBF jet phase space. The fiducial SM predictions for the numerator and the denominator are also given.
Measured and expected $R^\text{miss}$ as a function of $M_\text{jj}$ in the VBF phase space. The fiducial SM predictions for the numerator and the denominator are also given.
Measured and expected $R^\text{miss}$ as a function of $\Delta\phi_\text{jj}$ in the VBF jet phase space. The fiducial SM predictions for the numerator and the denominator are also given.
Measured and expected $R^\text{miss}$ as a function of $\Delta\phi_\text{jj}$ in the VBF phase space. The fiducial SM predictions for the numerator and the denominator are also given.
Statistical-only correlation matrix for all four measured distributions. <br> <br> Bins labelled 1-7 correspond to the $p_\text{T}^\text{miss}$ distribution in the $\geq 1$ jet phase space. <br> Bins labelled 8-13 correspond to the $p_\text{T}^\text{miss}$ distribution in the VBF phase space. <br> Bins labelled 14-18 correspond to the $M_\text{jj}$ distribution in the VBF phase space. <br> Bins labelled 19-24 correspond to the $\Delta\phi_\text{jj}$ distribution in the VBF phase space.
Statistical-only correlation matrix for all four measured distributions. <br> <br> Bins labelled 1-7 correspond to the $p_\text{T}^\text{miss}$ distribution in the $\geq 1$ jet phase space. <br> Bins labelled 8-13 correspond to the $p_\text{T}^\text{miss}$ distribution in the VBF phase space. <br> Bins labelled 14-18 correspond to the $M_\text{jj}$ distribution in the VBF phase space. <br> Bins labelled 19-24 correspond to the $\Delta\phi_\text{jj}$ distribution in the VBF phase space.
Statistical-only covariance matrix for all four measured distributions. <br> <br> Bins labelled 1-7 correspond to the $p_\text{T}^\text{miss}$ distribution in the $\geq 1$ jet phase space. <br> Bins labelled 8-13 correspond to the $p_\text{T}^\text{miss}$ distribution in the VBF phase space. <br> Bins labelled 14-18 correspond to the $M_\text{jj}$ distribution in the VBF phase space. <br> Bins labelled 19-24 correspond to the $\Delta\phi_\text{jj}$ distribution in the VBF phase space.
Statistical-only covariance matrix for all four measured distributions. <br> <br> Bins labelled 1-7 correspond to the $p_\text{T}^\text{miss}$ distribution in the $\geq 1$ jet phase space. <br> Bins labelled 8-13 correspond to the $p_\text{T}^\text{miss}$ distribution in the VBF phase space. <br> Bins labelled 14-18 correspond to the $M_\text{jj}$ distribution in the VBF phase space. <br> Bins labelled 19-24 correspond to the $\Delta\phi_\text{jj}$ distribution in the VBF phase space.
Systematic covariance matrix for all four measured distributions. <br> <br> Bins labelled 1-7 correspond to the $p_\text{T}^\text{miss}$ distribution in the $\geq 1$ jet phase space. <br> Bins labelled 8-13 correspond to the $p_\text{T}^\text{miss}$ distribution in the VBF phase space. <br> Bins labelled 14-18 correspond to the $M_\text{jj}$ distribution in the VBF phase space. <br> Bins labelled 19-24 correspond to the $\Delta\phi_\text{jj}$ distribution in the VBF phase space.
Systematic covariance matrix for all four measured distributions. <br> <br> Bins labelled 1-7 correspond to the $p_\text{T}^\text{miss}$ distribution in the $\geq 1$ jet phase space. <br> Bins labelled 8-13 correspond to the $p_\text{T}^\text{miss}$ distribution in the VBF phase space. <br> Bins labelled 14-18 correspond to the $M_\text{jj}$ distribution in the VBF phase space. <br> Bins labelled 19-24 correspond to the $\Delta\phi_\text{jj}$ distribution in the VBF phase space.
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