Observed yields in the boost_1_ge2J signal region category of the hh channel.

Observed yields in the boost_2 signal region category of the hh channel.

Observed yields in the boost_3 signal region category of the hh channel.

Observed yields in the ttH_0 signal region category of the hh channel.

Observed yields in the ttH_1 signal region category of the hh channel.

Observed yields in the VH_0 signal region category of the hh channel.

Observed yields in the VH_1 signal region category of the hh channel.

Observed yields in the VBF_0 signal region category of the hh channel.

Observed yields in the VBF_1 signal region category of the hh channel.

Observed yields in the boost_0_1J signal region category of the lh channel.

Observed yields in the boost_0_ge2J signal region category of the lh channel.

Observed yields in the boost_1_1J signal region category of the lh channel.

Observed yields in the boost_1_ge2J signal region category of the lh channel.

Observed yields in the boost_2 signal region category of the lh channel.

Observed yields in the boost_3 signal region category of the lh channel.

Observed yields in the VH_0 signal region category of the lh channel.

Observed yields in the VH_1 signal region category of the lh channel.

Observed yields in the VBF_0 signal region category of the lh channel.

Observed yields in the VBF_1 signal region category of the lh channel.

Observed yields in the boost_0_1J signal region category of the ll channel.

Observed yields in the boost_0_ge2J signal region category of the ll channel.

Observed yields in the boost_1_1J signal region category of the ll channel.

Observed yields in the boost_1_ge2J signal region category of the ll channel.

Observed yields in the boost_2 signal region category of the ll channel.

Observed yields in the boost_3 signal region category of the ll channel.

Observed yields in the VH_0 signal region category of the ll channel.

Observed yields in the VH_1 signal region category of the ll channel.

Observed yields in the VBF_0 signal region category of the ll channel.

Observed yields in the VBF_1 signal region category of the ll channel.

Best-fit values and uncertainties for the pp $\rightarrow H\rightarrow\tau\tau$ cross-section measurement and the measurement in the four dominant production modes. All measurements include the branching ratio of $H\rightarrow\tau\tau$ and are performed with true Higgs boson rapidity $|y_{H}|<2.5$. The SM predictions for each region, computed using the inclusive cross-section calculations and the simulated event samples are also shown. The contributions to the total uncertainty in the measurements from statistical (Stat. unc.) or systematic uncertainties (Syst. unc.) are given separately.

The measured correlations between each parameter of interest in the measurement of the cross-sections per production mode

Best-fit values and uncertainties for the $H\rightarrow\tau\tau$ cross-sections, in the reduced stage 1.2 STXS scheme. The EW production mode includes vector-boson fusion and qq$\rightarrow$V($\rightarrow$qq)H processes. All measurements include the branching ratio of $H\rightarrow\tau\tau$ and are performed with true Higgs boson rapidity $|y_{H}|<2.5$. The SM predictions for each region, computed using the inclusive cross-section calculations and the simulated event samples are also shown. The contributions to the total uncertainty in the measurements from statistical (Stat. unc.) or systematic uncertainties (Syst. unc.) are given separately. The asterisk symbol (*) indicates that the criteria for m$_{jj}$ only apply to events with at least two reconstructed jets.

The measured correlations between each pair of parameters of interest in the STXS measurement. The asterisk symbol (*) indicates that the criteria for mjj only apply to events with at least two reconstructed jets.

Post-fit BDT distributions after the VBF event selection for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. The VBF signal is shown for $\mu = 0.73$ and $\tilde d = -0.01$. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit $m_{\tau\tau}^{\mathrm{MMC}}$ distributions in the low BDT score CR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit Optimal Observable distributions in the low BDT score CR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. ''Other bkg'' denotes all background contributions not listed explicitly in the legend. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{had}}$ analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit distributions of the event yields as a function of the Optimal Observable in the SR for the $\tau_{\mathrm{had}}\tau_{\mathrm{had}}$ analysis channel. The values of $\tilde d$, the signal strength $\mu$, the normalization of background processes, and nuisance parameters for the event yield prediction are set to those which minimize the NLL. The size of the combined statistical, experimental and theoretical uncertainties is given.

The observed $\Delta\mathrm{NLL}$ curve as a function of $\tilde d$ values. For comparison, expected $\Delta\mathrm{NLL}$ curves are also shown. The constraints on the nuisance parameters and normalization factors are first determined in a CR-only fit, and then a fit to pseudo-data corresponding to these nuisance parameters, normalization factors, and to $\tilde d=0, \mu = 1$ or $\tilde d =0, \mu = 0.73$ is performed to obtain these $\Delta\mathrm{NLL}$ curves. Moreover, a pre-fit expected $\Delta\mathrm{NLL}$ is shown, using pseudo-data corresponding to $\tilde d =0$ and $\mu = 1$ in the signal and control regions.

The expected $\Delta\mathrm{NLL}$ curves comparing the sensitivity of the fit with and without systematic uncertainties. For comparison, other curves are shown which remove the effect of jet-based systematic uncertainties, $\tau$-based systematic uncertainties, and MC statistical uncertainties.

The observed $\Delta\mathrm{NLL}$ curves for each analysis channel as a function of $\tilde d$, compared to the combined result. For the individual analysis channel $\Delta\mathrm{NLL}$ curves, only event yield information in the other SRs is used, ensuring that the Optimal Observable distributions in the other SRs do not influence the preferred value of $\tilde d$. The signal strength is constrained to be positive in these individual channel $\Delta\mathrm{NLL}$ curves. The exact value of the $p_{\mathrm{T}}$ cut on the leading lepton depends on the trigger.

Post-fit BDT distributions in the top-quark CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit BDT distributions in the top-quark CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF channel. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit BDT distributions in the $Z\to \ell\ell$ CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit Optimal Observable distributions in the top-quark CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit Optimal Observable distributions in the top-quark CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ DF channel. The size of the combined statistical, experimental, and theoretical uncertainties is given.

Post-fit Optimal Observable distributions in the $Z\to \ell\ell$ CR for the $\tau_{\mathrm{lep}}\tau_{\mathrm{lep}}$ SF analysis channel. The size of the combined statistical, experimental, and theoretical uncertainties is given. The exact value of the $p_{\mathrm{T}}$ cut on the leptons depends on the trigger.

Post-fit distribution of weighted event yields as a function of the Optimal Observable for all four SRs combined. The contributions of the different SRs are weighted by a factor of ln(1 + S/B), where S and B are the post-fit expected numbers of signal and background events in that region, respectively. The size of the combined statistical, experimental, and theoretical uncertainties is given.