Charged particle mean multiplicities measured in 4x4 kinematic bins of $Q^2$ and $y$.

Charged particle mean multiplicities measured with the additional restriction to select only particles from the current region of the Breit frame $0<\eta^{*}<4$, in 4x4 kinematic bins of $Q^2$ and $y$.

Variance of the charged particle multiplicity measured in 4x4 kinematic bins of $Q^2$ and $y$.

Variance of the charged particle multiplicity measured with the additional restriction to select only particles from the current region of the Breit frame $0<\eta^{*}<4$, in 4x4 kinematic bins of $Q^2$ and $y$.

KNO function for charged particles neasured with the additional restriction to select only particles from the current region of the Breit frame $0<\eta^{*}<4$, in 4x4 kinematic bins of $Q^2$ and $y$.

Hadron entropy for charged particles selected in a sliding pseudorapidity window of 1.4 units size with transverse momenta $P_{T lab}>150$ MeV, in the accessible kinematic bins of momentum transfer $Q^2$ and $y$. The data are presented as a function of $Q^2$ and the corresponding average $x$-Bjorken.

Hadron entropy for charged particles neasured with the additional restriction to select only particles from the current region of the Breit frame $0<\eta^{*}<4$, in 4x4 kinematic bins of $Q^2$ and $y$. The data are presented as a function of $Q^2$ and the corresponding average $x$-Bjorken.

Summary of the sources of systematic and statistical uncertainties and their impact on the measurement of the ttH and tH signal rates, and the measured value of the unconstrained nuisance parameters. The quantity $\Delta r_{x}/r_{x}$ corresponds to the change in uncertainty when fixing the nuisance parameters associated with that uncertainty in the fit. Under the label "MC and sideband statistical uncertainty" are the uncertainties associated with the limited number of simulated MC events and the amount of data events in the application region of the MP method.

Number of events selected in the 2$\ell$ss+0$\tau_{\mathrm{h}}$, 3$\ell$+0$\tau_{\mathrm{h}}$, and 2$\ell$ss+1$\tau_{\mathrm{h}}$ analysis channels compared to the event yields expected from the $ tH$ and $ H$ signals and from background processes. The expected event yields are computed for the values of nuisance parameters and of the POI obtained from the ML fit. The best fit values of the POI amount to $\hat{r_{ttH}} = 0.92$ and $\hat{r_{tH}} = 5.7$. Quoted uncertainties represent the sum of statistical and systematic components.

Number of events selected in the 2$\ell$ss+0$\tau_{\mathrm{h}}$, 3$\ell$+0$\tau_{\mathrm{h}}$, and 2$\ell$ss+1$\tau_{\mathrm{h}}$ analysis channels compared to the event yields expected from the $ tH$ and $ H$ signals and from background processes. The expected event yields are computed for the values of nuisance parameters and of the POI obtained from the ML fit. The best fit values of the POI amount to $\hat{r_{ttH}} = 0.92$ and $\hat{r_{tH}} = 5.7$. Quoted uncertainties represent the sum of statistical and systematic components.

Number of events selected in the 1$\ell$+1$\tau_{\mathrm{h}}$, 0$\ell$+2$\tau_{\mathrm{h}}$, 2$\ell$os+1$\tau_{\mathrm{h}}$, and 1$\ell$+2$\tau_{\mathrm{h}}$ analysis channels compared to the event yields expected from the $ tH$ and $ H$ signals and from background processes. The expected event yields are computed for the values of nuisance parameters and of the POI obtained from the ML fit. The best fit values of the POI amount to $\hat{r_{ttH}} = 0.92$ and $\hat{r_{tH}} = 5.7$. Quoted uncertainties represent the sum of statistical and systematic components.

Number of events selected in the 1$\ell$+1$\tau_{\mathrm{h}}$, 0$\ell$+2$\tau_{\mathrm{h}}$, 2$\ell$os+1$\tau_{\mathrm{h}}$, and 1$\ell$+2$\tau_{\mathrm{h}}$ analysis channels compared to the event yields expected from the $ tH$ and $ H$ signals and from background processes. The expected event yields are computed for the values of nuisance parameters and of the POI obtained from the ML fit. The best fit values of the POI amount to $\hat{r_{ttH}} = 0.92$ and $\hat{r_{tH}} = 5.7$. Quoted uncertainties represent the sum of statistical and systematic components.

Number of events selected in the 4$\ell$+0$\tau_{\mathrm{h}}$, 3$\ell$+1$\tau_{\mathrm{h}}$, and 2$\ell$+2$\tau_{\mathrm{h}}$ analysis channels compared to the event yields expected from the $ tH$ and $ H$ signals and from background processes. The expected event yields are computed for the values of nuisance parameters and of the POI obtained from the ML fit. The best fit values of the POI amount to $\hat{r_{ttH}} = 0.92$ and $\hat{r_{tH}} = 5.7$. Quoted uncertainties represent the sum of statistical and systematic components.

Number of events selected in the 4$\ell$+0$\tau_{\mathrm{h}}$, 3$\ell$+1$\tau_{\mathrm{h}}$, and 2$\ell$+2$\tau_{\mathrm{h}}$ analysis channels compared to the event yields expected from the $ tH$ and $ H$ signals and from background processes. The expected event yields are computed for the values of nuisance parameters and of the POI obtained from the ML fit. The best fit values of the POI amount to $\hat{r_{ttH}} = 0.92$ and $\hat{r_{tH}} = 5.7$. Quoted uncertainties represent the sum of statistical and systematic components.

Dependence of the likelihood function L as a function of $\kappa_{\mathrm{t}}$ and $\kappa_{\mathrm{V}}$.

Dependence of the likelihood function L as a function of $\kappa_{\mathrm{t}}$ and $\kappa_{\mathrm{V}}$.

$-2\Delta log( L)$ as a function of the production rate of ttH and tH.

$-2\Delta log( L)$ as a function of the production rate of ttH and tH.

$-2\Delta log( L)$ as a function of the production rate of ttH and ttW.

$-2\Delta log( L)$ as a function of the production rate of ttH and ttW.

$-2\Delta log( L)$ as a function of the production rate of ttH and ttZ.

$-2\Delta log( L)$ as a function of the production rate of ttH and ttZ.

$-2\Delta log( L)$ as a function of the production rate of ttW and ttZ.

$-2\Delta log( L)$ as a function of the production rate of ttW and ttZ.

Covariance matrix of the fitted parameters of interest.

Covariance matrix of the fitted parameters of interest.

Production rate of the ttH signal measured in each of the ten channels individually and for the combination of all channels

Production rate of the ttH signal measured in each of the ten channels individually and for the combination of all channels

Production rate of the tH signal measured in each of the ten channels individually and for the combination of all channels

Production rate of the tH signal measured in each of the ten channels individually and for the combination of all channels

Probability for ttH signal events to pass the event selection in each of the analysis categories employed.

Neutron multiplicity dependence of acoplanarity ($\alpha$) from process $\gamma\gamma$ to $\mu^+\mu^-$ in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV.

Neutron multiplicity dependence of acoplanarity ($\alpha$) from process $\gamma\gamma$ to $\mu^+\mu^-$ in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV.

Neutron multiplicity dependence of acoplanarity ($\alpha$) from process $\gamma\gamma$ to $\mu^+\mu^-$ in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV.

Neutron multiplicity dependence of average core acoplanarity ($<\alpha^{core}>$) distributions from process $\gamma\gamma$ to $\mu^+\mu^-$ in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV.

Neutron multiplicity dependence of average invariant mass ($<m_{\mu\mu}>$) from process $\gamma\gamma$ to $\mu^+\mu^-$ in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV.

Acoplanarity ($\alpha$) distributions from process $\gamma\gamma$ to $\mu^+\mu^-$ for 0n1n class in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV. Dimuon rapidity is in the hemisphere containing larger neutron multiplicity.

Acoplanarity ($\alpha$) distributions from process $\gamma\gamma$ to $\mu^+\mu^-$ for 0nXn class in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV. Dimuon rapidity is in the hemisphere containing larger neutron multiplicity.

Acoplanarity ($\alpha$) distributions from process $\gamma\gamma$ to $\mu^+\mu^-$ for 1nXn class in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV. Dimuon rapidity is in the hemisphere containing larger neutron multiplicity.

Acoplanarity ($\alpha$) distributions from process $\gamma\gamma$ to $\mu^+\mu^-$ for 0n1n class in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV. Dimuon rapidity is in the hemisphere containing smaller neutron multiplicity.

Acoplanarity ($\alpha$) distributions from process $\gamma\gamma$ to $\mu^+\mu^-$ for 0nXn class in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV. Dimuon rapidity is in the hemisphere containing smaller neutron multiplicity.

Acoplanarity ($\alpha$) distributions from process $\gamma\gamma$ to $\mu^+\mu^-$ for 1nXn class in ultraperipheral PbPb at $\sqrt{s_{NN}}=5.02$ TeV. Dimuon rapidity is in the hemisphere containing smaller neutron multiplicity.

$\sqrt{\langle j_\mathrm{T}^2 \rangle }$ values for the narrow and wide components in p--Pb collisions at $\sqrt{s_\mathrm{NN}}$ = 5.02 TeV in $40 < p_\mathrm{T, jet}$ < 150 GeV/$c$.

Acceptances on TRUTH level of the DMt samples in the tW1L channel for all bins in the SR. The acceptance is defined as the number of weighted TRUTH events in the SR over the number of expected events without any selections. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Efficiencies of the DMt samples in the tW2L SR. The efficiency is defined as the number of weighted reconstructed events over the number of weighted TRUTH events in the SR. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

Acceptances on TRUTH level of the DMt samples in the tW2L SR. The acceptance is defined as the number of weighted TRUTH events in the SR over the number of expected events without any selections. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

Efficiencies of the DMt samples in the tW2L SR. The efficiency is defined as the number of weighted reconstructed events over the number of weighted TRUTH events in the SR. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Acceptances on TRUTH level of the DMt samples in the tW2L SR. The acceptance is defined as the number of weighted TRUTH events in the SR over the number of expected events without any selections. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Efficiencies of the DMt samples in the tj1L channel for all bins in the SR. The efficiency is defined as the number of weighted reconstructed events over the number of weighted TRUTH events in the SR. The map includes all used samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Acceptances on TRUTH level of the DMt samples in the tj1L channel for all bins in the SR. The acceptance is defined as the number of weighted TRUTH events in the SR over the number of expected events without any selections. The map includes all used samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW1L analysis considering only DMt signal.

Upper limits on excluded cross sections of the tW1L analysis considering only the DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the tW1L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the tW1L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW1L analysis considering only DMt signal.

Upper limits on excluded cross sections of the tW1L analysis considering only the DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the tW1L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the tW1L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW2L analysis considering only DMt signal.

Upper limits on excluded cross sections of the tW2L analysis considering only the DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the tW2L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW2L analysis considering only DMt signal.

Upper limits on excluded cross sections of the tW2L analysis considering only the DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the tW2L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the combined tW1L and tW2L analyses considering only the DMt signal.

Upper limits on excluded cross sections of the combined tW1L and tW2L analyses considering only the DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the statistical combination of the tW1L and tW2L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming only $tW$+DM contributions, for the statistical combination of the tW1L and tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the combined tW1L and tW2L analyses considering only the DMt signal.

Upper limits on excluded cross sections of the combined tW1L and tW2L analyses considering only the DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the statistical combination of the tW1L and tW2L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming only $tW$+DM contributions, for the statistical combination of the tW1L and tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW1L analysis considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW1L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW1L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW1L analysis considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW1L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW1L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW2L analysis considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW2L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tW2L analysis considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW2L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the combined tW1L and tW2L analyses considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the statistical combination of the tW1L and tW2L analysis channel.

The observed exclusion contours as a function of $(m_a, m_{H^{\pm}})$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the statistical combination of the tW1L and tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the combined tW1L and tW2L analyses considering the DMt$\bar{t}$+DMt signal.

The expected exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the statistical combination of the tW1L and tW2L analysis channel.

The observed exclusion contours as a function of $(m_{H^{\pm}}, \tan\beta)$, assuming DM$t\bar{t}$ and DM$t$ contributions, for the statistical combination of the tW1L and tW2L analysis channel.

Upper limits on signal strength (excluded cross section over theoretical cross section) of the tj1L analysis considering only the DMt signal.

Upper limits on upper limits on excluded cross sections of the tj1L analysis considering only the DMt signal.

The expected and observed cross section exclusion limits as a function of $m_{H^{\pm}}$ in the tj1L analysis channel for signal models with $m_a = 250~GeV$, and $\tan\beta=0.3$. The $\sigma^{}_\mathrm{BSM}$ is the cross section of the $t$-channel DM production process.

The expected and observed cross section exclusion limits as a function of $m_{H^{\pm}}$ in the tj1L analysis channel for signal models with $m_a = 250~GeV$, and $\tan\beta=0.5$. The $\sigma^{}_\mathrm{BSM}$ is the cross section of the $t$-channel DM production process.

Cross sections of the DMt samples in the tW1L channel. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

Cross sections of the DMt samples in the tW1L channel. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Cross sections times branching ratio of the DMt samples in the tW2L channel. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

Cross sections times branching ratio of the DMt samples in the tW2L channel. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Cross sections of the DMt samples in the tj1L channel. The map includes all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

MC generator filter efficiencies of the DMt samples in the tW1L channel. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

MC generator filter efficiencies of the DMt samples in the tW1L channel. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

MC generator filter efficiencies of the DMt samples in the tW2L channel. The maps include all samples in the $m_a - m_H$ plane with $tan\beta = 1$.

MC generator filter efficiencies of the DMt samples in the tW2L channel. The maps include all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

MC generator filter efficiencies of the DMt samples in the tj1L channel. The map includes all samples in the $m_H - tan\beta$ plane with $m_a = 250~GeV$.

Background-only fit results for the tW1L and tW2L signal regions. The backgrounds which contribute only a small amount (rare processes such as triboson, Higgs boson production processes, $t\bar{t}t\bar{t}$, $t\bar{t}WW$ and non-prompt or misidentified leptons background) are grouped and labelled as ``Others´´. The quoted uncertainties on the fitted SM background include both the statistical and systematic uncertainties.

Background-only fit results for the tj1L signal regions. The backgrounds which contribute only a small amount ($Z$+jets, rare processes such as $tWZ$, triboson, Higgs boson production processes, ,$t\bar{t}t\bar{t}$, $t\bar{t}WW$) are grouped and labelled as ``Others´´. The quoted uncertainties on the fitted SM background include both the statistical and systematic uncertainties.

Cutflow of the weighted events with statistical uncertainties for two DMt samples in all bins of the tW1L channel. The PreSelection includes at least 1 lepton in the event, at least 1 $b$-jet with $p_{\mathrm{T}} > 50~GeV$, $m\mathrm{_{T}^{lep}} > 30~GeV$, $\Delta\phi\mathrm{_{4jets, MET}^{min}} > 0.5$ and $E\mathrm{_{T}^{miss}} > 200~GeV$.

Cutflow of the weighted events with statistical uncertainties for two DMt samples in the tW2L channel. The PreSelection includes at least 2 leptons in the event, at least 1 $b$-jet with $p_{\mathrm{T}} > 40~GeV$, $m_{ll} > 40~GeV$, $m\mathrm{_{T2}} > 40~GeV$, $\Delta\phi\mathrm{_{4jets, MET}^{min}} > 0.5$ and $E\mathrm{_{T}^{miss}} > 200~GeV$.

Cutflow of the weighted events with the statistical uncertainties (except for the first cuts) for two DMt samples in all bins off the tj1L channel. The PreSelection includes at least 1 lepton in the event, at least 1 $b$-jet with $p_{\mathrm{T}} > 50~GeV$, $m\mathrm{_{T}^{lep}} > 30~GeV$, $\Delta\phi\mathrm{_{4jets, MET}^{min}} > 0.5$ and $E\mathrm{_{T}^{miss}} > 200~GeV$.

Forward neutron single spin asymmetries as a function of PT

Single vector leptoquark (LQv) k = 1 total selection efficiency, accounting for both the decay branching fraction and the event selection, for events that pass the signal region requirements and any of the top quark or b jet categories defined in the search.

Experimental uncertainties affecting transfer factors in the analysis that is used to estimate the W background in the signal region (SR). The number of W boson events are denoted as $W_{SR}$ for the SR and in analogy as $W_{\mu\nu}$ ($W_{e\nu}$) for the single-muon (single-electron) control region (CR).

Uncertainties assigned to the simulation based processes in SR and CRs.

Uncertainties assigned to the simulation based processes in SR and CRs.

Cross sections (fb) at large Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and their combination. The theoretical predictions from Madgraph at NLO in QCD and corrected to NLO in electroweak using the NNPDF 3.0 are also reported. With the exception of the largest Z $p_{T}$ bin, the statistical uncertainties in the measurements are much smaller than the systematic uncertainties. Both measurements and predictions correspond to $\sigma \mathcal{B}(Z -> \ell\ell)$, where $\sigma$ is the total fiducial cross section, $\mathcal{B}$ is the branching fraction, and $\ell$ is a charged lepton. The $Z -> \nu\nu$ measurement corresponds to $\sigma \mathcal{B}(Z -> \ell\ell)/\mathcal{B}(Z -> \nu\nu)$.

Cross sections (fb) at large Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and their combination. The theoretical predictions from Madgraph at NLO in QCD and corrected to NLO in electroweak using the NNPDF 3.0 are also reported. With the exception of the largest Z $p_{T}$ bin, the statistical uncertainties in the measurements are much smaller than the systematic uncertainties. Both measurements and predictions correspond to $\sigma \mathcal{B}(Z -> \ell\ell)$, where $\sigma$ is the total fiducial cross section, $\mathcal{B}$ is the branching fraction, and $\ell$ is a charged lepton. The $Z -> \nu\nu$ measurement corresponds to $\sigma \mathcal{B}(Z -> \ell\ell)/\mathcal{B}(Z -> \nu\nu)$.

Cross sections normalized to the total cross section measurements at high Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and in their combination. The uncertainty includes both statistical and systematic uncertainties.

Cross sections normalized to the total cross section measurements at high Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and in their combination. The uncertainty includes both statistical and systematic uncertainties.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.