The observed mass distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the short lifetime regime.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the long lifetime regime.

The observed $p_{\rm T$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Expected and observed distributions in SR-Inclusive_Low of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal track selection efficiency as a function of CLLP $\beta\gamma$ for SR-Inclusive_Low and SR-Inclusive_High bins. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal selection efficiency by the mass window for SR-Inclusive_Low and SR-Inclusive_High bins.

Acceptance for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |eta| < 1.8 and r_decay > 500 mm.

Acceptance for the chargino pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the stau pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Event-level efficiency for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Passing events in event selection steps for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes.

Passing events in event selection steps for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes.

Passing events in event selection steps for the chargino pair-production model for various masses and lifetimes.

Passing events in event selection steps for the stau pair-production model for various masses and lifetimes.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

Response matrix for pT ll mass 50-76 (electron channel)

Response matrix for pT ll mass 50-76 (muon channel)

Response matrix for pT ll mass 76-106 (electron channel)

Response matrix for pT ll mass 76-106 (muon channel)

Response matrix for pT ll mass 106-170 (electron channel)

Response matrix for pT ll mass 106-170 (muon channel)

Response matrix for pT ll mass 170-350 (electron channel)

Response matrix for pT ll mass 170-350 (muon channel)

Response matrix for pT ll mass 350-1000 (electron channel)

Response matrix for pT ll mass 50-76 jet (electron channel)

Response matrix for pT ll mass 50-76 jet (muon channel)

Response matrix for pT ll mass 76-106 jet (electron channel)

Response matrix for pT ll mass 76-106 jet (muon channel)

Response matrix for pT ll mass 106-170 jet (electron channel)

Response matrix for pT ll mass 106-170 jet (muon channel)

Response matrix for pT ll mass 170-350 jet (electron channel)

Response matrix for pT ll mass 170-350 jet (muon channel)

Response matrix for phistar mass 50-76 (electron channel)

Response matrix for phistar mass 50-76 (muon channel)

Response matrix for phistar mass 76-106 (electron channel)

Response matrix for phistar mass 76-106 (muon channel)

Response matrix for phistar mass 106-170 (electron channel)

Response matrix for phistar mass 106-170 (muon channel)

Response matrix for phistar mass 170-350 (electron channel)

Response matrix for phistar mass 170-350 (muon channel)

Response matrix for phistar mass 350-1000 (electron channel)

Response matrix for phistar mass 350-1000 (muon channel)

Bin-to-bin correlation in the measured cross section as a function of the rapidity absolute value of the first jet, $|y(\text{j}_1)|$.

Measured cross section as a function of the transverse momenum of the first jet, $p_{\text{T}}(\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the transverse momenum of the first jet, $p_{\text{T}}(\text{j}_1)$.

Measured cross section as a function of the rapidity absolute value of the second jet, $|y(\text{j}_2)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the rapidity absolute value of the second jet, $|y(\text{j}_2)|$.

Measured cross section as a function of the transverse momenum of the second jet, $p_{\text{T}}(\text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the transverse momenum of the second jet, $p_{\text{T}}(\text{j}_2)$.

Measured cross section as a function of the rapidity absolute value of the third jet, $|y(\text{j}_3)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the rapidity absolute value of the third jet, $|y(\text{j}_3)|$.

Measured cross section as a function of the transverse momenum of the third jet, $p_{\text{T}}(\text{j}_3)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the transverse momenum of the third jet, $p_{\text{T}}(\text{j}_3)$.

Measured cross section as a function of the $H_{\text{T}}$ observable for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the $H_{\text{T}}$ observable for events with at least one jet.

Measured cross section as a function of the $H_{\text{T}}$ observable for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the $H_{\text{T}}$ observable for events with at least two jets.

Measured cross section as a function of the $H_{\text{T}}$ observable for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the $H_{\text{T}}$ observable for events with at least three jets.

Measured differential cross section as a function of dijet mass, $M_{\text{j}_1\text{j}_2}$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of dijet mass, $M_{\text{j}_1\text{j}_2}$, for events with at least two jets.

Measured differential cross section as a function of Z boson rapidity absolute value, $|y(\text{Z})|$ for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of Z boson rapidity absolute value, $|y(\text{Z})|$ for events with at least one jet.

Measured differential cross section as a function of the leading and subleading jet rapidity difference, $y_{\text{diff}}(\text{j}_1,\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and subleading jet rapidity difference, $y_{\text{diff}}(\text{j}_1,\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the leading and subleading jet rapidity sum, $y_{\text{sum}}(\text{j}_1,\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and subleading jet rapidity sum, $y_{\text{sum}}(\text{j}_1,\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and leading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_1)$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_1)$, for events with at least one jet.

Measured differential cross section as a function of the Z boson and leading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_1)$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_1)$, for events with at least one jet.

Measured differential cross section as a function of the Z boson and leading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_1)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_1)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and leading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_1)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_1)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and subleading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and subleading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and subleading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and subleading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and dijet rapidity difference, $y_{\text{diff}}(\text{Z},\text{dijet})$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and dijet rapidity difference, $y_{\text{diff}}(\text{Z},\text{dijet})$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and dijet rapidity sum, $y_{\text{sum}}(\text{Z},\text{dijet})$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and dijet rapidity sum, $y_{\text{sum}}(\text{Z},\text{dijet})$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and leading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_1)$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_1)$, for events with at least one jet.

Measured differential cross section as a function of the Z boson and leading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_1)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_1)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and leading jet azimuthal difference for events, $\Delta\phi(\text{Z},\text{j}_1)$, with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet azimuthal difference for events, $\Delta\phi(\text{Z},\text{j}_1)$, with at least three jets.

Measured differential cross section as a function of the Z boson and subleading jet azimuthal difference for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and subleading jet azimuthal difference for events with at least two jets.

Measured differential cross section as a function of the Z boson and subleading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_2)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and subleading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_2)$, for events with at least three jets.

Measured differential cross section as a function of the Z boson and third jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_3)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and third jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_3)$, for events with at least three jets.

Measured differential cross section as a function of the leading and subleading jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and subleading jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the leading and subleading jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_2)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and subleading jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_2)$, for events with at least three jets.

Measured differential cross section as a function of the leading and third jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_3)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and third jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_3)$, for events with at least three jets.

Measured differential cross section as a function of the subleading and third jet azimuthal difference, $\Delta\phi(\text{j}_2,\text{j}_3)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the subleading and third jet azimuthal difference, $\Delta\phi(\text{j}_2,\text{j}_3)$, for events with at least three jets.

Measured cross section as a function of the leading jet transverse momentum, $p_{\text{T}}(\text{j}_1)$, and rapidity absolute value, $|y(\text{j}_1)|$ for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the leading jet transverse momentum, $p_{\text{T}}(\text{j}_1)$, and rapidity absolute value, $|y(\text{j}_1)|$ for events with at least one jet.

Measured cross section as a function of the leading jet and Z boson rapidity abosolute values, $|y(\text{j}_1|$ and $|y(\text(Z))|$, for events with at least one jet with $p_\text{T}>20\,\text{Gev}$ and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the leading jet and Z boson rapidity abosolute values, $|y(\text{j}_1|$ and $|y(\text(Z))|$, for events with at least one jet with $p_\text{T}>20\,\text{Gev}$.

Measured cross section as a function of the transverse momementum, $p_{\text{T}}(\text{Z})$, and rapidity, $y(\text{Z})$, of the Z boson, for events with at least one jet with $p_\text{T}>20\,\text{Gev}$ and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the transverse momementum, $p_{\text{T}}(\text{Z})$, and rapidity, $y(\text{Z})$, of the Z boson, for events with at least one jet with $p_\text{T}>20\,\text{Gev}$.

Results for the covariance matrix where the parameters a, b, c, and d are taken from a linear fit to the different CP-violating samples.

Measured normalized differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson, compared to the predictions obtained with the MadGraph5_aMC@NLO MC simulation, and to the theory prediction at NLO+NNLL accuracy (1905.07815). The distribution $1/σ\,Δσ$ is integrated over the bin, and $1/σ\,\mathrm{d}σ/\mathrm{d}p_{\mathrm{T}}(\mathrm{Z})$ is additionally divided by the bin width. The last bin includes the overflow contribution, but a finite bin width is used for the normalization.

Measured absolute differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$, compared to the predictions obtained with the MadGraph5_aMC@NLO MC simulation.

Measured absolute differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$, compared to the predictions obtained with the MadGraph5_aMC@NLO MC simulation.

Measured normalized differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$, compared to the predictions obtained with the MadGraph5_aMC@NLO MC simulation.

Measured normalized differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$, compared to the predictions obtained with the MadGraph5_aMC@NLO MC simulation.

Covariance matrix of the measured absolute differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson.

Covariance matrix of the measured absolute differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson.

Correlation matrix of the measured absolute differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson.

Correlation matrix of the measured absolute differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson.

Covariance matrix of the measured normalized differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson.

Covariance matrix of the measured normalized differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson.

Correlation matrix of the measured normalized differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson.

Correlation matrix of the measured normalized differential tt̄Z production cross section in the full phase space as a function of the transverse momentum of the Z boson.

Covariance matrix of the measured absolute differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$.

Covariance matrix of the measured absolute differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$.

Correlation matrix of the measured absolute differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$.

Correlation matrix of the measured absolute differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$.

Covariance matrix of the measured normalized differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$.

Covariance matrix of the measured normalized differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$.

Correlation matrix of the measured normalized differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$.

Correlation matrix of the measured normalized differential tt̄Z production cross section in the full phase space as a function of $\cosθ^{*}_{\mathrm{Z}}$.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 20--40\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 40--60\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 60--100\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to charged $\pi$ ($\pi^{+} + \pi^{-}$) at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to charged $\pi$ ($\pi^{+} + \pi^{-}$) as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to K$^{-}$ at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to K$^{-}$ as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to its ground state particle $\Lambda$ ($\Lambda + \bar{\Lambda}$) at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to its ground state particle $\Lambda$ ($\Lambda + \bar{\Lambda}$) as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

The p$_{T}$ distribution of K$^{*\pm}$/K$^{*0}$ in inelastic pp collisions at $\sqrt{s} = 13$ TeV. The p$_{T}$ distribution of K$^{*0}$ is taken from [3]. The systematic uncertanty due to global tracking, primary pions, material budget and hadronic interaction cross section are equal for charged and neutral K*, thus they cancel out in the propagation of the uncertainty to the final ratio.

The p$_{T}$ distribution of K$^{*\pm}$/K$*^{0}$ in inelastic pp collisions at $\sqrt{s} = 8$ TeV. The p$_{T}$ distribution of K$^{*0}$ is taken from [17]. The systematic uncertanty due to global tracking, primary pions, material budget and hadronic interaction cross section are equal for charged and neutral K*, thus they cancel out in the propagation of the uncertainty to the final ratio.

The p$_{T}$ distribution of K$^{*\pm}$/K$*^{0}$ in inelastic pp collisions at $\sqrt{s} = 5.02$ TeV. The p$_{T}$ distribution of K$^{*0}$ is taken from [11]. The systematic uncertanty due to global tracking, primary pions, material budget and hadronic interaction cross section are equal for charged and neutral K*, thus they cancel out in the propagation of the uncertainty to the final ratio.

Ratio of p$_{T}$ distribution of K$^{*\pm}$ at $\sqrt{s} = 13$ TeV to the same distribution at $\sqrt{s} = 5.02$ TeV. The systematic uncertanty due to material budget and hadronic interaction cross section are equal for the two energies, thus they cancel out in the propagation of the uncertainty to the final ratio.

Ratio of p$_{T}$ distribution of K$^{*\pm}$ at $\sqrt{s} = 8$ TeV to the same distribution at $\sqrt{s} = 5.02$ TeV. The systematic uncertanty due to material budget and hadronic interaction cross section are equal for the two energies, thus they cancel out in the propagation of the uncertainty to the final ratio.

The p$_{T}$ distribution of K$^{*\pm}$/K in inelastic pp collisions at $\sqrt{s} = 13$ TeV. The p$_{T}$ distribution of K is taken from [3].

The p$_{T}$ distribution of K$^{*\pm}$/K in inelastic pp collisions at $\sqrt{s} = 5.02$ TeV. The p$_{T}$ distribution of K is taken from [33].

The p$_{T}$ integrated (K*(892)$^{+}$+ K*(892)$^{-}$)/2 in the interval 0<p_{T}<15 GeV/c, the mean p_{T} and K$^{*\pm}$/K at mid-rapidity in inelastic pp collisions at $\sqrt{s} =$ 5.02, 8 and 13 TeV. In dN/dy the systematic uncertainty due to the normalizaton to inelastic collisions (2.51%, 2.72% and 2.55% for 5.02, 8 and 13 TeV, respectively) is not included. The kaon yield is (\K$^+$~+~\K$^-$)/2 from [3,17,33].